61,628 research outputs found

    Supervised Classification: Quite a Brief Overview

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    The original problem of supervised classification considers the task of automatically assigning objects to their respective classes on the basis of numerical measurements derived from these objects. Classifiers are the tools that implement the actual functional mapping from these measurements---also called features or inputs---to the so-called class label---or output. The fields of pattern recognition and machine learning study ways of constructing such classifiers. The main idea behind supervised methods is that of learning from examples: given a number of example input-output relations, to what extent can the general mapping be learned that takes any new and unseen feature vector to its correct class? This chapter provides a basic introduction to the underlying ideas of how to come to a supervised classification problem. In addition, it provides an overview of some specific classification techniques, delves into the issues of object representation and classifier evaluation, and (very) briefly covers some variations on the basic supervised classification task that may also be of interest to the practitioner

    Few-shot classification in Named Entity Recognition Task

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    For many natural language processing (NLP) tasks the amount of annotated data is limited. This urges a need to apply semi-supervised learning techniques, such as transfer learning or meta-learning. In this work we tackle Named Entity Recognition (NER) task using Prototypical Network - a metric learning technique. It learns intermediate representations of words which cluster well into named entity classes. This property of the model allows classifying words with extremely limited number of training examples, and can potentially be used as a zero-shot learning method. By coupling this technique with transfer learning we achieve well-performing classifiers trained on only 20 instances of a target class.Comment: In proceedings of the 34th ACM/SIGAPP Symposium on Applied Computin
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