NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

Learning Approaches to Analog and Mixed Signal Verification and Analysis

The increased integration and interaction of analog and digital components within a system has amplified the need for a fast, automated, combined analog, and digital verification methodology. There are many automated characterization, test, and verification methods used in practice for digital circuits, but analog and mixed signal circuits suffer from long simulation times brought on by transistor-level analysis. Due to the substantial amount of simulations required to properly characterize and verify an analog circuit, many undetected issues manifest themselves in the manufactured chips. Creating behavioral models, a circuit abstraction of analog components assists in reducing simulation time which allows for faster exploration of the design space. Traditionally, creating behavioral models for non-linear circuits is a manual process which relies heavily on design knowledge for proper parameter extraction and circuit abstraction. Manual modeling requires a high level of circuit knowledge and often fails to capture critical effects stemming from block interactions and second order device effects. For this reason, it is of interest to extract the models directly from the SPICE level descriptions so that these effects and interactions can be properly captured. As the devices are scaled, process variations have a more profound effect on the circuit behaviors and performances. Creating behavior models from the SPICE level descriptions, which include input parameters and a large process variation space, is a non-trivial task. In this dissertation, we focus on addressing various problems related to the design automation of analog and mixed signal circuits. Analog circuits are typically highly specialized and fined tuned to fit the desired specifications for any given system reducing the reusability of circuits from design to design. This hinders the advancement of automating various aspects of analog design, test, and layout. At the core of many automation techniques, simulations, or data collection are required. Unfortunately, for some complex analog circuits, a single simulation may take many days. This prohibits performing any type of behavior characterization or verification of the circuit. This leads us to the first fundamental problem with the automation of analog devices. How can we reduce the simulation cost while maintaining the robustness of transistor level simulations? As analog circuits can vary vastly from one design to the next and are hardly ever comprised of standard library based building blocks, the second fundamental question is how to create automated processes that are general enough to be applied to all or most circuit types? Finally, what circuit characteristics can we utilize to enhance the automation procedures? The objective of this dissertation is to explore these questions and provide suitable evidence that they can be answered. We begin by exploring machine learning techniques to model the design space using minimal simulation effort. Circuit partitioning is employed to reduce the complexity of the machine learning algorithms. Using the same partitioning algorithm we further explore the behavior characterization of analog circuits undergoing process variation. The circuit partitioning is general enough to be used by any CMOS based analog circuit. The ideas and learning gained from behavioral modeling during behavior characterization are used to improve the simulation through event propagation, input space search, complexity and information measurements. The reduction of the input space and behavioral modeling of low complexity, low information primitive elements reduces the simulation time of large analog and mixed signal circuits by 50-75%. The method is extended and applied to assist in analyzing analog circuit layout. All of the proposed methods are implemented on analog circuits ranging from small benchmark circuits to large, highly complex and specialized circuits. The proposed dependency based partitioning of large analog circuits in the time domain allows for fast identification of highly sensitive transistors as well as provides a natural division of circuit components. Modeling analog circuits in the time domain with this partitioning technique and SVM learning algorithms allows for very fast transient behavior predictions, three orders of magnitude faster than traditional simulators, while maintaining 95% accuracy. Analog verification can be explored through a reduction of simulation time by utilizing the partitions, information and complexity measures, and input space reduction. Behavioral models are created using supervised learning techniques for detected primitive elements. We will show the effectiveness of the method on four analog circuits where the simulation time is decreased by 55-75%. Utilizing the reduced simulation method, critical nodes can be found quickly and efficiently. The nodes found using this method match those found by an experienced layout engineer, but are detected automatically given the design and input specifications. The technique is further extended to find the tolerance of transistors to both process variation and power supply fluctuation. This information allows for corrections in layout overdesign or guidance in placing noise reducing components such as guard rings or decoupling capacitors. The proposed approaches significantly reduce the simulation time required to perform the tasks traditionally, maintain high accuracy, and can be automated

Exploring Spin-transfer-torque devices and memristors for logic and memory applications

As scaling CMOS devices is approaching its physical limits, researchers have begun exploring newer devices and architectures to replace CMOS. Due to their non-volatility and high density, Spin Transfer Torque (STT) devices are among the most prominent candidates for logic and memory applications. In this research, we first considered a new logic style called All Spin Logic (ASL). Despite its advantages, ASL consumes a large amount of static power; thus, several optimizations can be performed to address this issue. We developed a systematic methodology to perform the optimizations to ensure stable operation of ASL. Second, we investigated reliable design of STT-MRAM bit-cells and addressed the conflicting read and write requirements, which results in overdesign of the bit-cells. Further, a Device/Circuit/Architecture co-design framework was developed to optimize the STT-MRAM devices by exploring the design space through jointly considering yield enhancement techniques at different levels of abstraction. Recent advancements in the development of memristive devices have opened new opportunities for hardware implementation of non-Boolean computing. To this end, the suitability of memristive devices for swarm intelligence algorithms has enabled researchers to solve a maze in hardware. In this research, we utilized swarm intelligence of memristive networks to perform image edge detection. First, we proposed a hardware-friendly algorithm for image edge detection based on ant colony. Next, we designed the image edge detection algorithm using memristive networks

Layout-accurate Ultra-fast System-level Design Exploration Through Verilog-ams

This research addresses problems in designing analog and mixed-signal (AMS) systems by bridging the gap between system-level and circuit-level simulation by making simulations fast like system-level and accurate like circuit-level. The tools proposed include metamodel integrated Verilog-AMS based design exploration flows. The research involves design centering, metamodel generation flows for creating efficient behavioral models, and Verilog-AMS integration techniques for model realization. The core of the proposed solution is transistor-level and layout-level metamodeling and their incorporation in Verilog-AMS. Metamodeling is used to construct efficient and layout-accurate surrogate models for AMS system building blocks. Verilog-AMS, an AMS hardware description language, is employed to build surrogate model implementations that can be simulated with industrial standard simulators. The case-study circuits and systems include an operational amplifier (OP-AMP), a voltage-controlled oscillator (VCO), a charge-pump phase-locked loop (PLL), and a continuous-time delta-sigma modulator (DSM). The minimum and maximum error rates of the proposed OP-AMP model are 0.11 % and 2.86 %, respectively. The error rates for the PLL lock time and power estimation are 0.7 % and 3.0 %, respectively. The OP-AMP optimization using the proposed approach is ~17000× faster than the transistor-level model based approach. The optimization achieves a ~4× power reduction for the OP-AMP design. The PLL parasitic-aware optimization achieves a 10× speedup and a 147 µW power reduction. Thus the experimental results validate the effectiveness of the proposed solution

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2

Methoden und Beschreibungssprachen zur Modellierung und Verifikation vonSchaltungen und Systemen: MBMV 2015 - Tagungsband, Chemnitz, 03. - 04. März 2015

Der Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2015) findet nun schon zum 18. mal statt. Ausrichter sind in diesem Jahr die Professur Schaltkreis- und Systementwurf der Technischen Universität Chemnitz und das Steinbeis-Forschungszentrum Systementwurf und Test. Der Workshop hat es sich zum Ziel gesetzt, neueste Trends, Ergebnisse und aktuelle Probleme auf dem Gebiet der Methoden zur Modellierung und Verifikation sowie der Beschreibungssprachen digitaler, analoger und Mixed-Signal-Schaltungen zu diskutieren. Er soll somit ein Forum zum Ideenaustausch sein. Weiterhin bietet der Workshop eine Plattform für den Austausch zwischen Forschung und Industrie sowie zur Pflege bestehender und zur Knüpfung neuer Kontakte. Jungen Wissenschaftlern erlaubt er, ihre Ideen und Ansätze einem breiten Publikum aus Wissenschaft und Wirtschaft zu präsentieren und im Rahmen der Veranstaltung auch fundiert zu diskutieren. Sein langjähriges Bestehen hat ihn zu einer festen Größe in vielen Veranstaltungskalendern gemacht. Traditionell sind auch die Treffen der ITGFachgruppen an den Workshop angegliedert. In diesem Jahr nutzen zwei im Rahmen der InnoProfile-Transfer-Initiative durch das Bundesministerium für Bildung und Forschung geförderte Projekte den Workshop, um in zwei eigenen Tracks ihre Forschungsergebnisse einem breiten Publikum zu präsentieren. Vertreter der Projekte Generische Plattform für Systemzuverlässigkeit und Verifikation (GPZV) und GINKO - Generische Infrastruktur zur nahtlosen energetischen Kopplung von Elektrofahrzeugen stellen Teile ihrer gegenwärtigen Arbeiten vor. Dies bereichert denWorkshop durch zusätzliche Themenschwerpunkte und bietet eine wertvolle Ergänzung zu den Beiträgen der Autoren. [... aus dem Vorwort

Single Electron Devices and Circuit Architectures: Modeling Techniques, Dynamic Characteristics, and Reliability Analysis

The Single Electron (SE) technology is an important approach to enabling further feature size reduction and circuit performance improvement. However, new methods are required for device modeling, circuit behavior description, and reliability analysis with this technology due to its unique operation mechanism. In this thesis, a new macro-model of SE turnstile is developed to describe its physical characteristics for large-scale circuit simulation and design. Based on this model, several novel circuit architectures are proposed and implemented to further demonstrate the advantages of SE technique. The dynamic behavior of SE circuits, which is different from their CMOS counterpart, is also investigated using a statistical method. With the unreliable feature of SE devices in mind, a fast and recursive algorithm is developed to evaluate the reliability of SE logic circuits in a more efficient and effective manner

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Low Power Memory/Memristor Devices and Systems

This reprint focusses on achieving low-power computation using memristive devices. The topic was designed as a convenient reference point: it contains a mix of techniques starting from the fundamental manufacturing of memristive devices all the way to applications such as physically unclonable functions, and also covers perspectives on, e.g., in-memory computing, which is inextricably linked with emerging memory devices such as memristors. Finally, the reprint contains a few articles representing how other communities (from typical CMOS design to photonics) are fighting on their own fronts in the quest towards low-power computation, as a comparison with the memristor literature. We hope that readers will enjoy discovering the articles within

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems