Dual-wavelength system monitors deposition of films - A concept

System monitors fabrication of high-quality optical filters and other precise film deposition operations. System generates output signal of an element that changes rapidly when deposition process changes or stops, and eliminates defects of single-wavelength systems. Five additional advantages of dual-wavelength system are listed

Monitoring deposition of films

A system using dual wavelength characteristics of light passing through a film being deposited was described to generate an output signal that changes rapidly at the point when the deposition process should stop or change. Photodetectors are used to sense the light intensity changes at the two wavelengths, and the monitored signal represents the ratio of their sums and difference signal strengths

Conceptual design of the scientific instrument arrangement for the large space telescope

A description of the scientific instrument arrangement for the large space telescope (LST) is given, with some of the rationale for selecting this concept. The first section of this report describes the basic configuration and was designed for an f/20 telescope focal plane. The subsequent LSTWG meeting held in November gave some redirection to the scientific requirements, and these changes are described in the section, Configuration Update