1,213 research outputs found
Comparison of Short Circuit Failure Modes in SiC Planar MOSFETs, SiC Trench MOSFETs and SiC Cascode JFETs
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Impact of Short-Circuit Events on the Remaining Useful Life of SiC MOSFETs and Mitigation Strategy
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Active Power Cycling Test Bench for SiC Power MOSFETs - Principles, Design and Implementation
Get PDFA comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs
Get PDFThe behavior of Silicon Carbide Power MOSFETs under stressful short circuit conditions is investigated in this paper. Illustration of two different short-circuit failure phenomena for Silicon Carbide Power MOSFETs are thoroughly reported. Experimental evidences and TCAD electro-thermal simulations are exploited to describe and discriminate the failure sources. Physical causes are finally investigated and explained by means of properly calibrated numerical investigations, and are reported along with their effects on devices short-circuit capability
Effect of short-circuit stress on the degradation of the SiO<sub>2</sub> dielectric in SiC power MOSFETs
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