Variable - temperature scanning optical and force microscope

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.Comment: 24 pages, 9 figures, submitted to the journal "Review of Scientific Instruments

Enhanced Transmission and Reflection of Femtosecond Pulses by a Single Slit

We show that a physical mechanism responsible for the enhanced transmission and reflection of femtosecond pulses by a single subwavelength nanoslit in a thick metallic film is the Fabry-Perot-like resonant excitation of stationary, quasistationary and nonstationary waves inside the slit, which leads to the field enhancement inside and around the slit. The mechanism is universal for any pulse-scatter system, which supports the stationary resonances. We point out that there is a pulse duration limit below which the slit does not support the intraslit resonance.Comment: 4 pages, 3 figure

The optimal form of the scanning near-field optical microscopy probe

A theoretical approach to determine the optimal form of the near-field optical microscope probe is proposed. An analytical expression of the optimal probe form with subwavelength aperture has been obtained. The advantages of the probe with the optimal form are illustrated using numerical calculations. The conducted calculations show 10 times greater light throughput and the reception possibility of the more compactly localized light at the output probe aperture which could indicate better spatial resolution of the optical images in near-field optical technique using optimal probe.Comment: 12 pages, 6 figure

Near-field diffraction of fs and sub-fs pulses: super-resolutions of NSOM in space and time

The near-field diffraction of fs and sub-fs light pulses by nm-size slit-type apertures and its implication for near-field scanning optical microscopy (NSOM) is analyzed. The amplitude distributions of the diffracted wave-packets having the central wavelengths in the visible spectral region are found by using the Neerhoff and Mur coupled integral equations, which are solved numerically for each Fourier's component of the wave-packet. In the case of fs pulses, the duration and transverse dimensions of the diffracted pulse remain practically the same as that of the input pulse. This demonstrates feasibility of the NSOM in which a fs pulse is used to provide the fs temporal resolution together with nm-scale spatial resolution. In the sub-fs domain, the Fourier spectrum of the transmitted pulse experiences a considerable narrowing that leads to the increase of the pulse duration in a few times. This imposes a limit on the simultaneous resolutions in time and space.Comment: 5 figure

Reflectionless evanescent-wave amplification by two dielectric planar waveguides

Utilizing the underlying physics of evanescent wave amplification by a negative-refractive-index slab, it is shown that evanescent waves with specific spatial frequencies can also be amplified without any reflection simply by two dielectric planar waveguides. The simple configuration allows one to take advantage of the high resolution limit of a high-refractive-index material without contact with the object.Comment: 4 pages, 3 figures, v2: accepted by Optics Letters, v3: included the Erratum submitted to Optics Letter

Extension of Bethe's diffraction model to conical Geometry: application to near field optics

The generality of the Bethe's two dipole model for light diffraction through a subwavelength aperture in a conducting plane is studied in the radiation zone for coated conical fiber tips as those used in near field scanning optical microscopy. In order to describe the angular radiated power of the tip theoretically, we present a simple, analytical model for small apertures (radius < 40 nm) based on a multipole expansion. Our model is able to reproduce the available experimental results. It proves relatively insensitive to cone angle and aperture radius and contains, as a first approximation, the empirical two-dipole model proposed earlier

A compact fluorescence and polarization near-field scanning optical microscope

We present a transmission, fluorescence, and polarization near-field scanning optical microscope with shear-force feedback control that is small in size and simple to operate. This microscope features an ultrafine mechanical tip/sample approach with continuous manual submicron control over a range of several millimeters. The piezo-driven 12 μm x-yx-y scan range is complimented by a 4 mm coarse mechanical translation range in each direction. The construction materials used in the mechanical feedback loop have been carefully chosen for thermal compatibility in order to reduce differential expansion and contraction between the tip and sample. A unique pressure-fit sample mount allows for quick and reliable sample exchange. Shear-force feedback light is delivered to the scan head via an optical fiber so that a remote laser of any type may be used as a source. This dither light is collimated and refocused onto the tip, delivering a consistently small spot which is collected by a high numerical aperture objective. This new scan head incorporates an optical system which will permit the linearization of scan piezo response similar to a scheme used successfully with atomic force microscopy. This is designed to both overcome the piezo’s inherent hysteresis and to eliminate drift during long duration spatial scans or spectroscopic measurements at a single location. The scan head design offers added flexibility due to the use of optical fibers to deliver the dither and scan linearization light, and functions in any orientation for use in conjunction with upright or inverted optical microscopes. © 1998 American Institute of Physics.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/70291/2/RSINAK-69-7-2685-1.pd

Sparsity based sub-wavelength imaging with partially incoherent light via quadratic compressed sensing

We demonstrate that sub-wavelength optical images borne on partially-spatially-incoherent light can be recovered, from their far-field or from the blurred image, given the prior knowledge that the image is sparse, and only that. The reconstruction method relies on the recently demonstrated sparsity-based sub-wavelength imaging. However, for partially-spatially-incoherent light, the relation between the measurements and the image is quadratic, yielding non-convex measurement equations that do not conform to previously used techniques. Consequently, we demonstrate new algorithmic methodology, referred to as quadratic compressed sensing, which can be applied to a range of other problems involving information recovery from partial correlation measurements, including when the correlation function has local dependencies. Specifically for microscopy, this method can be readily extended to white light microscopes with the additional knowledge of the light source spectrum.Comment: 16 page

Enhanced transmission versus localization of a light pulse by a subwavelength metal slit: Can the pulse have both characteristics?

The existence of resonant enhanced transmission and collimation of light waves by subwavelength slits in metal films [for example, see T.W. Ebbesen et al., Nature (London) 391, 667 (1998) and H.J. Lezec et al., Science, 297, 820 (2002)] leads to the basic question: Can a light be enhanced and simultaneously localized in space and time by a subwavelength slit? To address this question, the spatial distribution of the energy flux of an ultrashort (femtosecond) wave-packet diffracted by a subwavelength (nanometer-size) slit was analyzed by using the conventional approach based on the Neerhoff and Mur solution of Maxwell's equations. The results show that a light can be enhanced by orders of magnitude and simultaneously localized in the near-field diffraction zone at the nm- and fs-scales. Possible applications in nanophotonics are discussed.Comment: 5 figure