Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

Advanced Timing and Synchronization Methodologies for Digital VLSI Integrated Circuits

This dissertation addresses timing and synchronization methodologies that are critical to the design, analysis and optimization of high-performance, integrated digital VLSI systems. As process sizes shrink and design complexities increase, achieving timing closure for digital VLSI circuits becomes a significant bottleneck in the integrated circuit design flow. Circuit designers are motivated to investigate and employ alternative methods to satisfy the timing and physical design performance targets. Such novel methods for the timing and synchronization of complex circuitry are developed in this dissertation and analyzed for performance and applicability.Mainstream integrated circuit design flow is normally tuned for zero clock skew, edge-triggered circuit design. Non-zero clock skew or multi-phase clock synchronization is seldom used because the lack of design automation tools increases the length and cost of the design cycle. For similar reasons, level-sensitive registers have not become an industry standard despite their superior size, speed and power consumption characteristics compared to conventional edge-triggered flip-flops.In this dissertation, novel design and analysis techniques that fully automate the design and analysis of non-zero clock skew circuits are presented. Clock skew scheduling of both edge-triggered and level-sensitive circuits are investigated in order to exploit maximum circuit performances. The effects of multi-phase clocking on non-zero clock skew, level-sensitive circuits are investigated leading to advanced synchronization methodologies. Improvements in the scalability of the computational timing analysis process with clock skew scheduling are explored through partitioning and parallelization.The integration of the proposed design and analysis methods to the physical design flow of integrated circuits synchronized with a next-generation clocking technology-resonant rotary clocking technology-is also presented. Based on the design and analysis methods presented in this dissertation, a computer-aided design tool for the design of rotary clock synchronized integrated circuits is developed

Near hybrid passenger vehicle development program, phase 1. Appendices C and D, Volume 2

Results of tradeoff studies are presented in summary form. Various aspects of the overall vehicle design discussed include selection of the base vehicle, the battery pack configuration, structural modifications, occupant protection, vehicle dynamics, and aerodynamics. The drivetrain design and integration, power conditioning unit, battery subsystem, control system, environmental system are described. Specifications, weight breakdown, and energy consumption measures, and advanced technology components are included

Orbital transfer vehicle concept definition and system analysis study. Volume 2: OTV concept definition and evaluation. Book 3: Subsystem trade studies

The technical trade studies and analyses reported in this book represent the accumulated work of the technical staff for the contract period. The general disciplines covered are as follows: (1) Guidance, Navigation, and Control; (2) Avionics Hardware; (3) Aeroassist Technology; (4) Propulsion; (5) Structure and Materials; and (6) Thermal Control Technology. The objectives in each of these areas were to develop the latest data, information, and analyses in support of the vehicle design effort

An advanced Framework for efficient IC optimization based on analytical models engine

En base als reptes sorgits a conseqüència de l'escalat de la tecnologia, la present tesis desenvolupa i analitza un conjunt d'eines orientades a avaluar la sensibilitat a la propagació d'esdeveniments SET en circuits microelectrònics. S'han proposant varies mètriques de propagació de SETs considerant l'impacto dels emmascaraments lògic, elèctric i combinat lògic-elèctric. Aquestes mètriques proporcionen una via d'anàlisi per quantificar tant les regions més susceptibles a propagar SETs com les sortides més susceptibles de rebre'ls. S'ha desenvolupat un conjunt d'algorismes de cerca de camins sensibilitzables altament adaptables a múltiples aplicacions, un sistema lògic especific i diverses tècniques de simplificació de circuits. S'ha demostrat que el retard d'un camí donat depèn dels vectors de sensibilització aplicats a les portes que formen part del mateix, essent aquesta variació de retard comparable a la atribuïble a les variacions paramètriques del proces.En base a los desafíos surgidos a consecuencia del escalado de la tecnología, la presente tesis desarrolla y analiza un conjunto de herramientas orientadas a evaluar la sensibilidad a la propagación de eventos SET en circuitos microelectrónicos. Se han propuesto varias métricas de propagación de SETs considerando el impacto de los enmascaramientos lógico, eléctrico y combinado lógico-eléctrico. Estas métricas proporcionan una vía de análisis para cuantificar tanto las regiones más susceptibles a propagar eventos SET como las salidas más susceptibles a recibirlos. Ha sido desarrollado un conjunto de algoritmos de búsqueda de caminos sensibilizables altamente adaptables a múltiples aplicaciones, un sistema lógico especifico y diversas técnicas de simplificación de circuitos. Se ha demostrado que el retardo de un camino dado depende de los vectores de sensibilización aplicados a las puertas que forman parte del mismo, siendo esta variación de retardo comparable a la atribuible a las variaciones paramétricas del proceso.Based on the challenges arising as a result of technology scaling, this thesis develops and evaluates a complete framework for SET propagation sensitivity. The framework comprises a number of processing tools capable of handling circuits with high complexity in an efficient way. Various SET propagation metrics have been proposed considering the impact of logic, electric and combined logic-electric masking. Such metrics provide a valuable vehicle to grade either in-circuit regions being more susceptible of propagating SETs toward the circuit outputs or circuit outputs more susceptible to produce SET. A quite efficient and customizable true path finding algorithm with a specific logic system has been constructed and its efficacy demonstrated on large benchmark circuits. It has been shown that the delay of a path depends on the sensitization vectors applied to the gates within the path. In some cases, this variation is comparable to the one caused by process parameters variation

Designs for increasing reliability while reducing energy and increasing lifetime

In the last decades, the computing technology experienced tremendous developments. For instance, transistors' feature size shrank to half at every two years as consistently from the first time Moore stated his law. Consequently, number of transistors and core count per chip doubles at each generation. Similarly, petascale systems that have the capability of processing more than one billion calculation per second have been developed. As a matter of fact, exascale systems are predicted to be available at year 2020. However, these developments in computer systems face a reliability wall. For instance, transistor feature sizes are getting so small that it becomes easier for high-energy particles to temporarily flip the state of a memory cell from 1-to-0 or 0-to-1. Also, even if we assume that fault-rate per transistor stays constant with scaling, the increase in total transistor and core count per chip will significantly increase the number of faults for future desktop and exascale systems. Moreover, circuit ageing is exacerbated due to increased manufacturing variability and thermal stresses, therefore, lifetime of processor structures are becoming shorter. On the other side, due to the limited power budget of the computer systems such that mobile devices, it is attractive to scale down the voltage. However, when the voltage level scales to beyond the safe margin especially to the ultra-low level, the error rate increases drastically. Nevertheless, new memory technologies such as NAND flashes present only limited amount of nominal lifetime, and when they exceed this lifetime, they can not guarantee storing of the data correctly leading to data retention problems. Due to these issues, reliability became a first-class design constraint for contemporary computing in addition to power and performance. Moreover, reliability even plays increasingly important role when computer systems process sensitive and life-critical information such as health records, financial information, power regulation, transportation, etc. In this thesis, we present several different reliability designs for detecting and correcting errors occurring in processor pipelines, L1 caches and non-volatile NAND flash memories due to various reasons. We design reliability solutions in order to serve three main purposes. Our first goal is to improve the reliability of computer systems by detecting and correcting random and non-predictable errors such as bit flips or ageing errors. Second, we aim to reduce the energy consumption of the computer systems by allowing them to operate reliably at ultra-low voltage level. Third, we target to increase the lifetime of new memory technologies by implementing efficient and low-cost reliability schemes

NASA Tech Briefs, March 1989

This issue's special features cover the NASA inventor of the year, and the other nominees for the year. Other Topics include: Electronic Components & and Circuits. Electronic Systems, Physical Sciences, Materials, Computer Programs, Mechanics, Machinery, Fabrication Technology, Mathematics and Information Sciences, and Life Science

Integrated Distributed Amplifiers for Ultra-Wideband BiCMOS Receivers Operating at Millimeter-Wave Frequencies

Millimetre-wave technology is used for applications such as telecommunications and imaging. For both applications, the bandwidth of existing systems has to be increased to support higher data rates and finer imaging resolutions. Millimetrewave circuits with very large bandwidths are developed in this thesis. The focus is put on amplifiers and the on-chip integration of the amplifiers with antennas. Circuit prototypes, fabricated in a commercially available 130nm Silicon-Germanium (SiGe) Bipolar Complementary Metal-Oxide-Semiconductor (BiCMOS) process, validated the developed techniques. Cutting-edge performances have been achieved in the field of distributed and resonant-matched amplifiers, as well as in that of the antenna-amplifier co-integration. Examples are as follows: - A novel cascode gain-cell with three transistors was conceived. By means of transconductance peaking towards high frequencies, the losses of the synthetic line can be compensated up to higher frequencies. The properties were analytically derived and explained. Experimental demonstration validated the technique by a Traveling-Wave Amplifier (TWA) able to produce 10 dB of gain over a frequency band of 170GHz.# - Two Cascaded Single-Stage Distributed Amplifiers (CSSDAs) have been demonstrated. The first CSSDA, optimized for low power consumption, requires less than 20mW to provide 10 dB of gain over a frequency band of 130 GHz. The second amplifier was designed for high-frequency operation and works up to 250 GHz leading to a record bandwidth for distributed amplifiers in SiGe technology. - The first complete CSSDA circuit analysis as function of all key parameters was presented. The typical degradation of the CSSDA output matching towards high frequencies was analytically quantified. A balanced architecture was then introduced to retain the frequency-response advantages of CSSDAs and yet ensure matching over the frequency band of interested. A circuit prototype validated experimentally the technique. - The first traveling-wave power combiner and divider capable of operation from the MHz range up to 200 GHz were demonstrated. The circuits improved the state of the art of the maximum frequency of operation and the bandwidth by a factor of five. - A resonant-matched balanced amplifier was demonstrated with a centre frequency of 185 GHz, 10 dB of gain and a 55GHz wide –3 dB-bandwidth. The power consumption of the amplifier is 16.8mW, one of the lowest for this circuit class, while the bandwidth is the broadest reported in literature for resonant-matched amplifiers in SiGe technology