Single-shot layered reflectance separation using a polarized light field camera

We present a novel computational photography technique for single shot separation of diffuse/specular reflectance as well as novel angular domain separation of layered reflectance. Our solution consists of a two-way polarized light field (TPLF) camera which simultaneously captures two orthogonal states of polarization. A single photograph of a subject acquired with the TPLF camera under polarized illumination then enables standard separation of diffuse (depolarizing) and polarization preserving specular reflectance using light field sampling. We further demonstrate that the acquired data also enables novel angular separation of layered reflectance including separation of specular reflectance and single scattering in the polarization preserving component, and separation of shallow scattering from deep scattering in the depolarizing component. We apply our approach for efficient acquisition of facial reflectance including diffuse and specular normal maps, and novel separation of photometric normals into layered reflectance normals for layered facial renderings. We demonstrate our proposed single shot layered reflectance separation to be comparable to an existing multi-shot technique that relies on structured lighting while achieving separation results under a variety of illumination conditions

Measurement and Modeling of the Optical Scattering Properties of Crop Canopies

The specular reflection process is shown to be a key aspect of radiation transfer by plant canopies. Polarization measurements are demonstrated as the tool for determining the specular and diffuse portions of the canopy radiance. The magnitude of the specular fraction of the reflectance is significant compared to the magnitude of the diffuse fraction. Therefore, it is necessary to consider specularly reflected light in developing and evaluating light-canopy interaction models for wheat canopies. Models which assume leaves are diffuse reflectors correctly predict only the diffuse fraction of the canopy reflectance factor. The specular reflectance model, when coupled with a diffuse leaf model, would predict both the specular and diffuse portions of the reflectance factor. The specular model predicts and the data analysis confirms that the single variable, angle of incidence of specularly reflected sunlight on the leaf, explains much of variation in the polarization data as a function of view-illumination directions

On the effect of thin film growth mechanisms on the specular reflectance of aluminum thin films deposited via filtered cathodic vacuum arc

The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly working pressure and deposition time, on the specular and diffuse reflectance of aluminium thin films, was studied. Changes in specular reflectance, measured by ultraviolet–visible and near-infrared spectroscopy (UV-vis-NIR) spectro photometry, were directly correlated with thin film elemental concentration depth profiles, obtained by Rutherford backscattering spectrometry (RBS), and surface and cross-sectional morphologies as measured by scanning electron microscopy (SEM) and profilometry. Finally, atomic force microscopy (AFM) provided information on the roughness and growth mechanism of the films. The two contributions to the total reflectance of the films, namely diffuse and specular reflectance, were found to be deeply influenced by deposition conditions. It was proven that working pressure and deposition time directly determine the predominant factor. Specular reflectance varied from 12 to 99.8% of the total reflectance for films grown at the same working pressure of 0.1 Pa and with different deposition times. This transformation could not be attributed to an oxidation of the films as stated by RBS, but was correlated with a progressive modification of the roughness, surface, and bulk morphology of the samples over the deposition time. Hence, the evolution in the final optical properties of the films is driven by different growth mechanisms and the resulting microstructures. In addition to the originally addressed CSP applications the potential of the developed aluminium films for other application rather than CSP, such as, for example, reference material for spectroscopic diffuse reflectance measurements, is also discussed

Development of a theory of the spectral reflectance of minerals, part 2

Theory of diffuse reflectance of particulate media including garnet, glass, corundum powders, and mixture

Diffuse reflectance measurement tool for laparoscopic surgery

Continuous-wave diffuse reflectance or Near Infrared Spectroscopy (NIRS) offers the possibility to perform a preliminary screening of tissue for ischemia or other tissue anomalies. A tool for intracavity NIRS measurements during laparoscopic surgery, developed within the framework of the FP7-IP ARAKNES (Array of Robots Augmenting the KiNematics of Endoluminal Surgery) project, is described. It consists of a probe, that is located on the tip of an appropriately shaped laparoscopic manipulator and then applied to the tissue. Such a probe employs an array of incoherent semiconductor light sources (LEDs) frequency-multiplexed on a single detector using a lock-in technique. The resulting overall tool structure is simple and compact, and allows efficient coupling of the emitted light towards the tissue. The tool has high responsivity and enables fast and accurate measurements. A dataset gathered from in-vivo tissue is presented. The performance both indicates direct applicability of the tool to significant surgical issues (ischemia detection), and clearly indicates the possibility of further miniaturizing the probe head towards catheterized approaches

The Use of Separated Reflection Components in Estimating Geometrical Parameters of Curved Surface Elements

Iterative least-squares estimation, requires accurate reflectance models to retrieve geometrical parameters of curved surface elements from an image projection. We investigate the use of separating the diffuse (body) reflection from the specular (surface) reflection being responsible for image highlights. Experiments show that the (smooth) diffuse component yields the best convergence properties, while the (sharp) specular component can contribute to the improvement of the noise insensitivit

Micromachined “side-viewing” optical sensor probe for detection of esophageal cancers

In this paper, we report the design, fabrication and testing of a new miniaturized optical sensor probe with “side viewing” capability for oblique incidence diffuse reflectance spectrometry. The sensor probe consists of a lithographically patterned polymer waveguides chip and two micromachined positioning substrates and source/collection fibers to achieve 45° light incidence and collection of spatially resolved diffuse reflectance. Diffuse reflectance of human esophageal surface has been successfully measured for differentiation of cancerous tissues from normal ones

The temporal dynamics of calibration target reflectance

A field experiment investigated the hypothesis that the nadir reflectance of calibration surface substrates (asphalt and concrete) remains stable over a range of time-scales. Measurable differences in spectral reflectance factors were found over periods as short as 30 minutes. Surface reflectance factors measured using a dual-field-of-view GER1500 spectroradiometer system showed a relationship with the relative proportion of diffuse irradiance, over periods when solar zenith changes were minimal. Reflectance measurements were collected over precise points on the calibration surfaces using a novel mobile spectroradiometer device, and uncertainty in terms of absolute reflectance was calculated as being < 0.05% within the usable range of the instrument (400-1000nm). Multi-date reflectance factors were compared using one-way ANOVA and found to differ significantly (p = 0.001). These findings illustrate the anisotropic nature of calibration surfaces, and place emphasis on the need to minimise the temporal delay in collection of field spectral measurements for vicarious calibration or empirical atmospheric correction purposes

Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

A new, simple and quick approach, oblique-incidence reflectometry, was used to measure the absorption and reduced scattering coefficients of a semi-infinite turbid medium. An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several transport mean free paths away from the incident point. The amount of shift yields the diffusion constant by a simple formula, and the slope of the diffuse reflectance yields the attenuation coefficient. Only the relative profile of the diffuse reflectance is needed to deduce both optical parameters, which makes this method attractive in clinical settings because it does not require a stringent calibration for absolute quantity measurements. This method was tested theoretically by Monte Carlo simulations and experimentally by a reflectometer. Because this method can be used to measure optical properties of biological tissues quickly and requires only inexpensive equipment, it has potential clinical application to the diagnosis of disease or monitoring of treatments