Combinational Circuit Obfuscation through Power Signature Manipulation

Today\u27s military systems are composed of hardware and software systems, many of which are critical technologies, and must be protected to ensure our adversaries cannot gain any information from a various analysis attacks. Side Channel Analysis (SCA) attacks allow an attacker to gain the significant information from the measured signatures leaked by side-channels such as power consumption, and electro-magnetic emission. In this research the focus on detecting, characterizing, and manipulating the power signature by designing a power signature estimation and manipulation method. This research has determined that the proposed method capable of characterizing and altering the type of power signature can provide a protection against adversarial SCA attacks

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

This paper presents a novel method to identify and insert redundant logic into a combinational circuit to improve its fault tolerance without having to replicate the entire circuit as is the case with conventional redundancy techniques. In this context, it is discussed how to estimate the fault masking capability of a combinational circuit using the truth-cum-fault enumeration table, and then it is shown how to identify the logic that can introduced to add redundancy into the original circuit without affecting its native functionality and with the aim of improving its fault tolerance though this would involve some trade-off in the design metrics. However, care should be taken while introducing redundant logic since redundant logic insertion may give rise to new internal nodes and faults on those may impact the fault tolerance of the resulting circuit. The combinational circuit that is considered and its redundant counterparts are all implemented in semi-custom design style using a 32/28nm CMOS digital cell library and their respective design metrics and fault tolerances are compared

Switching Activity Minimization for XOR Gate Decomposition

In this paper we focus on reduction of switching activity in combinational logic circuits. We are analyzing energy consumption of multi-input XOR gate where changes of inputs occur principally at different times at logic level. We obtain upper and lower bounds for switching activity in various combinations with decomposition of muli-phase input gate. This work presents the algorithm of synthesis for multi-input XOR gate with minimum switching activity. The results presented in this paper are useful for power estimation and low power design. More than 10 to 70 % reduction of in switching activity has been observed using this method.Статья рассматривает вопросы минимизации переключательной активности комбинационных схем. Представлен анализ энергопотребления многовходовых элементов «Исключающее ИЛИ» для случая, когда сигналы на входах меняют свое состояние прин­ципиально в различные моменты времени. Получены формулы, определяющие верх­нюю и нижнюю границы переключательной активности для различных вариантов де­композиции многовходовых элементов. В работе представлен алгоритм синтеза многовходового элемента «Исключающее ИЛИ» с минимальной переключательной активностью. Полученные результаты могут быть использованы для оценки энергопотребления и проектирования с пониженным энергопотреблением. Показано, что применение предложенного подхода позволяет на 10–70 % снизить переключательную активность

A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

Multilevel Power Estimation Of VLSI Circuits Using Efficient Algorithms

New and complex systems are being implemented using highly advanced Electronic Design Automation (EDA) tools. As the complexity increases day by day, the dissipation of power has emerged as one of the very important design constraints. Now low power designs are not only used in small size applications like cell phones and handheld devices but also in high-performance computing applications. Embedded memories have been used extensively in modern SOC designs. In order to estimate the power consumption of the entire design correctly, an accurate memory power model is needed. However, the memory power model commonly used in commercial EDA tools is too simple to estimate the power consumption accurately. For complex digital circuits, building their power models is a popular approach to estimate their power consumption without detailed circuit information. In the literature, most of power models are built with lookup tables. However, building the power models with lookup tables may become infeasible for large circuits because the table size would increase exponentially to meet the accuracy requirement. This thesis involves two parts. In first part it uses the Synopsys power measurement tools together with the use of synthesis and extraction tools to determine power consumed by various macros at different levels of abstraction including the Register Transfer Level (RTL), the gate and the transistor level. In general, it can be concluded that as the level of abstraction goes down the accuracy of power measurement increases depending on the tool used. In second part a novel power modeling approach for complex circuits by using neural networks to learn the relationship between power dissipation and input/output characteristic vector during simulation has been developed. Our neural power model has very low complexity such that this power model can be used for complex circuits. Using such a simple structure, the neural power models can still have high accuracy because they can automatically consider the non-linear power distributions. Unlike the power characterization process in traditional approaches, our characterization process is very simple and straightforward. More importantly, using the neural power model for power estimation does not require any transistor-level or gate-level description of the circuits. The experimental results have shown that the estimations are accurate and efficient for different test sequences with wide range of input distributions

Custom Integrated Circuits

Contains reports on nine research projects.Analog Devices, Inc.International Business Machines CorporationJoint Services Electronics Program Contract DAAL03-89-C-0001U.S. Air Force - Office of Scientific Research Contract AFOSR 86-0164BDuPont CorporationNational Science Foundation Grant MIP 88-14612U.S. Navy - Office of Naval Research Contract N00014-87-K-0825American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

Cross-Layer Resiliency Modeling and Optimization: A Device to Circuit Approach

The never ending demand for higher performance and lower power consumption pushes the VLSI industry to further scale the technology down. However, further downscaling of technology at nano-scale leads to major challenges. Reduced reliability is one of them, arising from multiple sources e.g. runtime variations, process variation, and transient errors. The objective of this thesis is to tackle unreliability with a cross layer approach from device up to circuit level

On Co-Optimization Of Constrained Satisfiability Problems For Hardware Software Applications

Manufacturing technology has permitted an exponential growth in transistor count and density. However, making efficient use of the available transistors in the design has become exceedingly difficult. Standard design flow involves synthesis, verification, placement and routing followed by final tape out of the design. Due to the presence of various undesirable effects like capacitive crosstalk, supply noise, high temperatures, etc., verification/validation of the design has become a challenging problem. Therefore, having a good design convergence may not be possible within the target time, due to a need for a large number of design iterations. Capacitive crosstalk is one of the major causes of design convergence problems in deep sub-micron era. With scaling, the number of crosstalk violations has been increasing because of reduced inter-wire distances. Consequently only the most severe crosstalk faults are fixed pre-silicon while the rest are tested post-silicon. Testing for capacitive crosstalk involves generation of input patterns which can be applied post-silicon to the integrated circuit and comparison of the output response. These patterns are generated at the gate/ Register Transfer Level (RTL) of abstraction using Automatic Test Pattern Generation (ATPG) tools. In this dissertation, anInteger Linear Programming (ILP) based ATPG technique for maximizing crosstalk induced delay increase at the victim net, for multiple aggressor crosstalk faults, is presented. Moreover, various solutions for pattern generation considering both zero as well as unit delay models is also proposed. With voltage scaling, power supply switching noise has become one of the leading causes of signal integrity related failures in deep sub-micron designs. Hence, during power supply network design and analysis of power supply switching noise, computation of peak supply current is an essential step. Traditional peak current estimation approaches involve addition of peak current associated with all the CMOS gates which are switching in a combinational circuit. Consequently, this approach does not take the Boolean and temporal relationships of the circuit into account. This work presents an ILP based technique for generation of an input pattern pair which maximizes switching supply currents for a combinational circuit in the presence of integer gate delays. The input pattern pair generated using the above approach can be applied post-silicon for power droop testing. With high level of integration, Multi-Processor Systems on Chip (MPSoC) feature multiple processor cores and accelerators on the same die, so as to exploit the instruction level parallelism in the application. For hardware-software co-design, application programming model is based on a Task Graph, which represents task dependencies and execution/transfer times for various threads and processes within an application. Mapping an application to an MPSoC traditionally involves representing it in the form of a task graph and employing static scheduling in order to minimize the schedule length. Dynamic system behavior is not taken into consideration during static scheduling, while dynamic scheduling requires the knowledge of task graph at runtime. A run-time task graph extraction heuristic to facilitate dynamic scheduling is also presented here. A novel game theory based approach uses this extracted task graph to perform run-time scheduling in order to minimize total schedule length. With increase in transistor density, power density has gone up substantially. This has lead to generation of regions with very high temperature called Hotspots. Hotspots lead to reliability and performance issues and affect design convergence. In current generation Integrated Circuits (ICs) temperature is controlled by reducing power dissipation using Dynamic Thermal Management (DTM) techniques like frequency and/or voltage scaling. These techniques are reactive in nature and have detrimental effects on performance. Here, a look-ahead based task migration technique is proposed, in order to utilize the multitude of cores available in an MPSoC to eliminate thermal emergencies. Our technique is based on temperature prediction, leveraging upon a novel wavelet based thermal modeling approach. Hence, this work addresses several optimization problems that can be reduced to constrained max-satisfiability, involving integer as well as Boolean constraints in hardware and software domains. Moreover, it provides domain specific heuristic solutions for each of them