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W drugiej połowie piętnastego stulecia Kraków stał się stolicą europejskiej astrologii, którą wykładali tutaj znani profesorowie Akademii Krakowskiej, tacy jak Piotr Gaszowiec czy Jan z Głogowa. Z pewnością poświęcali swoje prognostyki różnym ważnym datom. Jedną z takich dat jest 24 stycznia. Tego dnia bowiem planety tworzą specjalną koniunkcję, a znaki zodiaku układają się w szczególny wzór (Fragment tekstu)

Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence

Depth-profiling measurements by means of synchrotron radiation based grazing XRF techniques, i.e., grazing emission X-ray fluorescence (GEXRF) and grazing incidence X-ray fluorescence (GIXRF), present a promising approach for the non-destructive, sub-nanometer scale precision characterization of ultra shallow ion-implantations. The nanometer resolution is of importance with respect to actual semiconductor applications where the down-scaling of the device dimensions requires the doping of shallower depth ranges. The depth distributions of implanted ions can be deduced from the intensity dependence of the detected X-ray fluorescence (XRF) signal from the dopant atoms on either the grazing emission angle of the emitted X-rays (GEXRF), or the grazing incidence angle of the incident X-rays (GIXRF). The investigated sample depth depends on the grazing angle and can be varied from a few to several hundred nanometers. The GEXRF setup was equipped with a focusing polycapillary half-lens to allow for laterally resolved studies. The dopant depth distribution of the investigated low-energy (energy range from 1 keV up to 8 keV) P, In and Sb ion-implantations in Si or Ge wafers were reconstructed from the GEXRF data by using two different approaches, one with and one without a priori knowledge about the bell-shaped dopant depth distribution function. The results were compared to simulations and the trends predicted by theory were found to be well reproduced. The experimental GEXRF findings were moreover verified for selected samples by GIXRF

Evaluation of different analytical approaches using total reflection X-ray fluorescence systems for multielemental analysis of human tissues with different adipose content

Publisher Copyright: © 2022 The AuthorsElemental content plays an important role in biological processes, and so, the multielemental analysis of human tissue samples is required in biomedical research. Still, the small amount of available biological samples and the adipose content of the samples can be major setbacks for the accurate determination of elemental content. In this study, we explored the potential of several analytical approaches combined with total reflection X-ray fluorescence spectrometry (TXRF) for multielemental analysis of human tissues with different adipose content (colon, heart, liver, lung, muscle, intestine, skin, stomach, uterus, bladder and aorta). The capabilities and limitations of different sample treatment procedures (suspension and acidic digestion) and two TXRF systems with different anode configurations (Mo and W X-ray tubes) have been evaluated for such purpose. Results showed that for tissues with a higher fat content (e.g., skin, and intestine) the best strategy was the acidic digestion of the sample before TXRF analysis. However, for other tissues, acceptable results were obtained by suspending 20 mg of powdered material in 1 mL of 2 M nitric acid. A further enhancement of the limits of detection and accuracy of the results was achieved if using Mo-TXRF systems, especially for the determination of low Z elements (e.g., K, and Ca) and of elements present at low concentrations (e.g., Cu) in the human tissues. Finally, results by TXRF analysis were compared with those obtained with μ-EDXRF and ICP-OES, and a good agreement was obtained.publishersversionpublishe

Hypersatellite x-ray decay of 3d3d hollow-KK-shell atoms produced by heavy-ion impact

We report on the radiative decay of double K-shell vacancy states produced in solid Ca, V, Fe, and Cu targets by impact with about 10 MeV/amu C and Ne ions. The resulting K hypersatellite x-ray emission spectra were measured by means of high- energy-resolution spectroscopy using a von Hamos bent crystal spectrometer. The experiment was carried out at the Philips variable energy cyclotron of the Paul Scherrer Institute. From the fits of the x-ray spectra the energies, line widths, and relative intensities of the hypersatellite x-ray lines could be determined. The fitted intensities were corrected to account for the energy-dependent solid angle of the spectrometer, effective source size, target self-absorption, crystal reflectivity, and detector efficiency. The single-to-double K-shell ionization cross-section ratios were deduced from the corrected relative intensities of the hypersatellites and compared to theoretical predictions from the semiclassical approximation model using hydrogenlike and Dirac-Hartree-Fock wave functions and from classical trajectory Monte Carlo calculations

A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15–26 keV

The design and performance of a high-resolution transmission-type X-ray spectrometer for use in the 15–26 keV energy range at synchrotron light sources is reported. Monte Carlo X-ray-tracing simulations were performed to optimize the performance of the transmission-type spectrometer, based on the DuMond geometry, for use at the Super X-ray absorption beamline of the Swiss Light Source at the Paul Scherrer Institute. This spectrometer provides an instrumental energy resolution of 3.5 eV for X-ray emission lines around 16 keV and 12.5 eV for emission lines at 26 keV, which is comparable to the natural linewidths of the K and L X-ray transitions in the covered energy range. First experimental data are presented and compared with results of the Monte Carlo X-ray simulations