An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

A fault syndromes simulator for random access memories

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, the March test algorithm is used to detect and diagnose all faults related to Random Access Memories. This algorithm also allows the faults to be located and identified. However, the test and diagnosis process is mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of coupling faults and stuck-at faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built-in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on finding an efficient algorithm to be implemented in their designs

An efficient fault syndromes simulator for SRAM memories

Testing and diagnosis techniques play a key role in the advance of semiconductor memory technology. The challenge of failure detection has created intensive investigation on efficient testing and diagnosis algorithm for better fault coverage and diagnostic resolution. At present, March test algorithm is used to detect and diagnose all faults related to Random Access Memories. However, the test and diagnosis process are mainly done manually. Due to this, a systematic approach for developing and evaluating memory test algorithm is required. This work is focused on incorporating the March based test algorithm using a software simulator tool for implementing a fast and systematic memory testing algorithm. The simulator allows a user through a GUI to select a March based test algorithm depending on the desired fault coverage and diagnostic resolution. Experimental results show that using the simulator for testing is more efficient than that of the traditional testing algorithm. This new simulator makes it possible for a detailed list of stuck-at faults, transition faults and coupling faults covered by each algorithm and its percentage to be displayed after a set of test algorithms has been chosen. The percentage of diagnostic resolution is also displayed. This proves that the simulator reduces the trade-off between test time, fault coverage and diagnostic resolution. Moreover, the chosen algorithm can be applied to incorporate with memory built-in self-test and diagnosis, to have a better fault coverage and diagnostic resolution. Universities and industry involved in memory Built- in-Self test, Built-in-Self repair and Built-in-Self diagnose will benefit by saving a few years on researching an efficient algorithm to be implemented in their designs

Infrastructures and Algorithms for Testable and Dependable Systems-on-a-Chip

Every new node of semiconductor technologies provides further miniaturization and higher performances, increasing the number of advanced functions that electronic products can offer. Silicon area is now so cheap that industries can integrate in a single chip usually referred to as System-on-Chip (SoC), all the components and functions that historically were placed on a hardware board. Although adding such advanced functionality can benefit users, the manufacturing process is becoming finer and denser, making chips more susceptible to defects. Today’s very deep-submicron semiconductor technologies (0.13 micron and below) have reached susceptibility levels that put conventional semiconductor manufacturing at an impasse. Being able to rapidly develop, manufacture, test, diagnose and verify such complex new chips and products is crucial for the continued success of our economy at-large. This trend is expected to continue at least for the next ten years making possible the design and production of 100 million transistor chips. To speed up the research, the National Technology Roadmap for Semiconductors identified in 1997 a number of major hurdles to be overcome. Some of these hurdles are related to test and dependability. Test is one of the most critical tasks in the semiconductor production process where Integrated Circuits (ICs) are tested several times starting from the wafer probing to the end of production test. Test is not only necessary to assure fault free devices but it also plays a key role in analyzing defects in the manufacturing process. This last point has high relevance since increasing time-to-market pressure on semiconductor fabrication often forces foundries to start volume production on a given semiconductor technology node before reaching the defect densities, and hence yield levels, traditionally obtained at that stage. The feedback derived from test is the only way to analyze and isolate many of the defects in today’s processes and to increase process’s yield. With the increasing need of high quality electronic products, at each new physical assembly level, such as board and system assembly, test is used for debugging, diagnosing and repairing the sub-assemblies in their new environment. Similarly, the increasing reliability, availability and serviceability requirements, lead the users of high-end products performing periodic tests in the field throughout the full life cycle. To allow advancements in each one of the above scaling trends, fundamental changes are expected to emerge in different Integrated Circuits (ICs) realization disciplines such as IC design, packaging and silicon process. These changes have a direct impact on test methods, tools and equipment. Conventional test equipment and methodologies will be inadequate to assure high quality levels. On chip specialized block dedicated to test, usually referred to as Infrastructure IP (Intellectual Property), need to be developed and included in the new complex designs to assure that new chips will be adequately tested, diagnosed, measured, debugged and even sometimes repaired. In this thesis, some of the scaling trends in designing new complex SoCs will be analyzed one at a time, observing their implications on test and identifying the key hurdles/challenges to be addressed. The goal of the remaining of the thesis is the presentation of possible solutions. It is not sufficient to address just one of the challenges; all must be met at the same time to fulfill the market requirements

CBR and MBR techniques: review for an application in the emergencies domain

The purpose of this document is to provide an in-depth analysis of current reasoning engine practice and the integration strategies of Case Based Reasoning and Model Based Reasoning that will be used in the design and development of the RIMSAT system. RIMSAT (Remote Intelligent Management Support and Training) is a European Commission funded project designed to: a.. Provide an innovative, 'intelligent', knowledge based solution aimed at improving the quality of critical decisions b.. Enhance the competencies and responsiveness of individuals and organisations involved in highly complex, safety critical incidents - irrespective of their location. In other words, RIMSAT aims to design and implement a decision support system that using Case Base Reasoning as well as Model Base Reasoning technology is applied in the management of emergency situations. This document is part of a deliverable for RIMSAT project, and although it has been done in close contact with the requirements of the project, it provides an overview wide enough for providing a state of the art in integration strategies between CBR and MBR technologies.Postprint (published version

Techniques for the realization of ultrareliable spaceborne computers Interim scientific report

Error-free ultrareliable spaceborne computer

Modern Diagnostics Techniques for Electrical Machines, Power Electronics, and Drives

© 2015 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.[EN] For the last ten years, at least three different special sections dealing with diagnostics in power electrical engineering have been published in the IEEE transactions on industrial electronics [1]-[5]. All of them had their specificities, but the last ones, starting in 2011, were more connected to relevant events organized on the topic. In fact, these events have been clearly the only international forums fully dedicated to diagnostics techniques in power electrical engineering. For this particular issue, it has been decided to separate the different submissions into six parts: state of the art; general methods; induction machines (IMs); synchronous machines (SMs); . electrical drives; power components and power converters. The second section includes only one state-of-the-art paper, which is dedicated to actual techniques implemented in both industry and research laboratories. The third section includes three papers on diagnostic techniques not specifically aimed at a particular type of machine. The fourth section includes three papers devoted to diagnostics of rotor faults, two dedicated to stator insulation issues, and four papers dealing with mechanical faults diagnosis in IMs. The fifth section includes papers focusing on different types of SMs. The first two papers deal with wound-rotor SMs, the following three papers are dedicated to permanent-magnet radial flux machines, and the last one deals with permanent-magnet axial flux machines. Regarding the types of faults analyzed, there are three papers devoted to the diagnosis of interturn short circuits in the stator windings, i.e., one dedicated to the detection and location of field-winding-to-ground faults and a paper devoted to the diagnosis of static eccentricities. In the sixth section, two papers investigate issues related to faults in drive sensors, and one is devoted to fault detections in the coupling inductors. The last section includes two papers devoted to diagnosis of faults and losses analysis in switching components of power converters.Capolino, G.; Antonino-Daviu, J.; Riera-Guasp, M. (2015). Modern Diagnostics Techniques for Electrical Machines, Power Electronics, and Drives. IEEE Transactions on Industrial Electronics. 62(3):1738-1745. doi:10.1109/TIE.2015.2391186S1738174562