Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches

Embedded processors are widely used in critical applications such as space missions, where reliability is mandatory for the success of missions. Due to the increasing application complexity, the number of systems using Real-Time Operating Systems (RTOSs) is quickly growing to manage the execution of multiple applications and meet timing constraints. However, whether operating systems or bare-metal applications provide higher reliability is still being determined. We present a comprehensive reliability analysis of software applications running on a device with bare-metal and FreeRTOS against the same faults based on fault models derived from a proton test. Additionally, the FreeRTOS system has been evaluated with a set of software applications dedicated to evaluating specific RTOS functions, providing an additional evaluation for operations crucial for a real-time operating system

Two-Layer Error Control Codes Combining Rectangular and Hamming Product Codes for Cache Error

We propose a novel two-layer error control code, combining error detection capability of rectangular codes and error correction capability of Hamming product codes in an efficient way, in order to increase cache error resilience for many core systems, while maintaining low power, area and latency overhead. Based on the fact of low latency and overhead of rectangular codes and high error control capability of Hamming product codes, two-layer error control codes employ simple rectangular codes for each cache line to detect cache errors, while loading the extra Hamming product code checks bits in the case of error detection; thus enabling reliable large-scale cache operations. Analysis and experiments are conducted to evaluate the cache fault-tolerant capability of various existing solutions and the proposed approach. The results show that the proposed approach can significantly increase Mean-Error-To-Failure (METF) and Mean-Time-To-failure (MTTF) up to 2.8×, reduce storage overhead by over 57%, and increase instruction per-cycle (IPC) up to 7%, compared to complex four-way 4EC5ED; and it increases METF and MTTF up to 133×, reduces storage overhead by over 11%, and achieves a similar IPC compared to simple eight-way single-error correcting double-error detecting (SECDED). The cost of the proposed approach is no more than 4% external memory access overhead

A Power-Gated 8-Transistor Physically Unclonable Function Accelerates Evaluation Speeds

\ua9 2023 by the authors.The proposed 8-Transistor (8T) Physically Unclonable Function (PUF), in conjunction with the power gating technique, can significantly accelerate a single evaluation cycle more than 100,000 times faster than a 6-Transistor (6T) Static Random-Access Memory (SRAM) PUF. The 8T PUF is built to swiftly eliminate data remanence and maximise physical mismatch. Moreover, a two-phase power gating module is devised to provide controllable power on/off cycles for the chosen PUF clusters in order to facilitate fast statistical measurements and curb the in-rush current. The architecture and hardware implementation of the power-gated PUF are developed to accommodate fast multiple evaluations of PUF Responses. The fast speed enables a new data processing method, which coordinates Dark-bit masking and Multiple Temporal Majority Voting (TMV) in different Process, Voltage and Temperature (PVT) corners or during field usage, hence greatly reducing the Bit Error Rate (BER) and the hardware penalty for error correction. The designs are based on the UMC 65 nm technology and aim to tape out an Application-Specific Integrated Circuit (ASIC) chip. Post-layout Monte Carlo (MC) simulations are performed with Cadence, and the extracted PUF Responses are processed with Matlab to evaluate the 8T PUF performance and statistical metrics for subsequent inclusion in PUF Responses, which comprise the novelty of this approach

A Touch of Evil: High-Assurance Cryptographic Hardware from Untrusted Components

The semiconductor industry is fully globalized and integrated circuits (ICs) are commonly defined, designed and fabricated in different premises across the world. This reduces production costs, but also exposes ICs to supply chain attacks, where insiders introduce malicious circuitry into the final products. Additionally, despite extensive post-fabrication testing, it is not uncommon for ICs with subtle fabrication errors to make it into production systems. While many systems may be able to tolerate a few byzantine components, this is not the case for cryptographic hardware, storing and computing on confidential data. For this reason, many error and backdoor detection techniques have been proposed over the years. So far all attempts have been either quickly circumvented, or come with unrealistically high manufacturing costs and complexity. This paper proposes Myst, a practical high-assurance architecture, that uses commercial off-the-shelf (COTS) hardware, and provides strong security guarantees, even in the presence of multiple malicious or faulty components. The key idea is to combine protective-redundancy with modern threshold cryptographic techniques to build a system tolerant to hardware trojans and errors. To evaluate our design, we build a Hardware Security Module that provides the highest level of assurance possible with COTS components. Specifically, we employ more than a hundred COTS secure crypto-coprocessors, verified to FIPS140-2 Level 4 tamper-resistance standards, and use them to realize high-confidentiality random number generation, key derivation, public key decryption and signing. Our experiments show a reasonable computational overhead (less than 1% for both Decryption and Signing) and an exponential increase in backdoor-tolerance as more ICs are added

Robust and Traffic Aware Medium Access Control Mechanisms for Energy-Efficient mm-Wave Wireless Network-on-Chip Architectures

To cater to the performance/watt needs, processors with multiple processing cores on the same chip have become the de-facto design choice. In such multicore systems, Network-on-Chip (NoC) serves as a communication infrastructure for data transfer among the cores on the chip. However, conventional metallic interconnect based NoCs are constrained by their long multi-hop latencies and high power consumption, limiting the performance gain in these systems. Among, different alternatives, due to the CMOS compatibility and energy-efficiency, low-latency wireless interconnect operating in the millimeter wave (mm-wave) band is nearer term solution to this multi-hop communication problem. This has led to the recent exploration of millimeter-wave (mm-wave) wireless technologies in wireless NoC architectures (WiNoC). To realize the mm-wave wireless interconnect in a WiNoC, a wireless interface (WI) equipped with on-chip antenna and transceiver circuit operating at 60GHz frequency range is integrated to the ports of some NoC switches. The WIs are also equipped with a medium access control (MAC) mechanism that ensures a collision free and energy-efficient communication among the WIs located at different parts on the chip. However, due to shrinking feature size and complex integration in CMOS technology, high-density chips like multicore systems are prone to manufacturing defects and dynamic faults during chip operation. Such failures can result in permanently broken wireless links or cause the MAC to malfunction in a WiNoC. Consequently, the energy-efficient communication through the wireless medium will be compromised. Furthermore, the energy efficiency in the wireless channel access is also dependent on the traffic pattern of the applications running on the multicore systems. Due to the bursty and self-similar nature of the NoC traffic patterns, the traffic demand of the WIs can vary both spatially and temporally. Ineffective management of such traffic variation of the WIs, limits the performance and energy benefits of the novel mm-wave interconnect technology. Hence, to utilize the full potential of the novel mm-wave interconnect technology in WiNoCs, design of a simple, fair, robust, and efficient MAC is of paramount importance. The main goal of this dissertation is to propose the design principles for robust and traffic-aware MAC mechanisms to provide high bandwidth, low latency, and energy-efficient data communication in mm-wave WiNoCs. The proposed solution has two parts. In the first part, we propose the cross-layer design methodology of robust WiNoC architecture that can minimize the effect of permanent failure of the wireless links and recover from transient failures caused by single event upsets (SEU). Then, in the second part, we present a traffic-aware MAC mechanism that can adjust the transmission slots of the WIs based on the traffic demand of the WIs. The proposed MAC is also robust against the failure of the wireless access mechanism. Finally, as future research directions, this idea of traffic awareness is extended throughout the whole NoC by enabling adaptiveness in both wired and wireless interconnection fabric

Design Space Exploration and Resource Management of Multi/Many-Core Systems

The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

Miniaturized Transistors, Volume II

In this book, we aim to address the ever-advancing progress in microelectronic device scaling. Complementary Metal-Oxide-Semiconductor (CMOS) devices continue to endure miniaturization, irrespective of the seeming physical limitations, helped by advancing fabrication techniques. We observe that miniaturization does not always refer to the latest technology node for digital transistors. Rather, by applying novel materials and device geometries, a significant reduction in the size of microelectronic devices for a broad set of applications can be achieved. The achievements made in the scaling of devices for applications beyond digital logic (e.g., high power, optoelectronics, and sensors) are taking the forefront in microelectronic miniaturization. Furthermore, all these achievements are assisted by improvements in the simulation and modeling of the involved materials and device structures. In particular, process and device technology computer-aided design (TCAD) has become indispensable in the design cycle of novel devices and technologies. It is our sincere hope that the results provided in this Special Issue prove useful to scientists and engineers who find themselves at the forefront of this rapidly evolving and broadening field. Now, more than ever, it is essential to look for solutions to find the next disrupting technologies which will allow for transistor miniaturization well beyond silicon’s physical limits and the current state-of-the-art. This requires a broad attack, including studies of novel and innovative designs as well as emerging materials which are becoming more application-specific than ever before

MOCAST 2021

The 10th International Conference on Modern Circuit and System Technologies on Electronics and Communications (MOCAST 2021) will take place in Thessaloniki, Greece, from July 5th to July 7th, 2021. The MOCAST technical program includes all aspects of circuit and system technologies, from modeling to design, verification, implementation, and application. This Special Issue presents extended versions of top-ranking papers in the conference. The topics of MOCAST include:Analog/RF and mixed signal circuits;Digital circuits and systems design;Nonlinear circuits and systems;Device and circuit modeling;High-performance embedded systems;Systems and applications;Sensors and systems;Machine learning and AI applications;Communication; Network systems;Power management;Imagers, MEMS, medical, and displays;Radiation front ends (nuclear and space application);Education in circuits, systems, and communications

Reliability and Security Assessment of Modern Embedded Devices

L'abstract è presente nell'allegato / the abstract is in the attachmen