PDSOI and Radiation Effects: An Overview

Bulk silicon substrates are a common characteristic of nearly all commercial, Complementary Metal-Oxide-Semiconductor (CMOS), integrated circuits. These devices operate well on Earth, but are not so well received in the space environment. An alternative to bulk CMOS is the Silicon-On-Insulator (SOI), in which a &electric isolates the device layer from the substrate. SO1 behavior in the space environment has certain inherent advantages over bulk, a primary factor in its long-time appeal to space-flight IC designers. The discussion will investigate the behavior of the Partially-Depleted SO1 (PDSOI) device with respect to some of the more common space radiation effects: Total Ionized Dose (TID), Single-Event Upsets (SEUs), and Single-Event Latchup (SEL). Test and simulation results from the literature, bulk and epitaxial comparisons facilitate reinforcement of PDSOI radiation characteristics

Working at NASA: A Brief Summary

Invited presentation for Rhode Island School of Design students in a course titled 'Digital + Media.' I was asked to speak about my job and what I do, and that a technical topic would be acceptable as well. From the university:The students are a mixture of tech and more conceptual investigation. Questioning how the world is manifesting human and machine, the consequences good and bad, what technology is allowing us to experience, where technology is taking us. Even if your lecture was highly technical it would be interesting and inspiring, the students are grad students focusing on art in varying forms in relation to technology. Inspiration can come from being confronted with things you don't understand and translating it through art. Art, technology, society + culture is our overarching theme

Low-Cost, Class D Testing of Spacecraft Photovoltaic Systems Can Reduce Risk

The end-to-end verification of a spacecraft photovoltaic power generation system requires light! A lowcost, portable, and end-to-end photovoltaic-system test appropriate for NASA's new generation of Class D missions is presented. High risk, low-cost, and quick-turn satellites rarely have the resources to execute the traditional approaches from higher-class (A-C) missions. The Class D approach, as demonstrated on the Lunar Atmospheric and Dust Environment Explorer (LADEE), utilizes a portable, metalhalide, theatre lamp for an end-to-end photovoltaic system test. While not as precise and comprehensive as the traditional Large Area Pulsed Solar Simulator (LAPSS) test, the LADEE method leverages minimal resources into an ongoing assessment program that can be applied through numerous stages of the mission. The project takes a true Class D approach in assessing the technical value of a costly, highfidelity performance test versus a simpler approach with less programmatic risk. The resources required are a fraction of that for a LAPSS test, and is easy to repeat due to its portability. Further, the test equipment can be handed down to future projects without building an on-site facility. At the vanguard of Class D missions, the LADEE team frequently wrestled with and challenged the status quo. The philosophy of risk avoidance at all cost, typical to Class A-C missions, simply could not be executed. This innovative and simple testing solution is contextualized to NASA Class D programs and a specific risk encountered during development of the LADEE Electrical Power System (EPS). Selection of the appropriate lamp and safety concerns are discussed, with examples of test results. Combined with the vendor's panellevel data and periodic inspection, the method ensures system integrity from Integration and Test (I&T) through launch. Following launch, mission operations tools are utilized to assess system performance based on a scant amount of available data

Low-Cost, Class D Testing of Spacecraft Photovoltaic Systems Can Reduce Risk

The end-to-end verification of a spacecraft photovoltaic power generation system requires light! Specifically, the standard practice for doing so is the Large Area Pulsed Solar Simulation (LAPSS). A LAPSS test can characterize a photovoltaic system's efficiency via its response to rapidly applied impulses of simulated sunlight. However, a Class D program on a constrained budget and schedule may not have the resources to ship an entire satellite for a LAPSS test alone. Such was the case with the Lunar Atmospheric and Dust Environment Explorer (LADEE) program, which was also averse to the risk of hardware damage during shipment. When the Electrical Power System (EPS) team was denied a spacecraft-level LAPSS test, the lack of an end-to-end power generation test elevated to a project-level technical risk. The team pulled together very limited resources to not only eliminate the risk, but build a process to monitor the health of the system through mission operations. We discuss a process for performing a low-cost, end-to-end test of the LADEE photovoltaic system. The approach combines system-level functional test, panel-level performance results, and periodic inspection (and repair) up until launch. Following launch, mission operations tools are utilized to assess system performance based on a scant amount of data. The process starts in manufacturing at the subcontractor. The panel manufacturer provides functional test and LAPSS data on each individual panel. We apply an initial assumption that the per-panel performance is sufficient to meet the power generation requirements. The manufacturer's data is also carried as the performance allocation for each panel during EPS system modeling and initial mission operations. During integration and test, a high-power, professional theater lamp system provides simulated sunlight to each panel on the spacecraft, thereby permitting a true end-to-end system test. A passing test results in a step response to nearly full-rated current at the appropriate solar array switch in the power system. A metal-halide bulb, infrared imagers, and onboard spacecraft measurements are utilized to minimize risk of thermal damage during test. Data is provided to support test results for both passing and marginal panels. Prior to encapsulation in the launch vehicle, each panel is inspected for damage by the panel manufacturer. Cracked cells or other damage is amended on-site. Because the photovoltaic test system is inexpensive and portable, each repaired panel can be re-verified immediately. Post-launch, the photovoltaic system is again characterized for per-panel deviations from the manufacturer's performance test. This proved especially tricky as the LADEE spacecraft performs only one current measurement on the entire array. The algorithm for Matlab tools to assess panel performance based on spacecraft attitude is discussed. While not as precise and comprehensive as LAPSS, the LADEE approach leverages minimal resources into an ongoing assessment program that can be applied through numerous stages of the mission. The project takes a true Class D approach in assessing the technical value of a spacecraft level performance test versus the programmatic risk of shipping the spacecraft to another facility. The resources required are a fraction of that for a LAPSS test, and is easy to repeat. Further, the test equipment can be handed down to future projects without building an on-site facility

Cryogenic Applications of Commercial Electronic Components

We have developed a range of techniques useful for constructing analog and digital circuits for operation in a liquid Helium environment (4.2K), using commercially available low power components. The challenges encountered in designing cryogenic electronics include finding components that can function usefully in the cold and possess low enough power dissipation so as not to heat the systems they are designed to measure. From design, test, and integration perspectives it is useful for components to operate similarly at room and cryogenic temperatures; however this is not a necessity. Some of the circuits presented here have been used successfully in the MUSTANG and in the GISMO camera to build a complete digital to analog multiplexer (which will be referred to as the Cryogenic Address Driver board). Many of the circuit elements described are of a more general nature rather than specific to the Cryogenic Address Driver board, and were studied as a part of a more comprehensive approach to addressing a larger set of cryogenic electronic needs

Edoxaban versus warfarin in patients with atrial fibrillation

Contains fulltext : 125374.pdf (publisher's version ) (Open Access)BACKGROUND: Edoxaban is a direct oral factor Xa inhibitor with proven antithrombotic effects. The long-term efficacy and safety of edoxaban as compared with warfarin in patients with atrial fibrillation is not known. METHODS: We conducted a randomized, double-blind, double-dummy trial comparing two once-daily regimens of edoxaban with warfarin in 21,105 patients with moderate-to-high-risk atrial fibrillation (median follow-up, 2.8 years). The primary efficacy end point was stroke or systemic embolism. Each edoxaban regimen was tested for noninferiority to warfarin during the treatment period. The principal safety end point was major bleeding. RESULTS: The annualized rate of the primary end point during treatment was 1.50% with warfarin (median time in the therapeutic range, 68.4%), as compared with 1.18% with high-dose edoxaban (hazard ratio, 0.79; 97.5% confidence interval [CI], 0.63 to 0.99; P<0.001 for noninferiority) and 1.61% with low-dose edoxaban (hazard ratio, 1.07; 97.5% CI, 0.87 to 1.31; P=0.005 for noninferiority). In the intention-to-treat analysis, there was a trend favoring high-dose edoxaban versus warfarin (hazard ratio, 0.87; 97.5% CI, 0.73 to 1.04; P=0.08) and an unfavorable trend with low-dose edoxaban versus warfarin (hazard ratio, 1.13; 97.5% CI, 0.96 to 1.34; P=0.10). The annualized rate of major bleeding was 3.43% with warfarin versus 2.75% with high-dose edoxaban (hazard ratio, 0.80; 95% CI, 0.71 to 0.91; P<0.001) and 1.61% with low-dose edoxaban (hazard ratio, 0.47; 95% CI, 0.41 to 0.55; P<0.001). The corresponding annualized rates of death from cardiovascular causes were 3.17% versus 2.74% (hazard ratio, 0.86; 95% CI, 0.77 to 0.97; P=0.01), and 2.71% (hazard ratio, 0.85; 95% CI, 0.76 to 0.96; P=0.008), and the corresponding rates of the key secondary end point (a composite of stroke, systemic embolism, or death from cardiovascular causes) were 4.43% versus 3.85% (hazard ratio, 0.87; 95% CI, 0.78 to 0.96; P=0.005), and 4.23% (hazard ratio, 0.95; 95% CI, 0.86 to 1.05; P=0.32). CONCLUSIONS: Both once-daily regimens of edoxaban were noninferior to warfarin with respect to the prevention of stroke or systemic embolism and were associated with significantly lower rates of bleeding and death from cardiovascular causes. (Funded by Daiichi Sankyo Pharma Development; ENGAGE AF-TIMI 48 ClinicalTrials.gov number, NCT00781391.)