A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

Improved Physical Design for Manufacturing Awareness and Advanced VLSI

Increasing challenges arise with each new semiconductor technology node, especially in advanced nodes, where the industry tries to extract every ounce of benefit as it approaches the limits of physics, through manufacturing-aware design technology co-optimization and design-based equivalent scaling. The increasing complexity of design and process technologies, and ever-more complex design rules, also become hurdles for academic researchers, separating academic researchers from the most up-to-date technical issues.This thesis presents innovative methodologies and optimizations to address the above challenges. There are three directions in this thesis: (i) manufacturing-aware design technology co-optimization; (ii) advanced node design-based equivalent scaling; and (iii) an open source academic detailed routing flow.To realize manufacturing-aware design technology co-optimization, this thesis presents two works: (i) a multi-row detailed placement optimization for neighbor diffusion effect mitigation between neighboring standard cells; and (ii) a post-routing optimization to generate 2D block mask layout for dummy segment removal in self-aligned multiple patterning.To achieve advanced node design-based equivalent scaling, this thesis presents two improved physical design methodologies: (i) a post-placement flop tray generation approach for clock power reduction; and (ii) a detailed placement approach to exploit inter-row M1 routing for congestion and wirelength reduction.To address the increasing gap between academia and industry, this thesis presents two works toward an open source academic detailed routing flow: (i) a complete, robust, scalable and design ruleaware dynamic programming-based pin access analysis framework; and (ii) TritonRoute – the open source detailed router that is capable of delivering DRC-clean detailed routing solutions in advanced nodes.This thesis concludes with a summary of its contributions and open directions for future research

Datacenter Traffic Control: Understanding Techniques and Trade-offs

Datacenters provide cost-effective and flexible access to scalable compute and storage resources necessary for today's cloud computing needs. A typical datacenter is made up of thousands of servers connected with a large network and usually managed by one operator. To provide quality access to the variety of applications and services hosted on datacenters and maximize performance, it deems necessary to use datacenter networks effectively and efficiently. Datacenter traffic is often a mix of several classes with different priorities and requirements. This includes user-generated interactive traffic, traffic with deadlines, and long-running traffic. To this end, custom transport protocols and traffic management techniques have been developed to improve datacenter network performance. In this tutorial paper, we review the general architecture of datacenter networks, various topologies proposed for them, their traffic properties, general traffic control challenges in datacenters and general traffic control objectives. The purpose of this paper is to bring out the important characteristics of traffic control in datacenters and not to survey all existing solutions (as it is virtually impossible due to massive body of existing research). We hope to provide readers with a wide range of options and factors while considering a variety of traffic control mechanisms. We discuss various characteristics of datacenter traffic control including management schemes, transmission control, traffic shaping, prioritization, load balancing, multipathing, and traffic scheduling. Next, we point to several open challenges as well as new and interesting networking paradigms. At the end of this paper, we briefly review inter-datacenter networks that connect geographically dispersed datacenters which have been receiving increasing attention recently and pose interesting and novel research problems.Comment: Accepted for Publication in IEEE Communications Surveys and Tutorial

Metamorphic Code Generation from LLVM IR Bytecode

Metamorphic software changes its internal structure across generations with its functionality remaining unchanged. Metamorphism has been employed by malware writers as a means of evading signature detection and other advanced detection strate- gies. However, code morphing also has potential security benefits, since it increases the “genetic diversity” of software. In this research, we have created a metamorphic code generator within the LLVM compiler framework. LLVM is a three-phase compiler that supports multiple source languages and target architectures. It uses a common intermediate representation (IR) bytecode in its optimizer. Consequently, any supported high-level programming language can be transformed to this IR bytecode as part of the LLVM compila- tion process. Our metamorphic generator functions at the IR bytecode level, which provides many advantages over previously developed metamorphic generators. The morphing techniques that we employ include dead code insertion—where the dead code is actually executed within the morphed code—and subroutine permutation. We have tested the effectiveness of our code morphing using hidden Markov model analysis

SARA: Self-Aware Resource Allocation for Heterogeneous MPSoCs

In modern heterogeneous MPSoCs, the management of shared memory resources is crucial in delivering end-to-end QoS. Previous frameworks have either focused on singular QoS targets or the allocation of partitionable resources among CPU applications at relatively slow timescales. However, heterogeneous MPSoCs typically require instant response from the memory system where most resources cannot be partitioned. Moreover, the health of different cores in a heterogeneous MPSoC is often measured by diverse performance objectives. In this work, we propose a Self-Aware Resource Allocation (SARA) framework for heterogeneous MPSoCs. Priority-based adaptation allows cores to use different target performance and self-monitor their own intrinsic health. In response, the system allocates non-partitionable resources based on priorities. The proposed framework meets a diverse range of QoS demands from heterogeneous cores.Comment: Accepted by the 55th annual Design Automation Conference 2018 (DAC'18

Testability considerations for implementing an embedded memory subsystem

textThere are a number of testability considerations for VLSI design, but test coverage, test time, accuracy of test patterns and correctness of design information for DFD (Design for debug) are the most important ones in design with embedded memories. The goal of DFT (Design-for-Test) is to achieve zero defects. When it comes to the memory subsystem in SOCs (system on chips), many flavors of memory BIST (built-in self test) are able to get high test coverage in a memory, but often, no proper attention is given to the memory interface logic (shadow logic). Functional testing and BIST are the most prevalent tests for this logic, but functional testing is impractical for complicated SOC designs. As a result, industry has widely used at-speed scan testing to detect delay induced defects. Compared with functional testing, scan-based testing for delay faults reduces overall pattern generation complexity and cost by enhancing both controllability and observability of flip-flops. However, without proper modeling of memory, Xs are generated from memories. Also, when the design has chip compression logic, the number of ATPG patterns is increased significantly due to Xs from memories. In this dissertation, a register based testing method and X prevention logic are presented to tackle these problems. An important design stage for scan based testing with memory subsystems is the step to create a gate level model and verify with this model. The flow needs to provide a robust ATPG netlist model. Most industry standard CAD tools used to analyze fault coverage and generate test vectors require gate level models. However, custom embedded memories are typically designed using a transistor-level flow, there is a need for an abstraction step to generate the gate models, which must be equivalent to the actual design (transistor level). The contribution of the research is a framework to verify that the gate level representation of custom designs is equivalent to the transistor-level design. Compared to basic stuck-at fault testing, the number of patterns for at-speed testing is much larger than for basic stuck-at fault testing. So reducing test and data volume are important. In this desertion, a new scan reordering method is introduced to reduce test data with an optimal routing solution. With in depth understanding of embedded memories and flows developed during the study of custom memory DFT, a custom embedded memory Bit Mapping method using a symbolic simulator is presented in the last chapter to achieve high yield for memories.Electrical and Computer Engineerin