Parts application handbook study

The requirements for a NASA application handbook for standard electronic parts are determined and defined. This study concentrated on identifying in detail the type of information that designers and parts engineers need and expect in a parts application handbook for the effective application of standard parts on NASA projects

Practical Gpgpu Application Resilience Estimation And Fortification

Graphics Processing Units (GPUs) are becoming a de facto solution for accelerating a wide range of applications but remain susceptible to transient hardware faults (soft errors) that can easily compromise application output. One of the major challenges in the domain of GPU reliability is to accurately measure general purpose GPU (GPGPU) application resilience to transient faults. This challenge stems from the fact that a typical GPGPU application spawns a huge number of threads and then utilizes a large amount of potentially unreliable compute and memory resources available on the GPUs. As the number of possible fault locations can be in the billions, evaluating every fault and examining its effect on the application error resilience is impractical. Alternatively, fault site selection techniques have been proposed to approach high accuracy with less fault injection experiments. However, most of the existing methods in the literature only focus on the single-bit fault model and only one input. In this dissertation, we offer solutions to the two problems above. We extend a progressive fault site pruning technique for two multi-bit fault models: (a) multi-bit faults in the same word; (b) multiple single-bit faults in different words accessed by the same thread. We devise a methodology, SUGAR (Speeding Up GPGPU Application Resilience Estimation with input sizing), that dramatically speeds up the evaluation of application error resilience. Key of the SUGAR estimation methodology is the identification of repeating thread patterns that develop as a function of the size of the input. These patterns allow for accurate prediction of application error resilience for arbitrarily large inputs. With the presence of input-aware estimation strategies, we are able to pinpoint the vulnerabilities in a GPGPU application and propose low overhead protection techniques accordingly. Based on the variety of thread resilience in GPGPU applications, we propose a methodology that identifies the resilience of threads and aims to map threads with the same resilience characteristics to the same warp. Our technique allows engaging partial protection mechanisms at the warp level. We illustrate that threads can be remapped into reliable or unreliable warps with only minimal introduced overhead, and then selective protection via replication is applied in unreliable warps. We show how this remapping facilitates warp replication for error detection and correction and achieves a significant reduction of execution cycles, comparing to standard techniques. In addition to input-aware estimation and fortification, we present a detailed characterization comparing microarchitecture-level and software-level fault injection and show the gap of resilience estimation introduced by injecting faults into different layers in the system execution stack. We also implement a software-level redundancy protection mechanism and measure its effectiveness using microarchitecture-level and software-level fault injection

Execution of a Hybrid Vehicle Controls Development Effort Utilizing Model-Based Design, Hardware-in-the-loop Testing, Agile Scrum Methods and Requirements Engineering

Modern hybrid vehicles require sophisticated supervisory control systems in order to realize competitive efficiency gains. Processes such as model-based design, HIL simulation and Agile Scrum methods can allow for quicker and less costly development of a complex product. The design of a supervisory control system for a prototype PHEV vehicle was executed with the intent of developing a mule vehicle into a 99% production ready vehicle. The control system design process was carried through from requirements definition to operating parameter optimization of utilizing model-based design, HIL simulation and the Scrum model. A prototype vehicle that has a fully functioning hybrid system with innovative propulsion control methods has been produced by this process

GPU devices for safety-critical systems: a survey

Graphics Processing Unit (GPU) devices and their associated software programming languages and frameworks can deliver the computing performance required to facilitate the development of next-generation high-performance safety-critical systems such as autonomous driving systems. However, the integration of complex, parallel, and computationally demanding software functions with different safety-criticality levels on GPU devices with shared hardware resources contributes to several safety certification challenges. This survey categorizes and provides an overview of research contributions that address GPU devices’ random hardware failures, systematic failures, and independence of execution.This work has been partially supported by the European Research Council with Horizon 2020 (grant agreements No. 772773 and 871465), the Spanish Ministry of Science and Innovation under grant PID2019-107255GB, the HiPEAC Network of Excellence and the Basque Government under grant KK-2019-00035. The Spanish Ministry of Economy and Competitiveness has also partially supported Leonidas Kosmidis with a Juan de la Cierva Incorporación postdoctoral fellowship (FJCI-2020- 045931-I).Peer ReviewedPostprint (author's final draft

Design, Analysis and Test of Logic Circuits under Uncertainty.

Integrated circuits are increasingly susceptible to uncertainty caused by soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects become detrimental to circuit reliability. In order to address this, we develop methods for analyzing, designing, and testing circuits subject to probabilistic effects. Our main contributions are: 1) a fast, soft-error rate (SER) analyzer that uses functional-simulation signatures to capture error effects, 2) novel design techniques that improve reliability using little area and performance overhead, 3) a matrix-based reliability-analysis framework that captures many types of probabilistic faults, and 4) test-generation/compaction methods aimed at probabilistic faults in logic circuits. SER analysis must account for the main error-masking mechanisms in ICs: logic, timing, and electrical masking. We relate logic masking to node testability of the circuit and utilize functional-simulation signatures, i.e., partial truth tables, to efficiently compute estability (signal probability and observability). To account for timing masking, we compute error-latching windows (ELWs) from timing analysis information. Electrical masking is incorporated into our estimates through derating factors for gate error probabilities. The SER of a circuit is computed by combining the effects of all three masking mechanisms within our SER analyzer called AnSER. Using AnSER, we develop several low-overhead techniques that increase reliability, including: 1) an SER-aware design method that uses redundancy already present within the circuit, 2) a technique that resynthesizes small logic windows to improve area and reliability, and 3) a post-placement gate-relocation technique that increases timing masking by decreasing ELWs. We develop the probabilistic transfer matrix (PTM) modeling framework to analyze effects beyond soft errors. PTMs are compressed into algebraic decision diagrams (ADDs) to improve computational efficiency. Several ADD algorithms are developed to extract reliability and error susceptibility information from PTMs representing circuits. We propose new algorithms for circuit testing under probabilistic faults, which require a reformulation of existing test techniques. For instance, a test vector may need to be repeated many times to detect a fault. Also, different vectors detect the same fault with different probabilities. We develop test generation methods that account for these differences, and integer linear programming (ILP) formulations to optimize test sets.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/61584/1/smita_1.pd

Reliability training

Discussed here is failure physics, the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low cost reliable products. A review of reliability for the years 1940 to 2000 is given. Next, a review of mathematics is given as well as a description of what elements contribute to product failures. Basic reliability theory and the disciplines that allow us to control and eliminate failures are elucidated