11,197 research outputs found

    Pseudo-functional testing: bridging the gap between manufacturing test and functional operation.

    Get PDF
    Yuan, Feng.Thesis (M.Phil.)--Chinese University of Hong Kong, 2009.Includes bibliographical references (leaves 60-65).Abstract also in Chinese.Abstract --- p.iAcknowledgement --- p.iiChapter 1 --- Introduction --- p.1Chapter 1.1 --- Manufacturing Test --- p.1Chapter 1.1.1 --- Functional Testing vs. Structural Testing --- p.2Chapter 1.1.2 --- Fault Model --- p.3Chapter 1.1.3 --- Automatic Test Pattern Generation --- p.4Chapter 1.1.4 --- Design for Testability --- p.6Chapter 1.2 --- Pseudo-Functional Manufacturing Test --- p.13Chapter 1.3 --- Thesis Motivation and Organization --- p.16Chapter 2 --- On Systematic Illegal State Identification --- p.19Chapter 2.1 --- Introduction --- p.19Chapter 2.2 --- Preliminaries and Motivation --- p.20Chapter 2.3 --- What is the Root Cause of Illegal States? --- p.22Chapter 2.4 --- Illegal State Identification Flow --- p.26Chapter 2.5 --- Justification Scheme Construction --- p.30Chapter 2.6 --- Experimental Results --- p.34Chapter 2.7 --- Conclusion --- p.35Chapter 3 --- Compression-Aware Pseudo-Functional Testing --- p.36Chapter 3.1 --- Introduction --- p.36Chapter 3.2 --- Motivation --- p.38Chapter 3.3 --- Proposed Methodology --- p.40Chapter 3.4 --- Pattern Generation in Compression-Aware Pseudo-Functional Testing --- p.42Chapter 3.4.1 --- Circuit Pre-Processing --- p.42Chapter 3.4.2 --- Pseudo-Functional Random Pattern Generation with Multi-Launch Cycles --- p.43Chapter 3.4.3 --- Compressible Test Pattern Generation for Pseudo-Functional Testing --- p.45Chapter 3.5 --- Experimental Results --- p.52Chapter 3.5.1 --- Experimental Setup --- p.52Chapter 3.5.2 --- Results and Discussion --- p.54Chapter 3.6 --- Conclusion --- p.56Chapter 4 --- Conclusion and Future Work --- p.58Bibliography --- p.6

    Marijuana and Crime: Is there a Connection Beyond Prohibition?

    Get PDF
    We examine the relationship between marijuana use and non-drug related crime using data on arrests from the Arrestee Drug Abuse Monitoring (ADAM) Program and Uniform Crime Reports. There is a positive association between self-reported use at the time of the offence and non-drug related violent, property and income-producing crime even after accounting for other substance use in the ADAM data. Reduced form equations using both data sets only provide evidence supporting a causal mechanism for property and income-producing crime. In the case of violent crime, we find a statistically significant association with arrests but not reported crime, suggesting that marijuana use may just influence the likelihood of getting caught committing these crimes.

    Network Interface Design for Network-on-Chip

    Get PDF
    In the culture of globalized integrated circuit (IC, a.k.a chip) production, the use of Intellectual Property (IP) cores, computer aided design tools (CAD) and testing services from un-trusted vendors are prevalent to reduce the time to market. Unfortunately, the globalized business model potentially creates opportunities for hardware tampering and modification from adversary, and this tampering is known as hardware Trojan (HT). Network-on-chip (NoC) has emerged as an efficient on-chip communication infrastructure. In this work, the security aspects of NoC network interface (NI), one of the most critical components in NoC will be investigated and presented. Particularly, the NI design, hardware attack models and countermeasures for NI in a NoC system are explored. An OCP compatible NI is implemented in an IBM0.18ìm CMOS technology. The synthesis results are presented and compared with existing literature. Second, comprehensive hardware attack models targeted for NI are presented from system level to circuit level. The impact of hardware Trojans on NoC functionality and performance are evaluated. Finally, a countermeasure method is proposed to address the hardware attacks in NIs

    Design and test for timing uncertainty in VLSI circuits.

    Get PDF
    由於特徵尺寸不斷縮小,集成電路在生產過程中的工藝偏差在運行環境中溫度和電壓等參數的波動以及在使用過程中的老化等效應越來越嚴重,導致芯片的時序行為出現很大的不確定性。多數情況下,芯片的關鍵路徑會不時出現時序錯誤。加入更多的時序餘量不是一種很好的解決方案,因為這種保守的設計方法會抵消工藝進步帶來的性能上的好處。這就為設計一個時序可靠的系統提出了極大的挑戰,其中的一些關鍵問題包括:(一)如何有效地分配有限的功率預算去優化那些正爆炸式增加的關鍵路徑的時序性能;(二)如何產生能夠捕捉準確的最壞情況時延的高品質測試向量;(三)為了能夠取得更好的功耗和性能上的平衡,我們將不得不允許芯片在使用過程中出現一些頻率很低的時序錯誤。隨之而來的問題是如何做到在線的檢錯和糾錯。為了解決上述問題,我們首先發明了一種新的技術用於識別所謂的虛假路徑,該方法使我們能夠發現比傳統方法更多的虛假路徑。當將所提取的虛假路徑集成到靜態時序分析工具里以後,我們可以得到更為準確的時序分析結果,同時也能節省本來用於優化這些路徑的成本。接著,考慮到現有的延時自動向量生成(ATPG) 方法會產生功能模式下無法出現的測試向量,這種向量可能會造成測試過程中在被激活的路徑周圍出現過多(或過少)的電源噪聲(PSN) ,從而導致測試過度或者測試不足情況。為此,我們提出了一種新的偽功能ATPG工具。通過同時考慮功能約束以及電路的物理佈局信息,我們使用類似ATPG 的算法產生狀態跳變使其能最大化已激活的路徑周圍的PSN影響。最後,基於近似電路的原理,我們提出了一種新的在線原位校正技術,即InTimeFix,用於糾正時序錯誤。由於實現近似電路的綜合僅需要簡單的電路結構分析,因此該技術能夠很容易的擴展到大型電路設計上去。With technology scaling, integrated circuits (ICs) suffer from increasing process, voltage, and temperature (PVT) variations and aging effects. In most cases, these reliability threats manifest themselves as timing errors on speed-paths (i.e., critical or near-critical paths) of the circuit. Embedding a large design guard band to prevent timing errors to occur is not an attractive solution, since this conservative design methodology diminishes the benefit of technology scaling. This creates several challenges on build a reliable systems, and the key problems include (i) how to optimize circuit’s timing performance with limited power budget for explosively increased potential speed-paths; (ii) how to generate high quality delay test pattern to capture ICs’ accurate worst-case delay; (iii) to have better power and performance tradeoff, we have to accept some infrequent timing errors in circuit’s the usage phase. Therefore, the question is how to achieve online timing error resilience.To address the above issues, we first develop a novel technique to identify so-called false paths, which facilitate us to find much more false paths than conventional methods. By integrating our identified false paths into static timing analysis tool, we are able to achieve more accurate timing information and also save the cost used to optimize false paths. Then, due to the fact that existing delay automated test pattern generation (ATPG) methods may generate test patterns that are functionally-unreachable, and such patterns may incur excessive (or limited) power supply noise (PSN) on sensitized paths in test mode, thus leading to over-testing or under-testing of the circuits, we propose a novel pseudo-functional ATPG tool. By taking both circuit layout information and functional constrains into account, we use ATPG like algorithm to justify transitions that pose the maximized functional PSN effects on sensitized critical paths. Finally, we propose a novel in-situ correction technique to mask timing errors, namely InTimeFix, by introducing redundant approximation circuit with more timing slack for speed-paths into the design. The synthesis of the approximation circuit relies on simple structural analysis of the original circuit, which is easily scalable to large IC designs.Detailed summary in vernacular field only.Detailed summary in vernacular field only.Yuan, Feng.Thesis (Ph.D.)--Chinese University of Hong Kong, 2012.Includes bibliographical references (leaves 88-100).Abstract also in Chinese.Abstract --- p.iAcknowledgement --- p.ivChapter 1 --- Introduction --- p.1Chapter 1.1 --- Challenges to Solve Timing Uncertainty Problem --- p.2Chapter 1.2 --- Contributions and Thesis Outline --- p.5Chapter 2 --- Background --- p.7Chapter 2.1 --- Sources of Timing Uncertainty --- p.7Chapter 2.1.1 --- Process Variation --- p.7Chapter 2.1.2 --- Runtime Environment Fluctuation --- p.9Chapter 2.1.3 --- Aging Effect --- p.10Chapter 2.2 --- Technical Flow to Solve Timing Uncertainty Problem --- p.10Chapter 2.3 --- False Path --- p.12Chapter 2.3.1 --- Path Sensitization Criteria --- p.12Chapter 2.3.2 --- False Path Aware Timing Analysis --- p.13Chapter 2.4 --- Manufacturing Testing --- p.14Chapter 2.4.1 --- Functional Testing vs. Structural Testing --- p.14Chapter 2.4.2 --- Scan-Based DfT --- p.15Chapter 2.4.3 --- Pseudo-Functional Testing --- p.17Chapter 2.5 --- Timing Error Tolerance --- p.19Chapter 2.5.1 --- Timing Error Detection --- p.19Chapter 2.5.2 --- Timing Error Recover --- p.20Chapter 3 --- Timing-Independent False Path Identification --- p.23Chapter 3.1 --- Introduction --- p.23Chapter 3.2 --- Preliminaries and Motivation --- p.26Chapter 3.2.1 --- Motivation --- p.27Chapter 3.3 --- False Path Examination Considering Illegal States --- p.28Chapter 3.3.1 --- Path Sensitization Criterion --- p.28Chapter 3.3.2 --- Path-Aware Illegal State Identification --- p.30Chapter 3.3.3 --- Proposed Examination Procedure --- p.31Chapter 3.4 --- False Path Identification --- p.32Chapter 3.4.1 --- Overall Flow --- p.34Chapter 3.4.2 --- Static Implication Learning --- p.35Chapter 3.4.3 --- Suspicious Node Extraction --- p.36Chapter 3.4.4 --- S-Frontier Propagation --- p.37Chapter 3.5 --- Experimental Results --- p.38Chapter 3.6 --- Conclusion and Future Work --- p.42Chapter 4 --- PSN Aware Pseudo-Functional Delay Testing --- p.43Chapter 4.1 --- Introduction --- p.43Chapter 4.2 --- Preliminaries and Motivation --- p.45Chapter 4.2.1 --- Motivation --- p.46Chapter 4.3 --- Proposed Methodology --- p.48Chapter 4.4 --- Maximizing PSN Effects under Functional Constraints --- p.50Chapter 4.4.1 --- Pseudo-Functional Relevant Transitions Generation --- p.51Chapter 4.5 --- Experimental Results --- p.59Chapter 4.5.1 --- Experimental Setup --- p.59Chapter 4.5.2 --- Results and Discussion --- p.60Chapter 4.6 --- Conclusion --- p.64Chapter 5 --- In-Situ Timing Error Masking in Logic Circuits --- p.65Chapter 5.1 --- Introduction --- p.65Chapter 5.2 --- Prior Work and Motivation --- p.67Chapter 5.3 --- In-Situ Timing Error Masking with Approximate Logic --- p.69Chapter 5.3.1 --- Equivalent Circuit Construction with Approximate Logic --- p.70Chapter 5.3.2 --- Timing Error Masking with Approximate Logic --- p.72Chapter 5.4 --- Cost-Efficient Synthesis for InTimeFix --- p.75Chapter 5.4.1 --- Overall Flow --- p.76Chapter 5.4.2 --- Prime Critical Segment Extraction --- p.77Chapter 5.4.3 --- Prime Critical Segment Merging --- p.79Chapter 5.5 --- Experimental Results --- p.81Chapter 5.5.1 --- Experimental Setup --- p.81Chapter 5.5.2 --- Results and Discussion --- p.82Chapter 5.6 --- Conclusion --- p.85Chapter 6 --- Conclusion and Future Work --- p.86Bibliography --- p.10

    New techniques for functional testing of microprocessor based systems

    Get PDF
    Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

    Automating test oracles generation

    Get PDF
    Software systems play a more and more important role in our everyday life. Many relevant human activities nowadays involve the execution of a piece of software. Software has to be reliable to deliver the expected behavior, and assessing the quality of software is of primary importance to reduce the risk of runtime errors. Software testing is the most common quality assessing technique for software. Testing consists in running the system under test on a finite set of inputs, and checking the correctness of the results. Thoroughly testing a software system is expensive and requires a lot of manual work to define test inputs (stimuli used to trigger different software behaviors) and test oracles (the decision procedures checking the correctness of the results). Researchers have addressed the cost of testing by proposing techniques to automatically generate test inputs. While the generation of test inputs is well supported, there is no way to generate cost-effective test oracles: Existing techniques to produce test oracles are either too expensive to be applied in practice, or produce oracles with limited effectiveness that can only identify blatant failures like system crashes. Our intuition is that cost-effective test oracles can be generated using information produced as a byproduct of the normal development activities. The goal of this thesis is to create test oracles that can detect faults leading to semantic and non-trivial errors, and that are characterized by a reasonable generation cost. We propose two ways to generate test oracles, one derives oracles from the software redundancy and the other from the natural language comments that document the source code of software systems. We present a technique that exploits redundant sequences of method calls encoding the software redundancy to automatically generate test oracles named CCOracles. We describe how CCOracles are automatically generated, deployed, and executed. We prove the effectiveness of CCOracles by measuring their fault-finding effectiveness when combined with both automatically generated and hand-written test inputs. We also present Toradocu, a technique that derives executable specifications from Javadoc comments of Java constructors and methods. From such specifications, Toradocu generates test oracles that are then deployed into existing test suites to assess the outputs of given test inputs. We empirically evaluate Toradocu, showing that Toradocu accurately translates Javadoc comments into procedure specifications. We also show that Toradocu oracles effectively identify semantic faults in the SUT. CCOracles and Toradocu oracles stem from independent information sources and are complementary in the sense that they check different aspects of the system undertest

    Distance from a fishing community explains fish abundance in a no-take zone with weak compliance

    Get PDF
    There are numerous examples of no-take marine reserves effectively conserving fish stocks within their boundaries. However, no-take reserves can be rendered ineffective and turned into ‘paper parks’ through poor compliance and weak enforcement of reserve regulations. Long-term monitoring is thus essential to assess the effectiveness of marine reserves in meeting conservation and management objectives. This study documents the present state of the 15-year old no-take zone (NTZ) of South El Ghargana within the Nabq Managed Resource Protected Area, South Sinai, Egyptian Red Sea. Previous studies credited willing compliance by the local fishing community for the increased abundances of targeted fish within the designated NTZ boundaries compared to adjacent fished or take-zones. We compared benthic habitat and fish abundance within the NTZ and the adjacent take sites open to fishing, but found no significant effect of the reserve. Instead, the strongest evidence was for a simple negative relationship between fishing pressure and distance from the closest fishing village. The abundance of targeted piscivorous fish increased significantly with increasing distance from the village, while herbivorous fish showed the opposite trend. This gradient was supported by a corresponding negative correlation between the amount of discarded fishing gear observed on the reef and increasing distance from the village. Discarded fishing gear within the NTZ suggested decreased compliance with the no-take regulations. Our findings indicate that due to non-compliance the no-take reserve is no longer functioning effectively, despite its apparent initial successes and instead a gradient of fishing pressure exists with distance from the nearest fishing community

    Too Cool at School - Understanding Cool Teenagers

    Get PDF
    Cool can be thought about on three levels; the having of cool things, the doing of cool stuff and the being of cool. Whilst there is some understanding of cool products, the concept, of being cool is much more elusive to designers and developers of systems. This study examines this space by using a set of pre-prepared teenage personas as probes with a set of teenagers with the aim of better understanding what is, and isn’t cool about teenage behaviours. The study confirmed that teenagers are able to rank personas in order of cool and that the process of using personas can provide valuable insights around the phenomenon of cool. The findings confirm that cool is indeed about having cool things but in terms of behaviours cool can be a little bit, but not too, naughty

    E-democracy and values in information systems design

    Get PDF
    In this paper I demonstrate the utility of a Values in Design (VID) perspective for the assessment, the design and development of e-democracy tools. In the first part, I give some background information on Values in Design and Value-Sensitive Design and their relevance in the context of e-democracy. In part 2, I analyze three different e-democracy tools from a VID-perspective. The paper ends with some conclusions concerning the merits of VID for e-democracy as well as some considerations concerning the dual tasks of philosophers in assessing and promoting value-sensitive technology design
    corecore