A Survey on the Best Choice for Modulus of Residue Code

Nowadays, the development of technology and the growing need for dense and complex chips have led chip industries to increase their attention on the circuit testability. Also, using the electronic chips in certain industries, such as the space industry, makes the design of fault tolerant circuits a challenging issue. Coding is one of the most suitable methods for error detection and correction. The residue code, as one of the best choices for error detection aims, is wildly used in large arithmetic circuits such as multiplier and also finds a wide range of applications in processors and digital filters. The modulus value in this technique directly effect on the area overhead parameter. A large area overhead is one of the most important disadvantages especially for testing the small circuits. The purpose of this paper is to study and investigate the best choice for residue code check base that is used for simple and small circuits such as a simple ripple carry adder. The performances are evaluated by applying stuck-at-faults and transition-faults by simulators. The efficiency is defined based on fault coverage and normalized area overhead. The results show that the modulus 3 with 95% efficiency provided the best result. Residue code with this modulus for checking a ripple carry adder, in comparison with duplex circuit, 30% improves the efficiency

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

Efficient modular arithmetic units for low power cryptographic applications

The demand for high security in energy constrained devices such as mobiles and PDAs is growing rapidly. This leads to the need for efficient design of cryptographic algorithms which offer data integrity, authentication, non-repudiation and confidentiality of the encrypted data and communication channels. The public key cryptography is an ideal choice for data integrity, authentication and non-repudiation whereas the private key cryptography ensures the confidentiality of the data transmitted. The latter has an extremely high encryption speed but it has certain limitations which make it unsuitable for use in certain applications. Numerous public key cryptographic algorithms are available in the literature which comprise modular arithmetic modules such as modular addition, multiplication, inversion and exponentiation. Recently, numerous cryptographic algorithms have been proposed based on modular arithmetic which are scalable, do word based operations and efficient in various aspects. The modular arithmetic modules play a crucial role in the overall performance of the cryptographic processor. Hence, better results can be obtained by designing efficient arithmetic modules such as modular addition, multiplication, exponentiation and squaring. This thesis is organized into three papers, describes the efficient implementation of modular arithmetic units, application of these modules in International Data Encryption Algorithm (IDEA). Second paper describes the IDEA algorithm implementation using the existing techniques and using the proposed efficient modular units. The third paper describes the fault tolerant design of a modular unit which has online self-checking capability --Abstract, page iv

Self-Checking Ripple-Carry Adder with Ambipolar Silicon Nanowire FET

For the rapid adoption of new and aggressive technologies such as ambipolar Silicon NanoWire (SiNW), addressing fault-tolerance is necessary. Traditionally, transient fault detection implies large hardware overhead or performance decrease compared to permanent fault detection. In this paper, we focus on on-line testing and its application to ambipolar SiNW. We demonstrate on self - checking ripple - carry adder how ambipolar design style can help reduce the hardware overhead. When compared with equivalent CMOS process, ambipolar SiNW design shows a reduction in area of at least 56% (28%) with a decreased delay of 62% (6%) for Static (Transmission Gate) design style

Techniques for efficiently implementing totally self-checking checkers in MOS technology

This paper presents some new techniques for reducing the transistor count oof MOS implementations of totally self-checking (TSC) checkers. The techniques are (1) transfer of fanouts, (2) removal of inverters and (3) use of multi-level realizations of functions. These techniques also increase the speed of the circuit and may reduce the number of required tests. Their effectiveness has been demonstrated by applying them to m-out-of-n and Berger code checkers. Impressive reductions of up to 90% in the transistor count in some cases have been obtained for the MOS implementation of these checkers. This directly translates into saving of chip area.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/26970/1/0000537.pd

Design of CMOS PSCD circuits and checkers for stuck-at and stuck-on faults

[[abstract]]We present in this paper an approach to designing partially strongly code-disjoint (PSCD) CMOS circuits and checkers, considering transistor stuck-on faults in addition to gate-level stuck-at faults. Our design-for-testability (DFT) technique requires only a small number of extra transistors for monitoring abnormal static currents, coupled with a simple clocking scheme, to detect the stuck-on faults concurrently. The DFT circuitry not only can detect the faults in the functional circuit but also can detect or tolerate faults in itself, making it a good candidate for checker design. Switch and circuit level simulations were performed on a sample circuit, and a sample 4-out-of-8 code checker chip using the proposed technique has been designed, fabricated, and tested, showing the correctness of the method. Performance penalty is reduced by a novel BiCMOS checker circuit.[[fileno]]2030108010057[[department]]電機工程學

Reliability Driven Synthesis of Sequential Circuits

Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Research Corporation / SRC 95-DP-109Joint Services Electronics Program / N00014-90-J-127