Design of sigma-delta modulators for analog-to-digital conversion intensively using passive circuits

This thesis presents the analysis, design implementation and experimental evaluation of passiveactive discrete-time and continuous-time Sigma-Delta (ΣΔ) modulators (ΣΔMs) analog-todigital converters (ADCs). Two prototype circuits were manufactured. The first one, a discrete-time 2nd-order ΣΔM, was designed in a 130 nm CMOS technology. This prototype confirmed the validity of the ultra incomplete settling (UIS) concept used for implementing the passive integrators. This circuit, clocked at 100 MHz and consuming 298 μW, achieves DR/SNR/SNDR of 78.2/73.9/72.8 dB, respectively, for a signal bandwidth of 300 kHz. This results in a Walden FoMW of 139.3 fJ/conv.-step and Schreier FoMS of 168 dB. The final prototype circuit is a highly area and power efficient ΣΔM using a combination of a cascaded topology, a continuous-time RC loop filter and switched-capacitor feedback paths. The modulator requires only two low gain stages that are based on differential pairs. A systematic design methodology based on genetic algorithm, was used, which allowed decreasing the circuit’s sensitivity to the circuit components’ variations. This continuous-time, 2-1 MASH ΣΔM has been designed in a 65 nm CMOS technology and it occupies an area of just 0.027 mm2. Measurement results show that this modulator achieves a peak SNR/SNDR of 76/72.2 dB and DR of 77dB for an input signal bandwidth of 10 MHz, while dissipating 1.57 mW from a 1 V power supply voltage. The ΣΔM achieves a Walden FoMW of 23.6 fJ/level and a Schreier FoMS of 175 dB. The innovations proposed in this circuit result, both, in the reduction of the power consumption and of the chip size. To the best of the author’s knowledge the circuit achieves the lowest Walden FOMW for ΣΔMs operating at signal bandwidth from 5 MHz to 50 MHz reported to date

Low Power Analog to Digital Converters in Advanced CMOS Technology Nodes

The dissertation presents system and circuit solutions to improve the power efficiency and address high-speed design issues of ADCs in advanced CMOS technologies. For image sensor applications, a high-performance digitizer prototype based on column-parallel single-slope ADC (SS-ADC) topology for readout of a back-illuminated 3D-stacked CMOS image sensor is presented. To address the high power consumption issue in high-speed digital counters, a passing window (PW) based hybrid counter topology is proposed. To address the high column FPN under bright illumination conditions, a double auto-zeroing (AZ) scheme is proposed. The proposed techniques are experimentally verified in a prototype chip designed and fabricated in the TSMC 40 nm low-power CMOS process. The PW technique saves 52.8% of power consumption in the hybrid digital counters. Dark/bright column fixed pattern noise (FPN) of 0.0024%/0.028% is achieved employing the proposed double AZ technique for digital correlated double sampling (CDS). A single-column digitizer consumes total power of 66.8μW and occupies an area of 5.4 µm x 610 µm. For mobile/wireless receiver applications, this dissertation presents a low-power wide-bandwidth multistage noise-shaping (MASH) continuous-time delta-sigma modulator (CT-ΔΣM) employing finite impulse response (FIR) digital-to-analog converters (DACs) and encoder-embedded loop-unrolling (EELU) quantizers. The proposed MASH 1-1-1 topology is a cascade of three single-loop first-order CT-ΔΣM stages, each of which consists of an active-RC integrator, a current-steering DAC, and an EELU quantizer. An FIR filter in the main 1.5-bit DAC improves the modulator’s jitter sensitivity performance. FIR’s effect on the noise transfer function (NTF) of the modulator is compensated in the digital domain thanks to the MASH topology. Instead of employing a conventional analog direct feedback path, a 1.5-bit EELU quantizer based on multiplexing comparator outputs is proposed; this approach is suitable for highspeed operation together with power and area benefits. Fabricated in a 40-nm low-power CMOS technology, the modulator’s prototype achieves a 67.3 dB of signal-to-noise and distortion ratio (SNDR), 68 dB of signal-to-noise ratio (SNR), and 68.2 dB of dynamic range (DR) within 50.5 MHz of bandwidth (BW), while consuming 19 mW of total power (P). The proposed modulator features 161.5 dB of figure-of-merit (FOM), defined as FOM = SNDR + 10 log10 (BW/P)

Digital enhancement techniques for data converters in scaled CMOS technologies

This thesis presents digital enhancement techniques for data converters in advanced technology nodes. With technology scaling, traditional voltage-domain (VD) analog-to-digital converters (ADCs) face two major challenges: (1) reduction of dynamic range due to supply voltage scaling, and (2) decrease in intrinsic gain of transistors which makes high gain amplifier design tough. To address these challenges, a two-stage ADC architecture is presented which uses time-domain quantization to exploit the advantages of technology scaling. The architecture, consisting of a first stage successive approximation register (SAR) and a second stage ring oscillator, is highly digital and scaling friendly. Two prototypes have been developed to validate the proposed architecture. The 40nm CMOS prototype achieves 75.7 dB dynamic range at an excellent Schreier figure-of-merit of 172.2 dB. The proposed architecture has been extended to a capacitance-to-digital converter and a prototype has been developed in 40nm CMOS. The prototype can sense capacitances with a resolution of 1.3fF and has a Walden figure-of-merit of 60 fJ/step which is more than two times better than the current state-of-the-art. This thesis also presents digital techniques to improve performance of continuous-time(CT), delta-sigma digital-to-analog converters (DACs). Recently, CT delta-sigma DACs have received more attention than their discrete, switched-capacitor counterpart mainly because of low power and/or higher speed of operation. However, a critical disadvantage of CT, delta-sigma DACs is their greatly increased sensitivity to inter-symbol interference (ISI) error. To address this shortcoming of CT DACs, this thesis presents several algorithms that can mitigate ISI error simultaneously with static mismatch error. Further, the proposed algorithms are fully digital in nature and as such, are best poised to take maximum advantage of technology scaling. Thus, the techniques presented in this thesis will be important enabling factors in raising the envelope of performance of CT delta-sigma DACs in advanced technology nodes.Electrical and Computer Engineerin

Power Efficient Architectures for High Accuracy Analog-to-Digital Converters

Incremental ADCs (IADCs) have found wide applications in sensor interface circuitry since, compared to ∆Σ ADCs, they provide low-latency high-accuracy conversion and easy multiplexing among multiple channels. On the other hand, continuous-time ∆Σ ADCs (CTDSM) have been receiving more and more attention as a power-efficient solution in targeting medium to high accuracy over wider range of signal bandwidth (tens of MHz). In this dissertation, novel configurations have been explored in both architectures for power-efficient and high-accuracy data conversion. First, a multi-step incremental ADC (IADC) using multi-slope extended counting technique is described. Only one active integrator is used in the three-step conversion cycle. The accuracy of the IADC is extended by having it configured as multi-slope ADCs in two additional steps. The proposed IADC uses the same circuitry as a first-order IADC (IADC1), but it exhibits as good efficiency as its second-order ∆Σ ADC counterpart. For the same accuracy, the conversion cycle is shortened by a factor of more than 2⁹ compared to the IADC1. Fabricated in 0.18-μm CMOS process, the prototype ADC occupies 0.5 mm². With a 642 kHz clock, it achieves SNDR of 52.2 dB in the first step. The SNDR is boosted to 79.8 dB in the second step, and to 96.8 dB in the third step, over a 1 kHz signal band. The power consumption is 35 µW from a 1.5 V power supply. This gives an excellent Schreier FoM of 174.6 dB. Secondly, a multi-step incremental ADC with extended binary counting is proposed. It achieves high accuracy by splitting one conversion cycle into two serial steps. During the first step, the ADC works as a first-order incremental ADC (IADC1). The second step reuses the single integrator and extends the accuracy to 16 bits by a two-capacitor SAR-assisted binary counting technique. For the same accuracy, the conversion cycle is shortened by a factor of more than 2⁸ as compared to the single-step IADC. Fabricated in 0.18-μm CMOS process, the SAR-assisted IADC achieves a peak SNR/SNDR/DR of 97.1/96.6/100.2 dB over a 1.2 kHz bandwidth, while dissipating 33.2 μW from a 1.5 V supply. This gives a Schreier FoM of 175.8 dB and Walden FoM of 0.25 pJ/conv.-step. Finally, the design of a continuous-time ∆Σ modulator (CTDSM) to be used in an ultrasound beamformer for biomedical imaging is described. To achieve better resolution, the prototype modulator operates at 1.2 GHz. It incorporates a digital excess loop delay (ELD) compensation to replace the active adder in front of the internal quantizer. A digitally controlled reference-switching matrix, combined with the data-weighted averaging (DWA) technique, results in a delay-free feedback path. A multi-bit FIR feedback DAC, along with its compensation path, is used to achieve lower clock jitter sensitivity and better loop filter linearity. The modulator achieves 79.4 dB dynamic range, 77.3 dB SNR and 74.3 dB SNDR over a 15 MHz signal bandwidth. Fabricated in a 65 nm CMOS process, the core modulator occupies an area of only 0.16 mm² and dissipates 6.96 mW from a 1 V supply. A 58.6 fJ/conversion-step figure of merit was achieved.Keywords: Incremental ADC, multi-step operation, instrumentation and measurement, sensor interface, analog-to-digital converter, extended counting, chopper stabilization, delta-sigma ADC, multi-slope ADCsKeywords: Incremental ADC, multi-step operation, instrumentation and measurement, sensor interface, analog-to-digital converter, extended counting, chopper stabilization, delta-sigma ADC, multi-slope ADC

Multi-Stage Noise-Shaping Continuous-Time Sigma-Delta Modulator

The design of a single-loop continuous-time ∑∆ modulator (CT∑∆M) with high resolution, wide bandwidth, and low power consumption is very challenging. The multi-stage noise-shaping (MASH) CT∑∆M architecture is identified as an advancement to the single-loop CT∑∆M architecture in order to satisfy the ever stringent requirements of next generation wireless systems. However, it suffers from the problems of quantization noise leakage and non-ideal interstage interfacing which hinder its widespread adoption. To solve these issues, this dissertation proposes a MASH CT∑∆M with on-chip RC time constant calibration circuits, multiple feedforward interstage paths, and a fully integrated noise cancellation filter (NCF). The prototype core modulator architecture is a cascade of two single-loop second- order CT∑∆M stages, each of which consists of an integrator-based active-RC loop filter, current-steering feedback digital-to-analog converters, and a four-bit flash quantizer. On-chip RC time constant calibration circuits and high gain multi-stage operational amplifiers are realized to mitigate quantization noise leakage due to process variation. Multiple feedforward interstage paths are introduced to (i) synthesize a fourth-order noise transfer function with DC zeros, (ii) simplify the design of NCF, and (iii) reduce signal swings at the second-stage integrator outputs. Fully integrated in 40 nm CMOS, the prototype chip achieves 74.4 dB of signal-to-noise and distortion ratio (SNDR), 75.8 dB of signal-to-noise ratio, and 76.8 dB of dynamic range in 50.3 MHz of bandwidth (BW) at 1 GHz of sampling frequency with 43.0 mW of power consumption (P). It does not require external software calibration and possesses minimal out-of-band signal transfer function peaking. The figure-of-merit (FOM), defined as FOM = SNDR + 10 log10(BW/P), is 165.1 dB

Time-Interleaved Analog-to-Digital-Converters: Modeling, Blind Identification and Digital Correction of Frequency Response Mismatches

Analog-to-digital-conversion enables utilization of digital signal processing (DSP) in many applications today such as wireless communication, radar and electronic warfare. DSP is the favored choice for processing information over analog signal processing (ASP) because it can typically offer more flexibility, computational power, reproducibility, speed and accuracy when processing and extracting information. Software defined radio (SDR) receiver is one clear example of this, where radio frequency waveforms are converted into digital form as close to the antenna as possible and all the processing of the information contained in the received signal is extracted in a configurable manner using DSP. In order to achieve such goals, the information collected from the real world signals, which are commonly analog in their nature, must be converted into digital form before it can be processed using DSP in the respective systems. The common trend in these systems is to not only process ever larger bandwidths of data but also to process data in digital format at ever higher processing speeds with sufficient conversion accuracy. So the analog-to-digital-converter (ADC), which converts real world analog waveforms into digital form, is one of the most important cornerstones in these systems.The ADC must perform data conversion at higher and higher rates and digitize ever-increasing bandwidths of data. In accordance with the Nyquist-Shannon theorem, the conversion rate of the ADC must be suffcient to accomodate the BW of the signal to be digitized, in order to avoid aliasing. The conversion rate of the ADC can in general be increased by using parallel ADCs with each ADC performing the sampling at mutually different points in time. Interleaving the outputs of each of the individual ADCs provides then a higher digitization output rate. Such ADCs are referred to as TI-ADC. However, the mismatches between the ADCs cause unwanted spurious artifacts in the TI-ADC’s spectrum, ultimately leading to a loss in accuracy in the TI-ADC compared to the individual ADCs. Therefore, the removal or correction of these unwanted spurious artifacts is essential in having a high performance TI-ADC system.In order to remove the unwanted interleaving artifacts, a model that describes the behavior of the spurious distortion products is of the utmost importance as it can then facilitate the development of efficient digital post-processing schemes. One major contribution of this thesis consists of the novel and comprehensive modeling of the spurious interleaving mismatches in different TI-ADC scenarios. This novel and comprehensive modeling is then utilized in developing digital estimation and correction methods to remove the mismatch induced spurious artifacts in the TI-ADC’s spectrum and recovering its lost accuracy. Novel and first of its kind digital estimation and correction methods are developed and tested to suppress the frequency dependent mismatch spurs found in the TI-ADCs. The developed methods, in terms of the estimation of the unknown mismatches, build on statistical I/Q signal processing principles, applicable without specifically tailored calibration signals or waveforms. Techniques to increase the analog BW of the ADC are also analyzed and novel solutions are presented. The interesting combination of utilizing I/Q downconversion in conjunction with TI-ADC is examined, which not only extends the TI-ADC’s analog BW but also provides flexibility in accessing the radio spectrum. Unwanted spurious components created during the ADC’s bandwidth extension process are also analyzed and digital correction methods are developed to remove these spurs from the spectrum. The developed correction techniques for the removal of the undesired interleaving mismatch artifacts are validated and tested using various HW platforms, with up to 1 GHz instantaneous bandwidth. Comprehensive test scenarios are created using measurement data obtained from HW platforms, which are used to test and evaluate the performance of the developed interleaving mismatch estimation and correction schemes, evidencing excellent performance in all studied scenarios. The findings and results presented in this thesis contribute towards increasing the analog BW and conversion rate of ADC systems without losing conversion accuracy. Overall, these developments pave the way towards fulfilling the ever growing demands on the ADCs in terms of higher conversion BW, accuracy and speed

Low power VCO-based analog-to-digital conversion

textThis dissertation presents novel two stage ADC architecture with a VCO based second stage. With the scaling of the supply voltages in modern CMOS process it is difficult to design high gain operational amplifiers needed for traditional voltage domain two-stage analog to digital converters. However time resolution continues to improve with the advancement in CMOS technology making VCO-based ADC more attractive. The nonlinearity in voltage-to-frequency transfer function is the biggest challenge in design of VCO based ADC. The hybrid approach used in this work uses a voltage domain first stage to determine the most significant bits and uses a VCO based second stage to quantize the small residue obtained from first stage. The architecture relaxes the gain requirement on the the first stage opamp and also relaxes the linearity requirements on the second stage VCO. The prototype ADC built in 65nm CMOS process achieves 63.7dB SNDR in 10MHz bandwidth while only consuming 1.1mW of power. The performance of the prototype chip is comparable to the state-of-art in terms of figure-of-merit but this new architecture uses significantly less circuit area.Electrical and Computer Engineerin