Theoretical study of isolated dangling bonds, dangling bond wires and dangling bond clusters on H:Si(100)-(2×\times1) surface

We theoretically study the electronic band structure of isolated unpaired and paired dangling bonds (DB), DB wires and DB clusters on H:Si(100)-(2$\times$1) surface using Extended H\"uckel Theory (EHT) and report their effect on the Si band gap. An isolated unpaired DB introduces a near-midgap state, whereas a paired DB leads to $\pi$ and $\pi^*$ states, similar to those introduced by an unpassivated asymmetric dimer (AD) Si(100)-(2$\times$1) surface. Such induced states have very small dispersion due to their isolation from the other states, which reside in conduction and valence band. On the other hand, the surface state induced due to an unpaired DB wire in the direction along the dimer row (referred to as $[\bar{1}10]$), has large dispersion due to the strong coupling between the adjacent DBs, being 3.84$\AA$ apart. However, in the direction perpendicular to the dimer row (referred to as [110]), due to the reduced coupling between the DBs being 7.68$\AA$ apart, the dispersion in the surface state is similar to that of an isolated unpaired DB. Apart from this, a paired DB wire in $[\bar{1}10]$ direction introduces $\pi$ and $\pi^*$ states similar to those of an AD surface and a paired DB wire in [110] direction exhibits surface states similar to those of an isolated paired DB, as expected. Besides this, we report the electronic structure of different DB clusters, which exhibit states inside the band gap that can be interpreted as superpositions of states due to unpaired and paired DBs.Comment: 7 pages, 10 figure, 1 tabl

Measurements of Carrier Generation-Recombination Parameters in Silicon Solar Cell Material Using MOS Techniques

Modified and new measurement techniques were developed for determining the carrier generation-recombination (G-R) parameters in silicon solar cell material under carrier deficit and low-level carrier excess conditions using MOS-based test structures. The structures mainly consisted of ring-dot MOS Capacitors (MOS-C) and Schottky-Drained Gate-Controlled Diodes (SGCD). Sample G-R parameters were extracted from n-type high quality silicon solar cell material. Additional measurements were also performed on low-quality ntype silicon substrates for comparison purposes. The photoaccelerated MOS-C Capacitance-time (C-t) transient measurement technique, modified from the standard C-t method, allows one to drastically reduce the observation time in deducing the carrier generation lifetime (Tg) by simply illuminating the test structure during the transient. In applying the technique to MOS-C’s (which exhibited generation lifetime on the order of I msec) the observation time was reduced by approximately an order of magnitude. This is important in dealing with solar cell material because of typically long generation lifetimes. The SGCD structure, which consisted of an extended Schottky diode located next to an MOS-C, was developed and utilized for extracting the surface generation velocity (sg). The measurement is based on recording two C-t transients at Vd = 0 and at Vd = V t , respectively. The structure has a distinct advantage over the conventional PN junction GCD in that it is only slightly more complicated to fabricate and interrogate than a simple MOS-C. It was also demonstrated that steady-state deep-depletion C-V characteristics can be obtained using the SGCD structure. An MOS-C photo/forward-sweep measurement technique was primarily developed to extract the recombination lifetime (rp for n-type substrates) under low-level carrier excess conditions. The new technique is based on the change in inversion capacitance in response to a set of illumination and forward-sweep voltages applied to the MOS-C. The technique conveniently allows one to extract the recombination lifetime under room temperature conditions and was successfully applied to MOS-C’s fabricated on high quality silicon solar cell substrates

Zinc Oxide-on-Silicon Surface Acoustic Wave Devices

A monolithic ZnO-on-silicon surface acoustic wave (SAW) memory correlator has been fabricated which utilizes induced junctions separated by ion implanted regions to store a reference signal. The performance characteristics of this device have been investigated including storage time, dynamic range, and degenerate convolution efficiency. Verification of the existence of charge storage regions is possible prior to completed device fabrication. A theory explaining the charge storage process is developed and applied to the implant-isolated storage correlator. The implant-isolated correlator theory is applied to related structures which employ slightly different storage mechanisms. The ion implanted correlator is used to determine the wave potential associated with a propagating SAW. Characteristics of ZnO-on-Si SAW resonators with sputtered ZnO films limited to the interdigital transducer (IDT) regions are investigated. Upper limits on propagation loss for surface waves on silicon substrates are determined by employing externally coupled limited ZnO SAW resonators. Resonator Q-values are enhanced by restricting the lossy ZnO area and predictions are made as to achievable Q-values for resonators fabricated in the externally coupled configuration. Experimental results for limited ZnO, internally coupled ZnO-on-Si resonators are also given. A complete theory for the mode conversion resonator is presented which predicts the array separation for proper device operation. The theory also gives way to a special condition for spatial ndependence of resonator output with respect to IDT placement. Mode conversion resonators are fabricated which experimentally verify these predictions

A comprehensive model of gain recovery due to unipolar electron transport after a short optical pulse in quantum cascade lasers

We have developed a comprehensive model of gain recovery due to unipolar electron transport after a short optical pulse in quantum cascade lasers (QCLs) that takes into account all the participating energy levels, including the continuum, in a device. This work takes into account the incoherent scattering of electrons from one energy level to another and quantum coherent tunneling from an injector level to an active region level or vice versa. In contrast to the prior work that only considered transitions to and from a limited number of bound levels, this work include transitions between all bound levels and between the bound energy levels and the continuum. We simulated an experiment of S. Liu et al., in which 438-pJ femtosecond optical pulses at the device’s lasing wavelength were injected into an In0:653Ga0:348As=In0:310Al0:690As QCL structure; we found that approximately 1% of the electrons in the bound energy levels will be excited into the continuum by a pulse and that the probability that these electrons will be scattered back into bound energy levels is negligible, 104. The gain recovery that is predicted is not consistent with the experiments, indicating that one or more phenomena besides unipolar electron transport in response to a short optical pulse play an important role in the observed gain recovery

Direct observation and control of near-field radiative energy transfer in a natural hyperbolic material

Heat control is a key issue in nano-electronics, where new efficient energy transfer mechanisms are highly sought after. In this respect, there is indirect evidence that high-mobility hexagonal boron nitride (hBN)-encapsulated graphene exhibits hyperbolic out-of-plane radiative energy transfer when driven out-of-equilibrium. Here we directly observe radiative energy transfer due to the hyperbolic phonon polaritons modes of the hBN encapsulant in intrinsic graphene devices under large bias, using mid-infrared spectroscopy and pyrometry. By using different hBN crystals of varied crystalline quality, we engineer the energy transfer efficiency, a key asset for compact thermal management of electronic circuits.Comment: 21 pages including Supplementary Material (Main text: 10 pages, 4 figures