17 research outputs found

    Modification of SiO<sub>2</sub>, ZnO, Fe<sub>2</sub>O<sub>3</sub> and TiN Films by Electronic Excitation under High Energy Ion Impact

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    It has been known that the modification of non-metallic solid materials (oxides, nitrides, etc.), e.g., the formation of tracks, sputtering representing atomic displacement near the surface and lattice disordering are induced by electronic excitation under high-energy ion impact. We have investigated lattice disordering by the X-ray diffraction (XRD) of SiO2, ZnO, Fe2O3 and TiN films and have also measured the sputtering yields of TiN for a comparison of lattice disordering with sputtering. We find that both the degradation of the XRD intensity per unit ion fluence and the sputtering yields follow the power-law of the electronic stopping power and that these exponents are larger than unity. The exponents for the XRD degradation and sputtering are found to be comparable. These results imply that similar mechanisms are responsible for the lattice disordering and electronic sputtering. A mechanism of electron–lattice coupling, i.e., the energy transfer from the electronic system into the lattice, is discussed based on a crude estimation of atomic displacement due to Coulomb repulsion during the short neutralization time (~fs) in the ionized region. The bandgap scheme or exciton model is examined

    Modification of SiO2, ZnO, Fe2O3 and TiN Films by Electronic Excitation under High Energy Ion Impact

    No full text
    It has been known that the modification of non-metallic solid materials (oxides, nitrides, etc.), e.g., the formation of tracks, sputtering representing atomic displacement near the surface and lattice disordering are induced by electronic excitation under high-energy ion impact. We have investigated lattice disordering by the X-ray diffraction (XRD) of SiO2, ZnO, Fe2O3 and TiN films and have also measured the sputtering yields of TiN for a comparison of lattice disordering with sputtering. We find that both the degradation of the XRD intensity per unit ion fluence and the sputtering yields follow the power-law of the electronic stopping power and that these exponents are larger than unity. The exponents for the XRD degradation and sputtering are found to be comparable. These results imply that similar mechanisms are responsible for the lattice disordering and electronic sputtering. A mechanism of electron–lattice coupling, i.e., the energy transfer from the electronic system into the lattice, is discussed based on a crude estimation of atomic displacement due to Coulomb repulsion during the short neutralization time (~fs) in the ionized region. The bandgap scheme or exciton model is examined

    Characterization of functional materials for liquid blanket systems by cathodoluminescence measurement

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    Applicability of cathodouminescence (CL) measurements in development of functional materials for advanced liquid blanket systems was investigated by using a conventional scanning microprobe and CCD spectrometer. Firstly, CL spectra of lithium compounds for tritium fuel breeding, oxide, nitride and carbide functional materials for advanced blanket systems, fluoride materials for coolants, etc. were obtained to construct a database. Relations between changes in the spectra and the crystallinities of specimens were examined for ZrO2, Y2O3 and TiO2 coatings baked at different temperatures. The specimens with lower crystallinities showed broader luminescence peak at longer wavelengths. Changes in CL spectra by irradiation damages were also examined for Y2O3 and SiC by ion beam irradiations. Since luminescence intensity decreased significantly for the specimens with low crystallinities, an SEM system which can control the electron beam current more than 2 orders while keeping the spatial resolution of <1 μm is suitable for quick acquisition of CL spectra in the development of the functional materials. Once a database of CL spectra for candidate materials and their changes by crystallinities and irradiation damages is constructed, the CL measurement would be a reliable tool also in inspection and monitoring of materials during reactor construction and operation

    Sensitive in-operando observation of Li and O transport in thin-film Li-ion batteries

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    Thin-film batteries often contain oxides in the anode, cathode, and electrolyte materials. In-operando methods capable of Li and O depth profiling are relevant for battery research to study, e.g. diffusion and trapping of constituents. Here, we demonstrate ion beam-based analytical methods with high depth resolution and sensitivity for depth profiling Li and O in thin-film batteries using 10 MeV Li and He ions. Simultaneous depth profiling of Li and O was performed using combined coincidence elastic recoil detection analysis and Rutherford backscattering spectrometry measurements in the battery with 8 MeV He ions, and the Li and O transport was measured in operando. Reversible Li transport was observed from the LMO anode to the NbO cathode on charging and vice versa during discharging. O transport was observed from the LMO anode to the NbO cathode on first charging with 3.5 V but was not observed on further charging and discharging of the battery. Our in-operando measurements allow direct and quantitative observation of Li and O transport during charge-discharge cycles for thin-film batteries.

    Energy Dependence of MeV He +

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    Assessing the potential of ion beam analytical techniques for depth profiling Li in thin film Li ion batteries

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    Depth resolution and probing depth for Li in lithium thin film batteries achievable using different ion beam analytical techniques were investigated. Experiments using protons for nuclear reaction analysis, He ions for time-of-flight (TOF) energy elastic recoil detection analysis (ERDA) in transmission geometry, as well as He and Li ions for coincidence ERDA in transmission geometry are performed. Experimental results are compared in terms of the obtained Li concentration in the separator layer. In coincidence ERDA experiments, significant loss of Li-Li and He-Li coincidence counts was observed due to multiple scattering of recoiled/scattered particles in the battery sample. The ideal achievable Li depth resolution was calculated for the ion beam techniques. A depth resolution of 750, 1030, 310, and 510 x 10(15) atoms/cm(2) could be achieved in the Nb2O5 cathode by nuclear reaction analysis (NRA) using 2 MeV H, TOF-ERDA using 8 MeV He, and coincidence ERDA using 8 MeV He and 8 MeV Li ions, respectively, upon optimization of the experimental setup. While a depth resolution of 120 x 10(15) ions/cm(2) could be achieved for Li by conventional TOF-ERDA using an solid-state detector energy detector and light primary ions such as O under gracing incidence, TOF-ERDA experiments are found to produce significantly higher beam damage in batteries than other techniques. The beam damage in NRA and coincidence ERDA as performed in this study is estimated to be of the order of 10(-4) dpa. (C)&amp; nbsp;2021 Author(s).&amp; nbsp; All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license(http://creativecommons.org/licenses/by/4.0/)

    Japanese activities of the R&D on silicon carbide composites in the broader approach period and beyond

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    The R&D on SiC/SiC composites under the broader approach (BA) activities between Japan and the EU for fusion DEMO developed a fundamental database of mechanical (Task-1) and physical/chemical (Task-2) properties, with a primary target of the application of SiC/SiC composites as functional structure to be used in the dual coolant breeding blanket concept. This paper aims to summarize previous 10-years activities of the R&D of Japan and to provide the key deliverables toward the DEMO design. In Task-1, good creep and fatigue durability were first demonstrated. Besides, in-plane and inter-laminar strength anisotropy maps at elevated temperatures were comprehensively identified. In parallel, the irradiation effects of SiC materials were specifically determined as input parameters of the analytical model to provide for the irradiation-induced residual stresses. In Task-2, the apparent dose-dependence of the radiation-induced electrical conductivity and the indicative radiation-induced electrical degradation was identified by various irradiation sources. In addition, good gas confinement was identified. Furthermore, no accelerated corrosion for duration of 3000 h at below 1173 K was first demonstrated. With these achievements, it is suggested that the in-vessel component technology, e.g., material corrosion database development, activated corrosion product evaluation code development, compact module tests for validation of the key functions of the components, technology integration assessment for fusion nuclear tests, etc., should be further developed toward DEMO in near-term
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