88 research outputs found

    A Complementary Resistive Switch-based Crossbar Array Adder

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    Redox-based resistive switching devices (ReRAM) are an emerging class of non-volatile storage elements suited for nanoscale memory applications. In terms of logic operations, ReRAM devices were suggested to be used as programmable interconnects, large-scale look-up tables or for sequential logic operations. However, without additional selector devices these approaches are not suited for use in large scale nanocrossbar memory arrays, which is the preferred architecture for ReRAM devices due to the minimum area consumption. To overcome this issue for the sequential logic approach, we recently introduced a novel concept, which is suited for passive crossbar arrays using complementary resistive switches (CRSs). CRS cells offer two high resistive storage states, and thus, parasitic sneak currents are efficiently avoided. However, until now the CRS-based logic-in-memory approach was only shown to be able to perform basic Boolean logic operations using a single CRS cell. In this paper, we introduce two multi-bit adder schemes using the CRS-based logic-in-memory approach. We proof the concepts by means of SPICE simulations using a dynamical memristive device model of a ReRAM cell. Finally, we show the advantages of our novel adder concept in terms of step count and number of devices in comparison to a recently published adder approach, which applies the conventional ReRAM-based sequential logic concept introduced by Borghetti et al.Comment: 12 pages, accepted for IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS), issue on Computing in Emerging Technologie

    Asymptotic Stability and Asymptotic Synchronization of Memristive Regulatory-Type Networks

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    Memristive regulatory-type networks are recently emerging as a potential successor to traditional complementary resistive switch models. Qualitative analysis is useful in designing and synthesizing memristive regulatory-type networks. In this paper, we propose several succinct criteria to ensure global asymptotic stability and global asymptotic synchronization for a general class of memristive regulatory-type networks. The experimental simulations also show the performance of theoretical results

    ์ „์ž ์žฅ์น˜ ๋‚ด ๊ตญ๋ถ€์  ์ „๊ณ„ ํ–ฅ์ƒ์„ ์œ„ํ•œ ๋‚˜๋…ธ ๊ตฌ์กฐ์ฒด

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    ํ•™์œ„๋…ผ๋ฌธ(๋ฐ•์‚ฌ) -- ์„œ์šธ๋Œ€ํ•™๊ต๋Œ€ํ•™์› : ๊ณต๊ณผ๋Œ€ํ•™ ํ™”ํ•™์ƒ๋ฌผ๊ณตํ•™๋ถ€, 2021.8. ์กฐ์žฌ์˜.The goal of this dissertation is to investigate effect of nanostructures for local electric field enhancement in electronic devices and to provide experimental and theoretical bases for their practical use. Resistive random access memory (RRAM) is a data storage device that can be modulated its resistance states by external electrical stimuli. The electric field generated by the applied potential difference between the two electrodes acts as the driving force to switch the resistance states, so controlling the electric field within the device can lead to improved operational performance and reliability of the device. Even though considerable progress has been made through significant efforts to control the electric field within the device, selectively enhancing the electric field in the intended position for stable and uniform resistive switching behavior is still challenging. Engineered metal structures in the RRAM can efficiently manipulate the electric field. As the radius of the metal structures decreases, the charge density increases, generating electric field enhancements in confined region. To minimize the radius of the metal structure and thus to greatly increase the electric field in a local area, we introduced a nanoscale metal structure into the RRAM. First, pyramid-structured metal electrode with a sharp tip was used to achieve a tip-enhanced electric field, and the effect of the enhanced electric field on the resistive switching behaviors of the device was investigated. Based on numerical simulation and experimental results, we confirmed that pyramidal electrode with a tip radius of tens of nanometers can selectively enhance the electric field at the tip. The tip-enhanced electric field can facilitate the thermochemical reaction in transition metal oxide-based RRAMs and efficiency of charge injection and transport in organic-based RRAMs, as well as provide position selectivity during formation of conductive filament. The resulting RRAM exhibited reliable resistive switching behavior and highly improved device performance compared with conventional RRAM with planar electrode. As another approach to enhance the electric field within the resistive switching layer, we prepared spherical nanostructures via self-assembled block copolymer (BCP)/metal compound micelles. BCP and metal precursors were dissolved in aqueous media for use as BCP/metal compound micelles. These micelles were used as complementary resistive switch (CRS) layers of the memory device and the mechanism of CRS behavior was investigated. The spherical metal nanostructures can improve the electric fields, promoting a resistive switching mechanism based on electrochemical metallization. The resulting CRS memory exhibited reliable resistive switching behavior with four distinct threshold voltages in both cycle-to-cycle and cell-to-cell tests. Also, the conduction and resistive switching mechanism are experimentally demonstrated through the the analysis of the currentโ€“voltage data plot and detemination of the temperature coefficient of resistance. Overall, we pursued efficient engineering of metal nanostructures capable of manipulating electric fields for improving the operational performance and reliability of memory devices. There is no doubt that the commercialized RRAM will become popular in the near future after overcoming all the challenges of RRAM through continuous interest and research. We believe that these results will not only contribute to the significant advancement of all electronic devices, including RRAM, but will also help promote research activities in the electronic device field.๋ณธ ๋…ผ๋ฌธ์˜ ๋ชฉ์ ์€ ๋‚˜๋…ธ ๊ตฌ์กฐ์ฒด๋ฅผ ํ†ตํ•œ ์ „์ž ์žฅ์น˜ ๋‚ด ๊ตญ๋ถ€์  ์ „๊ณ„ ํ–ฅ์ƒ ํšจ๊ณผ๋ฅผ ์กฐ์‚ฌํ•˜๊ณ , ์ด์˜ ์‹ค์ œ ์‚ฌ์šฉ์„ ์œ„ํ•œ ์‹คํ—˜ ๋ฐ ์ด๋ก ์  ๊ธฐ๋ฐ˜์„ ์ œ๊ณตํ•˜๋Š” ๊ฒƒ์ด๋‹ค. ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ (resistive random access memory) ๋Š” ์™ธ๋ถ€ ์ „๊ธฐ ์ž๊ทน์— ์˜ํ•ด ์ €ํ•ญ ์ƒํƒœ๋ฅผ ๋ณ€ํ™” ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋Š” ๋ฐ์ดํ„ฐ ์ €์žฅ ์žฅ์น˜์ด๋‹ค. ๋‘ ์ „๊ทน ์‚ฌ์ด์— ์ธ๊ฐ€๋œ ์ „์œ„์ฐจ์— ์˜ํ•ด ์ƒ์„ฑ๋œ ์ „๊ธฐ์žฅ์€ ์ €ํ•ญ ์ƒํƒœ๋ฅผ ์ „ํ™˜์‹œํ‚ค๋Š” ๊ตฌ๋™๋ ฅ์œผ๋กœ์จ ์ž‘์šฉํ•˜๋ฏ€๋กœ, ์ „์ž ์žฅ์น˜ ๋‚ด์—์„œ ์ „๊ธฐ์žฅ์„ ์ œ์–ดํ•˜๋ฉด ์žฅ์น˜์˜ ์„ฑ๋Šฅ๊ณผ ์‹ ๋ขฐ์„ฑ์„ ํ–ฅ์ƒ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋‹ค. ์žฅ์น˜ ๋‚ด์—์„œ ์ „๊ธฐ์žฅ์„ ์ œ์–ดํ•˜๋ ค๋Š” ๋งŽ์€ ๋…ธ๋ ฅ์„ ํ†ตํ•ด ์ƒ๋‹นํ•œ ์ง„์ „์ด ์žˆ์—ˆ์ง€๋งŒ, ์•ˆ์ •์ ์ด๊ณ  ๊ท ์ผํ•œ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์„ ์œ„ํ•ด ์˜๋„๋œ ์œ„์น˜์—์„œ ์ „๊ธฐ์žฅ์„ ์„ ํƒ์ ์œผ๋กœ ํ–ฅ์ƒ์‹œํ‚ค๋Š” ์ผ์€ ์•„์ง ๋„์ „์  ๊ณผ์ œ์ด๋‹ค. ๊ตฌ์กฐํ™”๋œ ๊ธˆ์†์„ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ์ ‘๋ชฉ์‹œํ‚ด์œผ๋กœ์จ ์ „๊ธฐ์žฅ์„ ํšจ์œจ์ ์œผ๋กœ ์กฐ์ž‘ํ•  ์ˆ˜ ์žˆ๋‹ค. ๊ธˆ์† ๊ตฌ์กฐ์ฒด์˜ ๋ฐ˜๊ฒฝ์ด ๊ฐ์†Œํ•จ์— ๋”ฐ๋ผ ์ „ํ•˜ ๋ฐ€๋„๊ฐ€ ์ฆ๊ฐ€ํ•˜์—ฌ ๊ตญ๋ถ€์  ์˜์—ญ์—์„œ ์ „๊ธฐ์žฅ์ด ํ–ฅ์ƒ๋œ๋‹ค. ์ด ๋…ผ๋ฌธ์—์„œ๋Š” ๊ธˆ์† ๊ตฌ์กฐ์ฒด์˜ ๋ฐ˜๊ฒฝ์„ ์ตœ์†Œํ™”ํ•˜์—ฌ ๊ตญ๋ถ€์ ์œผ๋กœ ์ „๊ธฐ์žฅ์„ ํฌ๊ฒŒ ํ–ฅ์ƒ์‹œํ‚ค๊ธฐ ์œ„ํ•ด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ๋‚˜๋…ธ์Šค์ผ€์ผ์˜ ๊ธˆ์† ๊ตฌ์กฐ์ฒด๋ฅผ ๋„์ž…ํ•˜์˜€๋‹ค. ์ฒซ ๋ฒˆ์งธ๋กœ, ํŒ ๊ฐ•ํ™” (tip-enhanced) ์ „๊ธฐ์žฅ ํšจ๊ณผ๋ฅผ ๋‹ฌ์„ฑํ•˜๊ธฐ ์œ„ํ•ด ๋‚ ์นด๋กœ์šด ํŒ์„ ๊ฐ€์ง€๋Š” ํ”ผ๋ผ๋ฏธ๋“œ ๊ธˆ์† ๊ตฌ์กฐ์ฒด๋ฅผ ์ „๊ทน์œผ๋กœ ์‚ฌ์šฉํ•˜์˜€์œผ๋ฉฐ, ๊ฐ•ํ™”๋œ ์ „๊ธฐ์žฅ์ด ์†Œ์ž์˜ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์— ๋ฏธ์น˜๋Š” ์˜ํ–ฅ์„ ์กฐ์‚ฌํ•˜์˜€๋‹ค. ์œ ํ•œ์š”์†Œ๋ชจ๋ธ๋ง๊ณผ ์‹คํ—˜๊ฒฐ๊ณผ๋ฅผ ๋ฐ”ํƒ•์œผ๋กœ, ์ˆ˜์‹ญ ๋‚˜๋…ธ ๋ฏธํ„ฐ์˜ ํŒ ๋ฐ˜๊ฒฝ์„ ๊ฐ€์ง€๋Š” ํ”ผ๋ผ๋ฏธ๋“œ ๊ตฌ์กฐ์ฒด ์ „๊ทน์ด ํŒ ๋ถ€๊ทผ์—์„œ ์ „๊ธฐ์žฅ์„ ๊ตญ์†Œ์ ์œผ๋กœ ํ–ฅ์ƒ์‹œํ‚ฌ ์ˆ˜ ์žˆ์Œ์„ ํ™•์ธํ•˜์˜€๋‹ค. ํŒ ๊ฐ•ํ™” ์ „๊ธฐ์žฅ์€ ์ „์ด ๊ธˆ์† ์‚ฐํ™”๋ฌผ-๊ธฐ๋ฐ˜ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์—์„œ ์—ดํ™”ํ•™ (thermochemical) ๋ฐ˜์‘์„ ์ด‰์ง„์‹œํ‚ค๊ณ  ์œ ๊ธฐ-๊ธฐ๋ฐ˜ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์—์„œ ์ „ํ•˜ ์ฃผ์ž… (charge injection) ๋ฐ ์ˆ˜์†ก (transport) ํšจ์œจ์„ฑ์„ ํ–ฅ์ƒ์‹œํ‚ฌ ๋ฟ ์•„๋‹ˆ๋ผ, ์„ ํƒ์ ์ธ ์œ„์น˜์—์„œ๋งŒ ์ „๋„์„ฑ ํ•„๋ผ๋ฉ˜ํŠธ (conductive filament)๋ฅผ ํ˜•์„ฑ์‹œํ‚ฌ ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ํ”ผ๋ผ๋ฏธ๋“œ ๊ตฌ์กฐ์ฒด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๋Š” ์ข…๋ž˜์˜ ํ‰ํŒ ๊ตฌ์กฐ์ฒด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ๋น„ํ•ด ์•ˆ์ •์ ์ธ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™๊ณผ ํ–ฅ์ƒ๋œ ์žฅ์น˜ ์„ฑ๋Šฅ์„ ๋ณด์—ฌ์ฃผ์—ˆ๋‹ค. ์ €ํ•ญ ๋ณ€ํ™” ์ธต ๋‚ด์˜ ์ „๊ธฐ์žฅ์„ ํ–ฅ์ƒ์‹œํ‚ค๊ธฐ ์œ„ํ•œ ๋˜ ๋‹ค๋ฅธ ์ ‘๊ทผ๋ฒ•์œผ๋กœ, ์ž๊ธฐ์กฐ๋ฆฝ (self-assembled)๋œ ๋ธ”๋ก๊ณต์ค‘ํ•ฉ์ฒด (block copolymer)/๊ธˆ์† ๋ณตํ•ฉ์ฒด ๋ฏธ์…€ (micelle)์„ ์ด์šฉํ•˜์—ฌ ๊ตฌํ˜•์˜ ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด๋ฅผ ์†Œ์ž์˜ ์ค‘๊ฐ„์ธต์œผ๋กœ ๋„์ž…ํ•˜์˜€๋‹ค. ๋ธ”๋ก๊ณต์ค‘ํ•ฉ์ฒด ๋ฐ ๊ธˆ์†์ „๊ตฌ์ฒด๋ฅผ ๋ณตํ•ฉ์ฒด ๋ฏธ์…€๋กœ ์‚ฌ์šฉํ•˜๊ธฐ ์œ„ํ•ด ์„ ํƒ์  ์šฉ๋งค์— ์šฉํ•ด์‹œ์ผฐ๋‹ค. ํ•ด๋‹น ๋ฏธ์…€์„ ๋ฉ”๋ชจ๋ฆฌ ์†Œ์ž์˜ ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” (complementary resistive switch) ์ธต์œผ๋กœ ์‚ฌ์šฉํ•˜์˜€์œผ๋ฉฐ, ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์˜ ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์กฐ์‚ฌํ•˜์˜€๋‹ค. ๊ตฌํ˜•์˜ ๊ธˆ์† ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด๋Š” ์ „๊ธฐ์žฅ์„ ํ–ฅ์ƒ์‹œ์ผœ ์ „๊ธฐํ™”ํ•™์  ๊ธˆ์†ํ™” (electrochemical metallization)์— ๊ธฐ๋ฐ˜ํ•œ ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์ด‰์ง„์‹œํ‚ฌ ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”๋ชจ๋ฆฌ๋Š” ์‚ฌ์ดํด ๋ฐ ์…€๊ฐ„ ๋ฐ˜๋ณต ์‹œํ—˜ ๋ชจ๋‘์—์„œ 4๊ฐœ์˜ ์ž„๊ณ„ ์ „์••์œผ๋กœ ์•ˆ์ •์ ์ธ ์ €ํ•ญ ๋ณ€ํ™” ๋™์ž‘์„ ๋‚˜ํƒ€๋‚ด์—ˆ๋‹ค. ๋˜ํ•œ ์ „๋ฅ˜-์ „์•• ์ž๋ฃŒ ํ”Œ๋กฏ (plot) ๋ถ„์„๊ณผ ์ €ํ•ญ์˜ ์˜จ๋„ ๊ณ„์ˆ˜ ๊ฒฐ์ •์„ ํ†ตํ•ด ์žฅ์น˜์˜ ์ „๋„ ๋ฐ ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์‹คํ—˜์ ์œผ๋กœ ์ž…์ฆํ•˜์˜€๋‹ค. ์ „๋ฐ˜์ ์œผ๋กœ ๋ณธ ๋…ผ๋ฌธ์—์„œ๋Š” ์žฅ์น˜ ๋‚ด ์ „๊ธฐ์žฅ์„ ์ฆํญ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋Š” ๊ธˆ์† ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด์˜ ํšจ์œจ์ ์ธ ์—”์ง€๋‹ˆ์–ด๋ง์„ ํ†ตํ•ด ๋ฉ”๋ชจ๋ฆฌ ์žฅ์น˜์˜ ์„ฑ๋Šฅ๊ณผ ์‹ ๋ขฐ์„ฑ ํ–ฅ์ƒ์„ ์ถ”๊ตฌํ•˜์˜€๋‹ค. ์ง€์†์ ์ธ ๊ด€์‹ฌ๊ณผ ์—ฐ๊ตฌ๋ฅผ ํ†ตํ•ด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์˜ ๋ชจ๋“  ๊ณผ์ œ๋ฅผ ๊ทน๋ณตํ•œ ํ›„, ์ƒ์šฉํ™”๋œ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๊ฐ€ ๊ฐ€๊นŒ์šด ๋ฏธ๋ž˜์— ๋Œ€์ค‘ํ™”๋  ๊ฒƒ์ž„์„ ๋ฏฟ์–ด ์˜์‹ฌ์น˜ ์•Š๋Š”๋‹ค. ์šฐ๋ฆฌ๋Š” ์ด ๊ฒฐ๊ณผ๊ฐ€ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๋ฅผ ํฌํ•จํ•œ ๋ชจ๋“  ์ „์ž ์žฅ์น˜์˜ ํš๊ธฐ์ ์ธ ๋ฐœ์ „์— ๊ธฐ์—ฌํ•  ๋ฟ๋งŒ ์•„๋‹ˆ๋ผ ์ „์ž ์žฅ์น˜ ๋ถ„์•ผ์˜ ์—ฐ๊ตฌ ํ™œ๋™์„ ์ด‰์ง„ํ•˜๋Š” ๋ฐ์—๋„ ๋„์›€์ด ๋  ๊ฒƒ์ด๋ผ๊ณ  ๋ฏฟ๋Š”๋‹ค.Chapter 1. Introduction 1 1.1. Background 1 1.1.1. Necessity of new memory devices 1 1.1.2. Resistive random access memory 2 1.2. Motivation 4 1.3. Dissertation Overview 6 1.4. References 9 Chapter 2. Tip-Enhanced Electric Field-Driven Efficient Charge Injection and Transport in Organic Material-Based Resistive Memories 19 2.1. Introduction 21 2.2. Experimental 24 2.3. Results and Discussion 27 2.4. Conclusions 37 2.5. References 38 Chapter 3. Facilitation of the Thermochemical Mechanism in NiO-Based Resistive Switching Memories via Tip-Enhanced Electric Fields 52 3.1. Introduction 54 3.2. Experimental 57 3.3. Results and Discussion 60 3.4. Conclusions 66 3.5. References 67 Chapter 4. Facile Achievement of Complementary Resistive Switching Behaviors via Self-Assembled Block Copolymer Micelles 82 4.1. Introduction 83 4.2. Experimental 86 4.3. Results and Discussion 89 4.4. Conclusions 96 4.5. References 97 Chapter 5. Conclusion 109 Abstract in Korean 112๋ฐ•

    Applicability of Well-Established Memristive Models for Simulations of Resistive Switching Devices

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    Highly accurate and predictive models of resistive switching devices are needed to enable future memory and logic design. Widely used is the memristive modeling approach considering resistive switches as dynamical systems. Here we introduce three evaluation criteria for memristor models, checking for plausibility of the I-V characteristics, the presence of a sufficiently non-linearity of the switching kinetics, and the feasibility of predicting the behavior of two anti-serially connected devices correctly. We analyzed two classes of models: the first class comprises common linear memristor models and the second class widely used non-linear memristive models. The linear memristor models are based on Strukovs initial memristor model extended by different window functions, while the non-linear models include Picketts physics-based memristor model and models derived thereof. This study reveals lacking predictivity of the first class of models, independent of the applied window function. Only the physics-based model is able to fulfill most of the basic evaluation criteria.Comment: 9 pages; accepted for IEEE TCAS-

    Experimental study of artificial neural networks using a digital memristor simulator

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    ยฉ 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.This paper presents a fully digital implementation of a memristor hardware simulator, as the core of an emulator, based on a behavioral model of voltage-controlled threshold-type bipolar memristors. Compared to other analog solutions, the proposed digital design is compact, easily reconfigurable, demonstrates very good matching with the mathematical model on which it is based, and complies with all the required features for memristor emulators. We validated its functionality using Altera Quartus II and ModelSim tools targeting low-cost yet powerful field programmable gate array (FPGA) families. We tested its suitability for complex memristive circuits as well as its synapse functioning in artificial neural networks (ANNs), implementing examples of associative memory and unsupervised learning of spatio-temporal correlations in parallel input streams using a simplified STDP. We provide the full circuit schematics of all our digital circuit designs and comment on the required hardware resources and their scaling trends, thus presenting a design framework for applications based on our hardware simulator.Peer ReviewedPostprint (author's final draft
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