33,264 research outputs found

    Development of generic testing strategies for mixed-signal integrated circuits

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    Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described

    AFTI/F-16 digital flight control system experience

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    The Advanced Flighter Technology Integration (AFTI) F-16 program is investigating the integration of emerging technologies into an advanced fighter aircraft. The three major technologies involved are the triplex digital flight control system; decoupled aircraft flight control; and integration of avionics, pilot displays, and flight control. In addition to investigating improvements in fighter performance, the AFTI/F-16 program provides a look at generic problems facing highly integrated, flight-crucial digital controls. An overview of the AFTI/F-16 systems is followed by a summary of flight test experience and recommendations

    Developing a distributed electronic health-record store for India

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    The DIGHT project is addressing the problem of building a scalable and highly available information store for the Electronic Health Records (EHRs) of the over one billion citizens of India

    Simulation and BIM in building design, commissioning and operation: a comparison with the microelectronics industry

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    Analogy between the Microelectronics and Building industries is explored with the focus on design, commissioning and operation processes. Some issues found in the realisation of low energy buildings are highlighted and techniques gleaned from microelectronics proposed as possible solutions. Opportunities identified include: adoption of a more integrated process, use of standard cells, inclusion of controls and operational code in the design, generation of building commissioning tests from simulation, generation of building operational control code (including self-test) from simulation, inclusion of variation and uncertainties in the design process, use of quality processes such as indices to represent design robustness and formal continuous improvement methods. The possible integration of these techniques within a building information model (BIM) flow is discussed and some examples of enabling technologies given

    Experimental analysis of computer system dependability

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    This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

    Airborne Advanced Reconfigurable Computer System (ARCS)

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    A digital computer subsystem fault-tolerant concept was defined, and the potential benefits and costs of such a subsystem were assessed when used as the central element of a new transport's flight control system. The derived advanced reconfigurable computer system (ARCS) is a triple-redundant computer subsystem that automatically reconfigures, under multiple fault conditions, from triplex to duplex to simplex operation, with redundancy recovery if the fault condition is transient. The study included criteria development covering factors at the aircraft's operation level that would influence the design of a fault-tolerant system for commercial airline use. A new reliability analysis tool was developed for evaluating redundant, fault-tolerant system availability and survivability; and a stringent digital system software design methodology was used to achieve design/implementation visibility

    Software reliability through fault-avoidance and fault-tolerance

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    The use of back-to-back, or comparison, testing for regression test or porting is examined. The efficiency and the cost of the strategy is compared with manual and table-driven single version testing. Some of the key parameters that influence the efficiency and the cost of the approach are the failure identification effort during single version program testing, the extent of implemented changes, the nature of the regression test data (e.g., random), and the nature of the inter-version failure correlation and fault-masking. The advantages and disadvantages of the technique are discussed, together with some suggestions concerning its practical use

    An Adaptive Design Methodology for Reduction of Product Development Risk

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    Embedded systems interaction with environment inherently complicates understanding of requirements and their correct implementation. However, product uncertainty is highest during early stages of development. Design verification is an essential step in the development of any system, especially for Embedded System. This paper introduces a novel adaptive design methodology, which incorporates step-wise prototyping and verification. With each adaptive step product-realization level is enhanced while decreasing the level of product uncertainty, thereby reducing the overall costs. The back-bone of this frame-work is the development of Domain Specific Operational (DOP) Model and the associated Verification Instrumentation for Test and Evaluation, developed based on the DOP model. Together they generate functionally valid test-sequence for carrying out prototype evaluation. With the help of a case study 'Multimode Detection Subsystem' the application of this method is sketched. The design methodologies can be compared by defining and computing a generic performance criterion like Average design-cycle Risk. For the case study, by computing Average design-cycle Risk, it is shown that the adaptive method reduces the product development risk for a small increase in the total design cycle time.Comment: 21 pages, 9 figure

    On-Line Dependability Enhancement of Multiprocessor SoCs by Resource Management

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    This paper describes a new approach towards dependable design of homogeneous multi-processor SoCs in an example satellite-navigation application. First, the NoC dependability is functionally verified via embedded software. Then the Xentium processor tiles are periodically verified via on-line self-testing techniques, by using a new IIP Dependability Manager. Based on the Dependability Manager results, faulty tiles are electronically excluded and replaced by fault-free spare tiles via on-line resource management. This integrated approach enables fast electronic fault detection/diagnosis and repair, and hence a high system availability. The dependability application runs in parallel with the actual application, resulting in a very dependable system. All parts have been verified by simulation
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