1,781 research outputs found

    Data-driven Soft Sensors in the Process Industry

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    In the last two decades Soft Sensors established themselves as a valuable alternative to the traditional means for the acquisition of critical process variables, process monitoring and other tasks which are related to process control. This paper discusses characteristics of the process industry data which are critical for the development of data-driven Soft Sensors. These characteristics are common to a large number of process industry fields, like the chemical industry, bioprocess industry, steel industry, etc. The focus of this work is put on the data-driven Soft Sensors because of their growing popularity, already demonstrated usefulness and huge, though yet not completely realised, potential. A comprehensive selection of case studies covering the three most important Soft Sensor application fields, a general introduction to the most popular Soft Sensor modelling techniques as well as a discussion of some open issues in the Soft Sensor development and maintenance and their possible solutions are the main contributions of this work

    A Comprehensive Performance Evaluation of Deformable Face Tracking "In-the-Wild"

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    Recently, technologies such as face detection, facial landmark localisation and face recognition and verification have matured enough to provide effective and efficient solutions for imagery captured under arbitrary conditions (referred to as "in-the-wild"). This is partially attributed to the fact that comprehensive "in-the-wild" benchmarks have been developed for face detection, landmark localisation and recognition/verification. A very important technology that has not been thoroughly evaluated yet is deformable face tracking "in-the-wild". Until now, the performance has mainly been assessed qualitatively by visually assessing the result of a deformable face tracking technology on short videos. In this paper, we perform the first, to the best of our knowledge, thorough evaluation of state-of-the-art deformable face tracking pipelines using the recently introduced 300VW benchmark. We evaluate many different architectures focusing mainly on the task of on-line deformable face tracking. In particular, we compare the following general strategies: (a) generic face detection plus generic facial landmark localisation, (b) generic model free tracking plus generic facial landmark localisation, as well as (c) hybrid approaches using state-of-the-art face detection, model free tracking and facial landmark localisation technologies. Our evaluation reveals future avenues for further research on the topic.Comment: E. Antonakos and P. Snape contributed equally and have joint second authorshi

    Automatic Defect Detection for TFT-LCD Array Process Using Quasiconformal Kernel Support Vector Data Description

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    Defect detection has been considered an efficient way to increase the yield rate of panels in thin film transistor liquid crystal display (TFT-LCD) manufacturing. In this study we focus on the array process since it is the first and key process in TFT-LCD manufacturing. Various defects occur in the array process, and some of them could cause great damage to the LCD panels. Thus, how to design a method that can robustly detect defects from the images captured from the surface of LCD panels has become crucial. Previously, support vector data description (SVDD) has been successfully applied to LCD defect detection. However, its generalization performance is limited. In this paper, we propose a novel one-class machine learning method, called quasiconformal kernel SVDD (QK-SVDD) to address this issue. The QK-SVDD can significantly improve generalization performance of the traditional SVDD by introducing the quasiconformal transformation into a predefined kernel. Experimental results, carried out on real LCD images provided by an LCD manufacturer in Taiwan, indicate that the proposed QK-SVDD not only obtains a high defect detection rate of 96%, but also greatly improves generalization performance of SVDD. The improvement has shown to be over 30%. In addition, results also show that the QK-SVDD defect detector is able to accomplish the task of defect detection on an LCD image within 60 ms
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