A survey of carbon nanotube interconnects for energy efficient integrated circuits

This article is a review of the state-of-art carbon nanotube interconnects for Silicon application with respect to the recent literature. Amongst all the research on carbon nanotube interconnects, those discussed here cover 1) challenges with current copper interconnects, 2) process & growth of carbon nanotube interconnects compatible with back-end-of-line integration, and 3) modeling and simulation for circuit-level benchmarking and performance prediction. The focus is on the evolution of carbon nanotube interconnects from the process, theoretical modeling, and experimental characterization to on-chip interconnect applications. We provide an overview of the current advancements on carbon nanotube interconnects and also regarding the prospects for designing energy efficient integrated circuits. Each selected category is presented in an accessible manner aiming to serve as a survey and informative cornerstone on carbon nanotube interconnects relevant to students and scientists belonging to a range of fields from physics, processing to circuit design

Electrical and Structural Analysis of CNT-Metal Contacts in Via Interconnects

Vertically aligned carbon nanotubes grown by plasmaenhanced chemical vapor deposition offer a potentially suitable material for via interconnects in next-generation integrated circuits. Key performance-limiting factors include high contact resistance and low carbon nanotube packing density, which fall short of meeting the requirements delineated in the ITRS roadmap for interconnects. For individual carbon nanotube s, contact resistance is a major performance hurdle since it is the dominant component of carbon nanotube interconnect resistance, even in the case of vertically aligned carbon nanotube arrays. In this study, we correlate the carbon nanotube-metal interface nanostructure to their electrical properties in order to elucidate growth parameters that can lead to high density and low contact resistance and resistivity

Progress on Carbon Nanotube BEOL Interconnects

This article is a review of the current progress and results obtained in the European H2020 CONNECT project. Amongst all the research on carbon nanotube interconnects, those discussed here cover 1) process & growth of carbon nanotube interconnects compatible with back-end-of-line integration, 2) modeling and simulation from atomistic to circuit-level bench-marking and performance prediction, and 3) characterization and electrical measurements. We provide an overview of the current advancements on carbon nanotube interconnects and also regarding the prospects for designing energy efficient integrated circuits. Each selected category is presented in an accessible manner aiming to serve as a review and informative cornerstone on carbon nanotube interconnects

Compact and accurate models of large single-wall carbon-nanotube interconnects

Single-wall carbon nanotubes (SWCNTs) have been proposed for very large scale integration interconnect applications and their modeling is carried out using the multiconductor transmission line (MTL) formulation. Their time-domain analysis has some simulation issues related to the high number of SWCNTs within each bundle, which results in a highly complex model and loss of accuracy in the case of long interconnects. In recent years, several techniques have been proposed to reduce the complexity of the model whose accuracy decreases as the interconnection length increases. This paper presents a rigorous new technique to generate accurate reduced-order models of large SWCNT interconnects. The frequency response of the MTL is computed by using the spectral form of the dyadic Green's function of the 1-D propagation problem and the model complexity is reduced using rational-model identification techniques. The proposed approach is validated by numerical results involving hundreds of SWCNTs, which confirm its capability of reducing the complexity of the model, while preserving accuracy over a wide frequency range

Atoms-to-Circuits Simulation Investigation of CNT Interconnects for Next Generation CMOS Technology

In this study, we suggest a hierarchical model to investigate the electrical performance of carbon nanotube (CNT)- based interconnects. From the density functional theory, we have obtained important physical parameters, which are used in TCAD simulators to obtain the RC netlists. We then use these RC netlists for the circuit-level simulations to optimize interconnect design in VLSI. Also, we have compared various CNT-based interconnects such as single-walled CNTs, multi-walled CNTs, doped CNTs, and Cu-CNT composites in terms of conductivity, ring oscillator delay, and propagation time delay

Printable stretchable interconnects

This article presents recent progress and a comprehensive overview of stretchable interconnects based on printable nanocomposites. Nanocomposite-based inks for printed stretchable interconnects have been categorized according to dispersed filler materials. They comprise of carbon-based fillers and metal-based fillers. Benefits in terms of excellent electrical performance and elastic properties make nanocomposites the ideal candidates for stretchable interconnect applications. Deeper analysis of nanocomposites-based stretchable interconnects includes the correlation between the size of fillers, percolation ratio, maximum electrical conductivity and mechanical elasticity. The key trends in the field have been highlighted using curve fitting methods on large data collected from the literature. Furthermore, a wide variety of applications for stretchable interconnects are presented

Tuning Electrical Conductivity of CNT-PDMS Nanocomposites for Flexible Electronic Applications

This paper presents a study into the electrical conductivity of multi-wall carbon nanotube-polydimethylsiloxane (MWNT-PDMS) nanocomposite and their dependence on the filler concentration. It is observed that the electrical conductivity of the composites can be tailored by altering the filler concentration. Accordingly, the nanocomposites with filler weight ratio ranging from 1% to 8% were prepared and tested. Finally, the significance of results presented here for flexible pressure sensors and stretchable interconnects for electronic skin applications have been discussed