369 research outputs found

    Performance of a worm algorithm in Ï•4\phi^4 theory at finite quartic coupling

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    Worm algorithms have been very successful with the simulation of sigma models with fixed length spins which result from scalar field theories in the limit of infinite quartic coupling lambda. Here we investigate closer their algorithmic efficiency at finite and even vanishing lambda for the one component model in dimensions D = 2, 3, 4.Comment: 10 pages, 2 Fig

    Gate Delay Fault Test Generation for Non-Scan Circuits

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    This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation-backward justification technique: The test pattern generation is started at the fault location, and after successful ¿local¿ test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this pape

    Schrifttum

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    Dieses Dokument beinhaltet Buchbeschreibungen von "Die Säugetiere Westfalens" (Abhandlung aus dem Westf. Landesmuseums f. Naturkunde), "Naturwaldzellen IV, Weserbergland - Nachträge Niederhein." (Schriftenreihe LÖLF), Fischerei und Naturschutz (Veröff. Rp Detmold) und "Schwermetallbelastung von Böden und Kulturpflanzen in Nordrhein-Westfalen." (Schriftenreihe LÖLF)

    RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality

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    The recently started European Training Network (ETN) RESCUE advances scientific competences in the demanding and mutually dependent aspects of nano-electronic systems design, i.e. reliability, security and quality, as well as related electronic design automation tools. Second, it provides early-stage researchers with innovative cross-sectoral training in the involved disciplines and beyond, preparing them to face today’s and future challenges in nano-electronics design. Furthermore, they are also trained to be innovative, creative, and more important – will have an entrepreneurial mentality. The latter will help to compile ideas into products and services for economic and social benefits and creates qualified workforce and knowledge for the industry. The consortium consists of leading European research groups competent to tackle the interdependent challenges in a holistic manner, and is excellently balanced in terms of academic and industrial training and research facilities

    Testability enhancement of a basic set of CMOS cells

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    Testing should be evaluated as the ability of the test patterns to cover realistic faults, and high quality IC products demand high quality testing. We use a test strategy based on physical design for testability (to discover both open and short faults, which are difficult or even impossible to detect). Consequentially, layout level design for testability (LLDFT) rules have been developed, which prevent the faults, or at least reduce the chance of their appearing. The main purpose of this work is to apply a practical set of LLDFT rules to the library cells designed by the Centre Nacional de Microelectrònica (CNM) and obtain a highly testable cell library. The main results of the application of the LLDFT rules (area overheads and performance degradation) are summarized and the results are significant since IC design is highly repetitive; a small effort to improve cell layout can bring about great improvement in design

    Reducing global CO2 emissions with the technologies we have

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    The energy intensities of the various industrial sectors differ considerably across countries. This suggests a potential for emissions reductions through improved accessibility to efficient technologies. This paper estimates an upper-bound CO2 emission mitigation potential that could theoretically be achieved by improved access to efficient technologies in industrial sectors. We develop a linear optimization framework that facilitates the exchange of sectoral production technologies based on the World Input-Output Database (WIOD), assuming perfect substitutability of technologies and homogeneity within economic sectors, while ignoring barriers to technological adoption and price driven adjustments. We consider the full global supply chain network and multiple upstream production inputs in addition to energy demand. In contrast to existing literature our framework allows to consider supply chain effects of technology replacements. We use our model to calculate emission reduction potentials for varying levels of access to technology. If best practice technologies were made available globally, CO2 emissions could theoretically be reduced by more than 10 gigatons (Gt). In fact, even second-tier production technologies would create significant global reduction potentials. We decompose sectoral emission reductions to identify contributions by changes in energy intensity, supply chain effects and changes in carbon intensities. Excluding the latter, we find that considering supply chain effects increases total mitigation potentials by 14%. The largest CO2 emission reduction potentials are found for a small set of developing countries.DFG, SFB 1026, Sustainable Manufacturing - Globale Wertschöpfung nachhaltig gestalte

    Annual Report 1999 / Department for Computer Science

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    Selbstdarstellung des Instituts für Informatik der BTU Cottbus und Berichte der Lehrstühle für das Jahr 1999.Presentation of the Department for Computer Science of the BTU Cottbus and reports of the chairs at the department for the year 1999

    Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness

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    Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching speed and the expected life time. Additionally, vulnerability from particle radiation is increased. Hence, fault detection and on-line correction become a must for many applications. However, not only fault tolerance but self-awareness becomes also an advantage. Provided that by being aware of its own healthy state allow optimized configurations regarding system operation modes and configurable hardware mechanism. This paper shows a preliminary work in a configurable circuit and explores its configuration possibilities when integrated into a complete system

    Parents’ Perceived Similarity to Their Children, and Parents’ Perspective Taking Efforts: Associations of Cross-Informant Discrepancies with Adolescent Problem Behavior

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    Vierhaus M, Rueth J-E, Lohaus A. Parents’ Perceived Similarity to Their Children, and Parents’ Perspective Taking Efforts: Associations of Cross-Informant Discrepancies with Adolescent Problem Behavior. Frontiers in Psychology. 2016;7: 367.The main goal of this study is to provide empirical evidence for a theoretical mechanism underlying cross-informant discrepancies (CID), which occur between reports of different informants (e.g., children/adolescents and parents) of children’s/adolescents’ problem behavior. Studies comprehensively corroborate the existence of CID. However, an explanation of CID is rudimentary and inconsistent. Respective research often suffers from methodological problems and is often atheoretical. Addressing these critics, this study uses polynomial regression and is based on research on mind perception and anchoring-and-adjustment theory. It was assumed that higher CID are associated with parents’ perceived similarity to their children, whereas lower CID are related to parents’ perspective-taking efforts. Analyses were based on N = 168 parent–child dyads (children’s mean age: 12.50 years). Reports on problem behavior displayed substantial mean differences and medium-sized correlations. Polynomial regressions on CID partly supported the influence of parents’ perceived similarity and perspective taking efforts on CID. Results are discussed in the context of a possible theoretical fundament for CID
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