캘리브레이션이 필요없는 위상고정 루프의 설계

학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2017. 2. 김재하.A PVT-insensitive-bandwidth PLL and a chirp frequency synthesizer PLL are proposed using a constant-relative-gain digitally-controlled oscillator (DCO), a constant-gain time-to-digital converter (TDC), and a simple digital loop filter (DLF) without an explicit calibration or additional circuit components. A digital LC-PLL that realizes a PVT-insensitive loop bandwidth (BW) by using the constant-relative-gain LC-DCO and constant-gain TDC is proposed. In other words, based on ratiometric circuit designs, the LC-DCO can make a fixed percent change to its frequency for a unit change in its digital input and the TDC can maintain a fixed range and resolution measured in reference unit intervals (UIs) across PVT variations. With such LC-DCO and TDC, the proposed PLL can realize a bandwidth which is a constant fraction of the reference frequency even with a simple proportional-integral digital loop filter without any explicit calibration loops. The prototype digital LC-PLL fabricated in a 28-nm CMOS demonstrates a frequency range of 8.38~9.34 GHz and 652-fs,rms integrated jitter from 10-kHz to 1-GHz at 8.84-GHz while dissipating 15.2-mW and occupying 0.24-mm^2. Also, the PLL across three different die samples and supply voltage ranging from 1.0 to 1.2V demonstrates a nearly constant BW at 822-kHz with the variation of ±4.25-% only. A chirp frequency synthesizer PLL (FS-PLL) that is capable of precise triangular frequency modulation using type-III digital LC-PLL architecture for X-band FMCW imaging radar is proposed. By employing a phase-modulating two-point modulation (TPM), constant-gain TDC, and a simple second-order DLF with polarity-alternating frequency ramp estimator, the PLL achieves a gain self-tracking TPM realizing a frequency chirp with fast chirp slope (=chirp BW/chirp period) without increasing frequency errors around the turn-around points, degrading the effective resolution achievable. A prototype chirp FS-PLL fabricated in a 65nm CMOS demonstrates that the PLL can generate a precise triangular chirp profile centered at 8.9-GHz with 940-MHz bandwidth and 28.8-us period with only 1.9-MHz,rms frequency error including the turn-around points and 14.8-mW power dissipation. The achieved 32.63-MHz/us chirp slope is higher than that of FMCW FS-PLLs previously reported by 2.6x.CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 5 CHAPTER 2 CONVENTIONAL PHASE-LOCKED LOOP 7 2.1 CHARGE-PUMP PLL 7 2.1.1 OPERATING PRINCIPLE 7 2.1.2 LOOP DYNAMICS 9 2.2 DIGITAL PLL 10 2.2.1 OPERATING PRINCIPLE 11 2.2.2 LOOP DYNAMICS 12 CHAPTER 3 VARIATIONS ON PHASE-LOCKED LOOP 14 3.1 OSCILLATOR GAIN VARIATION 14 3.1.1 RING VOLTAGE-CONTROLLED OSCILLATOR 15 3.1.2 LC VOLTAGE-CONTROLLED OSCILLATOR 17 3.1.3 LC DIGITALLY-CONTROLLED OSCILLATOR 19 3.2 PHASE DETECTOR GAIN VARIATION 20 3.2.1 LINEAR PHASE DETECTOR 20 3.2.2 LINEAR TIME-TO-DIGITAL CONVERTER 21 CHAPTER 4 PROPOSED DCO AND TDC FOR CALIBRATION-FREE PLL 23 4.1 DIGTALLY-CONTROLLED OSCILLATOR (DCO) 25 4.1.1 OVERVIEW 24 4.1.2 CONSTANT-RELATIVE-GAIN DCO 26 4.2 TIME-TO-DIGITAL CONVERTER (TDC) 28 4.2.1 OVERVIEW 28 4.2.2 CONSTANT-GAIN TDC 30 CHAPTER 5 PVT-INSENSITIVE-BANDWIDTH PLL 35 5.1 OVERVIEW 36 5.2 PRIOR WORKS 37 5.3 PROPOSED PVT-INSENSITIVE-BANDWIDTH PLL 39 5.4 CIRCUIT IMPLEMENTATION 41 5.4.1 CAPACITOR-TUNED LC-DCO 41 5.4.2 TRANSFORMER-TUNED LC-DCO 45 5.4.3 OVERSAMPLING-BASED CONSTANT-GAIN TDC 49 5.4.4 PHASE DIGITAL-TO-ANALOG CONVERTER 52 5.4.5 DIGITAL LOOP FILTER 54 5.4.6 FREQUENCY DIVIDER 55 5.4.7 BANG-BANG PHASE-FREQUENCY DETECTOR 56 5.5 CELL-BASED DESIGN FLOW 57 5.6 MEASUREMENT RESULTS 58 CHAPTER 6 CHIRP FREQUENCY SYNTHESIZER PLL 66 6.1 OVERVIEW 67 6.2 PRIOR WORKS 71 6.3 PROPOSED CHIRP FREQUENCY SYNTHESIZER PLL 75 6.4 CIRCUIT IMPLEMENTATION 83 6.4.1 SECOND-ORDER DIGITAL LOOP FILTER 83 6.4.2 PHASE MODULATOR 84 6.4.3 CONSTANT-GAIN TDC 85 6.4.4 VRACTOR-BASED LC-DCO 87 6.4.5 OVERALL CLOCK CHAIN 90 6.5 MEASUREMENT RESULTS 91 6.6 SIGNAL-TO-NOISE RATIO OF RADAR 98 CHAPTER 7 CONCLUSION 100 BIBLIOGRAPHY 102 초록 109Docto

Time-Offset Fractional-N PLLs for Heterodyne FMCW SAR

This text contains an investigation into the use of time-offset fractional-N phase locked loops (PLLs) for heterodyne frequency-modulated continuous-wave (FMCW) synthetic aperture radar (SAR) and the impact of spurii on such a system. Heterodyne receiver architectures avoid phenomena which limit the sensitivity of their homodyne counterparts, and enable certain inter-antenna feed-through suppression techniques. Despite these advantages, homodyne receivers are more prevalent owing to advantages in size, weight and cost. Designed to address this dilemma, the miloSAR is believed to be the only heterodyne FMCW SAR to employ a pair of time-offset fractional-N PLLs for waveform synthesis to enable low-cost heterodyning and simplify filter-based feed-through suppression. This system architecture is revealed to be susceptible to swept-offset spurii termed spur chirps which hinder the sensor's performance. While integer boundary spurs and phase detector harmonics infamously plague fractional-N PLLs, their resultant spur-chirps have not seen analysis in the context of FMCW SAR. Simulations and measurements reveal that these spurii significantly degrade SAR image quality in terms of peak sidelobe ratio, structural similarity index measure and root mean square error. To combat this, several suppression techniques were assessed, namely: time domain zeroing, PLL loop bandwidth reduction, and a novel method termed range-Doppler spur masking. A subset of these suppression techniques were applied to measured SAR data sets, including car-borne data measured in Iowa, USA and airborne data captured in Oudtshoorn, South Africa. These results show that the impact of spur chirps can be effectively quelled, meaning that time-offset fractional-N PLLs offer an attractive, low-cost approach to the implementation of heterodyne FMCW SAR

Feasibility and systems definition study for Microwave Multi-Application Payload (MMAP)

Work completed on three Shuttle/Spacelab experiments is examined: the Adaptive Multibeam Phased Array Antenna (AMPA) Experiment, Electromagnetic Environment Experiment (EEE) and Millimeter Wave Communications Experiment (MWCE). Results included the definition of operating modes, sequence of operation, radii of operation about several ground stations, signal format, foot prints of typical orbits and preliminary definition of ground and user terminals. Conceptual hardware designs, Spacelab interfaces, data handling methods, experiment testing and verification studies were included. The MWCE-MOD I was defined conceptually for a steerable high gain antenna

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Concepts for smart AD and DA converters

This thesis studies the `smart' concept for application to analog-to-digital and digital-to-analog converters. The smart concept aims at improving performance - in a wide sense - of AD/DA converters by adding on-chip intelligence to extract imperfections and to correct for them. As the smart concept can correct for certain imperfections, it can also enable the use of more efficient architectures, thus yielding an additional performance boost. Chapter 2 studies trends and expectations in converter design with respect to applications, circuit design and technology evolution. Problems and opportunities are identfied, and an overview of performance criteria is given. Chapter 3 introduces the smart concept that takes advantage of the expected opportunities (described in chapter 2) in order to solve the anticipated problems. Chapter 4 applies the smart concept to digital-to-analog converters. In the discussed example, the concept is applied to reduce the area of the analog core of a current-steering DAC. It is shown that a sub-binary variable-radix approach reduces the area of the current-source elements substantially (10x compared to state-of-the-art), while maintaining accuracy by a self-measurement and digital pre-correction scheme. Chapter 5 describes the chip implementation of the sub-binary variable-radix DAC and discusses the experimental results. The results confirm that the sub-binary variable-radix design can achieve the smallest published current-source-array area for the given accuracy (12bit). Chapter 6 applies the smart concept to analog-to-digital converters, with as main goal the improvement of the overall performance in terms of a widely used figure-of-merit. Open-loop circuitry and time interleaving are shown to be key to achieve high-speed low-power solutions. It is suggested to apply a smart approach to reduce the effect of the imperfections, unintentionally caused by these key factors. On high-level, a global picture of the smart solution is proposed that can solve the problems while still maintaining power-efficiency. Chapter 7 deals with the design of a 500MSps open-loop track-and-hold circuit. This circuit is used as a test case to demonstrate the proposed smart approaches. Experimental results are presented and compared against prior art. Though there are several limitations in the design and the measurement setup, the measured performance is comparable to existing state-of-the-art. Chapter 8 introduces the first calibration method that counteracts the accuracy issues of the open-loop track-and-hold. A description of the method is given, and the implementation of the detection algorithm and correction circuitry is discussed. The chapter concludes with experimental measurement results. Chapter 9 introduces the second calibration method that targets the accuracy issues of time-interleaved circuits, in this case a 2-channel version of the implemented track-and-hold. The detection method, processing algorithm and correction circuitry are analyzed and their implementation is explained. Experimental results verify the usefulness of the method

The Telecommunications and Data Acquisition Report

This publication, one of a series formerly titled The Deep Space Network (DSN) Progress Report, documents DSN progress in flight project support, tracking and data acquisition research and technology, network engineering, hardware and software implementation, and operations. In addition, developments in Earth-based radio technology as applied to geodynamics, astrophysics, and the radio search for extraterrestrial intelligence are reported

Pipeline analog-to-digital converters for wide-band wireless communications

During the last decade, the development of the analog electronics has been dictated by the enormous growth of the wireless communications. Typical for the new communication standards has been an evolution towards higher data rates, which allows more services to be provided. Simultaneously, the boundary between analog and digital signal processing is moving closer to the antenna, thus aiming for a software defined radio. For analog-to-digital converters (ADCs) of radio receivers this indicates higher sample rate, wider bandwidth, higher resolution, and lower power dissipation. The radio receiver architectures, showing the greatest potential to meet the commercial trends, include the direct conversion receiver and the super heterodyne receiver with an ADC sampling at the intermediate frequency (IF). The pipelined ADC architecture, based on the switched capacitor (SC) technique, has most successfully covered the widely separated resolution and sample rate requirements of these receiver architectures. In this thesis, the requirements of ADCs in both of these receiver architectures are studied using the system specifications of the 3G WCDMA standard. From the standard and from the limited performance of the circuit building blocks, design constraints for pipeline ADCs, at the architectural and circuit level, are drawn. At the circuit level, novel topologies for all the essential blocks of the pipeline ADC have been developed. These include a dual-mode operational amplifier, low-power voltage reference circuits with buffering, and a floating-bulk bootstrapped switch for highly-linear IF-sampling. The emphasis has been on dynamic comparators: a new mismatch insensitive topology is proposed and measurement results for three different topologies are presented. At the architectural level, the optimization of the ADCs in the single-chip direct conversion receivers is discussed: the need for small area, low power, suppression of substrate noise, input and output interfaces, etc. Adaptation of the resolution and sample rate of a pipeline ADC, to be used in more flexible multi-mode receivers, is also an important topic included. A 6-bit 15.36-MS/s embedded CMOS pipeline ADC and an 8-bit 1/15.36-MS/s dual-mode CMOS pipeline ADC, optimized for low-power single-chip direct conversion receivers with single-channel reception, have been designed. The bandwidth of a pipeline ADC can be extended by employing parallelism to allow multi-channel reception. The errors resulted from mismatch of parallel signal paths are analyzed and their elimination is presented. Particularly, an optimal partitioning of the resolution between the stages, and the number of parallel channels, in time-interleaved ADCs are derived. A low-power 10-bit 200-MS/s CMOS parallel pipeline ADC employing double sampling and a front-end sample-and-hold (S/H) circuit is implemented. Emphasis of the thesis is on high-resolution pipeline ADCs with IF-sampling capability. The resolution is extended beyond the limits set by device matching by using calibration, while time interleaving is applied to widen the signal bandwidth. A review of calibration and error averaging techniques is presented. A simple digital self-calibration technique to compensate capacitor mismatch within a single-channel pipeline ADC, and the gain and offset mismatch between the channels of a time-interleaved ADC, is developed. The new calibration method is validated with two high-resolution BiCMOS prototypes, a 13-bit 50-MS/s single-channel and a 14-bit 160-MS/s parallel pipeline ADC, both utilizing a highly linear front-end allowing sampling from 200-MHz IF-band.reviewe

Electronics for Sensors

The aim of this Special Issue is to explore new advanced solutions in electronic systems and interfaces to be employed in sensors, describing best practices, implementations, and applications. The selected papers in particular concern photomultiplier tubes (PMTs) and silicon photomultipliers (SiPMs) interfaces and applications, techniques for monitoring radiation levels, electronics for biomedical applications, design and applications of time-to-digital converters, interfaces for image sensors, and general-purpose theory and topologies for electronic interfaces