Power efficient resilient microarchitectures for PVT variability mitigation

Nowadays, the high power density and the process, voltage, and temperature variations became the most critical issues that limit the performance of the digital integrated circuits because of the continuous scaling of the fabrication technology. Dynamic voltage and frequency scaling technique is used to reduce the power consumption while different time relaxation techniques and error recovery microarchitectures are used to tolerate the process, voltage, and temperature variations. These techniques reduce the throughput by scaling down the frequency or flushing and restarting the errant pipeline. This thesis presents a novel resilient microarchitecture which is called ERSUT-based resilient microarchitecture to tolerate the induced delays generated by the voltage scaling or the process, voltage, and temperature variations. The resilient microarchitecture detects and recovers the induced errors without flushing the pipeline and without scaling down the operating frequency. An ERSUT-based resilient 16 × 16 bit MAC unit, implemented using Global Foundries 65 nm technology and ARM standard cells library, is introduced as a case study with 18.26% area overhead and up to 1.5x speedup. At the typical conditions, the maximum frequency of the conventional MAC unit is about 375 MHz while the resilient MAC unit operates correctly at a frequency up to 565 MHz. In case of variations, the resilient MAC unit tolerates induced delays up to 50% of the clock period while keeping its throughput equal to the conventional MAC unit’s maximum throughput. At 375 MHz, the resilient MAC unit is able to scale down the supply voltage from 1.2 V to 1.0 V saving about 29% of the power consumed by the conventional MAC unit. A double-edge-triggered microarchitecture is also introduced to reduce the power consumption extremely by reducing the frequency of the clock tree to the half while preserving the same maximum throughput. This microarchitecture is applied to different ISCAS’89 benchmark circuits in addition to the 16x16 bit MAC unit and the average power reduction of all these circuits is 63.58% while the average area overhead is 31.02%. All these circuits are designed using Global Foundries 65nm technology and ARM standard cells library. Towards the full automation of the ERSUT-based resilient microarchitecture, an ERSUT-based algorithm is introduced in C++ to accelerate the design process of the ERSUT-based microarchitecture. The developed algorithm reduces the design-time efforts dramatically and allows the ERSUT-based microarchitecture to be adopted by larger industrial designs. Depending on the ERSUT-based algorithm, a validation study about applying the ERSUT-based microarchitecture on the MAC unit and different ISCAS’89 benchmark circuits with different complexity weights is introduced. This study shows that 72% of these circuits tolerates more than 14% of their clock periods and 54.5% of these circuits tolerates more than 20% while 27% of these circuits tolerates more than 30%. Consequently, the validation study proves that the ERSUT-based resilient microarchitecture is a valid applicable solution for different circuits with different complexity weights

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Latch-based RISC-V core with popcount instruction for CNN acceleration

Energy-efficiency is essential for vast majority of mobile and embedded battery-powered systems. Internet-of-Things paradigm combines requirements for high computational capabilities, extreme energy-efficiency and low-cost. Increasing manufacturing process variations pose formidable challenges for deep-submicron integrated circuit designs. The effects of variation are further exacerbated by lowered voltages in energy-efficient designs. Compared to traditional flip-flop-based design, latch-based design offers area, energy-efficiency and variation tolerance benefits at the cost of increased timing behavior complexity. A method for converting flip-flop-based processor core to latch-based core at register-transfer-level is presented in this work. Convolutional neural networks have enabled image recognition in the field of computer vision at unprecedented accuracy. Performance and memory requirements of canonical convolutional neural networks have been out of reach for low-cost IoT devices. In collaboration with Tampere University, a custom popcount instruction was added to the cores for accelerating IoT optimized vehicle classification convolutional neural network. This work compares simulation results from synthesized flip-flop-based and latch-based versions of a SCR1 RISC-V processor core and the effects of custom instruction for CNN acceleration. The latch core achieved roughly 50\% smaller energy per operation than the flip-flop core and 2.1x speedup was observed in the execution of the CNN when using the custom instruction

Energy-Efficient Digital Circuit Design using Threshold Logic Gates

abstract: Improving energy efficiency has always been the prime objective of the custom and automated digital circuit design techniques. As a result, a multitude of methods to reduce power without sacrificing performance have been proposed. However, as the field of design automation has matured over the last few decades, there have been no new automated design techniques, that can provide considerable improvements in circuit power, leakage and area. Although emerging nano-devices are expected to replace the existing MOSFET devices, they are far from being as mature as semiconductor devices and their full potential and promises are many years away from being practical. The research described in this dissertation consists of four main parts. First is a new circuit architecture of a differential threshold logic flipflop called PNAND. The PNAND gate is an edge-triggered multi-input sequential cell whose next state function is a threshold function of its inputs. Second a new approach, called hybridization, that replaces flipflops and parts of their logic cones with PNAND cells is described. The resulting \hybrid circuit, which consists of conventional logic cells and PNANDs, is shown to have significantly less power consumption, smaller area, less standby power and less power variation. Third, a new architecture of a field programmable array, called field programmable threshold logic array (FPTLA), in which the standard lookup table (LUT) is replaced by a PNAND is described. The FPTLA is shown to have as much as 50% lower energy-delay product compared to conventional FPGA using well known FPGA modeling tool called VPR. Fourth, a novel clock skewing technique that makes use of the completion detection feature of the differential mode flipflops is described. This clock skewing method improves the area and power of the ASIC circuits by increasing slack on timing paths. An additional advantage of this method is the elimination of hold time violation on given short paths. Several circuit design methodologies such as retiming and asynchronous circuit design can use the proposed threshold logic gate effectively. Therefore, the use of threshold logic flipflops in conventional design methodologies opens new avenues of research towards more energy-efficient circuits.Dissertation/ThesisDoctoral Dissertation Computer Science 201

Online self-test wrapper for runtime-reconfigurable systems

Reconfigurable Systems-on-a-Chip (SoC) architectures consist of microprocessors and Field Programmable Gate Arrays (FPGAs). In order to implement runtime reconfigurable systems, these SoC devices combine the ease of programmability and the flexibility that FPGAs provide. One representative of these is the new Xilinx Zynq-7000 Extensible Processing Platform (EPP), which integrates a dual-core ARM Cortex-A9 based Processing System (PS) and Programmable Logic (PL) in a single device. After power on, the PS is booted and the PL can subsequently be configured and reconfigured by the PS. Recent FPGA technologies incorporate the dynamic Partial Reconfiguration (PR) feature. PR allows new functionality to be programmed online into specific regions of the FPGA while the performance and functionality of the remaining logic is preserved. This on-the-fly reconfiguration characteristic enables designers to time-multiplex portions of hardware dynamically, load functions into the FPGA on an as-needed basis. The configuration access port on the FPGA can be used to load the configuration data from memory to the reconfigurable block, which enables the user to reconfigure the FPGA online and test runtime systems. Manufactured in the advanced 28 nm technologies, the modern generations of FPGAs are increasingly prone to latent defects and aging-related failure mechanisms. To detect faults contained in the reconfigurable gate arrays, dedicated on and off-line test methods can be employed to test the device in the field. Adaptive systems require that the fault is detected and localized, so that the faulty logic unit will not be used in future reconfiguration steps. This thesis presents the development and evaluation of a self-test wrapper for the reconfigurable parts in such hybrid SoCs. It comprises the implementation of Test Configurations (TCs) of reconfigurable components as well as the generation and application of appropriate test stimuli and response analysis. The self-test wrapper is successfully implemented and is fully compatible with the AMBA protocols. The TC implementation is based on an existing Java framework for Xilinx Virtex-5 FPGA, and extended to the Zynq-7000 EPP family. These TCs are successfully redesigned to have a full logic coverage of FPGA structures. Furthermore, the array-based testing method is adopted and the tests can be applied to any part of the reconfigurable fabric. A complete software project has been developed and built to allow the reconfiguration process to be triggered by the ARM microprocessor. Functional test of the reconfigurable architecture, online self-test execution and retrieval of results are under the control of the embedded processor. Implementation results and analysis demonstrate that TCs are successfully synthesized and can be dynamically reconfigured into the area under test, and subsequent tests can be performed accordingly

Testing for delay defects utilizing test data compression techniques

textAs technology shrinks new types of defects are being discovered and new fault models are being created for those defects. Transition delay and path delay fault models are two such models that have been created, but they still fall short in that they are unable to obtain a high test coverage of smaller delay defects; these defects can cause functional behavior to fail and also indicate potential reliability issues. The first part of this dissertation addresses these problems by presenting an enhanced timing-based delay fault testing technique that incorporates the use of standard delay ATPG, along with timing information gathered from standard static timing analysis. Utilizing delay fault patterns typically increases the test data volume by 3-5X when compared to stuck-at patterns. Combined with the increase in test data volume associated with the increase in gate count that typically accompanies the miniaturization of technology, this adds up to a very large increase in test data volume that directly affect test time and thus the manufacturing cost. The second part of this dissertation presents a technique for improving test compression and reducing test data volume by using multiple expansion ratios while determining the configuration of the scan chains for each of the expansion ratios using a dependency analysis procedure that accounts for structural dependencies as well as free variable dependencies to improve the probability of detecting faults. Finally, this dissertation addresses the problem of unknown values (X’s) in the output response data corrupting the data and degrading the performance of the output response compactor and thus the overall amount of test compression. Four techniques are presented that focus on handling response data with large percentages of X’s. The first uses X-canceling MISR architecture that is based on deterministically observing scan cells, and the second is a hybrid approach that combines a simple X-masking scheme with the X-canceling MISR for further gains in test compression. The third and fourth techniques revolve around reiterative LFSR X-masking, which take advantage of LFSR-encoded masks that can be reused for multiple scan slices in novel ways.Electrical and Computer Engineerin

Design of Timer for Application in ATM using FPGA and VHDL

A watchdog timer is a computer hardware timing device that triggers a system reset if the main program, due to some fault condition, such as a hang, neglects to regularly service the watchdog (writing a “service pulse” to it, also referred to as “petting the dog”). The intention is to bring the system back from the hung state into normal operation. Such a timer has got various important applications, one of them being in ATMs (Automated Teller Machine) which we have studied and designed in our project

Fault-Tolerant Computing: An Overview

Coordinated Science Laboratory was formerly known as Control Systems LaboratoryNASA / NAG-1-613Semiconductor Research Corporation / 90-DP-109Joint Services Electronics Program / N00014-90-J-127

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

High-Speed and Low-Energy On-Chip Communication Circuits.

Continuous technology scaling sharply reduces transistor delays, while fixed-length global wire delays have increased due to less wiring pitch with higher resistance and coupling capacitance. Due to this ever growing gap, long on-chip interconnects pose well-known latency, bandwidth, and energy challenges to high-performance VLSI systems. Repeaters effectively mitigate wire RC effects but do little to improve their energy costs. Moreover, the increased complexity and high level of integration requires higher wire densities, worsening crosstalk noise and power consumption of conventionally repeated interconnects. Such increasing concerns in global on-chip wires motivate circuits to improve wire performance and energy while reducing the number of repeaters. This work presents circuit techniques and investigation for high-performance and energy-efficient on-chip communication in the aspects of encoding, data compression, self-timed current injection, signal pre-emphasis, low-swing signaling, and technology mapping. The improved bus designs also consider the constraints of robust operation and performance/energy gains across process corners and design space. Measurement results from 5mm links on 65nm and 90nm prototype chips validate 2.5-3X improvement in energy-delay product.Ph.D.Electrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/75800/1/jseo_1.pd