Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

<p>As integrated circuits (ICs) continue to scale to smaller dimensions, long interconnects</p><p>have become the dominant contributor to circuit delay and a significant component of</p><p>power consumption. In order to reduce the length of these interconnects, 3D integration</p><p>and 3D stacked ICs (3D SICs) are active areas of research in both academia and industry.</p><p>3D SICs not only have the potential to reduce average interconnect length and alleviate</p><p>many of the problems caused by long global interconnects, but they can offer greater design</p><p>flexibility over 2D ICs, significant reductions in power consumption and footprint in</p><p>an era of mobile applications, increased on-chip data bandwidth through delay reduction,</p><p>and improved heterogeneous integration.</p><p>Compared to 2D ICs, the manufacture and test of 3D ICs is significantly more complex.</p><p>Through-silicon vias (TSVs), which constitute the dense vertical interconnects in a</p><p>die stack, are a source of additional and unique defects not seen before in ICs. At the same</p><p>time, testing these TSVs, especially before die stacking, is recognized as a major challenge.</p><p>The testing of a 3D stack is constrained by limited test access, test pin availability,</p><p>power, and thermal constraints. Therefore, efficient and optimized test architectures are</p><p>needed to ensure that pre-bond, partial, and complete stack testing are not prohibitively</p><p>expensive.</p><p>Methods of testing TSVs prior to bonding continue to be a difficult problem due to test</p><p>access and testability issues. Although some built-in self-test (BIST) techniques have been</p><p>proposed, these techniques have numerous drawbacks that render them impractical. In this dissertation, a low-cost test architecture is introduced to enable pre-bond TSV test through</p><p>TSV probing. This has the benefit of not needing large analog test components on the die,</p><p>which is a significant drawback of many BIST architectures. Coupled with an optimization</p><p>method described in this dissertation to create parallel test groups for TSVs, test time for</p><p>pre-bond TSV tests can be significantly reduced. The pre-bond probing methodology is</p><p>expanded upon to allow for pre-bond scan test as well, to enable both pre-bond TSV and</p><p>structural test to bring pre-bond known-good-die (KGD) test under a single test paradigm.</p><p>The addition of boundary registers on functional TSV paths required for pre-bond</p><p>probing results in an increase in delay on inter-die functional paths. This cost of test</p><p>architecture insertion can be a significant drawback, especially considering that one benefit</p><p>of 3D integration is that critical paths can be partitioned between dies to reduce their delay.</p><p>This dissertation derives a retiming flow that is used to recover the additional delay added</p><p>to TSV paths by test cell insertion.</p><p>Reducing the cost of test for 3D-SICs is crucial considering that more tests are necessary</p><p>during 3D-SIC manufacturing. To reduce test cost, the test architecture and test</p><p>scheduling for the stack must be optimized to reduce test time across all necessary test</p><p>insertions. This dissertation examines three paradigms for 3D integration - hard dies, firm</p><p>dies, and soft dies, that give varying degrees of control over 2D test architectures on each</p><p>die while optimizing the 3D test architecture. Integer linear programming models are developed</p><p>to provide an optimal 3D test architecture and test schedule for the dies in the 3D</p><p>stack considering any or all post-bond test insertions. Results show that the ILP models</p><p>outperform other optimization methods across a range of 3D benchmark circuits.</p><p>In summary, this dissertation targets testing and design-for-test (DFT) of 3D SICs.</p><p>The proposed techniques enable pre-bond TSV and structural test while maintaining a</p><p>relatively low test cost. Future work will continue to enable testing of 3D SICs to move</p><p>industry closer to realizing the true potential of 3D integration.</p>Dissertatio

Physical design methodologies for monolithic 3D ICs

The objective of this research is to develop physical design methodologies for monolithic 3D ICs and use them to evaluate the improvements in the power-performance envelope offered over 2D ICs. In addition, design-for-test (DfT) techniques essential for the adoption of shorter term through-silicon-via (TSV) based 3D ICs are explored. Testing of TSV-based 3D ICs is one of the last challenges facing their commercialization. First, a pre-bond testable 3D scan chain construction technique is developed. Next, a transition-delay-fault test architecture is presented, along with a study on how to mitigate IR-drop. Finally, to facilitate partitioning, a quick and accurate framework for test-TSV estimation is developed. Block-level monolithic 3D ICs will be the first to emerge, as significant IP can be reused. However, no physical design flows exist, and hence a monolithic 3D floorplanning framework is developed. Next, inter-tier performance differences that arise due to the not yet mature fabrication process are investigated and modeled. Finally, an inter-tier performance-difference aware floorplanner is presented, and it is demonstrated that high quality 3D floorplans are achievable even under these inter-tier differences. Monolithic 3D offers sufficient integration density to place individual gates in three dimensions and connect them together. However, no tools or techniques exist that can take advantage of the high integration density offered. Therefore, a gate-level framework that leverages existing 2D ICs tools is presented. This framework also provides congestion modeling and produces results that minimize routing congestion. Next, this framework is extended to commercial 2D IC tools, so that steps such as timing optimization and clock tree synthesis can be applied. Finally, a voltage-drop-aware partitioning technique is presented that can alleviate IR-drop issues, without any impact on the performance or maximum operating temperature of the chip.Ph.D

Integrating simultaneous bi-direction signalling in the test fabric of 3D stacked integrated circuits.

Jennions, Ian K. - Associate SupervisorThe world has seen significant advancements in electronic devices’ capabilities, most notably the ability to embed ultra-large-scale functionalities in lightweight, area and power-efficient devices. There has been an enormous push towards quality and reliability in consumer electronics that have become an indispensable part of human life. Consequently, the tests conducted on these devices at the final stages before these are shipped out to the customers have a very high significance in the research community. However, researchers have always struggled to find a balance between the test time (hence the test cost) and the test overheads; unfortunately, these two are inversely proportional. On the other hand, the ever-increasing demand for more powerful and compact devices is now facing a new challenge. Historically, with the advancements in manufacturing technology, electronic devices witnessed miniaturizing at an exponential pace, as predicted by Moore’s law. However, further geometric or effective 2D scaling seems complicated due to performance and power concerns with smaller technology nodes. One promising way forward is by forming 3D Stacked Integrated Circuits (SICs), in which the individual dies are stacked vertically and interconnected using Through Silicon Vias (TSVs) before being packaged as a single chip. This allows more functionality to be embedded with a reduced footprint and addresses another critical problem being observed in 2D designs: increasingly long interconnects and latency issues. However, as more and more functionality is embedded into a small area, it becomes increasingly challenging to access the internal states (to observe or control) after the device is fabricated, which is essential for testing. This access is restricted by the limited number of Chip Terminals (IC pins and the vertical Through Silicon Vias) that a chip could be fitted with, the power consumption concerns, and the chip area overheads that could be allocated for testing. This research investigates Simultaneous Bi-Directional Signaling (SBS) for use in Test Access Mechanism (TAM) designs in 3D SICs. SBS enables chip terminals to simultaneously send and receive test vectors on a single Chip Terminal (CT), effectively doubling the per-pin efficiency, which could be translated into additional test channels for test time reduction or Chip Terminal reduction for resource efficiency. The research shows that SBS-based test access methods have significant potential in reducing test times and/or test resources compared to traditional approaches, thereby opening up new avenues towards cost-effectiveness and reliability of future electronics.PhD in Manufacturin

Design for pre-bond testability in 3D integrated circuits

In this dissertation we propose several DFT techniques specific to 3D stacked IC systems. The goal has explicitly been to create techniques that integrate easily with existing IC test systems. Specifically, this means utilizing scan- and wrapper-based techniques, two foundations of the digital IC test industry. First, we describe a general test architecture for 3D ICs. In this architecture, each tier of a 3D design is wrapped in test control logic that both manages tier test pre-bond and integrates the tier into the large test architecture post-bond. We describe a new kind of boundary scan to provide the necessary test control and observation of the partial circuits, and we propose a new design methodology for test hardcore that ensures both pre-bond functionality and post-bond optimality. We present the application of these techniques to the 3D-MAPS test vehicle, which has proven their effectiveness. Second, we extend these DFT techniques to circuit-partitioned designs. We find that boundary scan design is generally sufficient, but that some 3D designs require special DFT treatment. Most importantly, we demonstrate that the functional partitioning inherent in 3D design can potentially decrease the total test cost of verifying a circuit. Third, we present a new CAD algorithm for designing 3D test wrappers. This algorithm co-designs the pre-bond and post-bond wrappers to simultaneously minimize test time and routing cost. On average, our algorithm utilizes over 90% of the wires in both the pre-bond and post-bond wrappers. Finally, we look at the 3D vias themselves to develop a low-cost, high-volume pre-bond test methodology appropriate for production-level test. We describe the shorting probes methodology, wherein large test probes are used to contact multiple small 3D vias. This technique is an all-digital test method that integrates seamlessly into existing test flows. Our experimental results demonstrate two key facts: neither the large capacitance of the probe tips nor the process variation in the 3D vias and the probe tips significantly hinders the testability of the circuits. Taken together, this body of work defines a complete test methodology for testing 3D ICs pre-bond, eliminating one of the key hurdles to the commercialization of 3D technology.PhDCommittee Chair: Lee, Hsien-Hsin; Committee Member: Bakir, Muhannad; Committee Member: Lim, Sung Kyu; Committee Member: Vuduc, Richard; Committee Member: Yalamanchili, Sudhaka

Test Planning for 3D SICs using ILP

In this paper we propose a test planning scheme for corebased 3D stacked integrated circuits where the total test cost for wafer sort of each individual chip and the test cost of the complete stack at package test is minimized. We use an Integer Linear Programming (ILP) model to find the optimal test cost, which is given as the weighted sum of the test time and the test access mechanism (TAM). As ILP is time consuming, we use a scheme to bound the test time and the TAM such that the search space is reduced. The proposed bounding scheme and the ILP model were applied on several ITC’02 benchmarks and the results show that optimal solutions were obtained at low computation time

On Energy Efficient Computing Platforms

In accordance with the Moore's law, the increasing number of on-chip integrated transistors has enabled modern computing platforms with not only higher processing power but also more affordable prices. As a result, these platforms, including portable devices, work stations and data centres, are becoming an inevitable part of the human society. However, with the demand for portability and raising cost of power, energy efficiency has emerged to be a major concern for modern computing platforms. As the complexity of on-chip systems increases, Network-on-Chip (NoC) has been proved as an efficient communication architecture which can further improve system performances and scalability while reducing the design cost. Therefore, in this thesis, we study and propose energy optimization approaches based on NoC architecture, with special focuses on the following aspects. As the architectural trend of future computing platforms, 3D systems have many bene ts including higher integration density, smaller footprint, heterogeneous integration, etc. Moreover, 3D technology can signi cantly improve the network communication and effectively avoid long wirings, and therefore, provide higher system performance and energy efficiency. With the dynamic nature of on-chip communication in large scale NoC based systems, run-time system optimization is of crucial importance in order to achieve higher system reliability and essentially energy efficiency. In this thesis, we propose an agent based system design approach where agents are on-chip components which monitor and control system parameters such as supply voltage, operating frequency, etc. With this approach, we have analysed the implementation alternatives for dynamic voltage and frequency scaling and power gating techniques at different granularity, which reduce both dynamic and leakage energy consumption. Topologies, being one of the key factors for NoCs, are also explored for energy saving purpose. A Honeycomb NoC architecture is proposed in this thesis with turn-model based deadlock-free routing algorithms. Our analysis and simulation based evaluation show that Honeycomb NoCs outperform their Mesh based counterparts in terms of network cost, system performance as well as energy efficiency.Siirretty Doriast

Investigation into yield and reliability enhancement of TSV-based three-dimensional integration circuits

Three dimensional integrated circuits (3D ICs) have been acknowledged as a promising technology to overcome the interconnect delay bottleneck brought by continuous CMOS scaling. Recent research shows that through-silicon-vias (TSVs), which act as vertical links between layers, pose yield and reliability challenges for 3D design. This thesis presents three original contributions.The first contribution presents a grouping-based technique to improve the yield of 3D ICs under manufacturing TSV defects, where regular and redundant TSVs are partitioned into groups. In each group, signals can select good TSVs using rerouting multiplexers avoiding defective TSVs. Grouping ratio (regular to redundant TSVs in one group) has an impact on yield and hardware overhead. Mathematical probabilistic models are presented for yield analysis under the influence of independent and clustering defect distributions. Simulation results using MATLAB show that for a given number of TSVs and TSV failure rate, careful selection of grouping ratio results in achieving 100% yield at minimal hardware cost (number of multiplexers and redundant TSVs) in comparison to a design that does not exploit TSV grouping ratios. The second contribution presents an efficient online fault tolerance technique based on redundant TSVs, to detect TSV manufacturing defects and address thermal-induced reliability issue. The proposed technique accounts for both fault detection and recovery in the presence of three TSV defects: voids, delamination between TSV and landing pad, and TSV short-to-substrate. Simulations using HSPICE and ModelSim are carried out to validate fault detection and recovery. Results show that regular and redundant TSVs can be divided into groups to minimise area overhead without affecting the fault tolerance capability of the technique. Synthesis results using 130-nm design library show that 100% repair capability can be achieved with low area overhead (4% for the best case). The last contribution proposes a technique with joint consideration of temperature mitigation and fault tolerance without introducing additional redundant TSVs. This is achieved by reusing spare TSVs that are frequently deployed for improving yield and reliability in 3D ICs. The proposed technique consists of two steps: TSV determination step, which is for achieving optimal partition between regular and spare TSVs into groups; The second step is TSV placement, where temperature mitigation is targeted while optimizing total wirelength and routing difference. Simulation results show that using the proposed technique, 100% repair capability is achieved across all (five) benchmarks with an average temperature reduction of 75.2? (34.1%) (best case is 99.8? (58.5%)), while increasing wirelength by a small amount

The Customizable Virtual FPGA: Generation, System Integration and Configuration of Application-Specific Heterogeneous FPGA Architectures

In den vergangenen drei Jahrzehnten wurde die Entwicklung von Field Programmable Gate Arrays (FPGAs) stark von Moore’s Gesetz, Prozesstechnologie (Skalierung) und kommerziellen Märkten beeinflusst. State-of-the-Art FPGAs bewegen sich einerseits dem Allzweck näher, aber andererseits, da FPGAs immer mehr traditionelle Domänen der Anwendungsspezifischen integrierten Schaltungen (ASICs) ersetzt haben, steigen die Effizienzerwartungen. Mit dem Ende der Dennard-Skalierung können Effizienzsteigerungen nicht mehr auf Technologie-Skalierung allein zurückgreifen. Diese Facetten und Trends in Richtung rekonfigurierbarer System-on-Chips (SoCs) und neuen Low-Power-Anwendungen wie Cyber Physical Systems und Internet of Things erfordern eine bessere Anpassung der Ziel-FPGAs. Neben den Trends für den Mainstream-Einsatz von FPGAs in Produkten des täglichen Bedarfs und Services wird es vor allem bei den jüngsten Entwicklungen, FPGAs in Rechenzentren und Cloud-Services einzusetzen, notwendig sein, eine sofortige Portabilität von Applikationen über aktuelle und zukünftige FPGA-Geräte hinweg zu gewährleisten. In diesem Zusammenhang kann die Hardware-Virtualisierung ein nahtloses Mittel für Plattformunabhängigkeit und Portabilität sein. Ehrlich gesagt stehen die Zwecke der Anpassung und der Virtualisierung eigentlich in einem Konfliktfeld, da die Anpassung für die Effizienzsteigerung vorgesehen ist, während jedoch die Virtualisierung zusätzlichen Flächenaufwand hinzufügt. Die Virtualisierung profitiert aber nicht nur von der Anpassung, sondern fügt auch mehr Flexibilität hinzu, da die Architektur jederzeit verändert werden kann. Diese Besonderheit kann für adaptive Systeme ausgenutzt werden. Sowohl die Anpassung als auch die Virtualisierung von FPGA-Architekturen wurden in der Industrie bisher kaum adressiert. Trotz einiger existierenden akademischen Werke können diese Techniken noch als unerforscht betrachtet werden und sind aufstrebende Forschungsgebiete. Das Hauptziel dieser Arbeit ist die Generierung von FPGA-Architekturen, die auf eine effiziente Anpassung an die Applikation zugeschnitten sind. Im Gegensatz zum üblichen Ansatz mit kommerziellen FPGAs, bei denen die FPGA-Architektur als gegeben betrachtet wird und die Applikation auf die vorhandenen Ressourcen abgebildet wird, folgt diese Arbeit einem neuen Paradigma, in dem die Applikation oder Applikationsklasse fest steht und die Zielarchitektur auf die effiziente Anpassung an die Applikation zugeschnitten ist. Dies resultiert in angepassten anwendungsspezifischen FPGAs. Die drei Säulen dieser Arbeit sind die Aspekte der Virtualisierung, der Anpassung und des Frameworks. Das zentrale Element ist eine weitgehend parametrierbare virtuelle FPGA-Architektur, die V-FPGA genannt wird, wobei sie als primäres Ziel auf jeden kommerziellen FPGA abgebildet werden kann, während Anwendungen auf der virtuellen Schicht ausgeführt werden. Dies sorgt für Portabilität und Migration auch auf Bitstream-Ebene, da die Spezifikation der virtuellen Schicht bestehen bleibt, während die physische Plattform ausgetauscht werden kann. Darüber hinaus wird diese Technik genutzt, um eine dynamische und partielle Rekonfiguration auf Plattformen zu ermöglichen, die sie nicht nativ unterstützen. Neben der Virtualisierung soll die V-FPGA-Architektur auch als eingebettetes FPGA in ein ASIC integriert werden, das effiziente und dennoch flexible System-on-Chip-Lösungen bietet. Daher werden Zieltechnologie-Abbildungs-Methoden sowohl für Virtualisierung als auch für die physikalische Umsetzung adressiert und ein Beispiel für die physikalische Umsetzung in einem 45 nm Standardzellen Ansatz aufgezeigt. Die hochflexible V-FPGA-Architektur kann mit mehr als 20 Parametern angepasst werden, darunter LUT-Grösse, Clustering, 3D-Stacking, Routing-Struktur und vieles mehr. Die Auswirkungen der Parameter auf Fläche und Leistung der Architektur werden untersucht und eine umfangreiche Analyse von über 1400 Benchmarkläufen zeigt eine hohe Parameterempfindlichkeit bei Abweichungen bis zu ±95, 9% in der Fläche und ±78, 1% in der Leistung, was die hohe Bedeutung von Anpassung für Effizienz aufzeigt. Um die Parameter systematisch an die Bedürfnisse der Applikation anzupassen, wird eine parametrische Entwurfsraum-Explorationsmethode auf der Basis geeigneter Flächen- und Zeitmodellen vorgeschlagen. Eine Herausforderung von angepassten Architekturen ist der Entwurfsaufwand und die Notwendigkeit für angepasste Werkzeuge. Daher umfasst diese Arbeit ein Framework für die Architekturgenerierung, die Entwurfsraumexploration, die Anwendungsabbildung und die Evaluation. Vor allem ist der V-FPGA in einem vollständig synthetisierbaren generischen Very High Speed Integrated Circuit Hardware Description Language (VHDL) Code konzipiert, der sehr flexibel ist und die Notwendigkeit für externe Codegeneratoren eliminiert. Systementwickler können von verschiedenen Arten von generischen SoC-Architekturvorlagen profitieren, um die Entwicklungszeit zu reduzieren. Alle notwendigen Konstruktionsschritte für die Applikationsentwicklung und -abbildung auf den V-FPGA werden durch einen Tool-Flow für Entwurfsautomatisierung unterstützt, der eine Sammlung von vorhandenen kommerziellen und akademischen Werkzeugen ausnutzt, die durch geeignete Modelle angepasst und durch ein neues Werkzeug namens V-FPGA-Explorer ergänzt werden. Dieses neue Tool fungiert nicht nur als Back-End-Tool für die Anwendungsabbildung auf dem V-FPGA sondern ist auch ein grafischer Konfigurations- und Layout-Editor, ein Bitstream-Generator, ein Architekturdatei-Generator für die Place & Route Tools, ein Script-Generator und ein Testbenchgenerator. Eine Besonderheit ist die Unterstützung der Just-in-Time-Kompilierung mit schnellen Algorithmen für die In-System Anwendungsabbildung. Die Arbeit schliesst mit einigen Anwendungsfällen aus den Bereichen industrielle Prozessautomatisierung, medizinische Bildgebung, adaptive Systeme und Lehre ab, in denen der V-FPGA eingesetzt wird

High Speed Test Interface Module Using MEMS Technology

With the transient frequency of available CMOS technologies exceeding hundreds of gigahertz and the increasing complexity of Integrated Circuit (IC) designs, it is now apparent that the architecture of current testers needs to be greatly improved to keep up with the formidable challenges ahead. Test requirements for modern integrated circuits are becoming more stringent, complex and costly. These requirements include an increasing number of test channels, higher test-speeds and enhanced measurement accuracy and resolution. In a conventional test configuration, the signal path from Automatic Test Equipment (ATE) to the Device-Under-Test (DUT) includes long traces of wires. At frequencies above a few gigahertz, testing integrated circuits becomes a challenging task. The effects on transmission lines become critical requiring impedance matching to minimize signal reflection. AC resistance due to the skin effect and electromagnetic coupling caused by radiation can also become important factors affecting the test results. In the design of a Device Interface Board (DIB), the greater the physical separation of the DUT and the ATE pin electronics, the greater the distortion and signal degradation. In this work, a new Test Interface Module (TIM) based on MEMS technology is proposed to reduce the distance between the tester and device-under-test by orders of magnitude. The proposed solution increases the bandwidth of test channels and reduces the undesired effects of transmission lines on the test results. The MEMS test interface includes a fixed socket and a removable socket. The removable socket incorporates MEMS contact springs to provide temporary with the DUT pads and the fixed socket contains a bed of micro-pins to establish electrical connections with the ATE pin electronics. The MEMS based contact springs have been modified to implement a high-density wafer level test probes for Through Silicon Vias (TSVs) in three dimensional integrated circuits (3D-IC). Prototypes have been fabricated using Silicon On Insulator SOI wafer. Experimental results indicate that the proposed architectures can operate up to 50 GHz without much loss or distortion. The MEMS probes can also maintain a good elastic performance without any damage or deformation in the test phase