Addressing Manufacturing Challenges in NoC-based ULSI Designs

Hernández Luz, C. (2012). Addressing Manufacturing Challenges in NoC-based ULSI Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/1669

Cost Effective Routing Implementations for On-chip Networks

Arquitecturas de múltiples núcleos como multiprocesadores (CMP) y soluciones multiprocesador para sistemas dentro del chip (MPSoCs) actuales se basan en la eficacia de las redes dentro del chip (NoC) para la comunicación entre los diversos núcleos. Un diseño eficiente de red dentro del chip debe ser escalable y al mismo tiempo obtener valores ajustados de área, latencia y consumo de energía. Para diseños de red dentro del chip de propósito general se suele usar topologías de malla 2D ya que se ajustan a la distribución del chip. Sin embargo, la aparición de nuevos retos debe ser abordada por los diseñadores. Una mayor probabilidad de defectos de fabricación, la necesidad de un uso optimizado de los recursos para aumentar el paralelismo a nivel de aplicación o la necesidad de técnicas eficaces de ahorro de energía, puede ocasionar patrones de irregularidad en las topologías. Además, el soporte para comunicación colectiva es una característica buscada para abordar con eficacia las necesidades de comunicación de los protocolos de coherencia de caché. En estas condiciones, un encaminamiento eficiente de los mensajes se convierte en un reto a superar. El objetivo de esta tesis es establecer las bases de una nueva arquitectura para encaminamiento distribuido basado en lógica que es capaz de adaptarse a cualquier topología irregular derivada de una estructura de malla 2D, proporcionando así una cobertura total para cualquier caso resultado de soportar los retos mencionados anteriormente. Para conseguirlo, en primer lugar, se parte desde una base, para luego analizar una evolución de varios mecanismos, y finalmente llegar a una implementación, que abarca varios módulos para alcanzar el objetivo mencionado anteriormente. De hecho, esta última implementación tiene por nombre eLBDR (effective Logic-Based Distributed Routing). Este trabajo cubre desde el primer mecanismo, LBDR, hasta el resto de mecanismos que han surgido progresivamente.Rodrigo Mocholí, S. (2010). Cost Effective Routing Implementations for On-chip Networks [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/8962Palanci

A fault-tolerant last level cache for CMPs operating at ultra-low voltage

Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-core power wall. However, as voltage decreases, some SRAM cells are unable to operate reliably and show a behavior consistent with a hard fault. Block disabling is a micro-architectural technique that allows low-voltage operation by deactivating faulty cache entries, at the expense of reducing the effective cache capacity. In the case of the last-level cache, this capacity reduction leads to an increase in off-chip memory accesses, diminishing the overall energy benefit of reducing the voltage supply. In this work, we exploit the reuse locality and the intrinsic redundancy of multi-level inclusive hierarchies to enhance the performance of block disabling with negligible cost. The proposed fault-aware last-level cache management policy maps critical blocks, those not present in private caches and with a higher probability of being reused, to active cache entries. Our evaluation shows that this fault-aware management results in up to 37.3% and 54.2% fewer misses per kilo instruction (MPKI) than block disabling for multiprogrammed and parallel workloads, respectively. This translates to performance enhancements of up to 13% and 34.6% for multiprogrammed and parallel workloads, respectively.Peer ReviewedPostprint (author's final draft

Reliability-aware and energy-efficient system level design for networks-on-chip

2015 Spring.Includes bibliographical references.With CMOS technology aggressively scaling into the ultra-deep sub-micron (UDSM) regime and application complexity growing rapidly in recent years, processors today are being driven to integrate multiple cores on a chip. Such chip multiprocessor (CMP) architectures offer unprecedented levels of computing performance for highly parallel emerging applications in the era of digital convergence. However, a major challenge facing the designers of these emerging multicore architectures is the increased likelihood of failure due to the rise in transient, permanent, and intermittent faults caused by a variety of factors that are becoming more and more prevalent with technology scaling. On-chip interconnect architectures are particularly susceptible to faults that can corrupt transmitted data or prevent it from reaching its destination. Reliability concerns in UDSM nodes have in part contributed to the shift from traditional bus-based communication fabrics to network-on-chip (NoC) architectures that provide better scalability, performance, and utilization than buses. In this thesis, to overcome potential faults in NoCs, my research began by exploring fault-tolerant routing algorithms. Under the constraint of deadlock freedom, we make use of the inherent redundancy in NoCs due to multiple paths between packet sources and sinks and propose different fault-tolerant routing schemes to achieve much better fault tolerance capabilities than possible with traditional routing schemes. The proposed schemes also use replication opportunistically to optimize the balance between energy overhead and arrival rate. As 3D integrated circuit (3D-IC) technology with wafer-to-wafer bonding has been recently proposed as a promising candidate for future CMPs, we also propose a fault-tolerant routing scheme for 3D NoCs which outperforms the existing popular routing schemes in terms of energy consumption, performance and reliability. To quantify reliability and provide different levels of intelligent protection, for the first time, we propose the network vulnerability factor (NVF) metric to characterize the vulnerability of NoC components to faults. NVF determines the probabilities that faults in NoC components manifest as errors in the final program output of the CMP system. With NVF aware partial protection for NoC components, almost 50% energy cost can be saved compared to the traditional approach of comprehensively protecting all NoC components. Lastly, we focus on the problem of fault-tolerant NoC design, that involves many NP-hard sub-problems such as core mapping, fault-tolerant routing, and fault-tolerant router configuration. We propose a novel design-time (RESYN) and a hybrid design and runtime (HEFT) synthesis framework to trade-off energy consumption and reliability in the NoC fabric at the system level for CMPs. Together, our research in fault-tolerant NoC routing, reliability modeling, and reliability aware NoC synthesis substantially enhances NoC reliability and energy-efficiency beyond what is possible with traditional approaches and state-of-the-art strategies from prior work

Fault- and Yield-Aware On-Chip Memory Design and Management

Ever decreasing device size causes more frequent hard faults, which becomes a serious burden to processor design and yield management. This problem is particularly pronounced in the on-chip memory which consumes up to 70% of a processor' s total chip area. Traditional circuit-level techniques, such as redundancy and error correction code, become less effective in error-prevalent environments because of their large area overhead. In this work, we suggest an architectural solution to building reliable on-chip memory in the future processor environment. Our approaches have two parts, a design framework and architectural techniques for on-chip memory structures. Our design framework provides important architectural evaluation metrics such as yield, area, and performance based on low level defects and process variations parameters. Processor architects can quickly evaluate their designs' characteristics in terms of yield, area, and performance. With the framework, we develop architectural yield enhancement solutions for on-chip memory structures including L1 cache, L2 cache and directory memory. Our proposed solutions greatly improve yield with negligible area and performance overhead. Furthermore, we develop a decoupled yield model of compute cores and L2 caches in CMPs, which show that there will be many more L2 caches than compute cores in a chip. We propose efficient utilization techniques for excess caches. Evaluation results show that excess caches significantly improve overall performance of CMPs

Parallel and Distributed Computing

The 14 chapters presented in this book cover a wide variety of representative works ranging from hardware design to application development. Particularly, the topics that are addressed are programmable and reconfigurable devices and systems, dependability of GPUs (General Purpose Units), network topologies, cache coherence protocols, resource allocation, scheduling algorithms, peertopeer networks, largescale network simulation, and parallel routines and algorithms. In this way, the articles included in this book constitute an excellent reference for engineers and researchers who have particular interests in each of these topics in parallel and distributed computing

Software-based and regionally-oriented traffic management in Networks-on-Chip

Since the introduction of chip-multiprocessor systems, the number of integrated cores has been steady growing and workload applications have been adapted to exploit the increasing parallelism. This changed the importance of efficient on-chip communication significantly and the infrastructure has to keep step with these new requirements. The work at hand makes significant contributions to the state-of-the-art of the latest generation of such solutions, called Networks-on-Chip, to improve the performance, reliability, and flexible management of these on-chip infrastructures

Exploiting Natural On-chip Redundancy for Energy Efficient Memory and Computing

Power density is currently the primary design constraint across most computing segments and the main performance limiting factor. For years, industry has kept power density constant, while increasing frequency, lowering transistors supply (Vdd) and threshold (Vth) voltages. However, Vth scaling has stopped because leakage current is exponentially related to it. Transistor count and integration density keep doubling every process generation (Moore’s Law), but the power budget caps the amount of hardware that can be active at the same time, leading to dark silicon. With each new generation, there are more resources available, but we cannot fully exploit their performance potential. In the last years, different research trends have explored how to cope with dark silicon and unlock the energy efficiency of the chips, including Near-Threshold voltage Computing (NTC) and approximate computing. NTC aggressively lowers Vdd to values near Vth. This allows a substantial reduction in power, as dynamic power scales quadratically with supply voltage. The resultant power reduction could be used to activate more chip resources and potentially achieve performance improvements. Unfortunately, Vdd scaling is limited by the tight functionality margins of on-chip SRAM transistors. When scaling Vdd down to values near-threshold, manufacture-induced parameter variations affect the functionality of SRAM cells, which eventually become not reliable. A large amount of emerging applications, on the other hand, features an intrinsic error-resilience property, tolerating a certain amount of noise. In this context, approximate computing takes advantage of this observation and exploits the gap between the level of accuracy required by the application and the level of accuracy given by the computation, providing that reducing the accuracy translates into an energy gain. However, deciding which instructions and data and which techniques are best suited for approximation still poses a major challenge. This dissertation contributes in these two directions. First, it proposes a new approach to mitigate the impact of SRAM failures due to parameter variation for effective operation at ultra-low voltages. We identify two levels of natural on-chip redundancy: cache level and content level. The first arises because of the replication of blocks in multi-level cache hierarchies. We exploit this redundancy with a cache management policy that allocates blocks to entries taking into account the nature of the cache entry and the use pattern of the block. This policy obtains performance improvements between 2% and 34%, with respect to block disabling, a technique with similar complexity, incurring no additional storage overhead. The latter (content level redundancy) arises because of the redundancy of data in real world applications. We exploit this redundancy compressing cache blocks to fit them in partially functional cache entries. At the cost of a slight overhead increase, we can obtain performance within 2% of that obtained when the cache is built with fault-free cells, even if more than 90% of the cache entries have at least a faulty cell. Then, we analyze how the intrinsic noise tolerance of emerging applications can be exploited to design an approximate Instruction Set Architecture (ISA). Exploiting the ISA redundancy, we explore a set of techniques to approximate the execution of instructions across a set of emerging applications, pointing out the potential of reducing the complexity of the ISA, and the trade-offs of the approach. In a proof-of-concept implementation, the ISA is shrunk in two dimensions: Breadth (i.e., simplifying instructions) and Depth (i.e., dropping instructions). This proof-of-concept shows that energy can be reduced on average 20.6% at around 14.9% accuracy loss

Multi-core devices for safety-critical systems: a survey

Multi-core devices are envisioned to support the development of next-generation safety-critical systems, enabling the on-chip integration of functions of different criticality. This integration provides multiple system-level potential benefits such as cost, size, power, and weight reduction. However, safety certification becomes a challenge and several fundamental safety technical requirements must be addressed, such as temporal and spatial independence, reliability, and diagnostic coverage. This survey provides a categorization and overview at different device abstraction levels (nanoscale, component, and device) of selected key research contributions that support the compliance with these fundamental safety requirements.This work has been partially supported by the Spanish Ministry of Economy and Competitiveness under grant TIN2015-65316-P, Basque Government under grant KK-2019-00035 and the HiPEAC Network of Excellence. The Spanish Ministry of Economy and Competitiveness has also partially supported Jaume Abella under Ramon y Cajal postdoctoral fellowship (RYC-2013-14717).Peer ReviewedPostprint (author's final draft