Robust H∞ filtering for time-delay systems with probabilistic sensor faults

Copyright [2009] IEEE. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Brunel University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected]. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.In this paper, a new robust H∞ filtering problem is investigated for a class of time-varying nonlinear system with norm-bounded parameter uncertainties, bounded state delay, sector-bounded nonlinearity and probabilistic sensor gain faults. The probabilistic sensor reductions are modeled by using a random variable that obeys a specific distribution in a known interval [alpha,beta], which accounts for the following two phenomenon: 1) signal stochastic attenuation in unreliable analog channel and 2) random sensor gain reduction in severe environment. The main task is to design a robust H∞ filter such that, for all possible uncertain measurements, system parameter uncertainties, nonlinearity as well as time-varying delays, the filtering error dynamics is asymptotically mean-square stable with a prescribed H∞ performance level. A sufficient condition for the existence of such a filter is presented in terms of the feasibility of a certain linear matrix inequality (LMI). A numerical example is introduced to illustrate the effectiveness and applicability of the proposed methodology

Testing a Quantum Computer

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.Comment: 15 pages, 17 equations, 27 tables, 8 figure

Testing microelectronic biofluidic systems

According to the 2005 International Technology Roadmap for Semiconductors, the integration of emerging nondigital CMOS technologies will require radically different test methods, posing a major challenge for designers and test engineers. One such technology is microelectronic fluidic (MEF) arrays, which have rapidly gained importance in many biological, pharmaceutical, and industrial applications. The advantages of these systems, such as operation speed, use of very small amounts of liquid, on-board droplet detection, signal conditioning, and vast digital signal processing, make them very promising. However, testable design of these devices in a mass-production environment is still in its infancy, hampering their low-cost introduction to the market. This article describes analog and digital MEF design and testing method

Fault Tolerance in Cellular Automata at High Fault Rates

A commonly used model for fault-tolerant computation is that of cellular automata. The essential difficulty of fault-tolerant computation is present in the special case of simply remembering a bit in the presence of faults, and that is the case we treat in this paper. We are concerned with the degree (the number of neighboring cells on which the state transition function depends) needed to achieve fault tolerance when the fault rate is high (nearly 1/2). We consider both the traditional transient fault model (where faults occur independently in time and space) and a recently introduced combined fault model which also includes manufacturing faults (which occur independently in space, but which affect cells for all time). We also consider both a purely probabilistic fault model (in which the states of cells are perturbed at exactly the fault rate) and an adversarial model (in which the occurrence of a fault gives control of the state to an omniscient adversary). We show that there are cellular automata that can tolerate a fault rate $1/2 - \xi$ (with $\xi>0$) with degree $O((1/\xi^2)\log(1/\xi))$, even with adversarial combined faults. The simplest such automata are based on infinite regular trees, but our results also apply to other structures (such as hyperbolic tessellations) that contain infinite regular trees. We also obtain a lower bound of $\Omega(1/\xi^2)$, even with purely probabilistic transient faults only

Automatic programming methodologies for electronic hardware fault monitoring

This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the Stressor - susceptibility interaction model. A circuit or a system is considered to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after pre-processing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm and classification and regression trees. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.This research was supported by the International Joint Research Grant of the IITA (Institute of Information Technology Assessment) foreign professor invitation program of the MIC (Ministry of Information and Communication), Korea

Time-efficient fault detection and diagnosis system for analog circuits

Time-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.Peer reviewedFinal Published versio

Variation aware analysis of bridging fault testing

This paper investigates the impact of process variation on test quality with regard to resistive bridging faults. The input logic threshold voltage and gate drive strength parameters are analyzed regarding their process variation induced influence on test quality. The impact of process variation on test quality is studied in terms of test escapes and measured by a robustness metric. It is shown that some bridges are sensitive to process variation in terms of logic behavior, but such variation does not necessarily compromise test quality if the test has high robustness. Experimental results of Monte-Carlo simulation based on recent process variation statistics are presented for ISCAS85 and -89 benchmark circuits, using a 45nm gate library and realistic bridges. The results show that tests generated without consideration of process variation are inadequate in terms of test quality, particularly for small test sets. On the other hand, larger test sets detect more of the logic faults introduced by process variation and have higher test quality

Harnessing the Power of Many: Extensible Toolkit for Scalable Ensemble Applications

Many scientific problems require multiple distinct computational tasks to be executed in order to achieve a desired solution. We introduce the Ensemble Toolkit (EnTK) to address the challenges of scale, diversity and reliability they pose. We describe the design and implementation of EnTK, characterize its performance and integrate it with two distinct exemplar use cases: seismic inversion and adaptive analog ensembles. We perform nine experiments, characterizing EnTK overheads, strong and weak scalability, and the performance of two use case implementations, at scale and on production infrastructures. We show how EnTK meets the following general requirements: (i) implementing dedicated abstractions to support the description and execution of ensemble applications; (ii) support for execution on heterogeneous computing infrastructures; (iii) efficient scalability up to O(10^4) tasks; and (iv) fault tolerance. We discuss novel computational capabilities that EnTK enables and the scientific advantages arising thereof. We propose EnTK as an important addition to the suite of tools in support of production scientific computing