Telehealth Sensor Authentication Through Memory Chip Variability

In light of the COVID-19 world-wide pandemic, the need for secure and readily available remote patient monitoring has never been more important. Rural and low income communities in particular have been severely impacted by the lack of accessibility to in-person healthcare. This has created the need for access to remote patient monitoring and virtual health visits in order for greater accessibility to premier care. In this paper, we propose hardware security primitives as a viable solution to meet the security challenges of the telehealth market. We have created a novel solution, called the High-Low (HiLo) method, that generates physical unclonable function (PUF) signatures based on process variation within flash memory in order to uniquely identify and authenticate remote sensors. The HiLo method consumes 20x less power than conventional authentication schemes, has an average latency of only 39ms for signature generation, and can be readily implemented through firmware on ONFI 2.2 compliant off-the-shelf NAND flash memory chips. The HiLo method generates 512 bit signatures with an average error rate of 5.9 * 10-4, while also adapting for flash chip aging. Due to its low latency, low error rate, and high power efficiency, we believe that the HiLo method could help progress the field of remote patient monitoring by accurately and efficiently authenticating remote health sensors

A High Reliability PUF Using Hot Carrier Injection Based Response Reinforcement

Achieving high reliability across environmental variations and over aging in physical unclonable functions (PUFs) remains a challenge for PUF designers. The conventional method to improve PUF reliability is to use powerful error correction codes (ECC) to correct the errors in the raw response from the PUF core. Unfortunately, these ECC blocks generally have high VLSI overheads, which scale up quickly with the error correction capability. Alternately, researchers have proposed techniques to increase the reliability of the PUF core, and thus significantly reduce the required strength (and complexity) of the ECC. One method of increasing the reliability of the PUF core is to use normally detrimental IC aging effects to reinforce the desired (or golden ) response of the PUF by altering the PUF circuit characteristics permanently and hence making the PUF more reliable. In this work, we present a PUF response reinforcement technique based on hot carrier injection (HCI) which can reinforce the PUF golden response in short stress times (i.e., tens of seconds), without impacting the surrounding circuits, and that has high permanence (i.e., does not degrade significantly over aging). We present a self-contained HCI-reinforcement-enabled PUF circuit based on sense amplifiers (SA) which autonomously self-reinforces with minimal external intervention. We have fabricated a custom ASIC testchip in 65nm bulk CMOS with the proposed PUF design. Measured results show high reliability across environmental variations and accelerated aging, as well as good uniqueness and randomness. For example, 1600 SA elements, after being HCI stressed for 125s, show 100% reliability (zero errors) across ~20% voltage variations a temperature range of -20C to 85C

Total Ionizing Dose Effects on a Delay-Based Physical Unclonable Function Implemented in FPGAs

Physical Unclonable Functions (PUFs) are hardware security primitives that are increasingly being used for authentication and key generation in ICs and FPGAs. For space systems, they are a promising approach to meet the needs for secure communications at low cost. To this purpose, it is essential to determine if they are reliable in the space radiation environment. In this work we evaluate the Total Ionizing Dose effects on a delay-based PUF implemented in SRAM-FPGA, namely a Ring Oscillator PUF. Several major quality metrics have been used to analyze the evolution of the PUF response with the total ionizing dose. Experimental results demonstrate that total ionizing dose has a perceptible effect on the quality of the PUF response, but it could still be used for space applications by making some appropriate corrections.Ministerio de Economía y Competitividad ESP2015-68245-C4-1-P, ESP-2015-68245-C4-4-P

物理複製不能関数における安全性の評価と向上に関する研究

In this thesis, we focus on Physically Unclonable Functions (PUFs), which are expected as one of the most promising cryptographic primitives for secure chip authentication. Generally, PUFbased authentication is achieved by two approaches: (A) using a PUF itself, which has multiple challenge (input) and response (output) pairs, or (B) using a cryptographic function, the secret key of which is generated from a PUF with a single challenge-response pair (CRP). We contribute to:(1) evaluate the security of Approach (A), and (2) improve the security of Approach (B). (1) Arbiter-based PUFs were the most feasible type of PUFs, which was used to construct Approach (A). However, Arbiter-based PUFs have a vulnerability; if an attacker knows some CRPs, she/he can predict the remaining unknown CRPs with high probability. Bistable Ring PUF (BR-PUF) was proposed as an alternative, but has not been evaluated by third parties. In this thesis, in order to construct Approach (A) securely, we evaluate the difficulty of predicting responses of a BR-PUF experimentally. As a result, the same responses are frequently generated for two challenges with small Hamming distance. Also, particular bits of challenges have a great impact on the responses. In conclusion, BR-PUFs are not suitable for achieving Approach (A)securely. In future work, we should discuss an alternative PUF suitable for secure Approach (A).(2) In order to achieve Approach (B) securely, a secret key ? generated from a PUF response?should have high entropy. We propose a novel method of extracting high entropy from PUF responses. The core idea is to effectively utilize the information on the proportion of ‘1’s including in repeatedly-measured PUF responses. We evaluate its effectiveness by fabricated test chips. As a result, the extracted entropy is about 1.72 times as large as that without the proposed method.Finally, we organize newly gained knowledge in this thesis, and discuss a new application of PUF-based technologies.電気通信大学201

Stochastic Memory Devices for Security and Computing

With the widespread use of mobile computing and internet of things, secured communication and chip authentication have become extremely important. Hardware-based security concepts generally provide the best performance in terms of a good standard of security, low power consumption, and large-area density. In these concepts, the stochastic properties of nanoscale devices, such as the physical and geometrical variations of the process, are harnessed for true random number generators (TRNGs) and physical unclonable functions (PUFs). Emerging memory devices, such as resistive-switching memory (RRAM), phase-change memory (PCM), and spin-transfer torque magnetic memory (STT-MRAM), rely on a unique combination of physical mechanisms for transport and switching, thus appear to be an ideal source of entropy for TRNGs and PUFs. An overview of stochastic phenomena in memory devices and their use for developing security and computing primitives is provided. First, a broad classification of methods to generate true random numbers via the stochastic properties of nanoscale devices is presented. Then, practical implementations of stochastic TRNGs, such as hardware security and stochastic computing, are shown. Finally, future challenges to stochastic memory development are discussed

Circuit Techniques for Low-Power and Secure Internet-of-Things Systems

The coming of Internet of Things (IoT) is expected to connect the physical world to the cyber world through ubiquitous sensors, actuators and computers. The nature of these applications demand long battery life and strong data security. To connect billions of things in the world, the hardware platform for IoT systems must be optimized towards low power consumption, high energy efficiency and low cost. With these constraints, the security of IoT systems become a even more difficult problem compared to that of computer systems. A new holistic system design considering both hardware and software implementations is demanded to face these new challenges. In this work, highly robust and low-cost true random number generators (TRNGs) and physically unclonable functions (PUFs) are designed and implemented as security primitives for secret key management in IoT systems. They provide three critical functions for crypto systems including runtime secret key generation, secure key storage and lightweight device authentication. To achieve robustness and simplicity, the concept of frequency collapse in multi-mode oscillator is proposed, which can effectively amplify the desired random variable in CMOS devices (i.e. process variation or noise) and provide a runtime monitor of the output quality. A TRNG with self-tuning loop to achieve robust operation across -40 to 120 degree Celsius and 0.6 to 1V variations, a TRNG that can be fully synthesized with only standard cells and commercial placement and routing tools, and a PUF with runtime filtering to achieve robust authentication, are designed based upon this concept and verified in several CMOS technology nodes. In addition, a 2-transistor sub-threshold amplifier based "weak" PUF is also presented for chip identification and key storage. This PUF achieves state-of-the-art 1.65% native unstable bit, 1.5fJ per bit energy efficiency, and 3.16% flipping bits across -40 to 120 degree Celsius range at the same time, while occupying only 553 feature size square area in 180nm CMOS. Secondly, the potential security threats of hardware Trojan is investigated and a new Trojan attack using analog behavior of digital processors is proposed as the first stealthy and controllable fabrication-time hardware attack. Hardware Trojan is an emerging concern about globalization of semiconductor supply chain, which can result in catastrophic attacks that are extremely difficult to find and protect against. Hardware Trojans proposed in previous works are based on either design-time code injection to hardware description language or fabrication-time modification of processing steps. There have been defenses developed for both types of attacks. A third type of attack that combines the benefits of logical stealthy and controllability in design-time attacks and physical "invisibility" is proposed in this work that crosses the analog and digital domains. The attack eludes activation by a diverse set of benchmarks and evades known defenses. Lastly, in addition to security-related circuits, physical sensors are also studied as fundamental building blocks of IoT systems in this work. Temperature sensing is one of the most desired functions for a wide range of IoT applications. A sub-threshold oscillator based digital temperature sensor utilizing the exponential temperature dependence of sub-threshold current is proposed and implemented. In 180nm CMOS, it achieves 0.22/0.19K inaccuracy and 73mK noise-limited resolution with only 8865 square micrometer additional area and 75nW extra power consumption to an existing IoT system.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/138779/1/kaiyuan_1.pd

Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges

Ferroelectric transistors (FeFETs) based on doped hafnium oxide (HfO2) have received much attention due to their technological potential in terms of scalability, highspeed, and low-power operation. Unfortunately, however, HfO2-FeFETs also suffer from persistent reliability challenges, specifically affecting retention, endurance, and variability. A deep understanding of the reliability physics of HfO2-FeFETs is an essential prerequisite for the successful commercialization of this promising technology. In this article, we review the literature about the relevant reliability aspects of HfO2-FeFETs. We initially focus on the reliability physics of ferroelectric capacitors, as a prelude to a comprehensive analysis of FeFET reliability. Then, we interpret key reliability metrics of the FeFET at the device level (i.e., retention, endurance, and variability) based on the physical mechanisms previously identified. Finally, we discuss the implications of device-level reliability metrics at both the circuit and system levels. Our integrative approach connects apparently unrelated reliability issues and suggests mitigation strategies at the device, circuit, or system level. We conclude this article by proposing a set of research opportunities to guide future development in this field