Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Proceedings of the 22nd Conference on Formal Methods in Computer-Aided Design – FMCAD 2022

The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing

Proceedings of the 22nd Conference on Formal Methods in Computer-Aided Design – FMCAD 2022

The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing

On Extracting Course-Grained Function Parallelism from C Programs

To efficiently utilize the emerging heterogeneous multi-core architecture, it is essential to exploit the inherent coarse-grained parallelism in applications. In addition to data parallelism, applications like telecommunication, multimedia, and gaming can also benefit from the exploitation of coarse-grained function parallelism. To exploit coarse-grained function parallelism, the common wisdom is to rely on programmers to explicitly express the coarse-grained data-flow between coarse-grained functions using data-flow or streaming languages. This research is set to explore another approach to exploiting coarse-grained function parallelism, that is to rely on compiler to extract coarse-grained data-flow from imperative programs. We believe imperative languages and the von Neumann programming model will still be the dominating programming languages programming model in the future. This dissertation discusses the design and implementation of a memory data-flow analysis system which extracts coarse-grained data-flow from C programs. The memory data-flow analysis system partitions a C program into a hierarchy of program regions. It then traverses the program region hierarchy from bottom up, summarizing the exposed memory access patterns for each program region, meanwhile deriving a conservative producer-consumer relations between program regions. An ensuing top-down traversal of the program region hierarchy will refine the producer-consumer relations by pruning spurious relations. We built an in-lining based prototype of the memory data-flow analysis system on top of the IMPACT compiler infrastructure. We applied the prototype to analyze the memory data-flow of several MediaBench programs. The experiment results showed that while the prototype performed reasonably well for the tested programs, the in-lining based implementation may not efficient for larger programs. Also, there is still room in improving the effectiveness of the memory data-flow analysis system. We did root cause analysis for the inaccuracy in the memory data-flow analysis results, which provided us insights on how to improve the memory data-flow analysis system in the future

Techniques d'abstraction pour l'analyse et la mitigation des effets dus à la radiation

The main objective of this thesis is to develop techniques that can beused to analyze and mitigate the effects of radiation-induced soft errors in industrialscale integrated circuits. To achieve this goal, several methods have been developedbased on analyzing the design at higher levels of abstraction. These techniquesaddress both sequential and combinatorial SER.Fault-injection simulations remain the primary method for analyzing the effectsof soft errors. In this thesis, techniques which significantly speed-up fault-injectionsimulations are presented. Soft errors in flip-flops are typically mitigated by selectivelyreplacing the most critical flip-flops with hardened implementations. Selectingan optimal set to harden is a compute intensive problem and the second contributionconsists of a clustering technique which significantly reduces the number offault-injections required to perform selective mitigation.In terrestrial applications, the effect of soft errors in combinatorial logic hasbeen fairly small. It is known that this effect is growing, yet there exist few techniqueswhich can quickly estimate the extent of combinatorial SER for an entireintegrated circuit. The third contribution of this thesis is a hierarchical approachto combinatorial soft error analysis.Systems-on-chip are often developed by re-using design-blocks that come frommultiple sources. In this context, there is a need to develop and exchange reliabilitymodels. The final contribution of this thesis consists of an application specificmodeling language called RIIF (Reliability Information Interchange Format). Thislanguage is able to model how faults at the gate-level propagate up to the block andchip-level. Work is underway to standardize the RIIF modeling language as well asto extend it beyond modeling of radiation-induced failures.In addition to the main axis of research, some tangential topics were studied incollaboration with other teams. One of these consisted in the development of a novelapproach for protecting ternary content addressable memories (TCAMs), a specialtype of memory important in networking applications. The second supplementalproject resulted in an algorithm for quickly generating approximate redundant logicwhich can protect combinatorial networks against permanent faults. Finally anapproach for reducing the detection time for errors in the configuration RAM forField-Programmable Gate-Arrays (FPGAs) was outlined.Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une particule subatomique, fait se déposer une charge dans les régions sensibles d'un transistor cela provoque une impulsion de courant. Cette impulsion peut alors engendrer l'inversion d'un bit ou se propager dans un réseau de logique combinatoire avant d'être échantillonnée par une bascule en aval.Selon l'état du circuit au moment de la frappe de la particule et selon l'application, cela provoquera une panne observable ou non. Parmi les événements induits par la radiation, seule une petite portion génère des pannes. Il est donc essentiel de déterminer cette fraction afin de prédire la fiabilité du système. En effet, les raisons pour lesquelles une perturbation pourrait être masquée sont multiples, et il est de plus parfois difficile de préciser ce qui constitue une erreur. A cela s'ajoute le fait que les circuits intégrés comportent des milliards de transistors. Comme souvent dans le contexte de la conception assisté par ordinateur, les approches hiérarchiques et les techniques d'abstraction permettent de trouver des solutions.Cette thèse propose donc plusieurs nouvelles techniques pour analyser les effets dus à la radiation. La première technique permet d'accélérer des simulations d'injections de fautes en détectant lorsqu'une faute a été supprimée du système, permettant ainsi d'arrêter la simulation. La deuxième technique permet de regrouper en ensembles les éléments d'un circuit ayant une fonction similaire. Ensuite, une analyse au niveau des ensemble peut être faite, identifiant ainsi ceux qui sont les plus critiques et qui nécessitent donc d'être durcis. Le temps de calcul est ainsi grandement réduit.La troisième technique permet d'analyser les effets des fautes transitoires dans les circuits combinatoires. Il est en effet possible de calculer à l'avance la sensibilité à des fautes transitoires de cellules ainsi que les effets de masquage dans des blocs fréquemment utilisés. Ces modèles peuvent alors être combinés afin d'analyser la sensibilité de grands circuits. La contribution finale de cette thèse consiste en la définition d'un nouveau langage de modélisation appelé RIIF (Reliability Information Ineterchange Format). Ce langage permet de décrire le taux des fautes dans des composants simples en fonction de leur environnement de fonctionnement. Ces composants simples peuvent ensuite être combinés permettant ainsi de modéliser la propagation de leur fautes vers des pannes au niveau système. En outre, l'utilisation d'un langage standard facilite l'échange de données de fiabilité entre les partenaires industriels.Au-delà des contributions principales, cette thèse aborde aussi des techniques permettant de protéger des mémoires associatives ternaires (TCAMs). Les approches classiques de protection (codes correcteurs) ne s'appliquent pas directement. Une des nouvelles techniques proposées consiste à utiliser une structure de données qui peut détecter, d'une manière statistique, quand le résultat n'est pas correct. La probabilité de détection peut être contrôlée par le nombre de bits alloués à cette structure. Une autre technique consiste à utiliser un détecteur de courant embarqué (BICS) afin de diriger un processus de fond directement vers le région touchée par une erreur. La contribution finale consiste en un algorithme qui permet de synthétiser de la logique combinatoire afin de protéger des circuits combinatoires contre les fautes transitoires.Dans leur ensemble, ces techniques facilitent l'analyse des erreurs provoquées par les effets dus à la radiation dans les circuits intégrés, en particulier pour les très grands circuits composés de blocs provenant de divers fournisseurs. Des techniques pour mieux sélectionner les bascules/flip-flops à durcir et des approches pour protéger des TCAMs ont étés étudiées

Design and optimization of approximate multipliers and dividers for integer and floating-point arithmetic

The dawn of the twenty-first century has witnessed an explosion in the number of digital devices and data. While the emerging deep learning algorithms to extract information from this vast sea of data are becoming increasingly compute-intensive, traditional means of improving computing power are no longer yielding gains at the same rate due to the diminishing returns from traditional technology scaling. To minimize the increasing gap between computational demands and the available resources, the paradigm of approximate computing is emerging as one of the potential solutions. Specifically, the resource-efficient approximate arithmetic units promise overall system efficiency, since most of the compute-intensive applications are dominated by arithmetic operations. This thesis primarily presents design techniques for approximate hardware multipliers and dividers. The thesis presents the design of two approximate integer multipliers and an approximate integer divider. These are: an error-configurable minimally-biased approximate integer multiplier (MBM), an error-configurable reduced-error approximate log based multiplier (REALM), and error-configurable integer divider INZeD. The two multiplier designs and the divider designs are based on the coupling of novel mathematically formulated error-reduction mechanisms in the classical approximate log based multiplier and dividers, respectively. They exhibit very low error bias and offer Pareto-optimal error vs. resource-efficiency trade-offs when compared with the state-of-the-art approximate integer multipliers/dividers. Further, the thesis also presents design of approximate floating-point multipliers and dividers. These designs utilize the optimized versions of the proposed MBM and REALM multipliers for mantissa multiplications and the proposed INZeD divider for mantissa division, and offer better design trade-offs than traditional precision scaling. The existing approximate integer dividers as well as the proposed INZeD suffer from unreasonably high worst-case error. This thesis presents WEID, which is a novel light-weight method for reducing worst-case error in approximate dividers. Finally, the thesis presents a methodology for selection of approximate arithmetic units for a given application. The methodology is based on a novel selection algorithm and utilizes the subrange error characterization of approximate arithmetic units, which performs error characterization independently in different segments of the input range

Massivel y parallel declarative computational models

Current computer archictectures are parallel, with an increasing number of processors. Parallel programming is an error-prone task and declarative models such as those based on constraints relieve the programmer from some of its difficult aspects, because they abstract control away. In this work we study and develop techniques for declarative computational models based on constraints using GPI, aiming at large scale parallel execution. The main contributions of this work are: A GPI implementation of a scalable dynamic load balancing scheme based on work stealing, suitable for tree shaped computations and effective for systems with thousands of threads. A parallel constraint solver, MaCS, implemented to take advantage of the GPI programming model. Experimental evaluation shows very good scalability results on systems with hundreds of cores. A GPI parallel version of the Adaptive Search algorithm, including different variants. The study on different problems advances the understanding of scalability issues known to exist with large numbers of cores; ### SUMÁRIO: Actualmente as arquitecturas de computadores são paralelas, com um crescente número de processadores. A programação paralela é uma tarefa propensa a erros e modelos declarativos baseados em restrições aliviam o programador de aspectos difíceis dado que abstraem o controlo. Neste trabalho estudamos e desenvolvemos técnicas para modelos de computação declarativos baseados em restrições usando o GPI, uma ferramenta e modelo de programação recente. O Objectivo é a execução paralela em larga escala. As contribuições deste trabalho são as seguintes: a implementação de um esquema dinâmico para balanceamento da computação baseado no GPI. O esquema é adequado para computações em árvores e efectiva em sistemas compostos por milhares de unidades de computação. Uma abordagem à resolução paralela de restrições denominadas de MaCS, que tira partido do modelo de programação do GPI. A Avaliação experimental revelou boa escalabilidade num sistema com centenas de processadores. Uma versão paralela do algoritmo Adaptive Search baseada no GPI, que inclui diferentes variantes. O estudo de diversos problemas aumenta a compreensão de aspectos relacionados com a escalabilidade e presentes na execução deste tipo de algoritmos num grande número de processadores

Reliable chip design from low powered unreliable components

The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling chip transistor density to double every two years. The transistors would continue to decline in cost and size but increase in power. The continuous transistor scaling and extremely lower power constraints in modern Very Large Scale Integrated(VLSI) chips can potentially supersede the benefits of the technology shrinking due to reliability issues. As VLSI technology scales into nanoscale regime, fundamental physical limits are approached, and higher levels of variability, performance degradation, and higher rates of manufacturing defects are experienced. Soft errors, which traditionally affected only the memories, are now also resulting in logic circuit reliability degradation. A solution to these limitations is to integrate reliability assessment techniques into the Integrated Circuit(IC) design flow. This thesis investigates four aspects of reliability driven circuit design: a)Reliability estimation; b) Reliability optimization; c) Fault-tolerant techniques, and d) Delay degradation analysis. To guide the reliability driven synthesis and optimization of combinational circuits, highly accurate probability based reliability estimation methodology christened Conditional Probabilistic Error Propagation(CPEP) algorithm is developed to compute the impact of gate failures on the circuit output. CPEP guides the proposed rewriting based logic optimization algorithm employing local transformations. The main idea behind this methodology is to replace parts of the circuit with functionally equivalent but more reliable counterparts chosen from a precomputed subset of Negation-Permutation-Negation(NPN) classes of 4-variable functions. Cut enumeration and Boolean matching driven by reliability-aware optimization algorithm are used to identify the best possible replacement candidates. Experiments on a set of MCNC benchmark circuits and 8051 functional microcontroller units indicate that the proposed framework can achieve up to 75% reduction of output error probability. On average, about 14% SER reduction is obtained at the expense of very low area overhead of 6.57% that results in 13.52% higher power consumption. The next contribution of the research describes a novel methodology to design fault tolerant circuitry by employing the error correction codes known as Codeword Prediction Encoder(CPE). Traditional fault tolerant techniques analyze the circuit reliability issue from a static point of view neglecting the dynamic errors. In the context of communication and storage, the study of novel methods for reliable data transmission under unreliable hardware is an increasing priority. The idea of CPE is adapted from the field of forward error correction for telecommunications focusing on both encoding aspects and error correction capabilities. The proposed Augmented Encoding solution consists of computing an augmented codeword that contains both the codeword to be transmitted on the channel and extra parity bits. A Computer Aided Development(CAD) framework known as CPE simulator is developed providing a unified platform that comprises a novel encoder and fault tolerant LDPC decoders. Experiments on a set of encoders with different coding rates and different decoders indicate that the proposed framework can correct all errors under specific scenarios. On average, about 1000 times improvement in Soft Error Rate(SER) reduction is achieved. Last part of the research is the Inverse Gaussian Distribution(IGD) based delay model applicable to both combinational and sequential elements for sub-powered circuits. The Probability Density Function(PDF) based delay model accurately captures the delay behavior of all the basic gates in the library database. The IGD model employs these necessary parameters, and the delay estimation accuracy is demonstrated by evaluating multiple circuits. Experiments results indicate that the IGD based approach provides a high matching against HSPICE Monte Carlo simulation results, with an average error less than 1.9% and 1.2% for the 8-bit Ripple Carry Adder(RCA), and 8-bit De-Multiplexer(DEMUX) and Multiplexer(MUX) respectively

Tools and Algorithms for the Construction and Analysis of Systems

This book is Open Access under a CC BY licence. The LNCS 11427 and 11428 proceedings set constitutes the proceedings of the 25th International Conference on Tools and Algorithms for the Construction and Analysis of Systems, TACAS 2019, which took place in Prague, Czech Republic, in April 2019, held as part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2019. The total of 42 full and 8 short tool demo papers presented in these volumes was carefully reviewed and selected from 164 submissions. The papers are organized in topical sections as follows: Part I: SAT and SMT, SAT solving and theorem proving; verification and analysis; model checking; tool demo; and machine learning. Part II: concurrent and distributed systems; monitoring and runtime verification; hybrid and stochastic systems; synthesis; symbolic verification; and safety and fault-tolerant systems