A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip

Nowadays, Embedded Flash Memory cores occupy a significant portion of Automotive Systems-on-Chip area, therefore strongly contributing to the final yield of the devices. Redundancy strategies play a key role in this context; in case of memory failures, a set of spare word- and bit-lines are allocated by a replacement algorithm that complements the memory testing procedure. In this work, we show that replacement algorithms, which are heavily constrained in terms of execution time, may be slightly inaccurate and lead to classify a repairable memory core as unrepairable. We denote this situation as Flash memory false fail. The proposed approach aims at identifying false fails by using a Machine Learning approach that exploits a feature extraction strategy based on shape recognition. Experimental results carried out on the manufacturing data show a high capability of predicting false fails

On quantifying fault patterns of the mesh interconnect networks

One of the key issues in the design of Multiprocessors System-on-Chip (MP-SoCs), multicomputers, and peerto- peer networks is the development of an efficient communication network to provide high throughput and low latency and its ability to survive beyond the failure of individual components. Generally, the faulty components may be coalesced into fault regions, which are classified into convex and concave shapes. In this paper, we propose a mathematical solution for counting the number of common fault patterns in a 2-D mesh interconnect network including both convex (|-shape, | |-shape, ý-shape) and concave (L-shape, Ushape, T-shape, +-shape, H-shape) regions. The results presented in this paper which have been validated through simulation experiments can play a key role when studying, particularly, the performance analysis of fault-tolerant routing algorithms and measure of a network fault-tolerance expressed as the probability of a disconnection

Fault-tolerant computer study

A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

Addressing Complexity and Intelligence in Systems Dependability Evaluation

Engineering and computing systems are increasingly complex, intelligent, and open adaptive. When it comes to the dependability evaluation of such systems, there are certain challenges posed by the characteristics of “complexity” and “intelligence”. The first aspect of complexity is the dependability modelling of large systems with many interconnected components and dynamic behaviours such as Priority, Sequencing and Repairs. To address this, the thesis proposes a novel hierarchical solution to dynamic fault tree analysis using Semi-Markov Processes. A second aspect of complexity is the environmental conditions that may impact dependability and their modelling. For instance, weather and logistics can influence maintenance actions and hence dependability of an offshore wind farm. The thesis proposes a semi-Markov-based maintenance model called “Butterfly Maintenance Model (BMM)” to model this complexity and accommodate it in dependability evaluation. A third aspect of complexity is the open nature of system of systems like swarms of drones which makes complete design-time dependability analysis infeasible. To address this aspect, the thesis proposes a dynamic dependability evaluation method using Fault Trees and Markov-Models at runtime.The challenge of “intelligence” arises because Machine Learning (ML) components do not exhibit programmed behaviour; their behaviour is learned from data. However, in traditional dependability analysis, systems are assumed to be programmed or designed. When a system has learned from data, then a distributional shift of operational data from training data may cause ML to behave incorrectly, e.g., misclassify objects. To address this, a new approach called SafeML is developed that uses statistical distance measures for monitoring the performance of ML against such distributional shifts. The thesis develops the proposed models, and evaluates them on case studies, highlighting improvements to the state-of-the-art, limitations and future work

Agent Based Test and Repair of Distributed Systems

This article demonstrates how to use intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) and BISR (Built-In Self-Repair) facilities. Agents are software modules that perform monitoring, diagnosis and repair of the faults. They form together a society whose members communicate, set goals and solve tasks. An experimental solution is presented, and future developments of the proposed approach are explore

Ultra Reliable Computing Systems

For high security and safety applications as well as general purpose applications, it is necessary to have ultra reliable computing systems. This dissertation describes our system of self-testable and self-repairable digital devices, especially, EPLDs (Electrically Programmable Logic Devices). In addition to significantly improving the reliability of digital systems, our self-healing and re-configurable system design with added repair capability can also provide higher yields, lower testing costs, and faster time-to-market for the semiconductor industry. The digital system in our approach is composed of blocks, which realize combinational and sequential circuits using GALs (Generic Array Logic Devices). We describe three techniques for fault-locating and fault-repairing in these devices. The methodology we used for evaluation of these methods and a comparison with devices that have no self-repair capability was simulation of the self-repair algorithms. Our simulations show that the lifetime for a GAL-based EPLD that uses our multiple self-repairing methods is longer than the lifetime of a GAL-based EPLD that uses a single self-repair method or no self-repair method. Specifically, our work demonstrates that the lifetime of a GAL can be increased by adding extra columns in the AND array of a GAL and extra output ORs in a GAL. It also gives information on how many extra columns and extra ORs a GAL needs and which self-repairing method should be used to guarantee a given lifetime. Thus, we can estimate an ideal point, where the maximum reliability can be reached with the minimum cost

Memory built-in self-repair and correction for improving yield: a review

Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in self-repair as a must-have feature to improve yield. Today’s system-on-chips contain memories occupying an area as high as 90% of the chip area. Shrinking technology uses stricter design rules for memories, making them more prone to manufacturing defects. Further, using 3D-stacked memories makes the system vulnerable to newer defects such as those coming from through-silicon-vias (TSV) and micro bumps. The increased memory size is also resulting in an increase in soft errors during system operation. Multiple memory repair techniques based on redundancy and correction codes have been presented to recover from such defects and prevent system failures. This paper reviews recently published memory repair methodologies, including various built-in self-repair (BISR) architectures, repair analysis algorithms, in-system repair, and soft repair handling using error correcting codes (ECC). It provides a classification of these techniques based on method and usage. Finally, it reviews evaluation methods used to determine the effectiveness of the repair algorithms. The paper aims to present a survey of these methodologies and prepare a platform for developing repair methods for upcoming-generation memories

A synthesis of logic and bio-inspired techniques in the design of dependable systems

Much of the development of model-based design and dependability analysis in the design of dependable systems, including software intensive systems, can be attributed to the application of advances in formal logic and its application to fault forecasting and verification of systems. In parallel, work on bio-inspired technologies has shown potential for the evolutionary design of engineering systems via automated exploration of potentially large design spaces. We have not yet seen the emergence of a design paradigm that effectively combines these two techniques, schematically founded on the two pillars of formal logic and biology, from the early stages of, and throughout, the design lifecycle. Such a design paradigm would apply these techniques synergistically and systematically to enable optimal refinement of new designs which can be driven effectively by dependability requirements. The paper sketches such a model-centric paradigm for the design of dependable systems, presented in the scope of the HiP-HOPS tool and technique, that brings these technologies together to realise their combined potential benefits. The paper begins by identifying current challenges in model-based safety assessment and then overviews the use of meta-heuristics at various stages of the design lifecycle covering topics that span from allocation of dependability requirements, through dependability analysis, to multi-objective optimisation of system architectures and maintenance schedules