A surrogate modeling and adaptive sampling toolbox for computer based design

An exceedingly large number of scientific and engineering fields are confronted with the need for computer simulations to study complex, real world phenomena or solve challenging design problems. However, due to the computational cost of these high fidelity simulations, the use of neural networks, kernel methods, and other surrogate modeling techniques have become indispensable. Surrogate models are compact and cheap to evaluate, and have proven very useful for tasks such as optimization, design space exploration, prototyping, and sensitivity analysis. Consequently, in many fields there is great interest in tools and techniques that facilitate the construction of such regression models, while minimizing the computational cost and maximizing model accuracy. This paper presents a mature, flexible, and adaptive machine learning toolkit for regression modeling and active learning to tackle these issues. The toolkit brings together algorithms for data fitting, model selection, sample selection (active learning), hyperparameter optimization, and distributed computing in order to empower a domain expert to efficiently generate an accurate model for the problem or data at hand

ooDACE toolbox: a flexible object-oriented Kriging implementation

When analyzing data from computationally expensive simulation codes, surrogate modeling methods are firmly established as facilitators for design space exploration, sensitivity analysis, visualization and optimization. Kriging is a popular surrogate modeling technique used for the Design and Analysis of Computer Experiments (DACE). Hence, the past decade Kriging has been the subject of extensive research and many extensions have been proposed, e.g., co-Kriging, stochastic Kriging, blind Kriging, etc. However, few Kriging implementations are publicly available and tailored towards scientists and engineers. Furthermore, no Kriging toolbox exists that unifies several Kriging flavors. This paper addresses this need by presenting an efficient object-oriented Kriging implementation and several Kriging extensions, providing a flexible and easily extendable framework to test and implement new Kriging flavors while reusing as much code as possible

Efficient simulation-driven design optimization of antennas using co-kriging

We present an efficient technique for design optimization of antenna structures. Our approach exploits coarse-discretization electromagnetic (EM) simulations of the antenna of interest that are used to create its fast initial model (a surrogate) through kriging. During the design process, the predictions obtained by optimizing the surrogate are verified using high-fidelity EM simulations, and this high-fidelity data is used to enhance the surrogate through co-kriging technique that accommodates all EM simulation data into one surrogate model. The co-kriging-based optimization algorithm is simple, elegant and is capable of yielding a satisfactory design at a low cost equivalent to a few high-fidelity EM simulations of the antenna structure. To our knowledge, this is a first application of co-kriging to antenna design. An application example is provided

Efficient generation of X-parameters transistor models by sequential sampling

This letter proposes a sequential sampling technique to generate efficiently multidimensional X-parameters models for microwave transistors, while guaranteeing X-parameters' validity and overcoming simulator convergence issues. The sequential sampling process selects a set of samples that are subsequently used to construct behavioral models with radial basis functions. The proposed method was compared with a tabular X-parameters model with cubic spline interpolation. The radial basis function models demonstrate very fast convergence and greater accuracy already for a few tens of samples. The proposed technique is illustrated for a GaAs HEMT using Curtice3 and Chalmers empirical model simulations as the data source

Practical implementation of a sequential sampling algorithm for EMI near-field scanning

Abstract—In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced trade-off between ‘exploration ’ and ‘exploitation’. Moreover, at every moment analytical models for the complete near-field pattern can be computed by means of Kriging. By comparing successive models, an automatic stopping criterion can be implemented. The performance and effectiveness of the proposed sampling algorithm is tested on a number of simple printed circuit boards and compared with that of the traditionally used uniform sampling

Sequential sampling strategy for the modeling of parameterized microwave and RF components

Accurate modeling of parameterized microwave and RF components often requires a large number of full-wave electromagnetic simulations. In order to reduce the overall simulation cost, a sequential sampling algorithm is proposed that selects a sparse set of data samples which characterize the overall response of the system. The resulting data samples can be fed into existing modeling techniques. The effectiveness of the approach is illustrated by a parameterized H-shaped microwave antenna