A complete design path for the layout of flexible macros

XIV+172hlm.;24c

Algorithmic studies on PCB routing

As IC technology advances, the package size keeps shrinking while the pin count of a package keeps increasing. A modern IC package can have a pin count of thousands. As a result, a complex printed circuit board (PCB) can host more than ten thousand signal nets. Such a huge pin count and net count make manual design of packages and PCBs an extremely time-consuming and error-prone task. On the other hand, increasing clock frequency imposes various physical constraints on PCB routing. These constraints make traditional IC and PCB routers not applicable to modern PCB routing. To the best of our knowledge, there is no mature commercial or academic automated router that handles these constraints well. Therefore, automated PCB routers that are tuned to handle such constraints become a necessity in modern design. In this dissertation, we propose novel algorithms for three major aspects of PCB routing: escape routing, area routing and layer assignment. Escape routing for packages and PCBs has been studied extensively in the past. Network flow is pervasively used to model this problem. However, previous studies are incomplete in two senses. First, none of the previous works correctly model the diagonal capacity, which is essential for 45 degree routing in most packages and PCBs. As a result, existing algorithms may either produce routing solutions that violate the diagonal capacity or fail to output a legal routing even though one exists. Second, few works discuss the escape routing problem of differential pairs. In high-performance PCBs, many critical nets use differential pairs to transmit signals. How to escape differential pairs from a pin array is an important issue that has received too little attention in the literature. In this dissertation, we propose a new network flow model that guarantees the correctness when diagonal capacity is taken into consideration. This model leads to the first optimal algorithm for escape routing. We also extend our model to handle missing pins. We then propose two algorithms for the differential pair escape routing problem. The first one computes the optimal routing for a single differential pair while the second one is able to simultaneously route multiple differential pairs considering both routability and wire length. We then propose a two-stage routing scheme based on the two algorithms. In our routing scheme, the second algorithm is used to generate initial routing and the first algorithm is used to perform rip-up and reroute. Length-constrained routing is another very important problem for PCB routing. Previous length-constrained routers all have assumptions on the routing topology. We propose a routing scheme that is free of any restriction on the routing topology. The novelty of our proposed routing scheme is that we view the length-constrained routing problem as an area assignment problem and use a placement structure to help transform the area assignment problem into a mathematical programming problem. Experimental results show that our routing scheme can handle practical designs that previous routers cannot handle. For designs that they could handle, our router runs much faster. Length-constrained routing requires the escaped nets to have matching ordering along the boundaries of the pin arrays. However, in some practical designs, the net ordering might be mismatched. To address this issue, we propose a preprocessing step to untangle such twisted nets. We also introduce a practical routing style, which we call single-detour routing, to simplify the untangling problem. We discover a necessary and sufficient condition for the existence of single-detour routing solutions and present a dynamic programming based algorithm that optimally solves the problem. By integrating our algorithm into the bus router in a length-constrained router, we show that many routing problems that cannot be solved previously can now be solved with insignificant increase in runtime. The nets on a PCB are usually grouped into buses. Because of the high pin density of the packages, the buses need to be assigned into multiple routing layers. We propose a layer assignment algorithm to assign a set of buses into multiple layers without causing any conflict. Our algorithm guarantees to produce a layer assignment with minimum number of layers. The key idea is to transform the layer assignment problem into a bipartite matching problem. This research result is an improvement over a previous work, which is optimal for only one layer

Enhancing OpenStreetMap for the Assessment of Critical Road Infrastructure in a Disaster Context

Die Häufigkeit von Naturkatastrophen nimmt weltweit zu, was zu immensen Schäden an kritischer Straßeninfrastruktur und deren Funktionalität führen kann. Daher ist es von entscheidender Bedeutung, die Funktionalität kritischer Straßeninfrastruktur vor, während und nach einer Katastrophe zu beurteilen. Dazu werden globale Straßendaten benötigt, die für die Routenplanung nutzbar sind. OpenStreetMap (OSM) stellt globale Straßennetzdaten zur Verfügung, die kostenlos und frei zugänglich sind. Allerdings ist die Verwendung der OSM Straßendaten für Routenplanungsanwendungen oft eine Herausforderung. Das übergeordnete Ziel dieser Arbeit ist die Entwicklung eines generischen, mehrskaligen Konzepts zur Analyse kritischer Straßeninfrastrukturen im Kontext von Naturgefahren unter Verwendung von OSM Daten. Dafür werden zwei aufeinander folgende Forschungsziele aufgestellt: (i) die Verbesserung der Routingfähigkeit von OSM Daten und (ii) die Bewertung kritischer Straßeninfrastruktur im Kontext von Naturgefahren. Daraus resultiert die Gliederung dieser Arbeit in zwei Hauptteile, die jeweils den Forschungszielen entsprechen. Im ersten Teil dieser Arbeit wird die Nutzbarkeit von OSM Daten für Routing Anwendungen verbessert. Zunächst wird dafür die Qualität des OSM Straßennetzwerks im Detail analysiert. Dabei werden zwei große Herausforderungen im Bereich der Anwendbarkeit von OSM Daten für die Routenplanung identifiziert: fehlende Geschwindigkeitsangaben und Fehler in der Straßenklassifizierung. Um die erste Herausforderung zu bewältigen, wird ein FuzzyFramework zur Geschwindigkeitsschätzung (Fuzzy-FSE) entwickelt, welches eine Fuzzy Regelung zur Schätzung der Durchschnittsgeschwindigkeit einsetzt. Diese Fuzzy Regelung basiert auf den Parametern Straßenklasse, Straßenneigung, Straßenoberfläche und Straßenlänge einsetzt. Das Fuzzy-FSE besteht aus zwei Teilen: einer Regel- und Wissensbasis, die über die Zugehörigkeitsfunktionen für den Ausgangsparameter Geschwindigkeit entscheidet, und mehrere Fuzzy-Regelsysteme, welche die resultierende Durchschnittsgeschwindigkeit berechnen. Die Ergebnisse zeigen, dass das Fuzzy-FSE auch bei ausschließlicher Verwendung von OSM Daten eine bessere Leistung erbringt als bestehende Methoden. Die Herausforderung der fehlerhaften Straßenklassifizierung wird durch die Entwicklung eines neuartigen Ansatzes zur Erkennung von Klassifizierungfehlern in OSM angegangen. Dabei wird sowohl nach nicht verbundenen Netzwerkteilen als auch nach Lücken im Straßennetzwerk gesucht. Verschiedene Parameter werden in einem Bewertungssystem kombiniert, um eine Fehlerwahrscheinlichkeit zu erhalten. Auf Basis der Fehlerwahrscheinlichkeit kann ein menschlicher Nutzer diese Fehler überprüfen und korrigieren. Die Ergebnisse deuten einerseits darauf hin, dass an Lücken mehr Klassifizierungsfehler gefunden werden als an nicht verbundenen Netzwerkteilen. Andererseits zeigen sie, dass das entwickelte Bewertungssystem bei einer benutzergesteuerten Suche nach Lücken zu einem schnellen Aufdecken von Klassifizierungsfehlern verwendet werden kann. Aus dem ersten Teil dieser Arbeit ergibt sich somit ein erweiterter OSM Datensatz mit verbesserter Routingfähigkeit. Im zweiten Teil dieser Arbeit werden die erweiterten OSM Daten zur Bewertung der kritischen Straßeninfrastruktur im Katastrophenkontext verwendet. Dazu wird der zweite Teil des generischen, mehrskaligen Konzepts entwickelt, das aus mehreren, miteinander verbundenen Modulen besteht. Ein Modul implementiert zwei Erreichbarkeitsindizes, welche verschiedene Aspekte der Erreichbarkeit im Straßennetzwerk hervorheben. In einem weiteren Modul wird ein grundlegendes Modell der Verkehrsnachfrage entwickelt, welches den täglichen interstädtischen Verkehr ausschließlich auf der Grundlage von OSM Daten schätzt. Ein drittes Modul verwendet die oben beschriebenen Module zur Schätzung verschiedener Arten von Auswirkungen von Naturkatastrophen auf das Straßennetzwerk. Schließlich wird in einem vierten Modul die Vulnerabilität des Straßennetzes gegenüber weiteren Schäden bei Langzeitkatastrophen analysiert. Das generische Konzept mit allen Modulen wird exemplarisch in zwei verschiedenen Regionen für zwei Waldbrandszenarien angewendet. Die Ergebnisse der Fallstudien zeigen, dass das Konzept ein wertvolles, flexibles und global anwendbares Instrument für Regionalplaner und Katastrophenmanagement darstellt, das länder- bzw. regionenspezifische Anpassungen ermöglicht und gleichzeitig wenig Daten benötigt

Interconnect-driven floorplanning.

Sham Chiu Wing.Thesis (M.Phil.)--Chinese University of Hong Kong, 2002.Includes bibliographical references (leaves 107-113).Abstracts in English and Chinese.Chapter 1 --- Introduction --- p.1Chapter 1.1 --- Motivations --- p.1Chapter 1.2 --- Progress on the Problem --- p.2Chapter 1.3 --- Our Contributions --- p.3Chapter 1.4 --- Thesis Organization --- p.5Chapter 2 --- Preliminaries --- p.6Chapter 2.1 --- Introduction --- p.6Chapter 2.1.1 --- The Role of Floorplanning --- p.6Chapter 2.1.2 --- Wirelength Estimation --- p.7Chapter 2.1.3 --- Different Types of Floorplan --- p.8Chapter 2.2 --- Representations of Floorplan --- p.10Chapter 2.2.1 --- Polish Expressions --- p.10Chapter 2.2.2 --- Sequence Pair --- p.11Chapter 2.2.3 --- Bounded-Sliceline Grid (BSG) Structure --- p.13Chapter 2.2.4 --- O-Tree --- p.14Chapter 2.2.5 --- B*-Tree --- p.16Chapter 2.2.6 --- Corner Block List --- p.18Chapter 2.2.7 --- Twin Binary Tree --- p.19Chapter 2.2.8 --- Comparisons between Different Representations --- p.20Chapter 2.3 --- Algorithms of Floorplan Design --- p.20Chapter 2.3.1 --- Constraint Based Floorplanning --- p.21Chapter 2.3.2 --- Integer Programming Based Floorplanning --- p.21Chapter 2.3.3 --- Neural Learning Based Floorplanning --- p.22Chapter 2.3.4 --- Rectangular Dualization --- p.22Chapter 2.3.5 --- Simulated Annealing --- p.23Chapter 2.3.6 --- Genetic Algorithm --- p.23Chapter 2.4 --- Summary --- p.24Chapter 3 --- Literature Review on Interconnect-Driven Floorplanning --- p.25Chapter 3.1 --- Introduction --- p.25Chapter 3.2 --- Simulated Annealing Approach --- p.25Chapter 3.2.1 --- """Pepper - A Timing Driven Early Floorplanner""" --- p.25Chapter 3.2.2 --- """A Timing Driven Block Placer Based on Sequence Pair Model""" --- p.26Chapter 3.2.3 --- """Integrated Floorplanning and Interconnect Planning""" --- p.27Chapter 3.2.4 --- """Interconnect Driven Floorplanning with Fast Global Wiring Planning and Optimization""" --- p.27Chapter 3.3 --- Genetic Algorithm Approach --- p.28Chapter 3.3.1 --- "“Timing Influenced General-cell Genetic Floorplanning""" --- p.28Chapter 3.4 --- Force Directed Approach --- p.29Chapter 3.4.1 --- """Timing Influenced Force Directed Floorplanning""" --- p.29Chapter 3.5 --- Congestion Planning --- p.30Chapter 3.5.1 --- """On the Behavior of Congestion Minimization During Placement""" --- p.30Chapter 3.5.2 --- """Congestion Minimization During Placement""" --- p.31Chapter 3.5.3 --- "“Estimating Routing Congestion Using Probabilistic Anal- ysis""" --- p.31Chapter 3.6 --- Buffer Planning --- p.32Chapter 3.6.1 --- """Buffer Block Planning for Interconnect Driven Floor- planning""" --- p.32Chapter 3.6.2 --- """Routability Driven Repeater Block Planning for Interconnect- centric Floorplanning""" --- p.33Chapter 3.6.3 --- """Provably Good Global Buffering Using an Available Block Plan""" --- p.34Chapter 3.6.4 --- "“Planning Buffer Locations by Network Flows""" --- p.34Chapter 3.6.5 --- """A Practical Methodology for Early Buffer and Wire Re- source Allocation""" --- p.35Chapter 3.7 --- Summary --- p.36Chapter 4 --- Floorplanner with Fixed Buffer Planning [34] --- p.37Chapter 4.1 --- Introduction --- p.37Chapter 4.2 --- Overview of the Floorplanner --- p.38Chapter 4.3 --- Congestion Model --- p.38Chapter 4.3.1 --- Construction of Grid Structure --- p.39Chapter 4.3.2 --- Counting the Number of Routes at a Grid --- p.40Chapter 4.3.3 --- Buffer Location Computation --- p.41Chapter 4.3.4 --- Counting Routes with Blocked Grids --- p.42Chapter 4.3.5 --- Computing the Probability of Net Crossing --- p.43Chapter 4.4 --- Time Complexity --- p.44Chapter 4.5 --- Simulated Annealing --- p.45Chapter 4.6 --- Wirelength Estimation --- p.46Chapter 4.6.1 --- Center-to-center Estimation --- p.47Chapter 4.6.2 --- Corner-to-corner Estimation --- p.47Chapter 4.6.3 --- Intersection-to-intersection Estimation --- p.48Chapter 4.7 --- Multi-pin Nets Handling --- p.49Chapter 4.8 --- Experimental Results --- p.50Chapter 4.9 --- Summary --- p.51Chapter 5 --- Floorplanner with Flexible Buffer Planning [35] --- p.53Chapter 5.1 --- Introduction --- p.53Chapter 5.2 --- Overview of the Floorplanner --- p.54Chapter 5.3 --- Congestion Model --- p.55Chapter 5.3.1 --- Probabilistic Model with Variable Interval Buffer Inser- tion Constraint --- p.57Chapter 5.3.2 --- Time Complexity --- p.61Chapter 5.4 --- Buffer Planning --- p.62Chapter 5.4.1 --- Estimation of Buffer Usage --- p.62Chapter 5.4.2 --- Estimation of Buffer Resources --- p.69Chapter 5.5 --- Two-phases Simulated Annealing --- p.70Chapter 5.6 --- Wirelength Estimation --- p.72Chapter 5.7 --- Multi-pin Nets Handling --- p.73Chapter 5.8 --- Experimental Results --- p.73Chapter 5.9 --- Remarks --- p.76Chapter 5.10 --- Summary --- p.76Chapter 6 --- Global Router --- p.77Chapter 6.1 --- Introduction --- p.77Chapter 6.2 --- Overview of the Global Router --- p.77Chapter 6.3 --- Buffer Insertion Constraint and Congestion Constraint --- p.78Chapter 6.4 --- Multi-pin Nets Handling --- p.79Chapter 6.5 --- Routing Methodology --- p.79Chapter 6.6 --- Implementation --- p.80Chapter 6.7 --- Summary --- p.86Chapter 7 --- Interconnect-Driven Floorplanning by Alternative Packings --- p.87Chapter 7.1 --- Introduction --- p.87Chapter 7.2 --- Overview of the Method --- p.87Chapter 7.3 --- Searching Alternative Packings --- p.89Chapter 7.3.1 --- Rectangular Supermodules in Sequence Pair --- p.89Chapter 7.3.2 --- Finding rearrangable module sets --- p.90Chapter 7.3.3 --- Alternative Sequence Pairs --- p.94Chapter 7.4 --- Implementation --- p.97Chapter 7.4.1 --- Re-calculation of Interconnect Cost --- p.98Chapter 7.4.2 --- Cost Function --- p.101Chapter 7.4.3 --- Time Complexity --- p.101Chapter 7.5 --- Experimental Results --- p.101Chapter 7.6 --- Summary --- p.103Chapter 8 --- Conclusion --- p.105Bibliography --- p.10

Analog layout design automation: ILP-based analog routers

The shrinking design window and high parasitic sensitivity in the advanced technology have imposed special challenges on the analog and radio frequency (RF) integrated circuit design. In this thesis, we propose a new methodology to address such a deficiency based on integer linear programming (ILP) but without compromising the capability of handling any special constraints for the analog routing problems. Distinct from the conventional methods, our algorithm utilizes adaptive resolutions for various routing regions. For a more congested region, a routing grid with higher resolution is employed, whereas a lower-resolution grid is adopted to a less crowded routing region. Moreover, we strengthen its speciality in handling interconnect width control so as to route the electrical nets based on analog constraints while considering proper interconnect width to address the acute interconnect parasitics, mismatch minimization, and electromigration effects simultaneously. In addition, to tackle the performance degradation due to layout dependent effects (LDEs) and take advantage of optical proximity correction (OPC) for resolution enhancement of subwavelength lithography, in this thesis we have also proposed an innovative LDE-aware analog layout migration scheme, which is equipped with our special routing methodology. The LDE constraints are first identified with aid of a special sensitivity analysis and then satisfied during the layout migration process. Afterwards the electrical nets are routed by an extended OPC-inclusive ILP-based analog router to improve the final layout image fidelity while the routability and analog constraints are respected in the meantime. The experimental results demonstrate the effectiveness and efficiency of our proposed methods in terms of both circuit performance and image quality compared to the previous works

Transistor-Level Layout of Integrated Circuits

In this dissertation, we present the toolchain BonnCell and its underlying algorithms. It has been developed in close cooperation with the IBM Corporation and automatically generates the geometry for functional groups of 2 to approximately 50 transistors. Its input consists of a set of transistors, including properties like their sizes and their types, a specification of their connectivity, and parameters to flexibly control the technological framework as well as the algorithms' behavior. Using this data, the tool computes a detailed geometric realization of the circuit as polygonal shapes on 16 layers. To this end, a placement routine configures the transistors and arranges them in the plane, which is the main subject of this thesis. Subsequently, a routing engine determines wires connecting the transistors to ensure the circuit's desired functionality. We propose and analyze a family of algorithms that arranges sets of transistors in the plane such that a multi-criteria target function is optimized. The primary goal is to obtain solutions that are as compact as possible because chip area is a valuable resource in modern techologies. In addition to the core algorithms we formulate variants that handle particularly structured instances in a suitable way. We will show that for 90% of the instances in a representative test bed provided by IBM, BonnCell succeeds to generate fully functional layouts including the placement of the transistors and a routing of their interconnections. Moreover, BonnCell is in wide use within IBM's groups that are concerned with transistor-level layout - a task that has been performed manually before our automation was available. Beyond the processing of isolated test cases, two large-scale examples for applications of the tool in the industry will be presented: On the one hand the initial design phase of a large SRAM unit required only half of the expected 3 month period, on the other hand BonnCell could provide valuable input aiding central decisions in the early concept phase of the new 14 nm technology generation

Lithography aware physical design and layout optimization for manufacturability

textAs technology continues to scale down, semiconductor manufacturing with 193nm lithography is greatly challenging because the required half pitch size is beyond the resolution limit. In order to bridge the gap between design requirements and manufacturing limitations, various resolution enhancement techniques have been proposed to avoid potentially problematic patterns and to improve product yield. In addition, co-optimization between design performance and manufacturability can further provide flexible and significant yield improvement, and it has become necessary for advanced technology nodes. This dissertation presents the methodologies to consider the lithography impact in different design stages to improve layout manufacturability. Double Patterning Lithography (DPL) has been a promising solution for sub-22nm node volume production. Among DPL techniques, self-aligned double patterning (SADP) provides good overlay controllability when two masks are not aligned perfectly. However, SADP process places several limitations on design flexibility and still exists many challenges in physical design stages. Starting from the early design stage, we analyze the standard cell designs and construct a set of SADP-aware cell placement candidates, and show that placement legalization based on this SADP awareness information can effectively resolve DPL conflicts. In the detailed routing stage, we propose a new routing cost formulation based on SADP-compliant routing guidelines, and achieve routing and layout decomposition simultaneously. In the case that limited routing perturbation is allowed, we propose a post-routing flow based on lithography simulation and lithography-aware design rules. Both routing methods, one in detailed routing stage and one in post routing stage, reduce DPL conflicts/violations significantly with negligible wire length impact. In the layout decomposition stage, layout modification is restricted and thus the manufacturability is even harder to guaranteed. By taking the advantage of complementary lithography, we present a new layout decomposition approach with e-beam cutting, which optimizes SADP overlay error and e-beam lithography throughput simultaneously. After the mask layout is defined, optical proximity correction (OPC) is one of the resolution enhancement techniques that is commonly required to compensate the image distortion from the lithography process. We propose an inverse lithography technique to solve the OPC problem considering design target and process window co-optimization. Our mask optimization is pixel based and thus can enable better contour fidelity. In the final physical verification stage, a complex and time-consuming lithography simulation needs to be performed to identify faulty patterns. We provide a classification method based on support vector machine and principle component analysis that detects lithographic hotspots efficiently and accurately.Electrical and Computer Engineerin

Regular cell design approach considering lithography-induced process variations

The deployment delays for EUVL, forces IC design to continue using 193nm wavelength lithography with innovative and costly techniques in order to faithfully print sub-wavelength features and combat lithography induced process variations. The effect of the lithography gap in current and upcoming technologies is to cause severe distortions due to optical diffraction in the printed patterns and thus degrading manufacturing yield. Therefore, a paradigm shift in layout design is mandatory towards more regular litho-friendly cell designs in order to improve line pattern resolution. However, it is still unclear the amount of layout regularity that can be introduced and how to measure the benefits and weaknesses of regular layouts. This dissertation is focused on searching the degree of layout regularity necessary to combat lithography variability and outperform the layout quality of a design. The main contributions that have been addressed to accomplish this objective are: (1) the definition of several layout design guidelines to mitigate lithography variability; (2) the proposal of a parametric yield estimation model to evaluate the lithography impact on layout design; (3) the development of a global Layout Quality Metric (LQM) including a Regularity Metric (RM) to capture the degree of layout regularity of a layout implementation and; (4) the creation of different layout architectures exploiting the benefits of layout regularity to outperform line-pattern resolution, referred as Adaptive Lithography Aware Regular Cell Designs (ALARCs). The first part of this thesis provides several regular layout design guidelines derived from lithography simulations so that several important lithography related variation sources are minimized. Moreover, a design level methodology, referred as gate biasing, is proposed to overcome systematic layout dependent variations, across-field variations and the non-rectilinear gate effect (NRG) applied to regular fabrics by properly configuring the drawn transistor channel length. The second part of this dissertation proposes a lithography yield estimation model to predict the amount of lithography distortion expected in a printed layout due to lithography hotspots with a reduced set of lithography simulations. An efficient lithography hotspot framework to identify the different layout pattern configurations, simplify them to ease the pattern analysis and classify them according to the lithography degradation predicted using lithography simulations is presented. The yield model is calibrated with delay measurements of a reduced set of identical test circuits implemented in a CMOS 40nm technology and thus actual silicon data is utilized to obtain a more realistic yield estimation. The third part of this thesis presents a configurable Layout Quality Metric (LQM) that considering several layout aspects provides a global evaluation of a layout design with a single score. The LQM can be leveraged by assigning different weights to each evaluation metric or by modifying the parameters under analysis. The LQM is here configured following two different set of partial metrics. Note that the LQM provides a regularity metric (RM) in order to capture the degree of layout regularity applied in a layout design. Lastly, this thesis presents different ALARC designs for a 40nm technology using different degrees of layout regularity and different area overheads. The quality of the gridded regular templates is demonstrated by automatically creating a library containing 266 cells including combinational and sequential cells and synthesizing several ITC'99 benchmark circuits. Note that the regular cell libraries only presents a 9\% area penalty compared to the 2D standard cell designs used for comparison and thus providing area competitive designs. The layout evaluation of benchmark circuits considering the LQM shows that regular layouts can outperform other 2D standard cell designs depending on the layout implementation.Los continuos retrasos en la implementación de la EUVL, fuerzan que el diseño de IC se realice mediante litografía de longitud de onda de 193 nm con innovadoras y costosas técnicas para poder combatir variaciones de proceso de litografía. La gran diferencia entre la longitud de onda y el tamaño de los patrones causa severas distorsiones debido a la difracción óptica en los patrones impresos y por lo tanto degradando el yield. En consecuencia, es necesario realizar un cambio en el diseño de layouts hacia diseños más regulares para poder mejorar la resolución de los patrones. Sin embargo, todavía no está claro el grado de regularidad que se debe introducir y como medir los beneficios y los perjuicios de los diseños regulares. El objetivo de esta tesis es buscar el grado de regularidad necesario para combatir las variaciones de litografía y mejorar la calidad del layout de un diseño. Las principales contribuciones para conseguirlo son: (1) la definición de diversas reglas de diseño de layout para mitigar las variaciones de litografía; (2) la propuesta de un modelo para estimar el yield paramétrico y así evaluar el impacto de la litografía en el diseño de layout; (3) el diseño de una métrica para analizar la calidad de un layout (LQM) incluyendo una métrica para capturar el grado de regularidad de un diseño (RM) y; (4) la creación de diferentes tipos de layout explotando los beneficios de la regularidad, referidos como Adaptative Lithography Aware Regular Cell Designs (ALARCs). La primera parte de la tesis, propone las diversas reglas de diseño para layouts regulares derivadas de simulaciones de litografía de tal manera que las fuentes de variación de litografía son minimizadas. Además, se propone una metodología de diseño para layouts regulares, referida como "gate biasing" para contrarrestar las variaciones sistemáticas dependientes del layout, las variaciones en la ventana de proceso del sistema litográfico y el efecto de puerta no rectilínea para configurar la longitud del canal del transistor correctamente. La segunda parte de la tesis, detalla el modelo de estimación del yield de litografía para predecir mediante un número reducido de simulaciones de litografía la cantidad de distorsión que se espera en un layout impreso debida a "hotspots". Se propone una eficiente metodología que identifica los distintos patrones de un layout, los simplifica para facilitar el análisis de los patrones y los clasifica en relación a la degradación predecida mediante simulaciones de litografía. El modelo de yield se calibra utilizando medidas de tiempo de un número reducido de idénticos circuitos de test implementados en una tecnología CMOS de 40nm y de esta manera, se utilizan datos de silicio para obtener una estimación realista del yield. La tercera parte de este trabajo, presenta una métrica para medir la calidad del layout (LQM), que considera diversos aspectos para dar una evaluación global de un diseño mediante un único valor. La LQM puede ajustarse mediante la asignación de diferentes pesos para cada métrica de evaluación o modificando los parámetros analizados. La LQM se configura mediante dos conjuntos de medidas diferentes. Además, ésta incluye una métrica de regularidad (RM) para capturar el grado de regularidad que se aplica en un diseño. Finalmente, esta disertación presenta los distintos diseños ALARC para una tecnología de 40nm utilizando diversos grados de regularidad y diferentes impactos en área. La calidad de estos diseños se demuestra creando automáticamente una librería de 266 celdas incluyendo celdas combinacionales y secuenciales y, sintetizando diversos circuitos ITC'99. Las librerías regulares solo presentan un 9% de impacto en área comparado con diseños de celdas estándar 2D y por tanto proponiendo diseños competitivos en área. La evaluación de los circuitos considerando la LQM muestra que los diseños regulares pueden mejorar otros diseños 2D dependiendo de la implementación del layout

Timing optimization during the physical synthesis of cell-based VLSI circuits

Tese (doutorado) - Universidade Federal de Santa Catarina, Centro Tecnológico, Programa de Pós-Graduação em Engenharia de Automação e Sistemas, Florianópolis, 2016.Abstract : The evolution of CMOS technology made possible integrated circuits with billions of transistors assembled into a single silicon chip, giving rise to the jargon Very-Large-Scale Integration (VLSI). The required clock frequency affects the performance of a VLSI circuit and induces timing constraints that must be properly handled by synthesis tools. During the physical synthesis of VLSI circuits, several optimization techniques are used to iteratively reduce the number of timing violations until the target clock frequency is met. The dramatic increase of interconnect delay under technology scaling represents one of the major challenges for the timing closure of modern VLSI circuits. In this scenario, effective interconnect synthesis techniques play a major role. That is why this thesis targets two timing optimization problems for effective interconnect synthesis: Incremental Timing-Driven Placement (ITDP) and Incremental Timing-Driven Layer Assignment (ITLA). For solving the ITDP problem, this thesis proposes a new Lagrangian Relaxation formulation that minimizes timing violations for both setup and hold timing constraints. This work also proposes a netbased technique that uses Lagrange multipliers as net-weights, which are dynamically updated using an accurate timing analyzer. The netbased technique makes use of a novel discrete search to relocate cells by employing the Euclidean distance to define a proper neighborhood. For solving the ITLA problem, this thesis proposes a network flow approach that handles simultaneously critical and non-critical segments, and exploits a few flow conservation conditions to extract timing information for each net segment individually, thereby enabling the use of an external timing engine. The experimental validation using benchmark suites derived from industrial circuits demonstrates the effectiveness of the proposed techniques when compared with state-of-the-art works.A evolução da tecnologia CMOS viabilizou a fabricação de circuitos integrados contendo bilhões de transistores em uma única pastilha de silício, dando origem ao jargão Very-Large-Scale Integration (VLSI). A frequência-alvo de operação de um circuito VLSI afeta o seu desempenho e induz restrições de timing que devem ser manipuladas pelas ferramentas de síntese. Durante a síntese física de circuitos VLSI, diversas técnicas de otimização são usadas para iterativamente reduzir o número de violações de timing até que a frequência-alvo de operação seja atingida. O aumento dramático do atraso das interconexões devido à evolução tecnológica representa um dos maiores desafios para o fluxo de timing closure de circuitos VLSI contemporâneos. Nesse cenário, técnicas de síntese de interconexão eficientes têm um papel fundamental. Por este motivo, esta tese aborda dois problemas de otimização de timing para uma síntese eficiente das interconexões de um circuito VLSI: Incremental Timing-Driven Placement (ITDP) e Incremental Timing-Driven Layer Assignment (ITLA). Para resolver o problema de ITDP, esta tese propõe uma nova formulação utilizando Relaxação Lagrangeana que tem por objetivo a minimização simultânea das violações de timing para restrições do tipo setup e hold. Este trabalho também propõe uma técnica que utiliza multiplicadores de Lagrange como pesos para as interconexões, os quais são atualizados dinamicamente através dos resultados de uma ferramenta de análise de timing. Tal técnica realoca as células do circuito por meio de uma nova busca discreta que adota a distância Euclidiana como vizinhança.Para resolver o problema de ITLA, esta tese propõe uma abordagem em fluxo em redes que otimiza simultaneamente segmentos críticos e não-críticos, e explora algumas condições de fluxo para extrair as informações de timing para cada segmento individualmente, permitindo assim o uso de uma ferramenta de timing externa. A validação experimental, utilizando benchmarks derivados de circuitos industriais, demonstra a eficiência das técnicas propostas quando comparadas com trabalhos estado da arte