Bi-Linear Homogeneity Enforced Calibration for Pipelined ADCs

Pipelined analog-to-digital converters (ADCs) are key enablers in many state-of-the-art signal processing systems with high sampling rates. In addition to high sampling rates, such systems often demand a high linearity. To meet these challenging linearity requirements, ADC calibration techniques were heavily investigated throughout the past decades. One limitation in ADC calibration is the need for a precisely known test signal. In our previous work, we proposed the homogeneity enforced calibration (HEC) approach, which circumvents this need by consecutively feeding a test signal and a scaled version of it into the ADC. The calibration itself is performed using only the corresponding output samples, such that the test signal can remain unknown. On the downside, the HEC approach requires the option to accurately scale the test signal, impeding an on-chip implementation. In this work, we provide a thorough analysis of the HEC approach, including the effects of an inaccurately scaled test signal. Furthermore, the bi-linear homogeneity enforced calibration (BL-HEC) approach is introduced and suggested to account for an inaccurate scaling and, therefore, to facilitate an on-chip implementation. In addition, a comprehensive stability and convergence analysis of the BL-HEC approach is carried out. Finally, we verify our concept with simulations.Comment: 12 pages, 5 figure

A Low-Power, Reconfigurable, Pipelined ADC with Automatic Adaptation for Implantable Bioimpedance Applications

Biomedical monitoring systems that observe various physiological parameters or electrochemical reactions typically cannot expect signals with fixed amplitude or frequency as signal properties can vary greatly even among similar biosignals. Furthermore, advancements in biomedical research have resulted in more elaborate biosignal monitoring schemes which allow the continuous acquisition of important patient information. Conventional ADCs with a fixed resolution and sampling rate are not able to adapt to signals with a wide range of variation. As a result, reconfigurable analog-to-digital converters (ADC) have become increasingly more attractive for implantable biosensor systems. These converters are able to change their operable resolution, sampling rate, or both in order convert changing signals with increased power efficiency. Traditionally, biomedical sensing applications were limited to low frequencies. Therefore, much of the research on ADCs for biomedical applications focused on minimizing power consumption with smaller bias currents resulting in low sampling rates. However, recently bioimpedance monitoring has become more popular because of its healthcare possibilities. Bioimpedance monitoring involves injecting an AC current into a biosample and measuring the corresponding voltage drop. The frequency of the injected current greatly affects the amplitude and phase of the voltage drop as biological tissue is comprised of resistive and capacitive elements. For this reason, a full spectrum of measurements from 100 Hz to 10-100 MHz is required to gain a full understanding of the impedance. For this type of implantable biomedical application, the typical low power, low sampling rate analog-to-digital converter is insufficient. A different optimization of power and performance must be achieved. Since SAR ADC power consumption scales heavily with sampling rate, the converters that sample fast enough to be attractive for bioimpedance monitoring do not have a figure-of-merit that is comparable to the slower converters. Therefore, an auto-adapting, reconfigurable pipelined analog-to-digital converter is proposed. The converter can operate with either 8 or 10 bits of resolution and with a sampling rate of 0.1 or 20 MS/s. Additionally, the resolution and sampling rate are automatically determined by the converter itself based on the input signal. This way, power efficiency is increased for input signals of varying frequency and amplitude

Built-in self-test and self-calibration for analog and mixed signal circuits

Analog-to-digital converters (ADC) are one of the most important components in modern electronic systems. In the mission-critical applications such as automotive, the reliability of the ADC is critical as the ADC impacts the system level performance. Due to the aging effect and environmental changes, the performance of the ADC may degrade and even fail to meet the accuracy requirement over time. Built-in self-test (BIST) and self-calibration are becoming the ultimate solution to achieve lifetime reliability. This dissertation introduces two ADC testing algorithms and two ADC built-in self-test circuit implementations to test the ADC integral nonlinearity (INL) and differential nonlinearity (DNL) on-chip. In the first testing algorithm, the ultrafast stimulus error removal and segmented model identification of linearity errors (USER-SMILE) is developed for ADC built-in self-test, which eliminates the need for precision stimulus and reduces the overall test time. In this algorithm, the ADC is tested twice with a nonlinear ramp, instead of using a linear ramp signal. Therefore, the stimulus can be easily generated on-chip in a low-cost way. For the two ramps, there is a constant voltage shift in between. As the input stimulus linearity is completely relaxed, there is no requirement on the waveform of the input stimulus as long as it covers the ADC input range. In the meantime, the high-resolution ADC linearity is modeled with segmented parameters, which reduces the number of samples required for achieving high-precision test, thus saving the test time. As a result, the USER-SMILE algorithm is able to use less than 1 sample/code nonlinear stimulus to test high resolution ADCs with less than 0.5 least significant bit (LSB) INL estimation error, achieving more than 10-time test time reduction. This algorithm is validated with both board-level implementation and on-chip silicon implementation. The second testing algorithm is proposed to test the INL/DNL for multi-bit-per-stages pipelined ADCs with reduced test time and better test coverage. Due to the redundancy characteristics of multi-bit-per-stages pipelined ADC, the conventional histogram test cannot estimate and calibrate the static linearity accurately. The proposed method models the pipelined ADC nonlinearity as segmented parameters with inter-stage gain errors using the raw codes instead of the final output codes. During the test phase, a pure sine wave is sent to the ADC as the input and the model parameters are estimated from the output data with the system identification method. The modeled errors are then removed from the digital output codes during the calibration phase. A high-speed 12-bit pipelined ADC is tested and calibrated with the proposed method. With only 4000 samples, the 12-bit ADC is accurately tested and calibrated to achieve less than 1 LSB INL. The ADC effective number of bits (ENOB) is improved from 9.7 bits to 10.84 bits and the spurious-free dynamic range (SFDR) is improved by more than 20dB after calibration. In the first circuit implementation, a low-cost on-chip built-in self-test solution is developed using an R2R digital-to-analog converter (DAC) structure as the signal generator and the voltage shift generator for ADC linearity test. The proposed DAC is a subradix-2 R2R DAC with a constant voltage shift generation capability. The subradix-2 architecture avoids positive voltage gaps caused by mismatches, which relaxes the DAC matching requirements and reduces the design area. The R2R DAC based BIST circuit is fabricated in TSMC 40nm technology with a small area of 0.02mm^2. Measurement results show that the BIST circuit is capable of testing a 15-bit ADC INL accurately with less than 0.5 LSB INL estimation error. In the second circuit implementation, a complete SAR ADC built-in self-test solution using the USER-SMILE is developed and implemented in a 28nm automotive microcontroller. A low-cost 12-bit resistive DAC with less than 12-bit linearity is used as the signal generator to test and calibrate a SAR ADC with a target linearity of 12 bits. The voltage shift generation is created inside the ADC with capacitor switching. The entire algorithm processing unit for USER-SMILE algorithm is also implemented on chip. The final testing results are saved in the memory for further digital calibration. Both the total harmonic distortion (THD) and the SFDR are improved by 20dB after calibration, achieving -84.5dB and 86.5dB respectively. More than 700 parts are tested to verify the robustness of the BIST solution

Error Compensation in Pipeline and Converters

This thesis provides an improved calibration and compensation scheme for pipeline Analog-to-Digital Converters (ADCs). This new scheme utilizes the intermediate stage outputs in a pipeline to characterize error mechanisms in the architecture. The goal of this compensation scheme is to increase the dynamic range of the ADC. The pipeline architecture is described in general, and tailored to the 1.5 bitslstage topology. Dominant error mechanisms are defined and characterized for an arbitrary stage in the pipeline. These error mechanisms are modeled with basis functions. The traditional calibration scheme is modified and used to iteratively calculate the error characteristics. The information from calibration is used to compensate the ADC. The calibration and compensation scheme is demonstrated both in simulation and using a custom hardware pipeline ADC. A 10-bit 5 MHz ADC was designed and fabricated in 0.5 pm CMOS to serve as the demonstration platform. The scheme was successful in showing improvements in dynamic range while using intermediate stage outputs to efficiently model errors in a pipeline stage. An application of the technique on the real converter showed an average of 8.6 dB improvement in SFDR in the full Nyquist band of the ADC. The average improvement in SINAD and ENOB are 3.2 dB and 0.53 bits respectively

Concepts for smart AD and DA converters

This thesis studies the `smart' concept for application to analog-to-digital and digital-to-analog converters. The smart concept aims at improving performance - in a wide sense - of AD/DA converters by adding on-chip intelligence to extract imperfections and to correct for them. As the smart concept can correct for certain imperfections, it can also enable the use of more efficient architectures, thus yielding an additional performance boost. Chapter 2 studies trends and expectations in converter design with respect to applications, circuit design and technology evolution. Problems and opportunities are identfied, and an overview of performance criteria is given. Chapter 3 introduces the smart concept that takes advantage of the expected opportunities (described in chapter 2) in order to solve the anticipated problems. Chapter 4 applies the smart concept to digital-to-analog converters. In the discussed example, the concept is applied to reduce the area of the analog core of a current-steering DAC. It is shown that a sub-binary variable-radix approach reduces the area of the current-source elements substantially (10x compared to state-of-the-art), while maintaining accuracy by a self-measurement and digital pre-correction scheme. Chapter 5 describes the chip implementation of the sub-binary variable-radix DAC and discusses the experimental results. The results confirm that the sub-binary variable-radix design can achieve the smallest published current-source-array area for the given accuracy (12bit). Chapter 6 applies the smart concept to analog-to-digital converters, with as main goal the improvement of the overall performance in terms of a widely used figure-of-merit. Open-loop circuitry and time interleaving are shown to be key to achieve high-speed low-power solutions. It is suggested to apply a smart approach to reduce the effect of the imperfections, unintentionally caused by these key factors. On high-level, a global picture of the smart solution is proposed that can solve the problems while still maintaining power-efficiency. Chapter 7 deals with the design of a 500MSps open-loop track-and-hold circuit. This circuit is used as a test case to demonstrate the proposed smart approaches. Experimental results are presented and compared against prior art. Though there are several limitations in the design and the measurement setup, the measured performance is comparable to existing state-of-the-art. Chapter 8 introduces the first calibration method that counteracts the accuracy issues of the open-loop track-and-hold. A description of the method is given, and the implementation of the detection algorithm and correction circuitry is discussed. The chapter concludes with experimental measurement results. Chapter 9 introduces the second calibration method that targets the accuracy issues of time-interleaved circuits, in this case a 2-channel version of the implemented track-and-hold. The detection method, processing algorithm and correction circuitry are analyzed and their implementation is explained. Experimental results verify the usefulness of the method

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Design techniques for low-power SAR ADCs in nano-scale CMOS technologies

This thesis presents low power design techniques for successive approximation register (SAR) analog-to-digital converters (ADCs) in nano-scale CMOS technologies. Low power SAR ADCs face two major challenges especially at high resolutions: (1) increased comparator power to suppress the noise, and (2) increased DAC switching energy due to the large DAC size. To improve the comparator’s power efficiency, a statistical estimation based comparator noise reduction technique is presented. It allows a low power and noisy comparator to achieve high signal-to-noise ratio (SNR) by estimating the conversion residue. A first prototype ADC in 65nm CMOS has been developed to validate the proposed noise reduction technique. It achieves 4.5 fJ/conv-step Walden figure of merit and 64.5 dB signal-to-noise and distortion ratio (SNDR). In addition, a bidirectional single-side switching technique is developed to reduce the DAC switching power. It can reduce the DAC switching power and the total number of unit capacitors by 86% and 75%, respectively. A second prototype ADC with the proposed switching technique is designed and fabricated in 180nm CMOS technology. It achieves an SNDR of 63.4 dB and consumes only 24 Wat 1MS/s, leading to aWalden figure of merit of 19.9 fJ/conv-step. This thesis also presents an improved loop-unrolled SAR ADC, which works at high frequency with reduced SAR logic power and delay. It employs the bidirectional single-side switching technique to reduce the comparator common-mode voltage variation. In addition, it uses a Vcm-adaptive offset calibration technique which can accurately calibrate comparator’s offset at its operating Vcm. A prototype ADC designed in 40nm CMOS achieves 35 dB at 700 MS/s sampling rate and consumes only 0.95 mW, leading to a Walden figure of merit of 30 fJ/conv-step.Electrical and Computer Engineerin

Circuits and algorithms for pipelined ADCs in scaled CMOS technologies

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.MIT Barker Engineering Library copy: printed in pages.Also issued printed in pages.Includes bibliographical references (leaves 179-184).CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.by Lane Gearle Brooks.Ph.D