Evidence of Deep Water Penetration in Silica during Stress Corrosion Fracture

We measure the thickness of the heavy water layer trapped under the stress corrosion fracture surface of silica using neutron reflectivity experiments. We show that the penetration depth is 65–85 Å, suggesting the presence of a damaged zone of ~100 Å extending ahead of the crack tip during its propagation. This estimate of the size of the damaged zone is compatible with other recent results

Significant techniques in the processing and interpretation of ERTS-1 data

The discipline oriented investigations underway at the Johnson Space Center (JSC) using ERTS-1 data provide an appropriate framework for the systematic evaluation of the various elements comprising a prototype multispectral data processing and analysis system. In particular such a system may be thought of as the integration of: (1) a preprocessing subsystem; (2) a spectral clustering subsystem, (3) a correlation and classification subsystem; (4) mensuration subsystem; and (5) an information management subsystem. Specific elements of this system are already operational at JSC. It is in the context of this system that technique development and application is being pursued at JSC. Aircraft, ERTS and EREP data will be utilized to refine the subsystem elements for each of the data acquisition systems or system combinations that are optimally suited for a specific Earth Resources application. The techniques reported are those that have been developed to date during the utilization of ERTS-1 data in this processing and analysis system

Submicrometric Films of Surface-Attached Polymer Network with Temperature-Responsive Properties

Temperature-responsive properties of surface-attached poly(N-isopropylacrylamide) (PNIPAM) network films with well-controlled chemistry are investigated. The synthesis consists of cross-linking and grafting preformed ene-reactive polymer chains through thiol--ene click chemistry. The formation of surface-attached and cross-linked polymer films has the advantage of being wellcontrolled without any caution of no-oxygen atmosphere or addition of initiators. PNIPAM hydrogel films with same cross-link density are synthesized on a wide range of thickness, from nanometers to micrometers. The swelling-collapse transition with temperature is studied by using ellipsometry, neutron reflectivity, and atomic force microscopy as complementary surface-probing techniques. Sharp and high amplitude temperature-induced phase transition is observed for all submicrometric PNIPAM hydrogel films. For temperature above LCST, surface-attached PNIPAM hydrogels collapse similarly but without complete expulsion of water. For temperature below LCST, the swelling of PNIPAM hydrogels depends on the film thickness. It is shown that the swelling is strongly affected by the surface attachment for ultrathin films below $\sim$150 nm. For thicker films above 150 nm (to micrometers), surface-attached polymer networks with the same cross-link density swell equally. The density profile of the hydrogel films in the direction normal to the substrate is confronted with in-plane topography of the free surface. It results that the free interface width is much larger than the roughness of the hydrogel film, suggesting pendant chains at the free surface.Comment: in Langmuir, American Chemical Society, 2015, LANGMUIR, 31 (42), pp.11516-1152

Mass Density of Individual Cobalt Nanowires

The mass density of nanowires is determined using in-situ resonance frequency experiments combined with quasi-static nanotensile tests. Our results reveal a mass density of 7.36 g/cm3 on average which is below the theoretical density of bulk cobalt. Also the density of electrodeposited cobalt nanowires is found to decrease with the aspect ratio. The results are discussed in terms of the measurement accuracy and the microstructure of the nanowires.Comment: 3 Figure

Universal scattering behavior of co-assembled nanoparticle-polymer clusters

Water-soluble clusters made from 7 nm inorganic nanoparticles have been investigated by small-angle neutron scattering. The internal structure factor of the clusters was derived and exhibited a universal behavior as evidenced by a correlation hole at intermediate wave-vectors. Reverse Monte-Carlo calculations were performed to adjust the data and provided an accurate description of the clusters in terms of interparticle distance and volume fraction. Additional parameters influencing the microstructure were also investigated, including the nature and thickness of the nanoparticle adlayer.Comment: 5 pages, 4 figures, paper published in Physical Review

The role of electron polarization on nuclear spin diffusion

Dynamic nuclear polarization (DNP) is capable of boosting signals in nuclear magnetic resonance by orders of magnitude by creating out-of-equilibrium nuclear spin polarization. The diffusion of nuclear spin polarization in the vicinity of paramagnetic dopants is a crucial step for DNP and remains yet not well understood. In this Letter, we show that the polarization of the electron spin controls the rate of proton spin diffusion in a DNP sample at 1.2 K and 7 T; at increasingly high electron polarization, spin diffusion vanishes. We rationalize our results using a 2 nucleus - 1 electron model and Lindblad s Master equation, which generalizes preexisting models in the literature and qualitatively accounts for the experimental observed spin diffusion dynamics.Comment: Main text: 6 pages, 3 figures Supplement: 9 pages, 4 figure

Small-Angle Neutron Scattering Reveals the Structural Details of Thermosensitive Polymer-Grafted Cellulose Nanocrystal Suspensions.

Thanks to the use of small-angle neutron scattering (SANS), a detailed structural description of thermosensitive polymer-grafted cellulose nanocrystals (CNCs) was obtained and the behavior of aqueous suspensions of these derivatized biosourced particles upon temperature increase was revealed. Although literature data show that the surface grafting of thermosensitive polymers drastically enhances the colloidal properties of CNCs, direct space microscopic investigation techniques fail in providing sufficient structural information on these objects. In the case of CNCs decorated with temperature-sensitive polyetheramines following a peptide coupling reaction, a qualitative and quantitative analysis of SANS spectra shows that CNCs are homogeneously covered by a shell comprising polymer chains in a Gaussian conformation with a thickness equal to their radius of gyration in solution, thus revealing a mushroom regime. An increase of the temperature above the lower critical solution temperature (LCST) of the polyetheramine results in the formation of finite size bundles whose aggregation number depends on the particle concentration and suspension temperature deviation from the LCST. SANS analysis further reveals local changes at the CNC surface corresponding to a release of water molecules and a related denser polymer shell conformation. Noticeably, data show a full reversibility at all length scales when a sample was cooled down to below the LCST after being heated above it. Overall, the results obtained by SANS allow an in-depth structural investigation of derivatized CNCs, which is of high interest for the design of functional materials comprising these biosourced colloids.Institut Carnot PolyNat (ANR N° 16-CARN-025-01), France

Roughness Analysis In Strained Silicon-on-insulator Wires And Films

Strained silicon is used to enhance performance in state-of-the-art CMOS. Under device operating conditions, the effect of strain is to reduce the carrier scattering at the channel by a smoother semiconductor surface. This has never been completely understood. This paper gives first evidence of the variation in surface roughness under realistic strained conditions. At the nanoscale, the SiO2/Si interface roughness is dependent on the scale of observation (self-affinity). To date, there is no experimental study of the SiO2/Si interface roughness scaling with strain. This work presents the effect of uniaxial and biaxial strains on the surface roughness of strained silicon-on-insulator films and wires using atomic force microscopy. Levels of strain ranging from 0% to 2.3%, encompassing those used in present CMOS devices have been investigated. It is shown that the silicon surface is affected by uniaxial and biaxial strains differently. 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