Шляхи удосконалення підготовки учнів до олімпіад з фізики

(uk) Стаття присвячена проблемі формування основ методики складання задач та завдань для олімпіад з фізики учнів середніх навчальних закладів освіти.(ru) Статья посвящена проблеме формирования основ методики составления задач и заданий для олимпиад по физике учащихся средних учебных заведений образования

The Road I Can\u27t Help Travelling : Holmes on Truth and Persuadability

Nano-structural evolution of layer morphology and interfacial roughness in Cr/Sc metal multilayers grown with ion assistance during magnetron sputter deposition has been investigated by high resolution transmission electron microscopy and hard X-ray reflectivity. Calculations based on a binary collision model predict an ion-assisted growth window for optimized Cr/Sc multilayer interface sharpness, within the ion energy range of 21 eV to 37 eV and an ion flux of 10 ions per deposited atom. Multilayers with nominal modulation periods in the range of 1.6 nm to 10.2 nm, grown with these conditions, exhibit a well-defined layer structure with an improved flattening and abruptness of the interfaces. It is shown that multilayers with a modulation period smaller than 3.4 nm have clear benefit from the reduced intermixing obtained by utilizing a two-stage ion energy modulation for each individual layer. The amorphization of Sc and Cr layers, below certain thicknesses, is found to be independent of the low energy ion-assistance. It is also shown that the Cr/Sc multilayers, containing periods less than 2 nm are ‘self healing’ i.e. they re-gain abrupt interfaces and flat layers after morphological disturbances during ion assisted growth. In comparison, multilayers grown without ion-assistance exhibited severe roughness and layer distortions.Original publication: N. Ghafoor, F. Eriksson, P.O.Å. Persson, L. Hultman and J. Birch, Effects of ion-assisted growth on the layer definition in Cr/Sc multilayers, 2008, Thin Solid Films, (516), 6, 982-990. http://dx.doi.org/10.1016/j.tsf.2007.06.108. Copyright: Elsevier B.V., http://www.elsevier.com

Morphology of buried interfaces in ion-assisted magnetron sputter deposited 11B4C-containing Ni/Ti multilayer neutron optics investigated by grazing incidence small angle scattering

Multilayer neutron optics require precise control of interface morphology for optimal performance. In this work, we investigate the effects of different growth conditions on the interface morphology of Ni/Ti based multilayers, with a focus on incorporating low-neutron-absorbing 11B4C and using different ion assistance schemes. Grazing incidence small angle X-ray scattering was used to probe the structural and morphological details of buried interfaces, revealing that the layers become more strongly correlated and the interfaces form mounds with increasing amounts of 11B4C. Applying high flux ion assistance during growth can reduce mound formation but lead to interface mixing, while a high flux modulated ion assistance scheme with an initial buffer layer grown at low ion energy and the top layer at higher ion energy prevents intermixing. The optimal condition was found to be adding 26.0 at.% 11B4C combined with high flux modulated ion assistance. A multilayer with a period of 48.2 {\AA} and 100 periods was grown under these conditions, and coupled fitting to neutron and X-ray reflectivity data revealed an average interface width of only 2.7 {\AA}, a significant improvement over the current state-of-the-art commercial Ni/Ti multilayers. Overall, our study demonstrates that the addition of 11B4C and the use of high flux modulated ion assistance during growth can significantly improve the interface morphology of Ni/Ti multilayers, leading to improved neutron optics performance.Comment: 14 page

Eutectic modification by ternary compound cluster formation in Al-Si alloys

Al-alloys with Si as the main alloying element constitute the vast majority of Al castings used commercially today. The eutectic Si microstructure in these alloys can be modified from plate-like to coral-like by the addition of a small amount of a third element to improve ductility and toughness. In this investigation the effects of Eu and Yb are studied and their influence on the microstructure is compared to further understand this modification. The two elements impact the alloy differently, where Eu modifies Si into a coral-like structure while Yb does not. Atom probe tomography shows that Eu is present within the Si phase in the form of ternary compound Al2Si2Eu clusters, while Yb is absent in the Si phase. This indicates that the presence of ternary compound clusters within Si is a necessary condition for the formation of a coral-like structure. A crystallographic orientation relationship between Si and the Al2Si2Eu phase was found, where the following plane normals are parallel: 011Si//0001Al2Si2Eu, 111Si//67¯10Al2Si2Eu and 011Si//67¯10Al2Si2Eu. No crystallographic relationship was found between Si and Al2Si2Yb. The heterogeneous formation of coherent Al2Si2Eu clusters inside the Si-phase is suggested to trigger the modification of the microstructure

Growth and Nano-structural Studies of Metallic Multilayer for X-ray Mirrors

A part of the Ph.D. project focused on growth and characterization of metal multilayers is presented in this licentiate thesis. The main interest in carrying out this research is to develop highly reflective normal-incidence condenser mirrors for soft X-ray microscopy studies in the water window (λ=2.4-4.2 nm) wavelength regime. Transition metals like Sc, Ti V, etc. have been considered because of the presence of their 2p-absorption edges within the water window. An anomalous dispersion at absorption edges has been utilized to get enhanced reflectance of soft X-rays. Since a single surface exhibits a very poor X-ray reflectivity, Cr/Sc, Cr/Ti, and Ni/V multilayers were grown in order to coherently add many reflections from several interfaces. The selection of Cr and Ni, as spacer layer, was made on the basis of their X-ray optical contrasts with the above-mentioned transition metals. The multilayer design, i.e., the individual layer thicknesses and the total number of bilayers, directly influences the resultant reflectance and careful determination was therefore made with the aid of computer simulations. All multilayers were grown on chemically cleaned Si substrates by ion-assisted dual target magnetron sputtering under high vacuum (~10-7 Torr) conditions. The effect of low and high ion-flux bombardment of low energy (&lt;50 eV) Ar ions, on growing surfaces was studied for all material systems. Furthermore, a two-stage deposition of each individual layer with modulated ion-energies was applied in order to obtain smooth and abrupt interfaces with as small intermixing as possible. Ion-surface interactions were also theoretically considered for estimating an appropriate ion-flux and ion-energy range desired for sufficient ad-atom mobilities. X-ray reflectivity and transmission electron microscopy have been the main probes for multilayer characterization in this work. For the Cr/Ti multilayer designed for normal incidence and grown with optimized two-stage ion-energy modulation, a peak reflectance of 2.1% was achieved at the Ti-2p absorption edge (λ=2.74 nm). For a multilayer mirror designed for the Brewster angle a maximum reflectance of 4.3% was accomplished. These measurements were made at the synchrotron radiation source BESSY in Berlin. Specular reflectivity and diffuse scattering scans were utilized for quantitative and qualitative analysis of the vertical and lateral structure of the multilayers. At-wavelength measurements of a series of Cr/Ti multilayers revealed the accumulation of roughness with increasing number of bilayers (N&gt;100) for this material system. Hard X-ray reflectivity and diffractometry were used for quality checks of the multilayers for rapid feedback to the deposition. In-situ annealing using hard X-ray reflectivity was also performed to assess the thermal stability of Cr/Ti multilayers. It was found that probably due to a strong thermal diffusion the degradation of multilayers (with bilayer period of 1.37 nm) in this material system occurs just above the growth temperature (~40°C). The accumulation of a low spatial frequency "waviness" with increasing number of layers in Cr/Ti multilayers was investigated by transmission electron microscopy. The influence of process conditions on multilayer structure with different periodicities was investigated by TEM analyses of a series of three samples for each of the above-mentioned material system. The Cr/Sc multilayers have shown the most flat and abrupt interface structure without any significant roughness evolution when grown with optimum process parameters.Report code: LiU-TEK-LIC-2005:48. On the day of the defence data the status of article I was: Accepted.</p

Materials Science of Multilayer X-ray Mirrors

This thesis treats the reflective and structural properties of multilayer structures. Soft X-ray multilayer mirrors intended as near-normal incidence reflective optics and polarizers in the water window (λ=2.4-4.4 nm) are the main focus. Such mirrors require multilayer periodicities between 1.2-2.2 nm, a large number ~600of multilayer periods (N), and atomically flat interfaces. Bi-metallic multilayers were deposited by dual-target magnetron sputtering on Si(001) Geometrical roughness and intermixing/interdiffusion at the interfaces were investigated in connection with the impact of ion-surface interactions during growth of Cr/Ti, Cr/Sc, and Ni/V multilayers. This was achieved by comparing multilayers grown with or without high-flux low energy (Eion&lt;30 eV) ion assistance. The use of modulated ion assistance resulted in a substantial improvement of interface flatness and abruptness in each of theAb-initio calculations indicate that the stabilization of the amorphous layer structure is due to a lowering of the total energy of the system by eliminating high energy incoherent interfaces between crystalline Sc and Cr. Light element incorporation in Cr/Sc multilayers was investigated through residual gas pressure variation. It is shown that multilayers retain their structural and optical properties within the high vacuum range of 2×10-7-to-2×10-6 Torr. The incorporation of 34 at.% nitrogen at a higher residual gas pressure ( ~2×10-5 Torr) resulted in highly textured understoichiometricx/ScNy multilayers. As a result of nitrogen incorporation, interface widths as small as 0.29 nm, and near-normal incidence reflectivity enhancement (at λ=3.11 nm) by 100 % (compared to pure Cr/Sc multilayers) was achieved. Light element incorporation was also found to be advantageous for the thermal stability of the multilayers. In-situ hard X-ray reflectivity measurements performed during isothermal annealing in thex/ScNy are stable up to 350 °C. As an alternative route to metallic multilayers, single crystal CrN/ScN superlattices, grown by reactive sputtering in N atmosphere onto MgO(001), were also investigated. The superlattice synthesis at 735 °C, resulted in highly abrupt interfaces with minimal interface widths of 0.2 nm. As-deposited superlattices with only 61 periodsλ=3.11 nm as well as very high thermal stability up to 850 °C.Denna avhandling behandlar syntes, analys, och materialvetenskap rörande så kallade multilagerspeglar för mjuk röntgenstrålning. Speglarna är lämpade som optiska komponenter för instrument såsom röntgenmikroskop i våglängdsområdet 2,4 nm till 4,4 nm, även kallat vattenfönstret. Tack vare de senaste decenniernas stora teknologiska och vetenskapliga framsteg i att framställa mycket intensiva källor för mjuk röntgenstrålning, såsom tex synkrotronljuskällor, frielektronlasrar, och plasmagenererade källor, är det nu tänkbart att utnyttja denna strålning till nya tillämpningar som tidigare inte varit möjliga. Några exempel är; röntgenmikroskopi av biologiska preparat med upplösning ca 1/100 av det som är möjligt med synligt ljus, fotolitografi av Det finns flera stora utmaningar för att lyckas tillverka multilagerspeglar. Först och främst måste man hitta materialkombinationer som ger upphov till reflektion i mellanytorna mellan materialen men som inte samtidigt absorberar all röntgenstrålning. Dessutom måste materialen gå att belägga på varandra i flera hundra tunna lager, vart och ett endast ca 1 nanometer tjockt, med en ytojämnhet om endast några tiondels nanometer. Den absoluta tjockleks precision i varje I det här arbetet har fyra olika typer av multilagerbeläggningar undersökts: krom/titan (Cr/Ti), krom/skandium (Cr/Sc), nickel/vanadin (Ni/V) samt kromnitrid/skandiumnitrid (CrN/ScN). Materialvalen har baserats på teoretiska beräkningar som visat att dessa materialsystem genererar mycket god reflektans i vattenfönstret. Varje kombination av metaller är optimal för en specifik våglängd och de individuella lagertjocklekarna måste optimeras teoretiskt för varje enskilt För Cr/Sc multilager har vi visat att lagren som beläggs har en oordnad, så kallad amorf, struktur mellan metallatomerna som har sitt ursprung i att multilagrets totala energi kan sänkas om mellanytor mellan kristallint Cr och kristallint Sc kan undvikas. Studier av effekterna av kväveupptag hos Cr/Sc multilagerspeglar under sputtringsprocessen har lett till ökad förståelse av materialsystemet. Till exempel har vi visat att kvävet framförallt binder till de inre regionerna av Sc och inte så mycket till Cr-lagren eller i mellanytorna. Med kväve i strukturen har vi gjort speglar som tål höga temperaturer, vilket är av stor betydelse för tillämpningar baserade högintensiva ljuskällor. Så kallade supergitter, dvs multilage

Coherency strain engineered decomposition of unstable multilayer alloys for improved thermal stability

A concept to improve hardness and thermal stability of unstable multilayer alloys is presented based on control of the coherency strain such that the driving force for decomposition is favorably altered. Cathodic arc evaporated cubic TiCrAlN/Ti 1−x Cr x N multilayer coatings are used as demonstrators. Upon annealing, the coatings undergo spinodal decomposition into nanometer-sized coherent Ti- and Al-rich cubic domains which is affected by the coherency strain. In addition, the growth of the domains is restricted by the surrounding TiCrN layer compared to a non-layered TiCrAlN coating which together results in an improved thermal stability of the cubic structure. A significant hardness increase is seen during decomposition for the case with high coherency strain while a low coherency strain results in a hardness decrease for high annealing temperatures. The metal diffusion paths during the domain coarsening are affected by strain which in turn is controlled by the Cr-content (x) in the Ti 1−x Cr x N layers. For x = 0 the diffusion occurs both parallel and perpendicular to the growth direction but for x &gt; =0.9 the diffusion occurs predominantly parallel to the growth direction. Altogether this study shows a structural tool to alter and fine-tune high temperature properties of multicomponent materials

Novel Fabrication Technology for Clamped Micron-Thick Titanium Diaphragms Used for the Packaging of an Implantable MEMS Acoustic Transducer

Micro-Electro-Mechanical Systems (MEMS) acoustic transducers are highly sophisticated devices with high sensing performance, small size, and low power consumption. To be applied in an implantable medical device, they require a customized packaging solution with a protecting shell, usually made from titanium (Ti), to fulfill biocompatibility and hermeticity requirements. To allow acoustic sound to be transferred between the surroundings and the hermetically sealed MEMS transducer, a compliant diaphragm element needs to be integrated into the protecting enclosure. In this paper, we present a novel fabrication technology for clamped micron-thick Ti diaphragms that can be applied on arbitrary 3D substrate geometry and hence directly integrated into the packaging structure. Stiffness measurements on various diaphragm samples illustrate that the technology enables a significant reduction of residual stress in the diaphragm developed during its deposition on a polymer sacrificial material. Keywords: implantable acoustic transducer; packaging; titanium/platinum multi-layer diaphragm; polymer sacrificial material; DC magnetron sputtering; intrinsic stress; stress measurement; stress relie

Interface bonding of Zr1−xAlxN nanocomposites investigated by x-ray spectroscopies and first principles calculations

The electronic structure, chemical bonding, and interface component in ZrN-AlN nanocomposites formed byphase separation during thin film deposition of metastable Zr1−xAlxN (x = 0.0, 0.12, 0.26, 0.40) are investigatedby resonant inelastic x-ray scattering, x-ray emission, and x-ray absorption spectroscopy and compared to firstprinciples calculations including transitions between orbital angular momentum final states. The experimentalspectra are compared with different interface-slab model systems using first principles all-electron full-potentialcalculations where the core states are treated fully relativistically. As shown in this work, the bulk sensitivity andelement selectivity of x-ray spectroscopy enables one to probe the symmetry and orbital directions at interfacesbetween cubic and hexagonal crystals. We show how the electronic structure develops from local octahedralbond symmetry of cubic ZrN that distorts for increasing Al content into more complex bonding. This results inthree different kinds of bonding originating from semicoherent interfaces with segregated ZrN and lamellar AlNnanocrystalline precipitates. An increasing chemical shift and charge transfer between the elements takes placewith increasing Al content and affects the bond strength and increases resistivity.Fulltext published under the terms of the Creative Commons Attribution 4.0 International license. https://creativecommons.org/licenses/by/4.0/No changes have been made to the fulltext.Funded by Bibsam.Funding agencies: Swedish Research Council (VR) LiLi-NFM Linnaeus EnvironmentSwedish Research Council [621-2009-5258]; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University (Faculty Grant SFO-Mat-LiU) [2009 00971, 2</p