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research
AVF stressmark: towards an automated methodology for bounding the worst-case vulnerability to soft errors
Authors
Lieven Eeckhout
Lizy Kurian John
Arun Arvind Nair
Publication date
1 January 2010
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
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Abstract
Abstract is not available.
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Last time updated on 01/04/2019
Ghent University Academic Bibliography
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oai:archive.ugent.be:1104929
Last time updated on 12/11/2016
