Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition to operating condition range and NBTI aging. The final design solutions present transistor sizing, which depart from intuitive transistor sizing criteria and show dramatic yield improvements, which have been verified by Monte Carlo SPICE analysis

Application of a simplified thermal-electric model of a sodium-nickel chloride battery energy storage system to a real case residential prosumer

Recently, power system customers have changed the way they interact with public networks, playing a more and more active role. End-users first installed local small-size generating units, and now they are being equipped with storage devices to increase the self-consumption rate. By suitably managing local resources, the provision of ancillary services and aggregations among several end-users are expected evolutions in the near future. In the upcoming market of household-sized storage devices, sodium-nickel chloride technology seems to be an interesting alternative to lead-acid and lithium-ion batteries. To accurately investigate the operation of the NaNiCl2 battery system at the residential level, a suitable thermoelectric model has been developed by the authors, starting from the results of laboratory tests. The behavior of the battery internal temperature has been characterized. Then, the designed model has been used to evaluate the economic profitability in installing a storage system in the case that end-users are already equipped with a photovoltaic unit. To obtain realistic results, real field measurements of customer consumption and solar radiation have been considered. A concrete interest in adopting the sodium-nickel chloride technology at the residential level is confirmed, taking into account the achievable benefits in terms of economic income, back-up supply, and increased indifference to the evolution of the electricity market

Optimization of the operation of smart rural grids through a novel rnergy management system

The paper proposes an innovative Energy Management System (EMS) that optimizes the grid operation based on economic and technical criteria. The EMS inputs the demand and renewable generation forecasts, electricity prices and the status of the distributed storages through the network, and solves with an optimal quarter-hourly dispatch for controllable resources. The performance of the EMS is quantified through diverse proposed metrics. The analyses were based on a real rural grid from the European FP7 project Smart Rural Grid. The performance of the EMS has been evaluated through some scenarios varying the penetration of distributed generation. The obtained results demonstrate that the inclusion of the EMS from both a technical point of view and an economic perspective for the adopted grid is justified. At the technical level, the inclusion of the EMS permits us to significantly increase the power quality in weak and radial networks. At the economic level and from a certain threshold value in renewables’ penetration, the EMS reduces the energy costs for the grid participants, minimizing imports from the external grid and compensating the toll to be paid in the form of the losses incurred by including additional equipment in the network (i.e., distributed storage).Postprint (published version

Modeling of thermally induced skew variations in clock distribution network

Clock distribution network is sensitive to large thermal gradients on the die as the performance of both clock buffers and interconnects are affected by temperature. A robust clock network design relies on the accurate analysis of clock skew subject to temperature variations. In this work, we address the problem of thermally induced clock skew modeling in nanometer CMOS technologies. The complex thermal behavior of both buffers and interconnects are taken into account. In addition, our characterization of the temperature effect on buffers and interconnects provides valuable insight to designers about the potential impact of thermal variations on clock networks. The use of industrial standard data format in the interface allows our tool to be easily integrated into existing design flow

Limits on Fundamental Limits to Computation

An indispensable part of our lives, computing has also become essential to industries and governments. Steady improvements in computer hardware have been supported by periodic doubling of transistor densities in integrated circuits over the last fifty years. Such Moore scaling now requires increasingly heroic efforts, stimulating research in alternative hardware and stirring controversy. To help evaluate emerging technologies and enrich our understanding of integrated-circuit scaling, we review fundamental limits to computation: in manufacturing, energy, physical space, design and verification effort, and algorithms. To outline what is achievable in principle and in practice, we recall how some limits were circumvented, compare loose and tight limits. We also point out that engineering difficulties encountered by emerging technologies may indicate yet-unknown limits.Comment: 15 pages, 4 figures, 1 tabl

Per-Core DVFS with Switched-Capacitor Converters for Energy Efficiency in Manycore Processors

Integrating multiple power converters on-chip improves energy efficiency of manycore architectures. Switched-capacitor (SC) dc-dc converters are compatible with conventional CMOS processes, but traditional implementations suffer from limited conversion efficiency. We propose a dynamic voltage and frequency scaling scheme with SC converters that achieves high converter efficiency by allowing the output voltage to ripple and having the processor core frequency track the ripple. Minimum core energy is achieved by hopping between different converter modes and tuning body-bias voltages. A multicore processor model based on a 28-nm technology shows conversion efficiencies of 90% along with over 25% improvement in the overall chip energy efficiency

Statistical Approach for Yield Optimization for Minimum Energy Operation in Subthreshold Circuits Considering Variability Issues

The supply voltage (V-dd) and threshold voltage (V-th) are two significant design variables that directly impact the performance and power consumption of circuits. The scaling of these voltages has become a popular option to satisfy performance and low power requirements. Subthreshold operation is a compelling approach for energy-constrained applications where processor speed is less important. However, subthreshold designs show dramatically increased sensitivity to process variations due to the exponential relationship of subthreshold drive current with V-th variation and drastically growing leakage power. If there is uncertainty in the value of the threshold or supply voltage, the power advantages of this very low-voltage operation diminishes. This paper presents a statistical methodology for choosing the optimum V-dd and V-th under manufacturing uncertainties and different operating conditions to minimize energy for a given frequency in subthreshold operation while ensuring yield maximality. Unlike the traditional energy optimization, to find the optimal values for the voltages, we have considered the following factors to make the optimization technique more acceptable: the application-dependent design constraints, variations in the design variables due to manufacturing uncertainty, device sizing, activity factor of the circuit, and power reduction techniques. To maximize the yield, a two-level optimization is employed. First, the design metric is carefully chosen and deterministically optimized to the optimum point in the feasible region. At the second level, a tolerance box is moved over the design space to find the best location in order to maximize the yield. The feasible region, which is application dependent, is constrained by the minimum performance and the maximum ratio of leakage to total power in the V-dd-V-th plane. The center of the tolerance box provides the nominal design values for V-dd and V-th such that the design has a maximum immunity to the variations and maximizes the yield. The yield is estimated directly using the joint cumulative distribution function over the tolerance box requiring no numerical integration and saving considerable computational complexity for multidimensional problems. The optimal designs, verified by Monte Carlo and SPECTRE simulations, demonstrate significant increase in yield. By using this methodology, yield is found to be strongly dependent on the design metrics, circuit switching activity, transistor sizing, and the given constraints

Power quality and electromagnetic compatibility: special report, session 2

The scope of Session 2 (S2) has been defined as follows by the Session Advisory Group and the Technical Committee: Power Quality (PQ), with the more general concept of electromagnetic compatibility (EMC) and with some related safety problems in electricity distribution systems. Special focus is put on voltage continuity (supply reliability, problem of outages) and voltage quality (voltage level, flicker, unbalance, harmonics). This session will also look at electromagnetic compatibility (mains frequency to 150 kHz), electromagnetic interferences and electric and magnetic fields issues. Also addressed in this session are electrical safety and immunity concerns (lightning issues, step, touch and transferred voltages). The aim of this special report is to present a synthesis of the present concerns in PQ&EMC, based on all selected papers of session 2 and related papers from other sessions, (152 papers in total). The report is divided in the following 4 blocks: Block 1: Electric and Magnetic Fields, EMC, Earthing systems Block 2: Harmonics Block 3: Voltage Variation Block 4: Power Quality Monitoring Two Round Tables will be organised: - Power quality and EMC in the Future Grid (CIGRE/CIRED WG C4.24, RT 13) - Reliability Benchmarking - why we should do it? What should be done in future? (RT 15