88 research outputs found
A Complementary Resistive Switch-based Crossbar Array Adder
Redox-based resistive switching devices (ReRAM) are an emerging class of
non-volatile storage elements suited for nanoscale memory applications. In
terms of logic operations, ReRAM devices were suggested to be used as
programmable interconnects, large-scale look-up tables or for sequential logic
operations. However, without additional selector devices these approaches are
not suited for use in large scale nanocrossbar memory arrays, which is the
preferred architecture for ReRAM devices due to the minimum area consumption.
To overcome this issue for the sequential logic approach, we recently
introduced a novel concept, which is suited for passive crossbar arrays using
complementary resistive switches (CRSs). CRS cells offer two high resistive
storage states, and thus, parasitic sneak currents are efficiently avoided.
However, until now the CRS-based logic-in-memory approach was only shown to be
able to perform basic Boolean logic operations using a single CRS cell. In this
paper, we introduce two multi-bit adder schemes using the CRS-based
logic-in-memory approach. We proof the concepts by means of SPICE simulations
using a dynamical memristive device model of a ReRAM cell. Finally, we show the
advantages of our novel adder concept in terms of step count and number of
devices in comparison to a recently published adder approach, which applies the
conventional ReRAM-based sequential logic concept introduced by Borghetti et
al.Comment: 12 pages, accepted for IEEE Journal on Emerging and Selected Topics
in Circuits and Systems (JETCAS), issue on Computing in Emerging Technologie
Asymptotic Stability and Asymptotic Synchronization of Memristive Regulatory-Type Networks
Memristive regulatory-type networks are recently emerging as a potential successor to traditional complementary resistive switch models. Qualitative analysis is useful in designing and synthesizing memristive regulatory-type networks. In this paper, we propose several succinct criteria to ensure global asymptotic stability and global asymptotic synchronization for a general class of memristive regulatory-type networks. The experimental simulations also show the performance of theoretical results
์ ์ ์ฅ์น ๋ด ๊ตญ๋ถ์ ์ ๊ณ ํฅ์์ ์ํ ๋๋ ธ ๊ตฌ์กฐ์ฒด
ํ์๋
ผ๋ฌธ(๋ฐ์ฌ) -- ์์ธ๋ํ๊ต๋ํ์ : ๊ณต๊ณผ๋ํ ํํ์๋ฌผ๊ณตํ๋ถ, 2021.8. ์กฐ์ฌ์.The goal of this dissertation is to investigate effect of nanostructures for local electric field enhancement in electronic devices and to provide experimental and theoretical bases for their practical use. Resistive random access memory (RRAM) is a data storage device that can be modulated its resistance states by external electrical stimuli. The electric field generated by the applied potential difference between the two electrodes acts as the driving force to switch the resistance states, so controlling the electric field within the device can lead to improved operational performance and reliability of the device. Even though considerable progress has been made through significant efforts to control the electric field within the device, selectively enhancing the electric field in the intended position for stable and uniform resistive switching behavior is still challenging.
Engineered metal structures in the RRAM can efficiently manipulate the electric field. As the radius of the metal structures decreases, the charge density increases, generating electric field enhancements in confined region. To minimize the radius of the metal structure and thus to greatly increase the electric field in a local area, we introduced a nanoscale metal structure into the RRAM.
First, pyramid-structured metal electrode with a sharp tip was used to achieve a tip-enhanced electric field, and the effect of the enhanced electric field on the resistive switching behaviors of the device was investigated. Based on numerical simulation and experimental results, we confirmed that pyramidal electrode with a tip radius of tens of nanometers can selectively enhance the electric field at the tip. The tip-enhanced electric field can facilitate the thermochemical reaction in transition metal oxide-based RRAMs and efficiency of charge injection and transport in organic-based RRAMs, as well as provide position selectivity during formation of conductive filament. The resulting RRAM exhibited reliable resistive switching behavior and highly improved device performance compared with conventional RRAM with planar electrode.
As another approach to enhance the electric field within the resistive switching layer, we prepared spherical nanostructures via self-assembled block copolymer (BCP)/metal compound micelles. BCP and metal precursors were dissolved in aqueous media for use as BCP/metal compound micelles. These micelles were used as complementary resistive switch (CRS) layers of the memory device and the mechanism of CRS behavior was investigated. The spherical metal nanostructures can improve the electric fields, promoting a resistive switching mechanism based on electrochemical metallization. The resulting CRS memory exhibited reliable resistive switching behavior with four distinct threshold voltages in both cycle-to-cycle and cell-to-cell tests. Also, the conduction and resistive switching mechanism are experimentally demonstrated through the the analysis of the currentโvoltage data plot and detemination of the temperature coefficient of resistance.
Overall, we pursued efficient engineering of metal nanostructures capable of manipulating electric fields for improving the operational performance and reliability of memory devices. There is no doubt that the commercialized RRAM will become popular in the near future after overcoming all the challenges of RRAM through continuous interest and research. We believe that these results will not only contribute to the significant advancement of all electronic devices, including RRAM, but will also help promote research activities in the electronic device field.๋ณธ ๋
ผ๋ฌธ์ ๋ชฉ์ ์ ๋๋
ธ ๊ตฌ์กฐ์ฒด๋ฅผ ํตํ ์ ์ ์ฅ์น ๋ด ๊ตญ๋ถ์ ์ ๊ณ ํฅ์ ํจ๊ณผ๋ฅผ ์กฐ์ฌํ๊ณ , ์ด์ ์ค์ ์ฌ์ฉ์ ์ํ ์คํ ๋ฐ ์ด๋ก ์ ๊ธฐ๋ฐ์ ์ ๊ณตํ๋ ๊ฒ์ด๋ค. ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ (resistive random access memory) ๋ ์ธ๋ถ ์ ๊ธฐ ์๊ทน์ ์ํด ์ ํญ ์ํ๋ฅผ ๋ณํ ์ํฌ ์ ์๋ ๋ฐ์ดํฐ ์ ์ฅ ์ฅ์น์ด๋ค. ๋ ์ ๊ทน ์ฌ์ด์ ์ธ๊ฐ๋ ์ ์์ฐจ์ ์ํด ์์ฑ๋ ์ ๊ธฐ์ฅ์ ์ ํญ ์ํ๋ฅผ ์ ํ์ํค๋ ๊ตฌ๋๋ ฅ์ผ๋ก์จ ์์ฉํ๋ฏ๋ก, ์ ์ ์ฅ์น ๋ด์์ ์ ๊ธฐ์ฅ์ ์ ์ดํ๋ฉด ์ฅ์น์ ์ฑ๋ฅ๊ณผ ์ ๋ขฐ์ฑ์ ํฅ์์ํฌ ์ ์๋ค. ์ฅ์น ๋ด์์ ์ ๊ธฐ์ฅ์ ์ ์ดํ๋ ค๋ ๋ง์ ๋
ธ๋ ฅ์ ํตํด ์๋นํ ์ง์ ์ด ์์์ง๋ง, ์์ ์ ์ด๊ณ ๊ท ์ผํ ์ ํญ ๋ณํ ๊ฑฐ๋์ ์ํด ์๋๋ ์์น์์ ์ ๊ธฐ์ฅ์ ์ ํ์ ์ผ๋ก ํฅ์์ํค๋ ์ผ์ ์์ง ๋์ ์ ๊ณผ์ ์ด๋ค.
๊ตฌ์กฐํ๋ ๊ธ์์ ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์ ์ ๋ชฉ์ํด์ผ๋ก์จ ์ ๊ธฐ์ฅ์ ํจ์จ์ ์ผ๋ก ์กฐ์ํ ์ ์๋ค. ๊ธ์ ๊ตฌ์กฐ์ฒด์ ๋ฐ๊ฒฝ์ด ๊ฐ์ํจ์ ๋ฐ๋ผ ์ ํ ๋ฐ๋๊ฐ ์ฆ๊ฐํ์ฌ ๊ตญ๋ถ์ ์์ญ์์ ์ ๊ธฐ์ฅ์ด ํฅ์๋๋ค. ์ด ๋
ผ๋ฌธ์์๋ ๊ธ์ ๊ตฌ์กฐ์ฒด์ ๋ฐ๊ฒฝ์ ์ต์ํํ์ฌ ๊ตญ๋ถ์ ์ผ๋ก ์ ๊ธฐ์ฅ์ ํฌ๊ฒ ํฅ์์ํค๊ธฐ ์ํด ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์ ๋๋
ธ์ค์ผ์ผ์ ๊ธ์ ๊ตฌ์กฐ์ฒด๋ฅผ ๋์
ํ์๋ค.
์ฒซ ๋ฒ์งธ๋ก, ํ ๊ฐํ (tip-enhanced) ์ ๊ธฐ์ฅ ํจ๊ณผ๋ฅผ ๋ฌ์ฑํ๊ธฐ ์ํด ๋ ์นด๋ก์ด ํ์ ๊ฐ์ง๋ ํผ๋ผ๋ฏธ๋ ๊ธ์ ๊ตฌ์กฐ์ฒด๋ฅผ ์ ๊ทน์ผ๋ก ์ฌ์ฉํ์์ผ๋ฉฐ, ๊ฐํ๋ ์ ๊ธฐ์ฅ์ด ์์์ ์ ํญ ๋ณํ ๊ฑฐ๋์ ๋ฏธ์น๋ ์ํฅ์ ์กฐ์ฌํ์๋ค. ์ ํ์์๋ชจ๋ธ๋ง๊ณผ ์คํ๊ฒฐ๊ณผ๋ฅผ ๋ฐํ์ผ๋ก, ์์ญ ๋๋
ธ ๋ฏธํฐ์ ํ ๋ฐ๊ฒฝ์ ๊ฐ์ง๋ ํผ๋ผ๋ฏธ๋ ๊ตฌ์กฐ์ฒด ์ ๊ทน์ด ํ ๋ถ๊ทผ์์ ์ ๊ธฐ์ฅ์ ๊ตญ์์ ์ผ๋ก ํฅ์์ํฌ ์ ์์์ ํ์ธํ์๋ค. ํ ๊ฐํ ์ ๊ธฐ์ฅ์ ์ ์ด ๊ธ์ ์ฐํ๋ฌผ-๊ธฐ๋ฐ ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์์ ์ดํํ (thermochemical) ๋ฐ์์ ์ด์ง์ํค๊ณ ์ ๊ธฐ-๊ธฐ๋ฐ ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์์ ์ ํ ์ฃผ์
(charge injection) ๋ฐ ์์ก (transport) ํจ์จ์ฑ์ ํฅ์์ํฌ ๋ฟ ์๋๋ผ, ์ ํ์ ์ธ ์์น์์๋ง ์ ๋์ฑ ํ๋ผ๋ฉํธ (conductive filament)๋ฅผ ํ์ฑ์ํฌ ์ ์์๋ค. ๊ทธ ๊ฒฐ๊ณผ ํผ๋ผ๋ฏธ๋ ๊ตฌ์กฐ์ฒด ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ๋ ์ข
๋์ ํํ ๊ตฌ์กฐ์ฒด ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์ ๋นํด ์์ ์ ์ธ ์ ํญ ๋ณํ ๊ฑฐ๋๊ณผ ํฅ์๋ ์ฅ์น ์ฑ๋ฅ์ ๋ณด์ฌ์ฃผ์๋ค.
์ ํญ ๋ณํ ์ธต ๋ด์ ์ ๊ธฐ์ฅ์ ํฅ์์ํค๊ธฐ ์ํ ๋ ๋ค๋ฅธ ์ ๊ทผ๋ฒ์ผ๋ก, ์๊ธฐ์กฐ๋ฆฝ (self-assembled)๋ ๋ธ๋ก๊ณต์คํฉ์ฒด (block copolymer)/๊ธ์ ๋ณตํฉ์ฒด ๋ฏธ์
(micelle)์ ์ด์ฉํ์ฌ ๊ตฌํ์ ๋๋
ธ๊ตฌ์กฐ์ฒด๋ฅผ ์์์ ์ค๊ฐ์ธต์ผ๋ก ๋์
ํ์๋ค. ๋ธ๋ก๊ณต์คํฉ์ฒด ๋ฐ ๊ธ์์ ๊ตฌ์ฒด๋ฅผ ๋ณตํฉ์ฒด ๋ฏธ์
๋ก ์ฌ์ฉํ๊ธฐ ์ํด ์ ํ์ ์ฉ๋งค์ ์ฉํด์์ผฐ๋ค. ํด๋น ๋ฏธ์
์ ๋ฉ๋ชจ๋ฆฌ ์์์ ์๋ณด์ ์ ํญ ๋ณํ (complementary resistive switch) ์ธต์ผ๋ก ์ฌ์ฉํ์์ผ๋ฉฐ, ์๋ณด์ ์ ํญ ๋ณํ ๊ฑฐ๋์ ๋ฉ์ปค๋์ฆ์ ์กฐ์ฌํ์๋ค. ๊ตฌํ์ ๊ธ์ ๋๋
ธ๊ตฌ์กฐ์ฒด๋ ์ ๊ธฐ์ฅ์ ํฅ์์์ผ ์ ๊ธฐํํ์ ๊ธ์ํ (electrochemical metallization)์ ๊ธฐ๋ฐํ ์ ํญ ๋ณํ ๋ฉ์ปค๋์ฆ์ ์ด์ง์ํฌ ์ ์์๋ค. ๊ทธ ๊ฒฐ๊ณผ ์๋ณด์ ์ ํญ ๋ณํ ๋ฉ๋ชจ๋ฆฌ๋ ์ฌ์ดํด ๋ฐ ์
๊ฐ ๋ฐ๋ณต ์ํ ๋ชจ๋์์ 4๊ฐ์ ์๊ณ ์ ์์ผ๋ก ์์ ์ ์ธ ์ ํญ ๋ณํ ๋์์ ๋ํ๋ด์๋ค. ๋ํ ์ ๋ฅ-์ ์ ์๋ฃ ํ๋กฏ (plot) ๋ถ์๊ณผ ์ ํญ์ ์จ๋ ๊ณ์ ๊ฒฐ์ ์ ํตํด ์ฅ์น์ ์ ๋ ๋ฐ ์ ํญ ๋ณํ ๋ฉ์ปค๋์ฆ์ ์คํ์ ์ผ๋ก ์
์ฆํ์๋ค.
์ ๋ฐ์ ์ผ๋ก ๋ณธ ๋
ผ๋ฌธ์์๋ ์ฅ์น ๋ด ์ ๊ธฐ์ฅ์ ์ฆํญ์ํฌ ์ ์๋ ๊ธ์ ๋๋
ธ๊ตฌ์กฐ์ฒด์ ํจ์จ์ ์ธ ์์ง๋์ด๋ง์ ํตํด ๋ฉ๋ชจ๋ฆฌ ์ฅ์น์ ์ฑ๋ฅ๊ณผ ์ ๋ขฐ์ฑ ํฅ์์ ์ถ๊ตฌํ์๋ค. ์ง์์ ์ธ ๊ด์ฌ๊ณผ ์ฐ๊ตฌ๋ฅผ ํตํด ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ์ ๋ชจ๋ ๊ณผ์ ๋ฅผ ๊ทน๋ณตํ ํ, ์์ฉํ๋ ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ๊ฐ ๊ฐ๊น์ด ๋ฏธ๋์ ๋์คํ๋ ๊ฒ์์ ๋ฏฟ์ด ์์ฌ์น ์๋๋ค. ์ฐ๋ฆฌ๋ ์ด ๊ฒฐ๊ณผ๊ฐ ์ ํญ๋ณํ๋ฉ๋ชจ๋ฆฌ๋ฅผ ํฌํจํ ๋ชจ๋ ์ ์ ์ฅ์น์ ํ๊ธฐ์ ์ธ ๋ฐ์ ์ ๊ธฐ์ฌํ ๋ฟ๋ง ์๋๋ผ ์ ์ ์ฅ์น ๋ถ์ผ์ ์ฐ๊ตฌ ํ๋์ ์ด์งํ๋ ๋ฐ์๋ ๋์์ด ๋ ๊ฒ์ด๋ผ๊ณ ๋ฏฟ๋๋ค.Chapter 1. Introduction 1
1.1. Background 1
1.1.1. Necessity of new memory devices 1
1.1.2. Resistive random access memory 2
1.2. Motivation 4
1.3. Dissertation Overview 6
1.4. References 9
Chapter 2. Tip-Enhanced Electric Field-Driven Efficient Charge Injection and Transport in Organic Material-Based Resistive Memories 19
2.1. Introduction 21
2.2. Experimental 24
2.3. Results and Discussion 27
2.4. Conclusions 37
2.5. References 38
Chapter 3. Facilitation of the Thermochemical Mechanism in NiO-Based Resistive Switching Memories via Tip-Enhanced Electric Fields 52
3.1. Introduction 54
3.2. Experimental 57
3.3. Results and Discussion 60
3.4. Conclusions 66
3.5. References 67
Chapter 4. Facile Achievement of Complementary Resistive Switching Behaviors via Self-Assembled Block Copolymer Micelles 82
4.1. Introduction 83
4.2. Experimental 86
4.3. Results and Discussion 89
4.4. Conclusions 96
4.5. References 97
Chapter 5. Conclusion 109
Abstract in Korean 112๋ฐ
Applicability of Well-Established Memristive Models for Simulations of Resistive Switching Devices
Highly accurate and predictive models of resistive switching devices are
needed to enable future memory and logic design. Widely used is the memristive
modeling approach considering resistive switches as dynamical systems. Here we
introduce three evaluation criteria for memristor models, checking for
plausibility of the I-V characteristics, the presence of a sufficiently
non-linearity of the switching kinetics, and the feasibility of predicting the
behavior of two anti-serially connected devices correctly. We analyzed two
classes of models: the first class comprises common linear memristor models and
the second class widely used non-linear memristive models. The linear memristor
models are based on Strukovs initial memristor model extended by different
window functions, while the non-linear models include Picketts physics-based
memristor model and models derived thereof. This study reveals lacking
predictivity of the first class of models, independent of the applied window
function. Only the physics-based model is able to fulfill most of the basic
evaluation criteria.Comment: 9 pages; accepted for IEEE TCAS-
Recommended from our members
MADX: Memristors-As-Drivers for Crossbar logic
Memristors have the potential to not only replace conventional memory, but also to open up new design possibilities because they store 1s and 0s as resistances rather than voltages. A memristor architecture that has attracted interest for its versatility and ease of integration with existing CMOS technologies is the crossbar array. In this paper, I modify the MAD scheme to create the MADX scheme for performing basic logic operations within a crossbar array. Then, I compare this scheme against two of the most well-known schemes, MAGIC and IMPLY. In the case study of a full-adder, both a one-bit and an 8-bit version, the MADX scheme achieves lower latency and substantially lower area requirements than both MAGIC and IMPLY. This is because it is more flexible about storing output values than either, does not destroy input values unlike IMPLY, and has more basic operations. In particular, it has XOR, which neither IMPLY nor MAGIC have and is useful for additionPlan II Honors Progra
Experimental study of artificial neural networks using a digital memristor simulator
ยฉ 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.This paper presents a fully digital implementation of a memristor hardware simulator, as the core of an emulator, based on a behavioral model of voltage-controlled threshold-type bipolar memristors. Compared to other analog solutions, the proposed digital design is compact, easily reconfigurable, demonstrates very good matching with the mathematical model on which it is based, and complies with all the required features for memristor emulators. We validated its functionality using Altera Quartus II and ModelSim tools targeting low-cost yet powerful field programmable gate array (FPGA) families. We tested its suitability for complex memristive circuits as well as its synapse functioning in artificial neural networks (ANNs), implementing examples of associative memory and unsupervised learning of spatio-temporal correlations in parallel input streams using a simplified STDP. We provide the full circuit schematics of all our digital circuit designs and comment on the required hardware resources and their scaling trends, thus presenting a design framework for applications based on our hardware simulator.Peer ReviewedPostprint (author's final draft
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