An efficient logic fault diagnosis framework based on effect-cause approach

Fault diagnosis plays an important role in improving the circuit design process and the manufacturing yield. With the increasing number of gates in modern circuits, determining the source of failure in a defective circuit is becoming more and more challenging. In this research, we present an efficient effect-cause diagnosis framework for combinational VLSI circuits. The framework consists of three stages to obtain an accurate and reasonably precise diagnosis. First, an improved critical path tracing algorithm is proposed to identify an initial suspect list by backtracing from faulty primary outputs toward primary inputs. Compared to the traditional critical path tracing approach, our algorithm is faster and exact. Second, a novel probabilistic ranking model is applied to rank the suspects so that the most suspicious one will be ranked at or near the top. Several fast filtering methods are used to prune unrelated suspects. Finally, to refine the diagnosis, fault simulation is performed on the top suspect nets using several common fault models. The difference between the observed faulty behavior and the simulated behavior is used to rank each suspect. Experimental results on ISCAS85 benchmark circuits show that this diagnosis approach is efficient both in terms of memory space and CPU time and the diagnosis results are accurate and reasonably precise

A Review of Bayesian Methods in Electronic Design Automation

The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

Doctor of Philosophy

dissertationOver the last decade, cyber-physical systems (CPSs) have seen significant applications in many safety-critical areas, such as autonomous automotive systems, automatic pilot avionics, wireless sensor networks, etc. A Cps uses networked embedded computers to monitor and control physical processes. The motivating example for this dissertation is the use of fault- tolerant routing protocol for a Network-on-Chip (NoC) architecture that connects electronic control units (Ecus) to regulate sensors and actuators in a vehicle. With a network allowing Ecus to communicate with each other, it is possible for them to share processing power to improve performance. In addition, networked Ecus enable flexible mapping to physical processes (e.g., sensors, actuators), which increases resilience to Ecu failures by reassigning physical processes to spare Ecus. For the on-chip routing protocol, the ability to tolerate network faults is important for hardware reconfiguration to maintain the normal operation of a system. Adding a fault-tolerance feature in a routing protocol, however, increases its design complexity, making it prone to many functional problems. Formal verification techniques are therefore needed to verify its correctness. This dissertation proposes a link-fault-tolerant, multiflit wormhole routing algorithm, and its formal modeling and verification using two different methodologies. An improvement upon the previously published fault-tolerant routing algorithm, a link-fault routing algorithm is proposed to relax the unrealistic node-fault assumptions of these algorithms, while avoiding deadlock conservatively by appropriately dropping network packets. This routing algorithm, together with its routing architecture, is then modeled in a process-algebra language LNT, and compositional verification techniques are used to verify its key functional properties. As a comparison, it is modeled using channel-level VHDL which is compiled to labeled Petri-nets (LPNs). Algorithms for a partial order reduction method on LPNs are given. An optimal result is obtained from heuristics that trace back on LPNs to find causally related enabled predecessor transitions. Key observations are made from the comparison between these two verification methodologies

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Learning digital test and diagnostics via Internet

An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access to the hardware equipments, which can be used in the classroom, for learning at home, in laboratory research and training, or for carrying out testing of students during exams. The tools support university courses on digital electronics, computer hardware, testing and design for testability to learn by hands-on exercises how to design digital systems, how to make them testable, how to build self-testing systems, how to generate test patterns, how to analyze the quality of tests, and how to localize faults in hardware. The tasks chosen for hands-on training represent simultaneously research problems, which allow to fostering in students critical thinking, problem solving skills and creativity

Probability Based Logic Locking on Integrated Circuits

The demand of integrated circuits (IC)s are increasing and the industry has outsourced the fabrication process to untrusted environments. An adversary at these untrusted facilities can reverse engineer parts of the IC to reveal the original design. IC piracy and overproduction are serious issues that threaten the security and integrity of a system. These ICs can be copied illegally and altered to contain malicious hardware. The pirated ICs can be placed in consumer products which may harm the system or leak sensitive information. Hardware obfuscation is a technique used to protect the original design before it gets fabricated, tested, assembled, and packaged. Hardware obfuscation intends to hide or alter the original design of a circuit to prevent attackers from determining the true design. Logic locking is a type of hardware obfuscation technique where additional key gates are inserted into the circuit. Only the correct key can unlock the functionality of that circuit otherwise the system produces the wrong output. In an effort to hinder these threats on ICs, we have developed a probability-based logic locking technique to protect the design of a circuit. Our proposed technique called ProbLock can be applied to combinational and sequential circuits through a critical selection process. We used a filtering process to select the best location of key gates based on various constraints. The main constraint is based on gate probabilities in the circuit. Each step in the filtering process generates a subset of nodes for each constraint. We also integrated an anti-SAT technique into ProbLock to enhance the security against a specific boolean satisfiability (SAT) attack. We analyzed the correlation between each constraint and adjusted the strength of the constraints before inserting key gates. We adjusted an optimized ProbLock to have a small overhead but high security metric against SAT attacks. We have tested our algorithm on 40 benchmarks from the ISCAS ’85 and ISCAS ’89 suite. ProbLock is evaluated using a SAT attack on the benchmark and measuring how well the attack performs on the locked circuit. Finally, we compared ProbLock to other logic locking techniques and discussed future steps for this project

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies

This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis