Simulation of Reciprocal Space Maps for Thin Ion-Implanted Layers in Yttrium-Iron Garnet Films with Defects

Numerical simulation of the reciprocal space maps measured from the ion-implanted single-crystal yttrium-iron garnet films on gadolinium-gallium garnet substrate has been carried out basing on the theoretical model of the triple-crystal dynamical diffractometry of crystalline multilayer systems with inhomogeneous strain distributions and randomly distributed defects. The presence of growth defects in both film and substrate as well as radiation defects created in subsurface layer of nanometer-scale thickness after 90 keV F+ ion implantation was taken into account in the proposed model of the film system

Химия элементов IА-VIIIА групп : учебное пособие для химических специальностей вузов

В книге изложены современные представления о неорганической химии элементов IА–VIIIА групп Периодической системы химических элементов Д.И. Менделеева. Содержание пособия соответствует программе курса «Неорганическая химия» для студентов ВУЗов, обучающихся по направлению 050101 – «Химия». В основе пособия – лекции по неорганической химии, которые читаются с 1973 г. студентам I курса специальности «Химия» в РУДН (факультет физико-математических и естественных наук, кафедра неорганической химии)

Dynamical X-Ray Diffraction Characterization of the Self-Organized Quantum Dot Formation In Imperfect Semiconductor Superlattices

The self-organized quantum dot (QD) formation in InGaAs/GaAs superlattices grown by molecular beam epitaxy was investigated by the high-resolution X-ray diffraction technique. The investigated samples had the identical structure consisting of fifteen periods of {InxGa1−xAs (8 ML)/GaAs (26 ML)} with the nominal In concentration x = 0.2. The diffraction profiles and reciprocal lattice maps for these samples have been measured at symmetrical (004) reflection by using the triple-crystal X-ray diffractometer. The analysis of the measured data was performed by using the proposed diffraction model based on the statistical theory of dynamical X-ray scattering in imperfect single crystals and multilayer structures

Cultura favorable hacia el uso de las Tecnologías de la Información y la Comunicación (TIC), en los estudiantes y docentes de la Escuela de Docencia Media Diversificada de la Facultad de Ciencias de la Educación

Compounds of magnesium, potassium, barium, and strontium chlorides with epsilon -caprolactam were prepared and studied by chemical and crystal-optical analyses, X-ray powder diffraction, and thermogravimetry. All of the compounds obtained were single-phase and crystallized in the monoclinic system. The final products of their thermolysis were MgO, CaCl2, SrCl2, and BaCl2, respectively

X-Ray Diffraction Characterization of Nanoscale Strains and Defects in Yttrium Iron Garnet Films Implanted with Fluorine Ions

The theoretical diffraction model for a crystalline multilayer system with inhomogeneous strain profile and randomly distributed defects has been created by using the statistical dynamical theory of X-ray diffraction in imperfect crystals. The dynamical scattering peculiarities in both coherent and diffuse scattering intensities have been taken into account for all the layers of the system by using derived recurrence relations between coherent scattering amplitudes. The investigated yttrium-iron garnet films grown on gadolinium-gallium garnet substrate were implanted with different doses of 90 keV F+ ions. The rocking curves measured from the as-grown and implanted samples have been treated by using the proposed theoretical model. This model has allowed for the reliable self-consistent determination of strain profile parameters and structural defect characteristics in both implanted film and substrate of the investigated samples

Simulation of Reciprocal Space Maps for Thin Ion-Implanted Layers in Yttrium-Iron Garnet Films with Defects

Numerical simulation of the reciprocal space maps measured from the ion-implanted single-crystal yttrium-iron garnet films on gadolinium-gallium garnet substrate has been carried out basing on the theoretical model of the triple-crystal dynamical diffractometry of crystalline multilayer systems with inhomogeneous strain distributions and randomly distributed defects. The presence of growth defects in both film and substrate as well as radiation defects created in subsurface layer of nanometer-scale thickness after 90 keV F+ ion implantation was taken into account in the proposed model of the film system

Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field

Quantitative characterization of complex microdefect structures in annealed silicon crystals (1150 °С, 40 h) and their transformations after exposing for one day in a weak magnetic field (1 T) has been performed by analyzing the rocking curves, which have been measured by a high-resolution double-crystal X-ray diffractometer. Based on the characterization results, which have been obtained by using the formulas of the dynamical theory of X-ray diffraction by imperfect crystals with randomly distributed microdefects of several types, the concentrations and average sizes of oxygen precipitates and dislocation loops after imposing the magnetic field and their dependences on time after its removing have been determined