T-infinity: The Dependency Inversion Principle for Rapid and Sustainable Multidisciplinary Software Development

The CFD Vision 2030 Study recommends that, NASA should develop and maintain an integrated simulation and software development infrastructure to enable rapid CFD technology maturation.... [S]oftware standards and interfaces must be emphasized and supported whenever possible, and open source models for noncritical technology components should be adopted. The current paper presents an approach to an open source development architecture, named T-infinity, for accelerated research in CFD leveraging the Dependency Inversion Principle to realize plugins that communicate through collections of functions without exposing internal data structures. Steady state flow visualization, mesh adaptation, fluid-structure interaction, and overset domain capabilities are demonstrated through compositions of plugins via standardized abstract interfaces without the need for source code dependencies between disciplines. Plugins interact through abstract interfaces thereby avoiding N 2 direct code-to-code data structure coupling where N is the number of codes. This plugin architecture enhances sustainable development by controlling the interaction between components to limit software complexity growth. The use of T-infinity abstract interfaces enables multidisciplinary application developers to leverage legacy applications alongside newly-developed capabilities. While rein, a description of interface details is deferred until the are more thoroughly tested and can be closed to modification

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools

INCOBAT

Electro-mobility is considered as a key technology to achieve green mobility and fulfil tomorrow’s emission standards. However, different challenges still need to be faced to achieve comparable performances to conventional vehicles and finally obtain market acceptance. Two of these challenges are vehicle range and production costs. In that context, the aim of INCOBAT (October 2013 – December 2016) was to provide innovative and cost efficient battery management systems for next generation HV-batteries. INCOBAT proposes a platform concept that achieves cost reduction, reduced complexity, increased reliability and flexibility while at the same time reaching higher energy efficiency.• Very tight control of the cell function leading to a significant increase of the driving range of the FEV;• Radical cost reduction of the battery management system with respect to current solutions;• Development of modular concepts for system architecture and partitioning, safety, security, reliability as well as verification and validation, thus enabling efficient integration into different vehicle platforms. The INCOBAT project focused on the following twelve technical innovations grouped into four innovation groups, which are summarized in this book:• Customer needs and integration aspects• Transversal innovation• Technology innovation• Transversal innovatio

High-Level Synthesis Based VLSI Architectures for Video Coding

High Efficiency Video Coding (HEVC) is state-of-the-art video coding standard. Emerging applications like free-viewpoint video, 360degree video, augmented reality, 3D movies etc. require standardized extensions of HEVC. The standardized extensions of HEVC include HEVC Scalable Video Coding (SHVC), HEVC Multiview Video Coding (MV-HEVC), MV-HEVC+ Depth (3D-HEVC) and HEVC Screen Content Coding. 3D-HEVC is used for applications like view synthesis generation, free-viewpoint video. Coding and transmission of depth maps in 3D-HEVC is used for the virtual view synthesis by the algorithms like Depth Image Based Rendering (DIBR). As first step, we performed the profiling of the 3D-HEVC standard. Computational intensive parts of the standard are identified for the efficient hardware implementation. One of the computational intensive part of the 3D-HEVC, HEVC and H.264/AVC is the Interpolation Filtering used for Fractional Motion Estimation (FME). The hardware implementation of the interpolation filtering is carried out using High-Level Synthesis (HLS) tools. Xilinx Vivado Design Suite is used for the HLS implementation of the interpolation filters of HEVC and H.264/AVC. The complexity of the digital systems is greatly increased. High-Level Synthesis is the methodology which offers great benefits such as late architectural or functional changes without time consuming in rewriting of RTL-code, algorithms can be tested and evaluated early in the design cycle and development of accurate models against which the final hardware can be verified

A Test Vector Minimization Algorithm Based On Delta Debugging For Post-Silicon Validation Of Pcie Rootport

In silicon hardware design, such as designing PCIe devices, design verification is an essential part of the design process, whereby the devices are subjected to a series of tests that verify the functionality. However, manual debugging is still widely used in post-silicon validation and is a major bottleneck in the validation process. The reason is a large number of tests vectors have to be analyzed, and this slows process down. To solve the problem, a test vector minimizer algorithm is proposed to eliminate redundant test vectors that do not contribute to reproduction of a test failure, hence, improving the debug throughput. The proposed methodology is inspired by the Delta Debugging algorithm which is has been used in automated software debugging but not in post-silicon hardware debugging. The minimizer operates on the principle of binary partitioning of the test vectors, and iteratively testing each subset (or complement of set) on a post-silicon System-Under-Test (SUT), to identify and eliminate redundant test vectors. Test results using test vector sets containing deliberately introduced erroneous test vectors show that the minimizer is able to isolate the erroneous test vectors. In test cases containing up to 10,000 test vectors, the minimizer requires about 16ns per test vector in the test case when only one erroneous test vector is present. In a test case with 1000 vectors including erroneous vectors, the same minimizer requires about 140μs per erroneous test vector that is injected. Thus, the minimizer’s CPU consumption is significantly smaller than the typical amount of time of a test running on SUT. The factors that significantly impact the performance of the algorithm are number of erroneous test vectors and distribution (spacing) of the erroneous vectors. The effect of total number of test vectors and position of the erroneous vectors are relatively minor compared to the other two. The minimization algorithm therefore was most effective for cases where there are only a few erroneous test vectors, with large number of test vectors in the set

Compressed Passive Macromodeling

This paper presents an approach for the extraction of passive macromodels of large-scale interconnects from their frequency-domain scattering responses. Here, large scale is intended both in terms of number of electrical ports and required dynamic model order. For such structures, standard approaches based on rational approximation via vector fitting and passivity enforcement via model perturbation may fail because of excessive computational requirements, both in terms of memory size and runtime. Our approach addresses this complexity by first reducing the redundancy in the raw scattering responses through a projection and approximation process based on a truncated singular value decomposition. Then we formulate a compressed rational fitting and passivity enforcement framework which is able to obtain speedup factors up to 2 and 3 orders of magnitude with respect to standard approaches, with full control over the approximation errors. Numerical results on a large set of benchmark cases demonstrate the effectiveness of the proposed techniqu

Rapid high-level behavioral modeling of soc communication interfaces

Abstract. The increasing complexity of hardware and software systems increases the amount of labour and resources required to model them. Especially in system-on-chips (SoC), the complexity of modeling is evident. Electronic system-level (ESL) modeling using the benefits of transaction level modeling (TLM) reduces the required resources and speeds up the modeling time. This thesis examines approximately timed modeling in the context of behavioral modeling with abstract processing elements and abstract arbitration procedures. This thesis describes the basic principles of SoC:s and TLM, and then a problem of modeling a SoC communication interface for a company is investigated, and a TLM solution to the modeling problem is explored.Järjestelmäpiirien tiedonsiirtoyhteyksien nopea korkean tason käytösmallinnus. Tiivistelmä. Laitteistojen ja systeemien kasvava kompleksisuus lisää niiden mallinnukseen vaadittua työmäärää ja resursseja. Erityisesti järjestelmäpiireissä (SoC) mallinnuksen monimutkaistuminen näkyy. Elektronisen järjestelmätason (ESL) mallinnus käyttämällä tapahtumatason mallinnuksen (TLM) hyötyjä vähentää vaadittuja resursseja ja nopeuttaa mallinnukseen kuluvaa aikaa. Tässä opinnäytetyössä tarkastellaan likimääräisesti ajastettua mallinnusta käytösmallinnuksen kontekstissa abstrakteilla prosessointi elementeillä ja abstrakteilla sovittelu proseduureilla. Tässä työssä kuvataan myös järjestelmäpiirin ja TLM:n perusperiaatteet, jonka jälkeen tutkitaan erään yrityksen SoC:in tiedonsiirtoväylän mallinnuksen ongelmaa, ja tutkitaan TLM ratkaisua mallinnusongelmalle

AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations