1,831 research outputs found

    Point-of-Need DNA Testing for Detection of Foodborne Pathogenic Bacteria

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    Foodborne pathogenic bacteria present a crucial food safety issue. Conventional diagnostic methods are time-consuming and can be only performed on previously produced food. The advancing field of point-of-need diagnostic devices integrating molecular methods, biosensors, microfluidics, and nanomaterials offers new avenues for swift, low-cost detection of pathogens with high sensitivity and specificity. These analyses and screening of food items can be performed during all phases of production. This review presents major developments achieved in recent years in point-of-need diagnostics in land-based sector and sheds light on current challenges in achieving wider acceptance of portable devices in the food industry. Particular emphasis is placed on methods for testing nucleic acids, protocols for portable nucleic acid extraction and amplification, as well as on the means for low-cost detection and read-out signal amplification

    Multiprocessing techniques for unmanned multifunctional satellites Final report,

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    Simulation of on-board multiprocessor for long lived unmanned space satellite contro

    Reduced Galloping Column Algorithm For Memory Testing

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    Memory testing is significantly important nowadays especially in SOC’s design, due to their rapid growth in the memory density and design complexity in smaller chip area and low power design. Thus, test time in memory testing is a key challenge to accelerate time to market, high yield and low test cost in high volume manufacturing. Test time reduction in memory testing is important in industry, as test cost is directly related to validation time of each product on the tester. There are lots of memory algorithms used for memory testing, including the galloping column algorithm (GalCol). The GalCol algorithm test is important to detect unique coupling and transition faults. However, the existing GalCol algorithm takes huge test time due to its test complexity. To overcome the test time issue in industry, reduced GalCol algorithms with solid data background are proposed. The reduced GalCol algoritms have similar test behavior as original GalCol algorithm with major difference in the number of galloping of the target cells. The galloping of target cells are reduced to first and last 8, 16 and 32 of cells of every base cell. This project is progressed in two stages, which are the software development using INTEL software and Synopsys tool and test implementation on INTEL production flow. These algorithm are verified on 15 units of 64KB L2 SRAM memory. In this project, test time reduction and consistent pass fail test results are achieved in the reduced GalCol algorithm tests. The GalCol X8 algorithm obtains the highest test time reduction of about 79.5% at 600MHz and 75.7% at 1.6GHz with consistent pass or fail test results comparable to original GalCol algorithm in the HVM test flow

    Aircraft electromagnetic compatibility

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    Illustrated are aircraft architecture, electromagnetic interference environments, electromagnetic compatibility protection techniques, program specifications, tasks, and verification and validation procedures. The environment of 400 Hz power, electrical transients, and radio frequency fields are portrayed and related to thresholds of avionics electronics. Five layers of protection for avionics are defined. Recognition is given to some present day electromagnetic compatibility weaknesses and issues which serve to reemphasize the importance of EMC verification of equipment and parts, and their ultimate EMC validation on the aircraft. Proven standards of grounding, bonding, shielding, wiring, and packaging are laid out to help provide a foundation for a comprehensive approach to successful future aircraft design and an understanding of cost effective EMC in an aircraft setting

    NASA Space Engineering Research Center Symposium on VLSI Design

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    The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

    VLSI signal processing through bit-serial architectures and silicon compilation

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    Exploring the Selection of Galaxy Clusters and Groups: An Optical Survey for X-ray Dark Clusters

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    Data from a new, wide field, coincident optical and X-ray survey, the X-ray Dark Cluster Survey (XDCS) are presented. This survey comprises simultaneous and independent searches for clusters of galaxies in the optical and X-ray passbands. Optical cluster detection algorithms implemented on the data are detailed. Two distinct optically selected catalogues are constructed, one based on I-band overdensity, the other on overdensities of colour-selected galaxies. The superior accuracy of the colour-selection technique over that of the single passband method is demonstrated, via internal consistency checks and comparison with external spectroscopic redshift information. This is compared with an X-ray selected cluster catalogue. In terms of gross numbers, the survey yields 185 I-band selected, 290 colour selected and 15 X-ray selected systems, residing in ~11deg^2 of optical + X-ray imaging. The relationship between optical richness/ luminosity and X-ray luminosity is examined, by measuring X-ray luminosities at the positions of our 290 colour-selected systems. Power law correlations between the optical richness/ luminosity versus X-ray luminosity are fitted, both exhibiting approximately 0.2 dex of intrinsic scatter. Interesting outliers in these correlations are discussed in greater detail. Spectroscopic follow up of a subsample of X-ray underluminous systems confirms their reality.Comment: Accepted for publication in MNRAS. 31 pages, 38 figures. Full resolution version available at http://star-www.dur.ac.uk/~dgg/xdcs1.ps.g
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