Wave techniques for noise modeling and measurement

The noise wave approach is applied to analysis, modeling, and measurement applications. Methods are presented for the calculation of component and network noise wave correlation matrices. Embedding calculations, relations to two-port figures-of-merit, and transformations to traditional representations are discussed. Simple expressions are derived for MESFET and HEMT noise wave parameters based on a linear equivalent circuit. A noise wave measurement technique is presented and experimentally compared with the conventional method

Behavioral Modelling of Digital Devices Via Composite Local-Linear State-Space Relations

This paper addresses the generation of accurate and efficient behavioral models of digital ICs. The proposed approach is based on the approximation of the device port characteristics by means of composite local linear state-space relations whose parameters can effectively be estimated from device port transient responses via well-established system identification techniques. The proposedmodels have been proven to overcome some inherent limitations of the state-of-the-art models used so far, and they can effectively be implemented in any commercial tool as Simulation Program with Integrated Circuit Emphasis (SPICE) subcircuits or VHDL-AMS hardware descriptions. A systematic study of the performances of the proposed state-space models is carried out on a synthetic test device. The effectiveness of the proposed approach has been demonstrated on a real application problem involving commercial devices and a data link of a mobile phon

Validation by Measurements of a IC Modeling Approach for SiP Applications

The growing importance of signal integrity (SI) analysis in integrated circuits (ICs), revealed by modern systemin-package methods, is demanding for new models for the IC sub-systems which are both accurate, efficient and extractable by simple measurement procedures. This paper presents the contribution for the establishment of an integrated IC modeling approach whose performance is assessed by direct comparison with the signals measured in laboratory of two distinct memory IC devices. Based on the identification of the main blocks of a typical IC device, the modeling approach consists of a network of system-level sub-models, some of which with already demonstrated accuracy, which simulated the IC interfacing behavior. Emphasis is given to the procedures that were developed to validate by means of laboratory measurements (and not by comparison with circuit-level simulations) the model performance, which is a novel and important aspect that should be considered in the design of IC models that are useful for SI analysi

Developing Model-Based Design Evaluation for Pipelined A/D Converters

This paper deals with a prospective approach of modeling, design evaluation and error determination applied to pipelined A/D converter architecture. In contrast with conventional ADC modeling algorithms targeted to extract the maximum ADC non-linearity error, the innovative approach presented allows to decompose magnitudes of individual error sources from a measured or simulated response of an ADC device. Design Evaluation methodology was successfully applied to Nyquist rate cyclic converters in our works [13]. Now, we extend its principles to pipelined architecture. This qualitative decomposition can significantly contribute to the ADC calibration procedure performed on the production line in term of integral and differential nonlinearity. This is backgrounded by the fact that the knowledge of ADC performance contributors provided by the proposed method helps to adjust the values of on-chip converter components so as to equalize (and possibly minimize) the total non-linearity error. In this paper, the design evaluation procedure is demonstrated on a system design example of pipelined A/D converter. Significant simulation results of each stage of the design evaluation process are given, starting from the INL performance extraction proceeded in a powerful Virtual Testing Environment implemented in Maple™ software and finishing by an error source simulation, modeling of pipelined ADC structure and determination of error source contribution, suitable for a generic process flow

Tensor Computation: A New Framework for High-Dimensional Problems in EDA

Many critical EDA problems suffer from the curse of dimensionality, i.e. the very fast-scaling computational burden produced by large number of parameters and/or unknown variables. This phenomenon may be caused by multiple spatial or temporal factors (e.g. 3-D field solvers discretizations and multi-rate circuit simulation), nonlinearity of devices and circuits, large number of design or optimization parameters (e.g. full-chip routing/placement and circuit sizing), or extensive process variations (e.g. variability/reliability analysis and design for manufacturability). The computational challenges generated by such high dimensional problems are generally hard to handle efficiently with traditional EDA core algorithms that are based on matrix and vector computation. This paper presents "tensor computation" as an alternative general framework for the development of efficient EDA algorithms and tools. A tensor is a high-dimensional generalization of a matrix and a vector, and is a natural choice for both storing and solving efficiently high-dimensional EDA problems. This paper gives a basic tutorial on tensors, demonstrates some recent examples of EDA applications (e.g., nonlinear circuit modeling and high-dimensional uncertainty quantification), and suggests further open EDA problems where the use of tensor computation could be of advantage.Comment: 14 figures. Accepted by IEEE Trans. CAD of Integrated Circuits and System

Harmonic balance surrogate-based immunity modeling of a nonlinear analog circuit

A novel harmonic balance surrogate-based technique to create fast and accurate behavioral models predicting, in the early design stage, the performance of nonlinear analog devices during immunity tests is presented. The obtained immunity model hides the real netlist, reduces the simulation time, and avoids expensive and time-consuming measurements after tape-out, while still providing high accuracy. The model can easily be integrated into a circuit simulator together with additional subcircuits, e.g., board and package models, as such allowing to efficiently reproduce complete immunity test setups during the early design stage and without disclosing any intellectual property. The novel method is validated by means of application to an industrial case study, being an automotive voltage regulator, clearly showing the technique's capabilities and practical advantages

Nonlinear mechanisms in passive microwave devices

Premi extraordinari doctorat curs 2010-2011, àmbit d’Enginyeria de les TICThe telecommunications industry follows a tendency towards smaller devices, higher power and higher frequency, which imply an increase on the complexity of the electronics involved. Moreover, there is a need for extended capabilities like frequency tunable devices, ultra-low losses or high power handling, which make use of advanced materials for these purposes. In addition, increasingly demanding communication standards and regulations push the limits of the acceptable performance degrading indicators. This is the case of nonlinearities, whose effects, like increased Adjacent Channel Power Ratio (ACPR), harmonics, or intermodulation distortion among others, are being included in the performance requirements, as maximum tolerable levels. In this context, proper modeling of the devices at the design stage is of crucial importance in predicting not only the device performance but also the global system indicators and to make sure that the requirements are fulfilled. In accordance with that, this work proposes the necessary steps for circuit models implementation of different passive microwave devices, from the linear and nonlinear measurements to the simulations to validate them. Bulk acoustic wave resonators and transmission lines made of high temperature superconductors, ferroelectrics or regular metals and dielectrics are the subject of this work. Both phenomenological and physical approaches are considered and circuit models are proposed and compared with measurements. The nonlinear observables, being harmonics, intermodulation distortion, and saturation or detuning, are properly related to the material properties that originate them. The obtained models can be used in circuit simulators to predict the performance of these microwave devices under complex modulated signals, or even be used to predict their performance when integrated into more complex systems. A key step to achieve this goal is an accurate characterization of materials and devices, which is faced by making use of advanced measurement techniques. Therefore, considerations on special measurement setups are being made along this thesis.Award-winningPostprint (published version