Timing models for high-level synthesis

In this paper, we describe a timing model for clock estimation during high-level synthesis. In order to obtain realistic timing estimates, the proposed model considers all delay elements, including datapath, control and wire delays, and several technology factors, such as layout architecture, technology mapping, buffers insertion and loading effects. The experimental results show that this model can provide much better estimates than previous models. This model is well suited for automatic and interactive synthesis as well as feedback-driven synthesis where performance matrices must be rapidly and incrementally calculated

An Electromigration and Thermal Model of Power Wires for a Priori High-Level Reliability Prediction

In this paper, a simple power-distribution electrothermal model including the interconnect self-heating is used together with a statistical model of average and rms currents of functional blocks and a high-level model of fanout distribution and interconnect wirelength. Following the 2001 SIA roadmap projections, we are able to predict a priori that the minimum width that satisfies the electromigration constraints does not scale like the minimum metal pitch in future technology nodes. As a consequence, the percentage of chip area covered by power lines is expected to increase at the expense of wiring resources unless proper countermeasures are taken. Some possible solutions are proposed in the paper

Gate-level timing analysis and waveform evaluation

Static timing analysis (STA) is an integral part of modern VLSI chip design. Table lookup based methods are widely used in current industry due to its fast runtime and mature algorithms. Conventional STA algorithms based on table-lookup methods are developed under many assumptions in timing analysis; however, most of those assumptions, such as that input signals and output signals can be accurately modeled as ramp waveforms, are no longer satisfactory to meet the increasing demand of accuracy for new technologies. In this dissertation, we discuss several crucial issues that conventional STA has not taken into consideration, and propose new methods to handle these issues and show that new methods produce accurate results. In logic circuits, gates may have multiple inputs and signals can arrive at these inputs at different times and with different waveforms. Different arrival times and waveforms of signals can cause very different responses. However, multiple-input transition effects are totally overlooked by current STA tools. Using a conventional single-input transition model when multiple-input transition happens can cause significant estimation errors in timing analysis. Previous works on this issue focus on developing a complicated gate model to simulate the behavior of logic gates. These methods have high computational cost and have to make significant changes to the prevailing STA tools, and are thus not feasible in practice. This dissertation proposes a simplified gate model, uses transistor connection structures to capture the behavior of multiple-input transitions and requires no change to the current STA tools. Another issue with table lookup based methods is that the load of each gate in technology libraries is modeled as a single lumped capacitor. But in the real circuit, the Abstract 2 gate connects to its subsequent gates via metal wires. As the feature size of integrated circuit scales down, the interconnection cannot be seen as a simple capacitor since the resistive shielding effect will largely affect the equivalent capacitance seen from the gate. As the interconnection has numerous structures, tabulating the timing data for various interconnection structures is not feasible. In this dissertation, by using the concept of equivalent admittance, we reduce an arbitrary interconnection structure into an equivalent π-model RC circuit. Many previous works have mapped the π-model to an effective capacitor, which makes the table lookup based methods useful again. However, a capacitor cannot be equivalent to a π-model circuit, and will thus result in significant inaccuracy in waveform evaluation. In order to obtain an accurate waveform at gate output, a piecewise waveform evaluation method is proposed in this dissertation. Each part of the piecewise waveform is evaluated according to the gate characteristic and load structures. Another contribution of this dissertation research is a proposed equivalent waveform search method. The signal waveforms can be very complicated in the real circuits because of noises, race hazards, etc. The conventional STA only uses one attribute (i.e., transition time) to describe the waveform shape which can cause significant estimation errors. Our approach is to develop heuristic search functions to find equivalent ramps to approximate input waveforms. Here the transition time of a final ramp can be completely different from that of the original waveform, but we can get higher accuracy on output arrival time and transition time. All of the methods mentioned in this dissertation require no changes to the prevailing STA tools, and have been verified across different process technologies

Register-transfer-level power profiling for system-on-chip power distribution network design and signoff

Abstract. This thesis is a study of how register-transfer-level (RTL) power profiling can help the design and signoff of power distribution network in digital integrated circuits. RTL power profiling is a method which collects RTL power estimation results to a single power profile which then can be analysed in order to find interesting time windows for specifying power distribution network design and signoff. The thesis starts with theory part. Complementary metal-oxide semiconductor (CMOS) inverter power dissipation is studied at first. Next, power distribution network structure and voltage drop problems are introduced. Voltage drop is demonstrated by using power distribution network impedance figures. Common on-chip power distribution network structure is introduced, and power distribution network design flow is outlined. Finally, decoupling capacitors function and impact on power distribution network impedance are thoroughly explained. The practical part of the thesis contains RTL power profiling flow details and power profiling flow results for one simulation case in one design block. Also, some methods of improving RTL power estimation accuracy are discussed and calibration with extracted parasitic is then used to get new set of power profiling time windows. After the results are presented, overall RTL power estimation accuracy is analysed and resulted time windows are compared to reference gate-level time windows. RTL power profiling result analysis shows that resulted time windows match the theory and RTL power profiling seems to be a promising method for finding time windows for power distribution network design and signoff.Rekisterisiirtotason tehoprofilointi järjestelmäpiirin tehonsiirtoverkon suunnittelussa ja verifioinnissa. Tiivistelmä. Tässä työssä tutkitaan, miten rekisterisiirtotason (RTL) tehoprofilointi voi auttaa digitaalisten integroitujen piirien tehonsiirtoverkon suunnittelussa ja verifioinnissa. RTL-tehoprofilointi on menetelmä, joka analysoi RTL-tehoestimoinnista saadusta tehokäyrästä hyödyllisiä aikaikkunoita tehonsiirtoverkon suunnitteluun ja verifiointiin. Työ alkaa teoriaosuudella, jonka aluksi selitetään, miten CMOS-invertteri kuluttaa tehoa. Seuravaksi esitellään tehonsiirtoverkon rakenne ja pahimmat tehonsiirtoverkon jännitehäviön aiheuttajat. Jännitehäviötä havainnollistetaan myös piirikaavioiden ja impedanssikäyrien avustuksella. Lisäksi integroidun piirin tehonsiirtoverkon suunnitteluvuo ja yleisin rakenne on esitelty. Lopuksi teoriaosuus käsittelee yksityiskohtaisesti ohituskondensaattoreiden toiminnan ja vaikutuksen tehonsiirtoverkon kokonaisimpedanssiin. Työn kokeellisessa osuudessa esitellään ensin tehoprofiloinnin vuo ja sen jälkeen vuon tulokset yhdelle esimerkkilohkolle yhdessä simulaatioajossa. Lisäksi tässä osiossa käsitellään RTL-tehoestimoinnin tarkkuutta ja tehdään RTL-tehoprofilointi loisimpedansseilla kalibroidulle RTL-mallille. Lopuksi RTL-tehoestimoinnin tuloksia ja saatuja RTL-tehoprofiloinnin aikaikkunoita analysoidaan ja verrataan porttitason mallin tuloksiin. RTL-tehoprofiloinnin tulosten analysointi osoittaa, että saatavat aikaikkunat vastaavat teoriaa ja että RTL-tehoprofilointi näyttää lupaavalta menetelmältä tehosiirtoverkon analysoinnin ja verifioinnin aikaikkunoiden löytämiseen

Fast, non-monte-carlo estimation of transient performance variation due to device mismatch

This paper describes an efficient way of simulating the effects of device random mismatch on circuit transient characteristics, such as variations in delay or in frequency. The proposed method models DC random offsets as equivalent AC pseudo-noises and leverages the fast, linear periodically time-varying (LPTV) noise analysis available from RF circuit simulators. Therefore, the method can be considered as an extension to DC match analysis and offers a large speed-up compared to the traditional Monte-Carlo analysis. Although the assumed linear perturbation model is valid only for small variations, it enables easy ways to estimate correlations among variations and identify the most sensitive design parameters to mismatch, all at no additional simulation cost. Three benchmarks measuring the variations in the input offset voltage of a clocked comparator, the delay of a logic path, and the frequency of an oscillator demonstrate the speed improvement of about 100-1000x compared to a 1000-point Monte-Carlo method