91 research outputs found
Adaptation of NEMO-LIM3 model for multigrid high resolution Arctic simulation
High-resolution regional hindcasting of ocean and sea ice plays an important
role in the assessment of shipping and operational risks in the Arctic Ocean.
The ice-ocean model NEMO-LIM3 was modified to improve its simulation quality
for appropriate spatio-temporal resolutions. A multigrid model setup with
connected coarse- (14 km) and fine-resolution (5 km) model configurations was
devised. These two configurations were implemented and run separately. The
resulting computational cost was lower when compared to that of the built-in
AGRIF nesting system. Ice and tracer boundary-condition schemes were modified
to achieve the correct interaction between coarse- and fine grids through a
long ice-covered open boundary. An ice-restoring scheme was implemented to
reduce spin-up time. The NEMO-LIM3 configuration described in this article
provides more flexible and customisable tools for high-resolution regional
Arctic simulations
Resonance effects due to the excitation of surface Josephson plasma waves in layered superconductors
We analytically examine the excitation of surface Josephson plasma waves
(SJPWs) in periodically-modulated layered superconductors. We show that the
absorption of the incident electromagnetic wave can be substantially increased,
for certain incident angles, due to the resonance excitation of SJPWs. The
absorption increase is accompanied by the decrease of the specular reflection.
Moreover, we find the physical conditions guaranteeing the total absorption
(and total suppression of the specular reflection). These conditions can be
realized for Bi2212 superconductor films.Comment: 17 pages, 3 figure
Broadband optical properties of monolayer and bulk MoS2
Layered semiconductors such as transition metal dichalcogenides (TMDs) offer endless possibilities for designing modern photonic and optoelectronic components. However, their optical engineering is still a challenging task owing to multiple obstacles, including the absence of a rapid, contactless, and the reliable method to obtain their dielectric function as well as to evaluate in situ the changes in optical constants and exciton binding energies. Here, we present an advanced approach based on ellipsometry measurements for retrieval of dielectric functions and the excitonic properties of both monolayer and bulk TMDs. Using this method, we conduct a detailed study of monolayer MoS2 and its bulk crystal in the broad spectral range (290β3300 nm). In the near- and mid-infrared ranges, both configurations appear to have no optical absorption and possess an extremely high dielectric permittivity making them favorable for lossless subwavelength photonics. In addition, the proposed approach opens a possibility to observe a previously unreported peak in the dielectric function of monolayer MoS2 induced by the use of perylene-3,4,9,10-tetracarboxylic acid tetrapotassium salt (PTAS) seeding promoters for MoS2 synthesis and thus enables its applications in chemical and biological sensing. Therefore, this technique as a whole offers a state-of-the-art metrological tool for next-generation TMD-based devices
Detection of Pionium with DIRAC
The aim of the DIRAC experiment at CERN is to provide an accurate determination of S-wave pion-pion scattering lengths from the measurement of the lifetime of the pi+ pi- atom. The measurement will be done with precision comparable to the level of accuracy of theoretical predictions, formulated in the context of Chiral Perturbation Theory. Therefore, the understanding of chiral symmetry breaking of QCD will be submitted to a stringent test
Π Π°Π·ΡΠ°Π±ΠΎΡΠΊΠ° Π°Π»Π³ΠΎΡΠΈΡΠΌΠ° Π°Π²ΡΠΎΠΌΠ°ΡΠΈΠ·ΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠ³ΠΎ ΠΏΡΠΎΠ΅ΠΊΡΠΈΡΠΎΠ²Π°Π½ΠΈΡ ΠΏΡΠΎΠ²ΠΎΠ΄Π½ΠΎΠ³ΠΎ ΠΌΠΎΠ½ΡΠ°ΠΆΠ°
Nowadays, 3D electrical wiring design automation is less covered by EDA&CAD systems, than its
other aspects (solid modeling, simulation analysis, printed circuit boards development). This article
offers an algorithm of electrical wiring design automation realization and an algorithm of computer
aided development of design documentation package for electrical wiring aspect. The algorithms
are based on EDA system Altium Designer and CAD system SolidWorks. As a case study, existing
instrument manufacturing plant was takenΠ Π½Π°ΡΡΠΎΡΡΠ΅Π΅ Π²ΡΠ΅ΠΌΡ Π°Π²ΡΠΎΠΌΠ°ΡΠΈΠ·Π°ΡΠΈΠΈ ΠΏΡΠΎΠ΅ΠΊΡΠΈΡΠΎΠ²Π°Π½ΠΈΡ ΠΎΠ±ΡΡΠΌΠ½ΠΎΠ³ΠΎ ΡΠ»Π΅ΠΊΡΡΠΈΡΠ΅ΡΠΊΠΎΠ³ΠΎ ΠΌΠΎΠ½ΡΠ°ΠΆΠ°
ΡΠ΄Π΅Π»ΡΠ΅ΡΡΡ Π·Π½Π°ΡΠΈΡΠ΅Π»ΡΠ½ΠΎ ΠΌΠ΅Π½ΡΡΠ΅ Π²Π½ΠΈΠΌΠ°Π½ΠΈΡ, ΡΠ΅ΠΌ Π΄ΡΡΠ³ΠΈΠΌ Π²ΠΎΠ·ΠΌΠΎΠΆΠ½ΠΎΡΡΡΠΌ Π‘ΠΠΠ (ΡΠ²Π΅ΡΠ΄ΠΎΡΠ΅Π»ΡΠ½ΠΎΠ΅
ΠΌΠΎΠ΄Π΅Π»ΠΈΡΠΎΠ²Π°Π½ΠΈΠ΅, Π°Π½Π°Π»ΠΈΠ· ΠΊΠΎΠ½ΡΡΡΡΠΊΡΠΈΠΉ, ΠΏΠ΅ΡΠ°ΡΠ½ΡΠΉ ΠΌΠΎΠ½ΡΠ°ΠΆ). Π Π΄Π°Π½Π½ΠΎΠΉ ΡΡΠ°ΡΡΠ΅ ΠΏΡΠ΅Π΄Π»ΠΎΠΆΠ΅Π½Ρ
Π°Π»Π³ΠΎΡΠΈΡΠΌ Π²Π½Π΅Π΄ΡΠ΅Π½ΠΈΡ ΡΠΈΡΡΠ΅ΠΌΡ Π°Π²ΡΠΎΠΌΠ°ΡΠΈΠ·ΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠΉ ΡΠ°Π·ΡΠ°Π±ΠΎΡΠΊΠΈ ΠΏΡΠΎΠ²ΠΎΠ΄Π½ΠΎΠ³ΠΎ ΠΌΠΎΠ½ΡΠ°ΠΆΠ°
ΠΈ Π°Π»Π³ΠΎΡΠΈΡΠΌ Π°Π²ΡΠΎΠΌΠ°ΡΠΈΠ·ΠΈΡΠΎΠ²Π°Π½Π½ΠΎΠΉ ΡΠ°Π·ΡΠ°Π±ΠΎΡΠΊΠΈ ΠΏΠ°ΠΊΠ΅ΡΠ° ΠΏΡΠΎΠ΅ΠΊΡΠ½ΠΎΠΉ Π΄ΠΎΠΊΡΠΌΠ΅Π½ΡΠ°ΡΠΈΠΈ Π½Π°
ΠΏΡΠΎΠ²ΠΎΠ΄Π½ΠΎΠΉ ΠΌΠΎΠ½ΡΠ°ΠΆ. ΠΠ»Π³ΠΎΡΠΈΡΠΌ ΠΎΡΠ½ΠΎΠ²Π°Π½ Π½Π° ΡΠΈΡΡΠ΅ΠΌΠ°Ρ
EDA Altium Designer ΠΈ CAD SolidWorks,
ΠΈΡΠΏΠΎΠ»ΡΠ·ΡΠ΅ΠΌΡΡ
Π½Π° ΠΏΡΠ΅Π΄ΠΏΡΠΈΡΡΠΈΡΡ
ΠΏΡΠΈΠ±ΠΎΡΠΎΡΡΡΠΎΠΈΡΠ΅Π»ΡΠ½ΠΎΠ³ΠΎ ΠΏΡΠΎΡΠΈΠ»
Ground of Organizational Structure of Organs of Military Management of Operative (Battle) Providing of Actions of Troops During Liquidation of Consequences of Emergencies of Technogenic Character
The technique of constructing a hierarchy of organizational structure of administrative bodies is proposed, which takes into account the rational number of components (structural subdivisions) of direct subordination both in vertical and horizontal structuring of military management units for operational (combat) support of forces (forces) during the emergence of an emergency situation of anthropogenic nature
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Surface slope metrology of highly curved x-ray optics with an interferometric microscope
The development of deterministic polishing techniques has given rise to vendors that manufacture high quality threedimensional x-ray optics. The surface metrology on these optics remains a difficult task. For the fabrication, vendors usually use unique surface metrology tools, generally developed on site, that are not available in the optical metrology labs at x-ray facilities. At the Advanced Light Source X-Ray Optics Laboratory, we have developed a rather straightforward interferometric-microscopy-based procedure capable of sub microradian characterization of sagittal slope variation of x-ray optics for two-dimensionally focusing and collimating (such as ellipsoids, paraboloids, etc.). In the paper, we provide the mathematical foundation of the procedure and describe the related instrument calibration. We also present analytical expression describing the ideal surface shape in the sagittal direction of a spheroid specified by the conjugate parameters of the optic's beamline application. The expression is useful when analyzing data obtained with such optics. The high efficiency of the developed measurement and data analysis procedures is demonstrated in results of measurements with a number of x-ray optics with sagittal radius of curvature between 56 mm and 480 mm. We also discuss potential areas of further improvement
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