The Design of a Debugger Unit for a RISC Processor Core

Recently, there has been a significant increase in design complexity for Embedded Systems often referred to as Hardware Software Co-Design. Complexity in design is due to both hardware and firmware closely coupled together in-order to achieve features for low power, high performance and low area. Due to these demands, embedded systems consist of multiple interconnected hardware IPs with complex firmware algorithms running on the device. Often such designs are available in bare-metal form, i.e without an Operating System, which results in difficulty while debugging due to lack of insight into the system. As a result, development cycle and time to market are increased. One of the major challenges for bare-metal design is to capture internal data required during debugging or testing in the post silicon validation stage effectively and efficiently. Post-silicon validation can be performed by leveraging on different technologies such as hardware software co-verification using hardware accelerators, FPGA emulation, logic analyzers, and so on which reduces the complete development cycle time. This requires the hardware to be instrumented with certain features which support debugging capabilities. As there is no standard for debugging capabilities and debugging infrastructure, it completely depends on the manufacturer to manufacturer or designer to designer. This work aims to implement minimum required features for debugging a bare-metal core by instrumenting the hardware compatible for debugging. It takes into consideration the fact that for a single core bare-metal embedded systems silicon area is also a constraint and there must be a trade-off between debugging capabilities which can be implemented in hardware and portions handled in software. The paper discusses various debugging approaches developed and implemented on various processor platforms and implements a new debugging infrastructure by instrumenting the Open-source AMBER 25 core with a set of debug features such as breakpoints, current state read, trace and memory access. Interface between hardware system and host system is designed using a JTAG standard TAP controller. The resulting design can be used in debugging and testing during post silicon verification and validation stages. The design is synthesized using Synopsys Design Compiler targeting a 65 nm technology node and results are compared for the instrumented and non-instrumented system

A Survey on Security Threats and Countermeasures in IEEE Test Standards

International audienceEditor's note: Test infrastructure has been shown to be a portal for hackers. This article reviews the threats and countermeasures for IEEE test infrastructure standards

Automated Debugging Methodology for FPGA-based Systems

Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computers, home automation, etc. to name a few. The modern designs constitute billions of transistors. However, with this evolution, ensuring that the devices fulfill the designer’s expectation under variable conditions has also become a great challenge. This requires a lot of design time and effort. Whenever an error is encountered, the process is re-started. Hence, it is desired to minimize the number of spins required to achieve an error-free product, as each spin results in loss of time and effort. Software-based simulation systems present the main technique to ensure the verification of the design before fabrication. However, few design errors (bugs) are likely to escape the simulation process. Such bugs subsequently appear during the post-silicon phase. Finding such bugs is time-consuming due to inherent invisibility of the hardware. Instead of software simulation of the design in the pre-silicon phase, post-silicon techniques permit the designers to verify the functionality through the physical implementations of the design. The main benefit of the methodology is that the implemented design in the post-silicon phase runs many order-of-magnitude faster than its counterpart in pre-silicon. This allows the designers to validate their design more exhaustively. This thesis presents five main contributions to enable a fast and automated debugging solution for reconfigurable hardware. During the research work, we used an obstacle avoidance system for robotic vehicles as a use case to illustrate how to apply the proposed debugging solution in practical environments. The first contribution presents a debugging system capable of providing a lossless trace of debugging data which permits a cycle-accurate replay. This methodology ensures capturing permanent as well as intermittent errors in the implemented design. The contribution also describes a solution to enhance hardware observability. It is proposed to utilize processor-configurable concentration networks, employ debug data compression to transmit the data more efficiently, and partially reconfiguring the debugging system at run-time to save the time required for design re-compilation as well as preserve the timing closure. The second contribution presents a solution for communication-centric designs. Furthermore, solutions for designs with multi-clock domains are also discussed. The third contribution presents a priority-based signal selection methodology to identify the signals which can be more helpful during the debugging process. A connectivity generation tool is also presented which can map the identified signals to the debugging system. The fourth contribution presents an automated error detection solution which can help in capturing the permanent as well as intermittent errors without continuous monitoring of debugging data. The proposed solution works for designs even in the absence of golden reference. The fifth contribution proposes to use artificial intelligence for post-silicon debugging. We presented a novel idea of using a recurrent neural network for debugging when a golden reference is present for training the network. Furthermore, the idea was also extended to designs where golden reference is not present

Determination of correct operation and behaviour of a structured amorphous surface

A recurring theme in intelligent environments is the intelligent surface composed of nanoscale processing units (smart dust). Such a surface (iSurface) can be considered an amorphous computer composed of a large array of identical processing units (iCells) each with its own sensor/effectors. An important requirement of such a surface is the need for a fast, reliable method to determine iCell operation, performance and code integrity. Any practical solution must fulfil certain criteria. First the impact on intercellular data communication bandwidth must be kept to a minimum, this is particularly important in high density, high speed iSurface applications such as high resolution video display. Previous work on processor profiling offered a possible solution in the form of metrics derived from profiling. This thesis describes a method developed to create long (>=32 bit) stable, robust metrics using a profiling technique that represents the current operational state of an iCell and thus enabling the quick exchange of diagnostics between iCells along with data traffic. Key requirements in the development of this system were fast acquisition of diagnostic variables, minimal affect on normal operation and the possibility of a hardware implementation which could be completely non intrusive in operation. The hardware developed fulfilled all these criteria in particular a novel method to create a stable metric that could determine compromised or incorrectly loaded code was developed. The metric of code integrity had both attributes of stability and responsiveness to change, something that has proven difficult to attain before. The uniqueness of the metrics produced by the hardware was also investigated and was determined to be very good and metric bit length was efficiently used. Impact on processor performance was also deemed acceptable at 2.31% and the developed architecture could theoretically be implemented in ‘system on chip’ (SOC) with zero processor overheads

Development of a Test-Bench for Evaluating the Embedded Implementation of the Improved Elephant Herding Optimization Algorithm Applied to Energy-Based Acoustic Localization

N/

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

When a Patch is Not Enough - HardFails: Software-Exploitable Hardware Bugs

In this paper, we take a deep dive into microarchitectural security from a hardware designer's perspective by reviewing the existing approaches to detect hardware vulnerabilities during the design phase. We show that a protection gap currently exists in practice that leaves chip designs vulnerable to software-based attacks. In particular, existing verification approaches fail to detect specific classes of vulnerabilities, which we call HardFails: these bugs evade detection by current verification techniques while being exploitable from software. We demonstrate such vulnerabilities in real-world SoCs using RISC-V to showcase and analyze concrete instantiations of HardFails. Patching these hardware bugs may not always be possible and can potentially result in a product recall. We base our findings on two extensive case studies: the recent Hack@DAC 2018 hardware security competition, where 54 independent teams of researchers competed world-wide over a period of 12 weeks to catch inserted security bugs in SoC RTL designs, and an in-depth systematic evaluation of state-of-the-art verification approaches. Our findings indicate that even combinations of techniques will miss high-impact bugs due to the large number of modules with complex interdependencies and fundamental limitations of current detection approaches. We also craft a real-world software attack that exploits one of the RTL bugs from Hack@DAC that evaded detection and discuss novel approaches to mitigate the growing problem of cross-layer bugs at design time