89 research outputs found

    Photoionization of the Ne-like Si4+ ion in ground and metastable states in the 110–184-eV photon energy range

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    We present measurements of the absolute photoionization cross section of the neonlike Si4+ ion over the 110–184 eV photon energy range. The measurements were performed using two independent merged-beam setups at the super-ACO and ASTRID synchrotron-radiation facilities, respectively. Signals produced in the photoionization of the 2p subshell of the Si4+ ion both from the 2p6 1S0 ground state and the 2p53s 3P0,2 metastable levels were observed. Calculations of the 2p photoionization cross sections were carried out using a multi-configuration Dirac-Fock code. They give results in good agreement with the measured spectra. Comparison with other available theoretical results is also presented

    Relativistic photoionization cross sections for C II

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    High resolution measurements of photoionization cross sections for atomic ions are now being made on synchrotron radiation sources. The recent measurements by Kjeldsen etal. (1999) showed good agreement between the observed resonance features and the the theoretical calculations in the close coupling approximation (Nahar 1995). However, there were several observed resonances that were missing in the theoretical predictions. The earlier theoretical calculation was carried out in LS coupling where the relativistic effects were not included. Present work reports photoionization cross sections including the relativistic effects in Breit-Pauli R-matrix (BPRM) approximation. The configuration interaction eigenfunction expansion for the core ion C III consists of 20 fine structure levels dominated by the configurations from 1s^22s^2 to 1s^22s3d. Detailed features in the calculated cross sections exhibit the missing resonances due to fine structure. The results benchmark the accuracy of BPRM photoionization cross sections as needed for recent and ongoing experiments.Comment: 13 pages, 3 figure

    Absolute photoionization cross section measurements of the Kr I-isoelectronic sequence

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    Photoionization spectra have been recorded in the 4s, 4p and 3d resonance regions for the Kr Iisoelectronic sequence using both the dual laser produced plasma technique (at DCU) to produce photoabsorption spectra, and the merged ion beam and synchrotron radiation technique (at ASTRID) to measure absolute photoionization cross sections. Profile parameters are compared for the 4s − np resonances of Rb+ and Sr2+. Many new 4p " ns, md transitions are identified with the aid of Hartree-Fock calculations, and consistent quantum defects are observed for the various ns and md Rydberg series. Absolute single and double photoionization cross sections recorded in the 3d region for Rb+ and Sr2+ ions show preferential decay via double photoionization. This is only the second report where both the DLP technique and the merged beam technique have been used simultaneously to record photoionization spectra, and the advantages of both techniques (i.e. better resolution in the case of DLP and values for absolute photoionization cross sections in the case of the merged beam technique) are highlighted

    4d-inner-shell ionization of Xe+ ions and subsequent Auger decay

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    We have studied Xe+4d inner-shell photoionization in a direct experiment on Xe+ ions, merging an ion and a photon beam and detecting the ejected electrons with a cylindrical mirror analyzer. The measured 4d photoelectron spectrum is compared to the 4d core valence double ionization spectrum of the neutral Xe atom, obtained with a magnetic bottle spectrometer. This multicoincidence experiment gives access to the spectroscopy of the individual Xe2+4d−15p−1 states and to their respective Auger decays, which are found to present a strong selectivity. The experimental results are interpreted with the help of ab initio calculations.1\. Auflag

    Absolute photoionization cross sections and resonance structure of doubly ionized silicon in the region of the 2p-1 threshold: experiment and theory

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    We present the absolute photoionization cross section of doubly ionized silicon as a function of photon energy. These were obtained by merging a Si2+ ion beam generated in an electron cyclotron resonance source with monochromatized synchrotron radiation from an undulator. The photoion yield measurements were carried out in the photon energy range between 95 eV and 170 eV, i.e., the region corresponding to the excitation followed by the ionization (threshold ∌133.8eV) of an inner-subshell 2p electron. Resonance structure due to 2p excitation in the 2p63s3p3P metastable state was also observed with its contribution to the total cross section not exceeding 3%. Calculation of the 2p photoionization continuum cross section as a function of photon energy was carried out using the relativistic random-phase approximation (RRPA) and agreed very well with the corresponding measurements. The resonance structure in the 3s cross section below the 2p threshold was found to be in good agreement with the multiconfiguration atomic structure calculations of Sayyad et al. [J. Phys. B 28, 1715 (1995)], while the corresponding RRPA-RMQDT (relativistic multi-channel quantum-defect theory) calculations proved less successful
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