Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

High-speed Design Of High-resolution Dacs

Tez (Doktora) -- İstanbul Teknik Üniversitesi, Fen Bilimleri Enstitüsü, 2009Thesis (PhD) -- İstanbul Technical University, Institute of Science and Technology, 2009Bu çalışmada, yüksek çözünürlüklü akım yönlendirmeli sayısal-analog dönüştürücülerin (SAD) hızlı tasarımını sağlayan yöntemler incelenmekte ve yeni yaklaşımlar önerilmektedir. Veri dönüştürücüler analog ve sayısal dünyalar arasında bir köprü oluşturdukları için hızlı ve verimli bir şekilde gerçekleştirilmeleri yüksek derecede arzu edilmektedir. Yüksek hızlı (birkaç 100MHz) ve yüksek çözünürlüklü (10 bitten fazla) SAD için artan rağbet, akım yönlendirmeli SADların kullanımını zorunlu kılmaktadır. Yüksek performanslı akım yönlendirmeli SADların tasarımında ve gerçekleştirmesinde kesimleme (segmentation) yöntemi kullanılmaktadır. Bu yöntem, yüksek hız ve yüksek çözünürlük gerektiren uygulamaların çoğunda avantajlı olmasına rağmen uzun süreli tasarım zamanı, karmaşıklık ve yüksek maliyet yüzünden değer kaybetmektedir. Böylece, bazı uygulamalar için zaman ve maliyet açısından bu yöntemin kullanılması hızlı ve verimli olmayabilir. Bu problemlerin üstesinden gelmek için yüksek çözünürlüklü SADların yüksek hızlı tasarımını sağlayan hızlı ve verimli yöntemler dikkate alınmaktadır. Uygun bir tasarım yöntemi ve yeni bir yapı önerilmektedir. Akım yönlendirmeli SADlar gibi karmaşık karma yapılı sistemlerin tasarımı için davranışsal modelin oluşturulması zorunlu olmaktadır. Bu amaçla gerçekleştirilen modellerin çoğu sistemin davranışı hakkında istenilen eksiksiz manzarayı vermemektedir. Bu yüzden, transistor seviyesindeki tasarıma geçmeden önce, tasarımı hızlandırabilen ve sistemin davranışını doğru bir şekilde yansıtabilen modeller geliştirilmektedir. SIMULINK® kullanılarak bir davranışsal model kurulmakta ve modelin performansı benzetimlerle sınanmaktadır. Sonuç olarak, uygulanan yöntemin verimliliğini ve davranışsal modelin doğruluğunu sınamak için 0.35µm CMOS proses teknolojisi için tasarlanan bir 12 bitlik melez akım yönlendirmeli SAD kullanılmaktadır. Yapı bloklarında yapılan iyileştirmeler ve kullanılan farklı yöntemler, gerçekleştirilen SAD’ın serimindeki ilgili kısımlarda yer almaktadırlar. CADENCE Geleneksel Tümleşik Devre Tasarım Araçları kullanılarak serim sonrası benzetimleri yapılmakta ve SAD’ın performans karakteristikleri incelenmektedir.In this thesis, different problems related to the design speed-up of high-resolution current-steering digital-to-analog converters (DAC) are addressed and novel solutions are proposed. Since data converters form the bridge between the analog and digital world their efficient implementation is highly desirable. The increase in demand for high-speed (several 100MHz) and high-resolution (higher than 10-bit) DAC, forces the use of current-steering DACs. Segmentation method is used for the design and the implementation of high performance current-steering DACs. Although this methodology is advantageous in most of the applications requiring high-speed and high-resolution, it suffers from the prolonged design time, complexity and high cost. Thus, the use of this methodology for some applications is not efficient concerning the time and the cost. To overcome these problems efficient methodologies for the high-speed design of high-resolution DACs are considered. A proper design methodology and a novel architecture are introduced. Behavioral modeling is necessary for the design of complex mixed-mode systems like current-steering DACs. Most of the models constructed can not give a complete view of the system’s behavior. For this reason, models that speed up the design and reflect accurately the behavior of the system prior to transistor level implementation are developed. A SIMULINK® based behavioral model is developed and verified through simulations. To conclude, the efficiency of the applied methodology and the accuracy of the behavioral model are validated through the implementation of a 12-bit hybrid current-steering DAC in a 0.35µm CMOS process technology. The improvements in the building blocks and the different approaches used are reflected in the respective parts of the layout of the implemented DAC. Post-layout simulations are obtained using CADENCE Custom IC Design Tools and the performance metrics of the DAC are investigated.DoktoraPh

Design of a low power switched-capacitor pipeline analog-to-digital converter

An Analog to Digital Converter (ADC) is a circuit which converts an analog signal into digital signal. Real world is analog, and the data processed by the computer or by other signal processing systems is digital. Therefore, the need for ADCs is obvious. In this thesis, several novel designs used to improve ADCs operation speed and reduce ADC power consumption are proposed. First, a high speed switched source follower (SSF) sample and hold amplifier without feedthrough penalty is implemented and simulated. The SSF sample and hold amplifier can achieve 6 Bit resolution with sampling rate at 10Gs/s. Second, a novel rail-to-rail time domain comparator used in successive approximation register ADC (SAR ADC) is implemented and simulated. The simulation results show that the proposed SAR ADC can only consume 1.3 muW with a 0.7 V power supply. Finally, a prototype pipeline ADC is implemented and fabricated in an IBM 90nm CMOS process. The proposed design is validated using measurement on a fabricated silicon IC, and the proposed 10-bit ADC achieves a peak signal-to-noise- and-distortion-ratio (SNDR) of 47 dB. This SNDR translates to a figure of merit (FOM) of 2.6N/conversion-step with a 1.2 V power supply

Energy Efficient Pipeline ADCs Using Ring Amplifiers

Pipeline ADCs require accurate amplification. Traditionally, an operational transconductance amplifier (OTA) configured as a switched-capacitor (SC) amplifier performs such amplification. However, traditional OTAs limit the power efficiency of ADCs since they require high quiescent current for slewing and bandwidth. In addition, it is difficult to design low-voltage OTAs in modern, scaled CMOS. The ring amplifier is an energy efficient and high output swing alternative to an OTA for SC circuits which is basically a three-stage inverter amplifier stabilized in a feedback configuration. However, the conventional ring amplifier requires external biases, which makes the ring amplifier less practical when we consider process, supply voltage, and temperature (PVT) variation. In this dissertation, three types of innovative ring amplifiers are presented and verified with state-of-the-art energy efficient pipeline ADCs. These new ring amplifiers overcome the limitations of the conventional ring amplifier and further improve energy efficiency. The first topic of this dissertation is a self-biased ring amplifier that makes the ring amplifier more practical and power efficient, while maintaining the benefits of efficient slew-based charging and an almost rail-to-rail output swing. In addition, the ring amplifiers are also used as comparators in the 1.5b sub-ADCs by utilizing the unique characteristics of the ring amplifier. This removes the need for dedicated comparators in sub-ADCs, thus further reducing the power consumption of the ADC. The prototype 10.5b 100 MS/s comparator-less pipeline ADC with the self-biased ring amplifiers has measured SNDR, SNR and SFDR of 56.6 dB (9.11b), 57.5 dB and 64.7 dB, respectively, and consumes 2.46 mW, which results in Walden Figure-of-Merit (FoM) of 46.1 fJ/ conversion∙step. The second topic is a fully-differential ring amplifier, which solves the problems of single-ended ring amplifiers while maintaining the benefits of the single-ended ring amplifiers. This differential ring-amplifier is applied in a 13b 50 MS/s SAR-assisted pipeline ADC. Furthermore, an improved capacitive DAC switching method for the first stage SAR reduces the DAC linearity errors and switching energy. The prototype ADC achieves measured SNDR, SNR and SFDR of 70.9 dB (11.5b), 71.3 dB and 84.6 dB, respectively, and consumes 1 mW. This measured performance is equivalent to Walden and Schreier FoMs of 6.9 fJ/conversion∙step and 174.9 dB, respectively. Finally, a four-stage fully-differential ring amplifier improves the small-signal gain to over 90 dB without compromising speed. In addition, a new auto-zero noise filtering method reduces noise without consuming additional power. This is more area efficient than the conventional auto-zero noise folding reduction technique. A systematic mismatch free SAR CDAC layout method is also presented. The prototype 15b 100 MS/s calibration-free SAR-assisted pipeline ADC using the four-stage ring amplifier achieves 73.2 dB SNDR (11.9b) and 90.4 dB SFDR with a 1.1 V supply. It consumes 2.3 mW resulting in Schreier FoM of 176.6 dB.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/138759/1/yonglim_1.pd

Circuits and algorithms for pipelined ADCs in scaled CMOS technologies

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.MIT Barker Engineering Library copy: printed in pages.Also issued printed in pages.Includes bibliographical references (leaves 179-184).CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.by Lane Gearle Brooks.Ph.D

Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

Low-Power Slew-Rate Boosting Based 12-Bit Pipeline ADC Utilizing Forecasting Technique in the Sub-ADCS

The dissertation presents architecture and circuit solutions to improve the power efficiency of high-speed 12-bit pipelined ADCs in advanced CMOS technologies. First, the 4.5bit algorithmic pipelined front-end stage is proposed. It is shown that the algorithmic pipelined ADC requires a simpler sub-ADC and shows lower sensitivity to the Multiplying DAC (MDAC) errors and smaller area and power dissipation in comparison to the conventional multi-bit per stage pipelined ADC. Also, it is shown that the algorithmic pipelined architecture is more tolerant to capacitive mismatch for the same input-referred thermal noise than the conventional multi-bit per stage architecture. To take full advantage of these properties, a modified residue curve for the pipelined ADC is proposed. This concept introduces better linearity compared with the conventional residue curve of the pipelined ADC; this approach is particularly attractive for the digitization of signals with large peak to average ratio such as OFDM coded signals. Moreover, the minimum total required transconductance for the different architectures of the 12-bit pipelined ADC are computed. This helps the pipelined ADC designers to find the most power-efficient architecture between different topologies based on the same input-referred thermal noise. By employing this calculation, the most power efficient architecture for realizing the 12-bit pipelined ADC is selected. Then, a technique for slew-rate (SR) boosting in switched-capacitor circuits is proposed in the order to be utilized in the proposed 12-bit pipelined ADC. This technique makes use of a class-B auxiliary amplifier that generates a compensating current only when high slew-rate is demanded by large input signal. The proposed architecture employs simple circuitry to detect the need of injecting current at the output load by implementing a Pre-Amp followed by a class-B amplifier, embedded with a pre-defined hysteresis, in parallel with the main amplifier to boost its slew phase. The proposed solution requires small static power since it does not need high dc-current at the output stage of the main amplifier. The proposed technique is suitable for high-speed low-power multi-bit/stage pipelined ADC applications. Both transistor-level simulations and experimental results in TSMC 40nm technology reduces the slew-time for more than 45% and shorts the 1% settling time by 28% when used in a 4.5bit/stage pipelined ADC; power consumption increases by 20%. In addition, the technique of inactivating and disconnecting of the sub-ADC’s comparators by forecasting the sign of the sampled input voltage is proposed in the order to reduce the dynamic power consumption of the sub-ADCs in the proposed 12-bit pipelined ADC. This technique reduces the total dynamic power consumption more than 46%. The implemented 12-bit pipelined ADC achieves an SNDR/SFDR of 65.9/82.3 dB at low input frequencies and a 64.1/75.5 dB near Nyquist frequency while running at 500 MS/s. The pipelined ADC prototype occupies an active area of 0.9 mm^2 and consumes 18.16 mW from a 1.1 V supply, resulting in a figure of merit (FOM) of 22.4 and a 27.7 fJ/conversion-step at low-frequency and Nyquist frequency, respectively

Low-Power Slew-Rate Boosting Based 12-Bit Pipeline ADC Utilizing Forecasting Technique in the Sub-ADCS

The dissertation presents architecture and circuit solutions to improve the power efficiency of high-speed 12-bit pipelined ADCs in advanced CMOS technologies. First, the 4.5bit algorithmic pipelined front-end stage is proposed. It is shown that the algorithmic pipelined ADC requires a simpler sub-ADC and shows lower sensitivity to the Multiplying DAC (MDAC) errors and smaller area and power dissipation in comparison to the conventional multi-bit per stage pipelined ADC. Also, it is shown that the algorithmic pipelined architecture is more tolerant to capacitive mismatch for the same input-referred thermal noise than the conventional multi-bit per stage architecture. To take full advantage of these properties, a modified residue curve for the pipelined ADC is proposed. This concept introduces better linearity compared with the conventional residue curve of the pipelined ADC; this approach is particularly attractive for the digitization of signals with large peak to average ratio such as OFDM coded signals. Moreover, the minimum total required transconductance for the different architectures of the 12-bit pipelined ADC are computed. This helps the pipelined ADC designers to find the most power-efficient architecture between different topologies based on the same input-referred thermal noise. By employing this calculation, the most power efficient architecture for realizing the 12-bit pipelined ADC is selected. Then, a technique for slew-rate (SR) boosting in switched-capacitor circuits is proposed in the order to be utilized in the proposed 12-bit pipelined ADC. This technique makes use of a class-B auxiliary amplifier that generates a compensating current only when high slew-rate is demanded by large input signal. The proposed architecture employs simple circuitry to detect the need of injecting current at the output load by implementing a Pre-Amp followed by a class-B amplifier, embedded with a pre-defined hysteresis, in parallel with the main amplifier to boost its slew phase. The proposed solution requires small static power since it does not need high dc-current at the output stage of the main amplifier. The proposed technique is suitable for high-speed low-power multi-bit/stage pipelined ADC applications. Both transistor-level simulations and experimental results in TSMC 40nm technology reduces the slew-time for more than 45% and shorts the 1% settling time by 28% when used in a 4.5bit/stage pipelined ADC; power consumption increases by 20%. In addition, the technique of inactivating and disconnecting of the sub-ADC’s comparators by forecasting the sign of the sampled input voltage is proposed in the order to reduce the dynamic power consumption of the sub-ADCs in the proposed 12-bit pipelined ADC. This technique reduces the total dynamic power consumption more than 46%. The implemented 12-bit pipelined ADC achieves an SNDR/SFDR of 65.9/82.3 dB at low input frequencies and a 64.1/75.5 dB near Nyquist frequency while running at 500 MS/s. The pipelined ADC prototype occupies an active area of 0.9 mm^2 and consumes 18.16 mW from a 1.1 V supply, resulting in a figure of merit (FOM) of 22.4 and a 27.7 fJ/conversion-step at low-frequency and Nyquist frequency, respectively

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

A high performance zero-crossing based pipelined analog-to-digital converter

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (leaves 46-47).In this thesis, I describe a zero-crossing based pipelined ADC. Unlike traditional pipelined ADCs, this work does not use any op-amps in the signal path. The use of zero-crossing based circuits made it possible to achieve a much better figure of merit. The ADC is design to operate at 200MS/s with a resolution of 12 bits. The simulated results suggest that the target performance is achievable with less than 10 mW of power. This design's figure of merit is at least an order of magnitude better than any existing designs that have comparable speed and accuracy performance. The design will be fabricated later to be tested in silicon.by Yue Jack Chu.S.M