A Modified Signal Feed-Through Pulsed Flip-Flop for Low Power Applications

In this paper a modified signal feed-through pulsed flip-flop has been presented for low power applications. Signal feed-through flip-flop uses a pass transistor to feed input data directly to the output. Feed through transistor and feedback signals have been modified for delay, static and dynamic power reduction. HSPICE simulation shows 22% reduction in leakage power and 8% of dynamic power. Delay has been reduced by 14% using TSMC 90nm technology parameters. The proposed pulsed flip-flop has the lowest PDP (Power Delay Product) among other pulsed flip-flops discussed

A Novel Approach For Design Of Pulse Triggered Flip-Flop To Enhance Speed And Power

In VLSI Technology, flip-flops contribute a significant portion of chip area and power consumption to overall system design. Pulse triggered flip-flops (P-FF) have single latch and hence simpler in circuit complexity. Use of Explicit type design for P-FF gives the speed advantage. This paper presents various Pulse triggered Flip-flop (P-FF) designs and various techniques to achieve a better design in terms of power consumption and speed. Introduction of simple pass transistor in latch design can be used to speed up data transition. Dual edge triggering can be adopted as it consumes less power as compared to single edge triggering. Also conditional discharge technique can be used to reduce switching activity. The work is done in tanner tool software. DOI: 10.17762/ijritcc2321-8169.15025

High Performance Low Power Dual Edge Triggered Static D Flip-Flop

In this paper a low-power double-edge triggered static flip-flop (DETSFF) suitable for low-power and high performance applications is presented. The designed DETFF is verified at gpdk 180nm-1.8V CMOS technology. Comparison with some of the latest DETFFs shows that the proposed DETSFF can achieve the lowest power consumption, lowest clock to Q delay and thus Power-delay-product (PDP). Moreover, the proposed DETSFF comprises of only 15 transistors hence require lesser number of transistors and thus requires lesser overall silicon area.DOI:http://dx.doi.org/10.11591/ijece.v3i5.316

CMOS VLSI correlator design for radio-astronomical signal processing : a thesis presented in partial fulfilment of the requirements for the degree of Doctor of Philosophy in Engineering at Massey University, Auckland, New Zealand

Multi-element radio telescopes employ methods of indirect imaging to capture the image of the sky. These methods are in contrast to direct imaging methods whereby the image is constructed from sensor measurements directly and involve extensive signal processing on antenna signals. The Square Kilometre Array, or the SKA, is a future radio telescope of this type that, once built, will become the largest telescope in the world. The unprecedented scale of the SKA requires novel solutions to be developed for its signal processing pipeline one of the most resource-consuming parts of which is the correlator. The SKA uses the FX correlator construction that consists of two parts: the F part that translates antenna signals into frequency domain and the X part that cross-correlates these signals between each other. This research focuses on the integrated circuit design and VLSI implementation issues of the X part of a very large FX correlator in 28 nm and 130 nm CMOS. The correlator’s main processing operation is the complex multiply-accumulation (CMAC) for which custom 28 nm CMAC designs are presented and evaluated. Performance of various memories inside the correlator also affects overall efficiency, and input-buffered and output-buffered approaches are considered with the goal of improving upon it. For output-buffered designs, custom memory control circuits have been designed and prototyped in 130 nm that improve upon eDRAM by taking advantage of sequential access patterns. For the input-buffered architecture, a new scheme is proposed that decreases the usage of the input-buffer memory by a third by making use of multiple accumulators in every CMAC. Because cross-correlation is a very data-intensive process, high-performance SerDes I/O is essential to any practical ASIC implementation. On the I/O design, the 28 nm full-rate transmitter delivering 15 Gbps per lane is presented. This design consists of the scrambler, the serialiser, the digital VCO with analog fine-tuning and the SST driver including features of a 4-tap FFE, impedance tuning and amplitude tuning

Low Power Explicit Pulse Triggered Flip-Flop Design Based On A Pass Transistor

In VLSI system design, power consumption is the ambitious issue for the past respective years. Advanced IC fabrication technology grants the use of nano scaled devices, so the power dissipation becomes major problem in the designing of VLSI chips. In this paper we present, a low-power flip-flop (FF) design featuring an explicit type pulse-triggered structure and a modified true single phase clock latch based on a signal feed-through scheme using pass transistor. The offered design successfully figure out the long discharging path problem in conventional explicit type pulse-triggered FF (P-FF) designs and achieves better power performance by consuming low power. The proposed design also significantly reduces delay time, set-up time and hold time. Simulation results based on TMC 180nm CMOS technology reveal that the proposed design features the best power and delay performance in several FF designs under comparison

Low-Power Redundant-Transition-Free TSPC Dual-Edge-Triggering Flip-Flop Using Single-Transistor-Clocked Buffer

In the modern graphics processing unit (GPU)/artificial intelligence (AI) era, flip-flop (FF) has become one of the most power-hungry blocks in processors. To address this issue, a novel single-phase-clock dual-edge-triggering (DET) FF using a single-transistor-clocked (STC) buffer (STCB) is proposed. The STCB uses a single-clocked transistor in the data sampling path, which completely removes clock redundant transitions (RTs) and internal RTs that exist in other DET designs. Verified by post-layout simulations in 22 nm fully depleted silicon on insulator (FD-SOI) CMOS, when operating at 10% switching activity, the proposed STC-DET outperforms prior state-of-the-art low-power DET in power consumption by 14% and 9.5%, at 0.4 and 0.8 V, respectively. It also achieves the lowest power-delay-product (PDP) among the DETs

Power Reductions with Energy Recovery Using Resonant Topologies

The problem of power densities in system-on-chips (SoCs) and processors has become more exacerbated recently, resulting in high cooling costs and reliability issues. One of the largest components of power consumption is the low skew clock distribution network (CDN), driving large load capacitance. This can consume as much as 70% of the total dynamic power that is lost as heat, needing elaborate sensing and cooling mechanisms. To mitigate this, resonant clocking has been utilized in several applications over the past decade. An improved energy recovering reconfigurable generalized series resonance (GSR) solution with all the critical support circuitry is developed in this work. This LC resonant clock driver is shown to save about 50% driver power (\u3e40% overall), on a 22nm process node and has 50% less skew than a non-resonant driver at 2GHz. It can operate down to 0.2GHz to support other energy savings techniques like dynamic voltage and frequency scaling (DVFS). As an example, GSR can be configured for the simpler pulse series resonance (PSR) operation to enable further power saving for double data rate (DDR) applications, by using de-skewing latches instead of flip-flop banks. A PSR based subsystem for 40% savings in clocking power with 40% driver active area reduction xii is demonstrated. This new resonant driver generates tracking pulses at each transition of clock for dual edge operation across DVFS. PSR clocking is designed to drive explicit-pulsed latches with negative setup time. Simulations using 45nm IBM/PTM device and interconnect technology models, clocking 1024 flip-flops show the reductions, compared to non-resonant clocking. DVFS range from 2GHz/1.3V to 200MHz/0.5V is obtained. The PSR frequency is set \u3e3× the clock rate, needing only 1/10th the inductance of prior-art LC resonance schemes. The skew reductions are achieved without needing to increase the interconnect widths owing to negative set-up times. Applications in data circuits are shown as well with a 90nm example. Parallel resonant and split-driver non-resonant configurations as well are derived from GSR. Tradeoffs in timing performance versus power, based on theoretical analysis, are compared for the first time and verified. This enables synthesis of an optimal topology for a given application from the GSR

DESIGN OF LOW POWER PULSE TRIGGERED FLIP FLOP USING CONDITIONAL PULSE- ENHANCEMENT SCHEME

Volume 2 Issue 1 (January 2014

Circuit designs for low-power and SEU-hardened systems

The desire to have smaller and faster portable devices is one of the primary motivations for technology scaling. Though advancements in device physics are moving at a very good pace, they might not be aggressive enough for now-a-day technology scaling trends. As a result, the MOS devices used for present day integrated circuits are pushed to the limit in terms of performance, power consumption and robustness, which are the most critical criteria for almost all applications. Secondly, technology advancements have led to design of complex chips with increasing chip densities and higher operating speeds. The design of such high performance complex chips (microprocessors, digital signal processors, etc) has massively increased the power dissipation and, as a result, the operating temperatures of these integrated circuits. In addition, due to the aggressive technology scaling the heat withstanding capabilities of the circuits is reducing, thereby increasing the cost of packaging and heat sink units. This led to the increase in prominence for smarter and more robust low-power circuit and system designs. Apart from power consumption, another criterion affected by technology scaling is robustness of the design, particularly for critical applications (security, medical, finance, etc). Thus, the need for error free or error immune designs. Until recently, radiation effects were a major concern in space applications only. With technology scaling reaching nanometer level, terrestrial radiation has become a growing concern. As a result Single Event Upsets (SEUs) have become a major challenge to robust designs. Single event upset is a temporary change in the state of a device due to a particle strike (usually from the radiation belts or from cosmic rays) which may manifest as an error at the output. This thesis proposes a novel method for adaptive digital designs to efficiently work with the lowest possible power consumption. This new technique improves options in performance, robustness and power. The thesis also proposes a new dual data rate flipflop, which reduces the necessary clock speed by half, drastically reducing the power consumption. This new dual data rate flip-flop design culminates in a proposed unique radiation hardened dual data rate flip-flop, Firebird\u27. Firebird offers a valuable addition to the future circuit designs, especially with the increasing importance of the Single Event Upsets (SEUs) and power dissipation with technology scaling.\u2

A New Area and Power Efficient Single Edge Triggered Flip-Flop Structure for Low Data Activity and High Frequency Applications

In this work, a new area and power efficient single edge triggered flip-flop has been proposed. The proposed design is compared with six existing flip-flop designs. In the proposed design, the number of transistors is reduced to decrease the area. The number of clocked transistors of the devised flip-flop is also reduced to minimize the power consumption. As compared to the other state of the art single edge triggered flip-flop designs, the newly proposed design is the best energy efficient with the comparable power delay product (PDP) having an improvement of up to 61.53% in view of power consumption. The proposed flip-flop also has the lowest transistor count and the lowest area. The simulation results show that the proposed flip-flop is best suited for low power and low area systems especially for low data activity and high frequency applications. Keywords: PDP, reliability, delay, process node, clock frequenc